EP1218915A4 - Systems and methods for high performance scanning - Google Patents

Systems and methods for high performance scanning

Info

Publication number
EP1218915A4
EP1218915A4 EP99964213A EP99964213A EP1218915A4 EP 1218915 A4 EP1218915 A4 EP 1218915A4 EP 99964213 A EP99964213 A EP 99964213A EP 99964213 A EP99964213 A EP 99964213A EP 1218915 A4 EP1218915 A4 EP 1218915A4
Authority
EP
European Patent Office
Prior art keywords
systems
methods
high performance
performance scanning
scanning
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP99964213A
Other languages
German (de)
French (fr)
Other versions
EP1218915A1 (en
Inventor
David Stern
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Affymetrix Inc
Original Assignee
Affymetrix Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US09/383,986 external-priority patent/US6545264B1/en
Application filed by Affymetrix Inc filed Critical Affymetrix Inc
Publication of EP1218915A1 publication Critical patent/EP1218915A1/en
Publication of EP1218915A4 publication Critical patent/EP1218915A4/en
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/008—Details of detection or image processing, including general computer control
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0036—Scanning details, e.g. scanning stages
    • G02B21/0048—Scanning details, e.g. scanning stages scanning mirrors, e.g. rotating or galvanomirrors, MEMS mirrors
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0076—Optical details of the image generation arrangements using fluorescence or luminescence
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/008—Details of detection or image processing, including general computer control
    • G02B21/0084—Details of detection or image processing, including general computer control time-scale detection, e.g. strobed, ultra-fast, heterodyne detection
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/24—Base structure
    • G02B21/26—Stages; Adjusting means therefor
EP99964213A 1999-08-26 1999-12-10 Systems and methods for high performance scanning Withdrawn EP1218915A4 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US383986 1999-08-26
US09/383,986 US6545264B1 (en) 1998-10-30 1999-08-26 Systems and methods for high performance scanning
PCT/US1999/029351 WO2001015193A1 (en) 1999-08-26 1999-12-10 Systems and methods for high performance scanning

Publications (2)

Publication Number Publication Date
EP1218915A1 EP1218915A1 (en) 2002-07-03
EP1218915A4 true EP1218915A4 (en) 2002-10-09

Family

ID=23515571

Family Applications (1)

Application Number Title Priority Date Filing Date
EP99964213A Withdrawn EP1218915A4 (en) 1999-08-26 1999-12-10 Systems and methods for high performance scanning

Country Status (3)

Country Link
EP (1) EP1218915A4 (en)
JP (1) JP2003507777A (en)
WO (1) WO2001015193A1 (en)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH697814B1 (en) * 2001-01-26 2009-02-27 Tecan Trading Ag Optical system and method for exciting and measuring fluorescence on or in samples treated with fluorescent dyes.
DE10148188A1 (en) * 2001-09-28 2003-04-17 Leica Mikroskopie & Syst Microscope with contrast-enhancing image recording device
DE10152609A1 (en) * 2001-10-25 2003-05-08 Max Planck Gesellschaft Optical microscope has an adjustable objective so a sample can be viewed from different incidence angles by use of an adjustment device that varies the objective and beam guidance optics positions
DE102004058565B4 (en) * 2004-10-18 2022-04-21 Leica Microsystems Cms Gmbh scanning microscope
JP4905139B2 (en) * 2007-01-11 2012-03-28 株式会社ニコン Scanning laser microscope
US7863831B2 (en) 2008-06-12 2011-01-04 3M Innovative Properties Company AC illumination apparatus with amplitude partitioning
DE102010007729A1 (en) 2010-02-12 2011-08-18 Leica Microsystems CMS GmbH, 35578 Device for scanning an object, method for operating the device and scanning microscope
CN104597590B (en) * 2014-12-30 2018-02-02 深圳先进技术研究院 A kind of super-resolution fluorescence light spectrum image-forming microscope
CN113074917A (en) * 2021-04-01 2021-07-06 南京信息工程大学 Micro-nano structure characteristic parameter measuring method and device based on Bessel beam defocusing scanning

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3013467A (en) * 1957-11-07 1961-12-19 Minsky Marvin Microscopy apparatus
US5260569A (en) * 1991-07-25 1993-11-09 Fuji Photo Film Co., Ltd. Scanning microscope and scanning mechanism
US5459325A (en) * 1994-07-19 1995-10-17 Molecular Dynamics, Inc. High-speed fluorescence scanner
WO2000026935A2 (en) * 1998-10-30 2000-05-11 Affymetrix, Inc. Systems and methods for high performance scanning

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5631734A (en) * 1994-02-10 1997-05-20 Affymetrix, Inc. Method and apparatus for detection of fluorescently labeled materials
JP2000512744A (en) * 1996-05-16 2000-09-26 アフィメトリックス，インコーポレイテッド System and method for detecting label material
US5880465A (en) * 1996-05-31 1999-03-09 Kovex Corporation Scanning confocal microscope with oscillating objective lens

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3013467A (en) * 1957-11-07 1961-12-19 Minsky Marvin Microscopy apparatus
US5260569A (en) * 1991-07-25 1993-11-09 Fuji Photo Film Co., Ltd. Scanning microscope and scanning mechanism
US5459325A (en) * 1994-07-19 1995-10-17 Molecular Dynamics, Inc. High-speed fluorescence scanner
WO2000026935A2 (en) * 1998-10-30 2000-05-11 Affymetrix, Inc. Systems and methods for high performance scanning

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of WO0115193A1 *

Also Published As

Publication number Publication date
JP2003507777A (en) 2003-02-25
WO2001015193A1 (en) 2001-03-01
EP1218915A1 (en) 2002-07-03

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