WO2008054558A3 - Deviation angle self compensating substantially achromatic retarder - Google Patents

Deviation angle self compensating substantially achromatic retarder Download PDF

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Publication number
WO2008054558A3
WO2008054558A3 PCT/US2007/015695 US2007015695W WO2008054558A3 WO 2008054558 A3 WO2008054558 A3 WO 2008054558A3 US 2007015695 W US2007015695 W US 2007015695W WO 2008054558 A3 WO2008054558 A3 WO 2008054558A3
Authority
WO
WIPO (PCT)
Prior art keywords
substantially achromatic
deviation angle
angle self
self compensating
achromatic retarder
Prior art date
Application number
PCT/US2007/015695
Other languages
French (fr)
Other versions
WO2008054558A2 (en
Original Assignee
J A Woollam Co Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US11/590,408 external-priority patent/US7460230B2/en
Application filed by J A Woollam Co Inc filed Critical J A Woollam Co Inc
Priority to KR1020087030571A priority Critical patent/KR101335567B1/en
Priority to JP2009534564A priority patent/JP2010508511A/en
Priority to EP07810297A priority patent/EP2062018B1/en
Publication of WO2008054558A2 publication Critical patent/WO2008054558A2/en
Publication of WO2008054558A3 publication Critical patent/WO2008054558A3/en

Links

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00Optical elements other than lenses
    • G02B5/30Polarising elements
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00Optical elements other than lenses
    • G02B5/30Polarising elements
    • G02B5/3083Birefringent or phase retarding elements
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J4/00Measuring polarisation of light
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21Polarisation-affecting properties
    • G01N21/211Ellipsometry
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/06Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the phase of light
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/28Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for polarising
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/02Details
    • G01J1/04Optical or mechanical part supplementary adjustable parts
    • G01J1/0407Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21Polarisation-affecting properties
    • G01N21/211Ellipsometry
    • G01N2021/213Spectrometric ellipsometry

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Polarising Elements (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Optical Elements Other Than Lenses (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Optical Radar Systems And Details Thereof (AREA)

Abstract

A substantially achromatic multiple element compensator system (R1, R2, W1, W2) for use in wide spectral range (for example, 190 - 1700 nm) rotating compensator spectroscopic ellipsometer and/or polarimeter systems. Multiple total internal reflections enter retardance into an entered beam of electromagnetic radiation, and the elements (R1, R2, W1, W2) are oriented to minimize changes in the net retardance vs. the input beam angle resulting from changes in the position and/or rotation of the system of elements.
PCT/US2007/015695 2006-10-31 2007-07-10 Deviation angle self compensating substantially achromatic retarder WO2008054558A2 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
KR1020087030571A KR101335567B1 (en) 2006-10-31 2007-07-10 Deviation angle self compensating substantially achromatic retarder
JP2009534564A JP2010508511A (en) 2006-10-31 2007-07-10 Substantially achromatic retarder that self-compensates for declination
EP07810297A EP2062018B1 (en) 2006-10-31 2007-07-10 Deviation angle self compensating substantially achromatic retarder

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US11/590,408 US7460230B2 (en) 2005-11-04 2006-10-31 Deviation angle self compensating substantially achromatic retarder
US11/590,408 2006-10-31
US11/633,138 US7450231B2 (en) 2005-11-04 2006-12-04 Deviation angle self compensating substantially achromatic retarder
US11/633,138 2006-12-04

Publications (2)

Publication Number Publication Date
WO2008054558A2 WO2008054558A2 (en) 2008-05-08
WO2008054558A3 true WO2008054558A3 (en) 2008-09-04

Family

ID=39344822

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2007/015695 WO2008054558A2 (en) 2006-10-31 2007-07-10 Deviation angle self compensating substantially achromatic retarder

Country Status (5)

Country Link
US (1) US7450231B2 (en)
EP (1) EP2062018B1 (en)
JP (2) JP2010508511A (en)
KR (1) KR101335567B1 (en)
WO (1) WO2008054558A2 (en)

Families Citing this family (77)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11026768B2 (en) 1998-10-08 2021-06-08 Align Technology, Inc. Dental appliance reinforcement
US9492245B2 (en) 2004-02-27 2016-11-15 Align Technology, Inc. Method and system for providing dynamic orthodontic assessment and treatment profiles
US7907280B2 (en) * 2005-11-04 2011-03-15 J.A. Woollam Co., Inc. Method of constructing a deviation angle self compensating substantially achromatic retarder to compensate beam traslation
US8462341B2 (en) 2005-11-04 2013-06-11 J.A. Woollam Co., Inc. Mounting for deviation angle self compensating substantially achromatic retarder
US7878805B2 (en) 2007-05-25 2011-02-01 Align Technology, Inc. Tabbed dental appliance
US8738394B2 (en) 2007-11-08 2014-05-27 Eric E. Kuo Clinical data file
US8108189B2 (en) 2008-03-25 2012-01-31 Align Technologies, Inc. Reconstruction of non-visible part of tooth
US8092215B2 (en) 2008-05-23 2012-01-10 Align Technology, Inc. Smile designer
US9492243B2 (en) 2008-05-23 2016-11-15 Align Technology, Inc. Dental implant positioning
US8172569B2 (en) 2008-06-12 2012-05-08 Align Technology, Inc. Dental appliance
US8152518B2 (en) 2008-10-08 2012-04-10 Align Technology, Inc. Dental positioning appliance having metallic portion
JP4711009B2 (en) 2008-10-16 2011-06-29 ソニー株式会社 Optical measuring device
US8169611B2 (en) 2009-02-27 2012-05-01 University Of Nebraska Board Of Regents Terahertz-infrared ellipsometer system, and method of use
US8736838B2 (en) 2009-02-27 2014-05-27 J.A. Woollam Co., Inc. Terahertz ellipsometer system, and method of use
US8488119B2 (en) 2009-02-27 2013-07-16 J.A. Woollam Co., Inc. Terahertz-infrared ellipsometer system, and method of use
US8416408B1 (en) 2009-02-27 2013-04-09 J.A. Woollam Co., Inc. Terahertz-infrared ellipsometer system, and method of use
US8934096B2 (en) 2009-02-27 2015-01-13 University Of Nebraska Board Of Regents Terahertz-infrared ellipsometer system, and method of use
US8292617B2 (en) 2009-03-19 2012-10-23 Align Technology, Inc. Dental wire attachment
US8765031B2 (en) 2009-08-13 2014-07-01 Align Technology, Inc. Method of forming a dental appliance
US9241774B2 (en) 2010-04-30 2016-01-26 Align Technology, Inc. Patterned dental positioning appliance
US9211166B2 (en) 2010-04-30 2015-12-15 Align Technology, Inc. Individualized orthodontic treatment index
US9403238B2 (en) 2011-09-21 2016-08-02 Align Technology, Inc. Laser cutting
WO2013101252A1 (en) * 2011-12-31 2013-07-04 J.A. Woollam Co., Inc. Terahertz ellipsometer system, and method of use
US9375300B2 (en) 2012-02-02 2016-06-28 Align Technology, Inc. Identifying forces on a tooth
JP6097703B2 (en) * 2012-02-08 2017-03-15 学校法人 埼玉医科大学 Axisymmetric polarization conversion element
US9220580B2 (en) 2012-03-01 2015-12-29 Align Technology, Inc. Determining a dental treatment difficulty
US9414897B2 (en) 2012-05-22 2016-08-16 Align Technology, Inc. Adjustment of tooth position in a virtual dental model
US10772506B2 (en) 2014-07-07 2020-09-15 Align Technology, Inc. Apparatus for dental confocal imaging
US9693839B2 (en) 2014-07-17 2017-07-04 Align Technology, Inc. Probe head and apparatus for intraoral confocal imaging using polarization-retarding coatings
US9675430B2 (en) 2014-08-15 2017-06-13 Align Technology, Inc. Confocal imaging apparatus with curved focal surface
US10449016B2 (en) 2014-09-19 2019-10-22 Align Technology, Inc. Arch adjustment appliance
US9610141B2 (en) 2014-09-19 2017-04-04 Align Technology, Inc. Arch expanding appliance
CN104317064A (en) * 2014-09-24 2015-01-28 福建福晶科技股份有限公司 Broadband achromatic compensator
WO2016057464A1 (en) * 2014-10-06 2016-04-14 Applied Photophysics, Inc. Calibration device and uses thereof
US9744001B2 (en) 2014-11-13 2017-08-29 Align Technology, Inc. Dental appliance with cavity for an unerupted or erupting tooth
US10504386B2 (en) 2015-01-27 2019-12-10 Align Technology, Inc. Training method and system for oral-cavity-imaging-and-modeling equipment
CN105181604A (en) * 2015-05-11 2015-12-23 福州大学 Multi-angle incident single shot ellipsometry measurement method
US10248883B2 (en) 2015-08-20 2019-04-02 Align Technology, Inc. Photograph-based assessment of dental treatments and procedures
US11554000B2 (en) 2015-11-12 2023-01-17 Align Technology, Inc. Dental attachment formation structure
US11931222B2 (en) 2015-11-12 2024-03-19 Align Technology, Inc. Dental attachment formation structures
US11103330B2 (en) 2015-12-09 2021-08-31 Align Technology, Inc. Dental attachment placement structure
US11596502B2 (en) 2015-12-09 2023-03-07 Align Technology, Inc. Dental attachment placement structure
EP3988048B1 (en) 2016-06-17 2024-01-17 Align Technology, Inc. Orthodontic appliance performance monitor
US10470847B2 (en) 2016-06-17 2019-11-12 Align Technology, Inc. Intraoral appliances with sensing
JP2019523064A (en) 2016-07-27 2019-08-22 アライン テクノロジー, インコーポレイテッド Intraoral scanner with dental diagnostic function
US10507087B2 (en) 2016-07-27 2019-12-17 Align Technology, Inc. Methods and apparatuses for forming a three-dimensional volumetric model of a subject's teeth
CN117257492A (en) 2016-11-04 2023-12-22 阿莱恩技术有限公司 Method and apparatus for dental imaging
WO2018102702A1 (en) 2016-12-02 2018-06-07 Align Technology, Inc. Dental appliance features for speech enhancement
US11376101B2 (en) 2016-12-02 2022-07-05 Align Technology, Inc. Force control, stop mechanism, regulating structure of removable arch adjustment appliance
EP3824843A1 (en) 2016-12-02 2021-05-26 Align Technology, Inc. Palatal expanders and methods of expanding a palate
AU2017366755B2 (en) 2016-12-02 2022-07-28 Align Technology, Inc. Methods and apparatuses for customizing rapid palatal expanders using digital models
US10548700B2 (en) 2016-12-16 2020-02-04 Align Technology, Inc. Dental appliance etch template
US10456043B2 (en) 2017-01-12 2019-10-29 Align Technology, Inc. Compact confocal dental scanning apparatus
US10779718B2 (en) 2017-02-13 2020-09-22 Align Technology, Inc. Cheek retractor and mobile device holder
US10613515B2 (en) 2017-03-31 2020-04-07 Align Technology, Inc. Orthodontic appliances including at least partially un-erupted teeth and method of forming them
US11045283B2 (en) 2017-06-09 2021-06-29 Align Technology, Inc. Palatal expander with skeletal anchorage devices
WO2019005808A1 (en) 2017-06-26 2019-01-03 Align Technology, Inc. Biosensor performance indicator for intraoral appliances
US10885521B2 (en) 2017-07-17 2021-01-05 Align Technology, Inc. Method and apparatuses for interactive ordering of dental aligners
WO2019018784A1 (en) 2017-07-21 2019-01-24 Align Technology, Inc. Palatal contour anchorage
CN110996842B (en) 2017-07-27 2022-10-14 阿莱恩技术有限公司 Tooth staining, transparency and glazing
EP3658067B1 (en) 2017-07-27 2023-10-25 Align Technology, Inc. System and methods for processing an orthodontic aligner by means of an optical coherence tomography
US11116605B2 (en) 2017-08-15 2021-09-14 Align Technology, Inc. Buccal corridor assessment and computation
WO2019036677A1 (en) 2017-08-17 2019-02-21 Align Technology, Inc. Dental appliance compliance monitoring
US10813720B2 (en) 2017-10-05 2020-10-27 Align Technology, Inc. Interproximal reduction templates
CN114939001A (en) 2017-10-27 2022-08-26 阿莱恩技术有限公司 Substitute occlusion adjustment structure
CN111295153B (en) 2017-10-31 2023-06-16 阿莱恩技术有限公司 Dental appliance with selective bite loading and controlled tip staggering
US11096763B2 (en) 2017-11-01 2021-08-24 Align Technology, Inc. Automatic treatment planning
US11534974B2 (en) 2017-11-17 2022-12-27 Align Technology, Inc. Customized fabrication of orthodontic retainers based on patient anatomy
EP3716885B1 (en) 2017-11-30 2023-08-30 Align Technology, Inc. Orthodontic intraoral appliances comprising sensors
WO2019118876A1 (en) 2017-12-15 2019-06-20 Align Technology, Inc. Closed loop adaptive orthodontic treatment methods and apparatuses
US10980613B2 (en) 2017-12-29 2021-04-20 Align Technology, Inc. Augmented reality enhancements for dental practitioners
CA3086553A1 (en) 2018-01-26 2019-08-01 Align Technology, Inc. Diagnostic intraoral scanning and tracking
US11937991B2 (en) 2018-03-27 2024-03-26 Align Technology, Inc. Dental attachment placement structure
CA3096417A1 (en) 2018-04-11 2019-10-17 Align Technology, Inc. Releasable palatal expanders
US11733534B2 (en) * 2021-01-21 2023-08-22 AdlOptica Optical Systems GmbH Optics for formation of multiple light spots with controlled spot intensity and variable spot pattern geometry
JP7221320B2 (en) * 2021-03-05 2023-02-13 株式会社光学技研 Broadband retarder, measuring device and optical attenuator provided with broadband retarder
JP7221433B1 (en) 2022-02-03 2023-02-13 株式会社光学技研 Optical element and method for manufacturing optical element

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5751482A (en) * 1996-04-22 1998-05-12 Imation Corp. Achromatic polarization-rotating right-angle prism system
US20020181101A1 (en) * 2001-04-28 2002-12-05 Appel Roland Kevin Optical device
US20060023308A1 (en) * 2004-07-29 2006-02-02 Hunt Jeffrey H Infrared polarization rotation element

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1119240A (en) * 1965-09-23 1968-07-10 Nat Res Dev Quarterwave retardation systems
US4331378A (en) 1976-10-22 1982-05-25 E. I. Du Pont De Nemours And Company Reinforced optical fiber cable with glass or silica core
DD245489A1 (en) * 1985-12-31 1987-05-06 Zeiss Jena Veb Carl CIRCULAR POLARIZATION DEVICE
US4822150A (en) * 1987-05-18 1989-04-18 Eastman Kodak Company Optical device for rotating the polarization of a light beam
GB8720923D0 (en) * 1987-09-05 1987-10-14 Emi Plc Thorn Optical image rotators
US4917461A (en) * 1989-01-11 1990-04-17 Goldstein Dennis H Achromatic infrared retarder
JPH0336504A (en) * 1989-07-03 1991-02-18 Copal Co Ltd Optical path deflecting device
US5706212A (en) 1996-03-20 1998-01-06 Board Of Regents Of University Of Nebraska Infrared ellipsometer/polarimeter system, method of calibration, and use thereof
US6084674A (en) 1999-01-04 2000-07-04 J. A. Woollam Co., Inc. Parallelogram shaped optical retarder element for use in spectroscopic ellipsometer and polarimeter systems
US6100981A (en) 1999-01-04 2000-08-08 J.A. Woollam Co. Inc. Dual horizontally oriented triangle shaped optical retarder element for use in spectroscopic ellipsometer and polarimeter systems
US6353477B1 (en) * 1992-09-18 2002-03-05 J. A. Woollam Co. Inc. Regression calibrated spectroscopic rotating compensator ellipsometer system with pseudo-achromatic retarder system
US6141102A (en) 1999-01-19 2000-10-31 J. A. Woolam Co. Inc Single trianglular shaped optical retarder element for use in spectroscopic ellipsometer and polarimeter systems
US6118537A (en) 1999-01-04 2000-09-12 J. A. Woollam Co. Inc. Multiple tipped berek plate optical retarder elements for use in spectroscopic ellipsometer and polarimeter systems
US6084675A (en) 1995-09-20 2000-07-04 J. A. Woollam Co. Inc. Adjustable beam alignment compensator/retarder with application in spectroscopic ellipsometer and polarimeter systems
JP3340824B2 (en) * 1993-12-13 2002-11-05 レーザーテック株式会社 Optical system including total reflection prism
US5946098A (en) 1997-12-23 1999-08-31 J.A. Woollam Co. Inc. Optical elements for use in spectroscopic ellipsometer and polarimeter systems
US5706087A (en) 1996-10-04 1998-01-06 The Board Of Regents Of The University Of Nebraska Electromagnetic beam directing means-sample analysis system stage, and method of use
US6546159B1 (en) * 2001-08-22 2003-04-08 Avanex Corporation Method and apparatus for compensating differential group delay
US7202418B2 (en) 2004-01-07 2007-04-10 Cable Components Group, Llc Flame retardant and smoke suppressant composite high performance support-separators and conduit tubes
US7218821B2 (en) 2004-08-20 2007-05-15 Furukawa Electric North America Inc. Optical fiber cables
US7298480B2 (en) 2005-12-23 2007-11-20 Ecole Polytechnique Broadband ellipsometer / polarimeter system

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5751482A (en) * 1996-04-22 1998-05-12 Imation Corp. Achromatic polarization-rotating right-angle prism system
US20020181101A1 (en) * 2001-04-28 2002-12-05 Appel Roland Kevin Optical device
US20060023308A1 (en) * 2004-07-29 2006-02-02 Hunt Jeffrey H Infrared polarization rotation element

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of EP2062018A4 *

Also Published As

Publication number Publication date
JP2012141623A (en) 2012-07-26
US20080100842A1 (en) 2008-05-01
KR101335567B1 (en) 2013-12-02
US7450231B2 (en) 2008-11-11
KR20090087812A (en) 2009-08-18
EP2062018A4 (en) 2009-10-21
WO2008054558A2 (en) 2008-05-08
JP2010508511A (en) 2010-03-18
JP5438789B2 (en) 2014-03-12
EP2062018B1 (en) 2012-03-07
EP2062018A2 (en) 2009-05-27

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