EP0234579A3 - Reflection density measuring system - Google Patents

Reflection density measuring system Download PDF

Info

Publication number: EP0234579A3
Authority: EP; European Patent Office
Prior art keywords: measuring system; reflection density; density measuring; reflection; measuring
Prior art date: 1986-02-26
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Granted

Application number

EP87102732A

Other versions

EP0234579B1 (en

EP0234579A2 (en

Inventor

Nobuhiko C/O Fuji Photo Film Co. Ltd. Ogura

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

Fujifilm Holdings Corp

Original Assignee

Fuji Photo Film Co Ltd

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1986-02-26

Filing date

1987-02-26

Publication date

1990-01-17

1986-02-26 Priority claimed from JP4089086A external-priority patent/JPS62198736A/en

1986-04-19 Priority claimed from JP9095686A external-priority patent/JPS62247229A/en

1987-02-26 Application filed by Fuji Photo Film Co Ltd filed Critical Fuji Photo Film Co Ltd

1987-09-02 Publication of EP0234579A2 publication Critical patent/EP0234579A2/en

1990-01-17 Publication of EP0234579A3 publication Critical patent/EP0234579A3/en

1995-01-11 Application granted granted Critical

1995-01-11 Publication of EP0234579B1 publication Critical patent/EP0234579B1/en

2007-02-26 Anticipated expiration legal-status Critical

Status Expired - Lifetime legal-status Critical Current

Links

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
- G01N21/474—Details of optical heads therefor, e.g. using optical fibres
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
- G01N2021/4776—Miscellaneous in diffuse reflection devices
- G01N2021/478—Application in testing analytical test strips

EP87102732A 1986-02-26 1987-02-26 Reflection density measuring system Expired - Lifetime EP0234579B1 (en)

Applications Claiming Priority (4)

Application Number	Priority Date	Filing Date	Title
JP4089086A JPS62198736A (en)	1986-02-26	1986-02-26	Measuring instrument for reflection density
JP40890/86		1986-02-26
JP9095686A JPS62247229A (en)	1986-04-19	1986-04-19	Reflection density measuring apparatus
JP90956/86		1986-04-19

Publications (3)

Publication Number	Publication Date
EP0234579A2 EP0234579A2 (en)	1987-09-02
EP0234579A3 true EP0234579A3 (en)	1990-01-17
EP0234579B1 EP0234579B1 (en)	1995-01-11

Family

ID=26380406

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
EP87102732A Expired - Lifetime EP0234579B1 (en)	1986-02-26	1987-02-26	Reflection density measuring system

Country Status (3)

Country	Link
US (1)	US4823169A (en)
EP (1)	EP0234579B1 (en)
DE (1)	DE3750963T2 (en)

Families Citing this family (37)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
GB2193803A (en) *	1986-07-04	1988-02-17	De La Rue Syst	Monitoring diffuse reflectivity
NL8901722A (en) *	1989-07-06	1991-02-01	Oce Nederland Bv	DEVICE FOR MEASURING LIGHT SCATTERED BY AN INFORMATION CARRIER
JPH0365953U (en) *	1989-10-30	1991-06-26
US5150174A (en) *	1991-03-25	1992-09-22	Eaton Corporation	Photoelectric color sensor
US5318143A (en) *	1992-06-22	1994-06-07	The Texas A & M University System	Method and apparatus for lane sensing for automatic vehicle steering
US5428439A (en) *	1992-09-23	1995-06-27	The Texas A&M University System	Range measurement system
JP2800587B2 (en) *	1992-10-05	1998-09-21	松下電器産業株式会社	Foreign matter inspection device and foreign matter inspection method
US6307629B1 (en)	1997-08-12	2001-10-23	Lj Laboratories, L.L.C.	Apparatus and method for measuring optical characteristics of an object
US5926262A (en) *	1997-07-01	1999-07-20	Lj Laboratories, L.L.C.	Apparatus and method for measuring optical characteristics of an object
US5966205A (en)	1997-07-01	1999-10-12	Lj Laboratories, Llc	Method and apparatus for detecting and preventing counterfeiting
US6373573B1 (en)	2000-03-13	2002-04-16	Lj Laboratories L.L.C.	Apparatus for measuring optical characteristics of a substrate and pigments applied thereto
US5880826A (en)	1997-07-01	1999-03-09	L J Laboratories, L.L.C.	Apparatus and method for measuring optical characteristics of teeth
US5745229A (en) *	1996-01-02	1998-04-28	Lj Laboratories, L.L.C.	Apparatus for determining optical characteristics of an object
US6254385B1 (en)	1997-01-02	2001-07-03	Lj Laboratories, Llc	Apparatus and method for measuring optical characteristics of teeth
US6118521A (en) *	1996-01-02	2000-09-12	Lj Laboratories, L.L.C.	Apparatus and method for measuring optical characteristics of an object
US5759030A (en) *	1996-01-02	1998-06-02	Lj Laboratories, L.L.C.	Method for determing optical characteristics of teeth
US6239868B1 (en)	1996-01-02	2001-05-29	Lj Laboratories, L.L.C.	Apparatus and method for measuring optical characteristics of an object
JP3546914B2 (en) *	1996-10-18	2004-07-28	富士ゼロックス株式会社	Optical measuring method, optical measuring device, and image forming apparatus
US6233047B1 (en)	1997-01-02	2001-05-15	Lj Laboratories, L.L.C.	Apparatus and method for measuring optical characteristics of an object
US6301004B1 (en) *	2000-05-31	2001-10-09	Lj Laboratories, L.L.C.	Apparatus and method for measuring optical characteristics of an object
US6870616B2 (en) *	1998-06-30	2005-03-22	Jjl Technologies Llc	Spectrometer apparatus for determining an optical characteristic of an object or material having one or more sensors for determining a physical position or non-color property
US6271913B1 (en)	1997-07-01	2001-08-07	Lj Laboratories, Llc	Apparatus and method for measuring optical characteristics of an object
US6449041B1 (en)	1997-07-01	2002-09-10	Lj Laboratories, Llc	Apparatus and method for measuring optical characteristics of an object
US6501542B2 (en)	1998-06-30	2002-12-31	Lj Laboratories, Llc	Apparatus and method for measuring optical characteristics of an object
US6246479B1 (en)	1998-06-08	2001-06-12	Lj Laboratories, L.L.C.	Integrated spectrometer assembly and methods
US6246471B1 (en)	1998-06-08	2001-06-12	Lj Laboratories, Llc	Apparatus and method for measuring optical characteristics of an object
US6573984B2 (en) *	1998-06-30	2003-06-03	Lj Laboratories Llc	Apparatus and method for measuring optical characteristics of teeth
US6249348B1 (en)	1998-11-23	2001-06-19	Lj Laboratories, L.L.C.	Integrated spectrometer assembly and methods
US6538726B2 (en)	1998-07-10	2003-03-25	Lj Laboratories, Llc	Apparatus and method for measuring optical characteristics of an object
US6519037B2 (en)	1999-12-23	2003-02-11	Lj Laboratories, Llc	Spectrometer having optical unit including a randomized fiber optic implement
US6362888B1 (en)	1999-12-23	2002-03-26	Lj Laboratories, L.L.C.	Spectrometer assembly
US6414750B2 (en)	2000-01-10	2002-07-02	Lj Laboratories, L.L.C.	Spectrometric apparatus and method for measuring optical characteristics of an object
JP2001324503A (en)	2000-05-12	2001-11-22	Fuji Photo Film Co Ltd	Measuring method of dry analysis element
DE10061336A1 (en)	2000-12-08	2002-06-13	Roche Diagnostics Gmbh	System for the analysis of sample liquids including a position control unit
US20020090321A1 (en) *	2001-01-11	2002-07-11	Fuji Photo Film Co., Ltd.	Incubator
US6903813B2 (en)	2002-02-21	2005-06-07	Jjl Technologies Llc	Miniaturized system and method for measuring optical characteristics
US20060066850A1 (en) *	2004-09-29	2006-03-30	Fuji Photo Film Co., Ltd.	Light measuring device, biochemical analyzer, biochemical analysis method, and spectrophotometer

Citations (4)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
DE1096636B (en) *	1956-01-25	1961-01-05	Glanzstoff Ag	Device for measuring the reflected radiation from surfaces
US3526777A (en) *	1968-04-25	1970-09-01	Hunter Associates Lab Inc	Reflectance measuring apparatus including a mask for compensating for movement of the specimen
US3718399A (en) *	1971-06-29	1973-02-27	G Kalman	Distance compensated reflectance sensor
EP0099024A2 (en) *	1982-07-14	1984-01-25	Bayer Diagnostic GmbH	Method and device for measuring reflection

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US3578977A (en) *	1968-02-19	1971-05-18	Rohe Scientific Corp	Reflection tests having photocell with aperture
US4037970A (en) *	1972-08-24	1977-07-26	Neotec Corporation	Optical analyzer for agricultural products
US4252443A (en) *	1979-08-09	1981-02-24	Domtar Inc.	Blackening sensor
FR2465213A1 (en) *	1979-09-13	1981-03-20	Oreal	APPARATUS FOR DIGITAL COLORING OR COLOR MODIFICATION OF AN OBJECT
JPH06117046A (en) *	1992-10-05	1994-04-26	Masaru Ogiwara	Concrete block

1987
- 1987-02-26 EP EP87102732A patent/EP0234579B1/en not_active Expired - Lifetime
- 1987-02-26 US US07/019,402 patent/US4823169A/en not_active Expired - Lifetime
- 1987-02-26 DE DE3750963T patent/DE3750963T2/en not_active Expired - Lifetime

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
DE1096636B (en) *	1956-01-25	1961-01-05	Glanzstoff Ag	Device for measuring the reflected radiation from surfaces
US3526777A (en) *	1968-04-25	1970-09-01	Hunter Associates Lab Inc	Reflectance measuring apparatus including a mask for compensating for movement of the specimen
US3718399A (en) *	1971-06-29	1973-02-27	G Kalman	Distance compensated reflectance sensor
EP0099024A2 (en) *	1982-07-14	1984-01-25	Bayer Diagnostic GmbH	Method and device for measuring reflection

Also Published As

Publication number	Publication date
DE3750963T2 (en)	1995-05-18
EP0234579B1 (en)	1995-01-11
DE3750963D1 (en)	1995-02-23
US4823169A (en)	1989-04-18
EP0234579A2 (en)	1987-09-02

Legal Events

Date	Code	Title	Description
1987-07-18	PUAI	Public reference made under article 153(3) epc to a published international application that has entered the european phase	Free format text: ORIGINAL CODE: 0009012
1987-09-02	AK	Designated contracting states	Kind code of ref document: A2 Designated state(s): DE FR GB
1989-11-29	PUAL	Search report despatched	Free format text: ORIGINAL CODE: 0009013
1990-01-17	AK	Designated contracting states	Kind code of ref document: A3 Designated state(s): DE FR GB
1990-06-20	17P	Request for examination filed	Effective date: 19900423
1991-09-11	17Q	First examination report despatched	Effective date: 19910726
1994-11-25	GRAA	(expected) grant	Free format text: ORIGINAL CODE: 0009210
1995-01-11	AK	Designated contracting states	Kind code of ref document: B1 Designated state(s): DE FR GB
1995-02-23	REF	Corresponds to:	Ref document number: 3750963 Country of ref document: DE Date of ref document: 19950223
1995-04-07	ET	Fr: translation filed
1995-11-11	PLBE	No opposition filed within time limit	Free format text: ORIGINAL CODE: 0009261
1995-11-11	STAA	Information on the status of an ep patent application or granted ep patent	Free format text: STATUS: NO OPPOSITION FILED WITHIN TIME LIMIT
1996-01-03	26N	No opposition filed
2002-01-01	REG	Reference to a national code	Ref country code: GB Ref legal event code: IF02
2006-02-17	PGFP	Annual fee paid to national office [announced via postgrant information from national office to epo]	Ref country code: FR Payment date: 20060217 Year of fee payment: 20
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2006-03-31	PGFP	Annual fee paid to national office [announced via postgrant information from national office to epo]	Ref country code: DE Payment date: 20060331 Year of fee payment: 20
2007-02-25	PG25	Lapsed in a contracting state [announced via postgrant information from national office to epo]	Ref country code: GB Free format text: LAPSE BECAUSE OF EXPIRATION OF PROTECTION Effective date: 20070225
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