DE60029878D1 - Verfahren und Vorrichtung zur Bestimmung von Teilchen unter Benutzung der Reflexion eines mehrfachabtastenden Strahls - Google Patents

Verfahren und Vorrichtung zur Bestimmung von Teilchen unter Benutzung der Reflexion eines mehrfachabtastenden Strahls

Info

Publication number
DE60029878D1
DE60029878D1 DE60029878T DE60029878T DE60029878D1 DE 60029878 D1 DE60029878 D1 DE 60029878D1 DE 60029878 T DE60029878 T DE 60029878T DE 60029878 T DE60029878 T DE 60029878T DE 60029878 D1 DE60029878 D1 DE 60029878D1
Authority
DE
Germany
Prior art keywords
beam spot
scanning
optical
circular path
relates
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60029878T
Other languages
English (en)
Other versions
DE60029878T2 (de
Inventor
Oliver Hamann
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mettler Toledo Autochem Inc
Original Assignee
Mettler Toledo Autochem Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mettler Toledo Autochem Inc filed Critical Mettler Toledo Autochem Inc
Application granted granted Critical
Publication of DE60029878D1 publication Critical patent/DE60029878D1/de
Publication of DE60029878T2 publication Critical patent/DE60029878T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
    • G01N21/51—Scattering, i.e. diffuse reflection within a body or fluid inside a container, e.g. in an ampoule
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
    • G01N15/02—Investigating particle size or size distribution
    • G01N15/0205—Investigating particle size or size distribution by optical means, e.g. by light scattering, diffraction, holography or imaging
    • G01N15/0211—Investigating a scatter or diffraction pattern
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N2021/4704—Angular selective
    • G01N2021/4709—Backscatter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/10—Scanning
    • G01N2201/105—Purely optical scan
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/24—Coupling light guides
    • G02B6/42—Coupling light guides with opto-electronic elements
    • G02B6/4201—Packages, e.g. shape, construction, internal or external details
    • G02B6/4204—Packages, e.g. shape, construction, internal or external details the coupling comprising intermediate optical elements, e.g. lenses, holograms
    • G02B6/4206—Optical features
DE60029878T 1999-05-04 2000-05-04 Verfahren und Vorrichtung zur Bestimmung von Teilchen unter Benutzung der Reflexion eines mehrfachabtastenden Strahls Expired - Lifetime DE60029878T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US13248099P 1999-05-04 1999-05-04
US132480P 1999-05-04

Publications (2)

Publication Number Publication Date
DE60029878D1 true DE60029878D1 (de) 2006-09-21
DE60029878T2 DE60029878T2 (de) 2007-03-15

Family

ID=22454252

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60029878T Expired - Lifetime DE60029878T2 (de) 1999-05-04 2000-05-04 Verfahren und Vorrichtung zur Bestimmung von Teilchen unter Benutzung der Reflexion eines mehrfachabtastenden Strahls

Country Status (7)

Country Link
US (1) US6449042B1 (de)
EP (1) EP1063512B1 (de)
JP (1) JP4455730B2 (de)
AT (1) ATE335998T1 (de)
AU (1) AU780158B2 (de)
CA (1) CA2307509A1 (de)
DE (1) DE60029878T2 (de)

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JP2004109010A (ja) * 2002-09-19 2004-04-08 Otsuka Denshi Co Ltd 散乱光測定装置
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US7030383B2 (en) * 2003-08-04 2006-04-18 Cadent Ltd. Speckle reduction method and apparatus
WO2005091970A2 (en) * 2004-03-06 2005-10-06 Michael Trainer Methods and apparatus for determining the size and shape of particles
US8634072B2 (en) 2004-03-06 2014-01-21 Michael Trainer Methods and apparatus for determining characteristics of particles
DE102004040912A1 (de) * 2004-08-23 2006-03-09 Hauni Maschinenbau Ag Optische Kontrolle von Produkten der Tabakverarbeitenden Industrie
US7596545B1 (en) 2004-08-27 2009-09-29 University Of Kansas Automated data entry system
US7932081B2 (en) 2005-03-10 2011-04-26 Gen-Probe Incorporated Signal measuring system for conducting real-time amplification assays
DE102006043013A1 (de) * 2006-09-13 2008-03-27 Robert Bosch Gmbh Vorrichtung und Verfahren zur Messung wenigstens eines Parameters von Partikeln in einem Fluid
AU2008265610B2 (en) 2007-06-21 2012-08-23 Gen-Probe Incorporated Instrument and receptacles for performing processes
JP4389991B2 (ja) * 2007-10-26 2009-12-24 ソニー株式会社 微小粒子の光学的測定方法及び光学的測定装置
WO2009095679A2 (en) * 2008-02-01 2009-08-06 Cambridge Consultants Limited Photometric pevice
EA021737B1 (ru) 2008-10-23 2015-08-31 Эм-Ай Эл.Эл.Си. Устройство для определения гранулометрического состава
US9007580B2 (en) 2011-04-11 2015-04-14 Schlumberger Norge As Method and apparatus for measuring particle size distribution in drilling fluid
UY33005A (es) 2009-11-04 2010-12-31 Colgate Palmolive Co Celulosa microfibrosa con una distribucion del tamaño de las particulas que le permite ser utilizada en composiciones surfactantes estructuradas
CA2777708C (en) 2009-11-04 2014-08-12 Colgate-Palmolive Company Process to produce stable suspending system
JP5856983B2 (ja) 2011-01-20 2016-02-10 オリンパス株式会社 単一発光粒子からの光の検出を用いた光分析方法及び光分析装置
CN103403533B (zh) 2011-02-24 2017-02-15 简.探针公司 用于分辨光信号检测器中不同调制频率的光信号的系统和方法
CN103733049B (zh) 2011-08-15 2016-01-20 奥林巴斯株式会社 利用单个发光粒子检测的光分析装置、光分析方法以及光分析用计算机程序
WO2013031439A1 (ja) 2011-08-26 2013-03-07 オリンパス株式会社 単一発光粒子検出を用いた光分析装置、光分析方法及び光分析用コンピュータプログラム
DE102013111256B4 (de) * 2013-10-11 2021-06-10 Sick Engineering Gmbh Vorrichtung zur Messung der Lichtstreuung und Verfahren zum Prüfen einer Empfangsoptik
DE102014109166A1 (de) 2014-07-01 2016-01-21 Parsum-Gesellschaft für Partikel-, Strömungs- und Umweltmeßtechnik mbH Verfahren zur Partikelformbestimmung
DE102014223151A1 (de) * 2014-11-13 2016-05-19 Robert Bosch Gmbh Partikelzähler
DE102015116474A1 (de) 2015-09-29 2017-03-30 Hochschule Reutlingen Verfahren zum Ermitteln von Deskriptoren, welche mit Eigenschaften eines Partikelkollektivs korrelieren
JPWO2017098597A1 (ja) 2015-12-09 2018-10-11 オリンパス株式会社 単一発光粒子検出を用いた光分析方法及び光分析装置
US9816859B1 (en) * 2016-05-13 2017-11-14 The United States Of America As Represented By The Secretary Of The Navy Imaging optical beam attenuation coefficient meter
EP3252446B1 (de) * 2016-05-30 2019-07-24 Hitachi High-Tech Analytical Science Limited Detektoranordnung zur analyse der elementaren zusammensetzung einer probe mittels optischer emissionsspektroskopie
WO2018178387A1 (de) * 2017-03-31 2018-10-04 Precitec Gmbh & Co. Kg Vorrichtung und verfahren zur additiven fertigung
DE102018212685B4 (de) * 2018-07-30 2023-06-22 Robert Bosch Gmbh Optische Partikelsensorvorrichtung und entsprechendes Partikelmessverfahren
CN112119343B (zh) * 2019-02-02 2023-04-21 深圳市大疆创新科技有限公司 扫描模组及测距装置
CN109765159A (zh) * 2019-03-13 2019-05-17 陈美香 一种粉尘浓度检测仪

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US5751423A (en) * 1996-12-06 1998-05-12 United Sciences, Inc. Opacity and forward scattering monitor using beam-steered solid-state light source

Also Published As

Publication number Publication date
CA2307509A1 (en) 2000-11-04
DE60029878T2 (de) 2007-03-15
US6449042B1 (en) 2002-09-10
EP1063512B1 (de) 2006-08-09
AU780158B2 (en) 2005-03-03
JP2001033384A (ja) 2001-02-09
EP1063512A2 (de) 2000-12-27
AU3252600A (en) 2000-11-16
EP1063512A3 (de) 2003-08-13
ATE335998T1 (de) 2006-09-15
JP4455730B2 (ja) 2010-04-21

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