CN106662434A - Confocal surface topography measurement with a focal plane inclined with respect to the direction of the relative movement of confocal apparatus and sample - Google Patents

Confocal surface topography measurement with a focal plane inclined with respect to the direction of the relative movement of confocal apparatus and sample Download PDF

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Publication number
CN106662434A
CN106662434A CN201580047365.2A CN201580047365A CN106662434A CN 106662434 A CN106662434 A CN 106662434A CN 201580047365 A CN201580047365 A CN 201580047365A CN 106662434 A CN106662434 A CN 106662434A
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China
Prior art keywords
dimensional structure
relative
returning
optic probe
characteristic
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Granted
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CN201580047365.2A
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CN106662434B (en
Inventor
埃雷兹·兰伯特
阿迪·莱文
塔勒·维科尔
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Align Technology Inc
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Align Technology Inc
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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2513—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with several lines being projected in more than one direction, e.g. grids, patterns
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61C—DENTISTRY; APPARATUS OR METHODS FOR ORAL OR DENTAL HYGIENE
    • A61C19/00—Dental auxiliary appliances
    • A61C19/04—Measuring instruments specially adapted for dentistry
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61C—DENTISTRY; APPARATUS OR METHODS FOR ORAL OR DENTAL HYGIENE
    • A61C9/00—Impression cups, i.e. impression trays; Impression methods
    • A61C9/004—Means or methods for taking digitized impressions
    • A61C9/0046—Data acquisition means or methods
    • A61C9/0053—Optical means or methods, e.g. scanning the teeth by a laser or light beam
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61C—DENTISTRY; APPARATUS OR METHODS FOR ORAL OR DENTAL HYGIENE
    • A61C9/00—Impression cups, i.e. impression trays; Impression methods
    • A61C9/004—Means or methods for taking digitized impressions
    • A61C9/0046—Data acquisition means or methods
    • A61C9/0053—Optical means or methods, e.g. scanning the teeth by a laser or light beam
    • A61C9/006—Optical means or methods, e.g. scanning the teeth by a laser or light beam projecting one or more stripes or patterns on the teeth
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2518—Projection by scanning of the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/02—Systems using the reflection of electromagnetic waves other than radio waves
    • G01S17/06—Systems determining position data of a target
    • G01S17/08—Systems determining position data of a target for measuring distance only
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0028—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders specially adapted for specific applications, e.g. for endoscopes, ophthalmoscopes, attachments to conventional microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B23/00—Telescopes, e.g. binoculars; Periscopes; Instruments for viewing the inside of hollow bodies; Viewfinders; Optical aiming or sighting devices
    • G02B23/24—Instruments or systems for viewing the inside of hollow bodies, e.g. fibrescopes
    • G02B23/2407—Optical details
    • G02B23/2461—Illumination
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B23/00—Telescopes, e.g. binoculars; Periscopes; Instruments for viewing the inside of hollow bodies; Viewfinders; Optical aiming or sighting devices
    • G02B23/24—Instruments or systems for viewing the inside of hollow bodies, e.g. fibrescopes
    • G02B23/26—Instruments or systems for viewing the inside of hollow bodies, e.g. fibrescopes using light guides
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B3/00—Simple or compound lenses
    • G02B3/0006—Arrays
    • G02B3/0037—Arrays characterized by the distribution or form of lenses
    • G02B3/0056—Arrays characterized by the distribution or form of lenses arranged along two different directions in a plane, e.g. honeycomb arrangement of lenses
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/006—Optical details of the image generation focusing arrangements; selection of the plane to be imaged

Abstract

An apparatus is described for measuring surface topography of a three-dimensional structure. In many embodiments, the apparatus is configured to focus each of a plurality of light beams to a respective fixed focal position relative to the apparatus. The apparatus measures a characteristic of each of a plurality of returned light beams that are generated by illuminating the three-dimensional structure with the light beams. The characteristic is measured for a plurality of different positions and/or orientations between the apparatus and the three-dimensional structure. Surface topography of the three-dimensional structure is determined based at least in part on the measured characteristic of the returned light beams for the plurality of different positions and/or orientations between the apparatus and the three-dimensional structure.

Description

Confocal plane is inclined confocal with the relative movement direction of sample relative to confocal equipment Measuring surface form
Background technology
Various methods are had been developed for for optical measurement surface topography.For example, developed and employed and can be used in The optical system and method for the surface topography of the tooth of optical measurement patient.For example, the surface topography of the tooth for measuring can be used In design and manufacture artificial tooth, and/or for determining orthodontic treatment plan to correct malocclusion.
A kind of technology for optical measurement surface topography employ laser triangulation measure dental surface and optics away from From the distance between probe, the probe is inserted in the oral cavity of patient.However, due to for example from dental surface suboptimum it is anti- Rate is penetrated, causes the surface topography measured via laser triangulation may be lower than desired precision.
Can be from Siemens Company (Siemens GmbH) or Sirona Dental Equipment Company (Sirona Dental Systems the other technologies for optical measurement surface topography implemented in) commercially available CEREC-1 and CEREC-2 systems are distinguished Using light cross-section method and phase shift method.The three-dimensional coordinate of the tooth that two systems are prepared using the hand hold transducer measurement of particular design. However, both approaches are required to deposit (that is, respectively measurement powder and the Chinese white suspension of specific coil serving on tooth Liquid).The thickness of coating should meet specific and unmanageable demand, and this may cause the inaccurate of measurement data.
In another technology, based on using probe to the physical scan on surface and by, for example, optics or other Sensoring determines the position of probe and carries out the mapping of dental surface pattern.
United States Patent (USP) No.5372502 discloses a kind of optic probe for three-dimensional measurement.
By on various pattern projections to tooth to be measured, and using the figure of the corresponding multiple distortions of optic probe capture Case.The pattern of each capture can be used in refining topography measurement.
The content of the invention
There is provided the apparatus and method of the surface topography for being used to measure three-dimensional structure.In various embodiments, for measuring The equipment of surface topography is configured to multiple diverse locations and/or direction between the optic probe and three-dimensional structure for equipment And illuminate three-dimensional structure (for example, the denture of patient) using light beam.Disclosed apparatus and method are employed not with respect to optics Probe and the optically cofocus scanning of the three-dimensional structure in the case of the focal position of mobile beam, but using optic probe phase For the movement of structure, it is achieved thereby that less, faster and more cost effective optics.
So as in an aspect, describing a kind of equipment is used to measure the surface topography of three-dimensional structure.Equipment is configured to The characteristic of each Returning beam in multiple Returning beams is measured, the Returning beam is by using the three-dimensional knot of multiple light beams irradiation Structure and produce.For the multiple diverse locations between equipment and three-dimensional structure and/or towards measurement characteristicses.
In another aspect, describing a kind of equipment is used to measure the surface topography of three-dimensional structure.In various embodiments, if It is standby to include optic probe, optical system and processing unit.Optic probe is moved relative to three-dimensional structure.Optical system will be multiple Each incident beam focus in incident beam are to relative to optic probe and away from the respective focal position of optic probe. Three-dimensional structure is irradiated by using incident beam and produce Returning beam.For between optic probe and three-dimensional structure it is multiple not With relative position and/or direction, the characteristic of the Returning beam of measurement is based at least partially on, processing unit determines three-dimensional structure Surface topography.
In another aspect, a kind of method for measuring the surface topography of three-dimensional structure is described.Method includes will be multiple Each incident beam focus in incident beam are to relative to optic probe and away from the respective focus of optic probe.Pass through Three-dimensional structure is irradiated using incident beam and produce Returning beam.For multiple different between optic probe and three-dimensional structure Relative position and/or the characteristic towards measurement Returning beam, to generate the surface topography data of three-dimensional structure.
By reading specification, claims and accompanying drawing, other purposes and feature of the present invention will become clear from.
Description of the drawings
The novel feature of the present invention is specifically described in the following claims.To obtain right by reference to described further below Being best understood from for the features and advantages of the present invention, it is described to describe the illustrative enforcement for elaborating the principle using the present invention in detail Example, and its accompanying drawing is：
Figure 1A and 1B schematically shows the confocal measuring surface form equipment according to multiple embodiments using block diagram (Figure 1B is the continuity of Figure 1A)；
Fig. 2A is the top view of the exploring block of the confocal measuring surface form equipment according to embodiment；
Fig. 2 B are the longitudinal sections through the exploring block of Fig. 2A, depict the exemplary light ray for passing through；
Fig. 2 C and 2D are the end-views of the exploring block of the Fig. 2A according to multiple embodiments；
Fig. 3 A are shown according to the use fixed focus position of multiple embodiments come the optic probe of Scan Architecture；
Fig. 3 B illustrate another view of the optic probe of Fig. 3 A during using fixed focus position Scan Architecture；
Fig. 4 A illustrate according to multiple embodiments be configured to multiple light beams are focused on the optics of respective focal position Component；
Fig. 4 B illustrate according to multiple embodiments be configured to multiple light beams are focused on another optics of oblique focal plane Component；
Fig. 5 illustrates the microlens array for beam array to be focused on oblique focal plane according to how each embodiment；
Fig. 6 A illustrate according to multiple embodiments be configured to multiple light beams are focused on another optics of oblique focal plane Component；
Fig. 6 B illustrate the optical path of the Returning beam of the optical module by Fig. 6 A according to multiple embodiments；
Fig. 7 A illustrate according to multiple embodiments be configured to multiple light beams are focused on another optics of oblique focal plane Component；
Fig. 7 B illustrate the expansion configuration of the optical module of Fig. 7 A；And
Fig. 8 is simplified block diagram, describes the use fixed focus position measurement surface pattern according to multiple embodiments Method the step of.
Specific embodiment
This document describes the apparatus and method of the confocal measurement using surface topography.In certain methods, such as its disclosure In the method for the United States Patent (USP) No.6697164 description that content is all expressly incorporated herein by reference, the incident light that measuring apparatus are produced Beam is used to determine the surface topography of three-dimensional structure.Equipment includes optic probe, and light beam sends to illuminate the knot from the optic probe Structure.Light beam focuses on each intersection point (also known as focal position) outside optic probe by focusing optics.In order to measure 3 d surface topography, the optical scanner focal position by the multiple positions relative to optic probe.Focal position is along incidence (axial scan) is moved relative to optic probe in the direction of propagation of light beam.Focal position can also orthogonally move with the direction of propagation (transversal scanning).Any description herein in connection with the direction of light can be considered as referring to the side of the principal ray (chief ray) of light To.Similarly, any description herein in connection with the direction of propagation of light can be considered as the direction of propagation of the principal ray of light.It is logical Often, for example, by via such as galvanometer mirror, motor and/or appropriate device as telescopic sweep mechanism and Mechanical Moving Optical element is realizing the axial scan relative to optic probe and/or transversal scanning.However, using such axial scan Or transversal scanning component may increase size, weight and the cost of measuring apparatus.
By contrast, the apparatus and method of the disclosure in not optics moving focal point position relative to the position of optic probe In the case of carry out the confocal measurement of 3 d surface topography.With optical scanner described above relative to optic probe focal position Method compare, each light beam is focused to respective focus by method described herein, and the respective intersection point is visited relative to optics Head is with fixed space arrangement.Relative movement between optic probe and three-dimensional structure is used to make focus move relative to structure. Measurement the distance between optic probe and three-dimensional structure for the multiple diverse locations between optic probe and three-dimensional structure and/or Direction.Carry out processing data then in conjunction with the data with regard to the relative position between probe and three-dimensional structure, it is measured to determine The surface topography of structure.By avoiding using optical scanner mechanism, devices disclosed herein and method are relative to existing optics Measuring system can be less, faster and more cost-efficient.
In various embodiments, it is more than one with the Returning beam produced by incident beam light structures by measurement Characteristic is determining the distance between optic probe and three-dimensional structure.Such characteristic can include such as Returning beam intensity, Wavelength, polarization, phase shift, interference and/or dispersion.Herein in regard to light intensity any description also can be applied to light other are suitable Characteristic, vice versa.The measurement of characteristic can be used in whether detection incident beam is focused on the surface of structure, and so as to true Determine the distance between optic probe and three-dimensional structure.
For example, the intensity of measurement Returning beam can be based on and determines the surface topography of structure.In various embodiments, if It is standby to be configured so that the intensity of any specific light beam returned from structure is maximum when surface of the incident beam focus in structure 's.By relative to structure mobile probe, passing through when the corresponding intensity for returning the reflected beams of identification is maximum, it is determined that The distance between probe and structure for particular beam and the position and orientation popped one's head in relative to structure.Then can be based on The intensity and optic probe of the Returning beam of measurement determines the surface shape of structure relative to position and/or the direction of structure Looks.
Which as another example, can come by using spatial-frequency analysis to recognize region of structure in focus Determine surface topography.In various embodiments, focal zone is by comprising the spatial frequency higher than non-focusing region.Accordingly, it is capable to When it is maximum enough by the spatial frequency of identification region, so as to be directed to the ad-hoc location and direction popped one's head in relative to structure, really The distance between specific region on fixed probe and structure.The method can be used in determining the surface of the structure with spatial detail Pattern.
Apparatus and method described herein can be used in the surface topography of the three-dimensional structure for measuring any appropriate.In multiple realities In applying example, carry out optical measurement to produce the data of the 3 d surface topography for representing patient's denture.For example, data can be used in producing The three dimensional virtual models of denture that life can be shown and manipulate.Three dimensional virtual models can be used in for example defining patient's denture Spatial relationship, it is used to create dental case (for example, crown or bridge work) for patient, there is provided mathematical model or physical model are used for Record preserves purpose, sets up treatment plan, manufacture orthodontic appliance or any other dentistry purpose.Surface topography data can be by Such as manufacture device is arrived in storage and/or transmission or output, and the manufacture device can be used in for example manufacturing the physics mould of patient's denture Type, Dental Technician creates dental case using the physical model for patient.
In an aspect, there is provided a kind of equipment, for measuring the surface topography of three-dimensional structure.The equipment can be configured For：A () each light beam in multiple light beams is focused on the focal position of each self-retaining both with respect to equipment；B () measurement passes through The characteristic of each Returning beam in the multiple Returning beams for irradiating three-dimensional structure with light beam and producing, the characteristic is to be directed to Multiple diverse locations between equipment and three-dimensional structure and/or towards measured；And (c) for device and three-dimensional structure it Between multiple diverse locations and/or direction, be based at least partially on the characteristic of Returning beam of measurement determining three-dimensional structure Surface topography.
In another aspect, there is provided a kind of equipment, for measuring the surface topography of three-dimensional structure.The equipment includes being configured It is the optic probe relative to three-dimensional structure movement.Equipment include illumination unit, the illumination unit be configured to produce it is multiple enter Irradiating light beam, each incident beam includes first wave length component.The equipment include optical system, the optical system be configured to by The first wave length component opposing optical probe of each incident beam of multiple incident beams focuses to the focal position of each self-retaining. The equipment includes detector cell, and the detector cell is configured to measure the spy of each Returning beam in multiple Returning beams Property, the Returning beam irradiates three-dimensional structure and produces by using incident beam.Equipment includes what is combined with detector cell Processing unit, the processing unit be configured to between optic probe and three-dimensional structure multiple different relative positions and/ Or direction, the characteristic of multiple Returning beams of measurement is based at least partially on determining the surface topography of three-dimensional structure.Multiple In embodiment, characteristic is intensity.
In various embodiments, detector cell includes the two-dimensional array of sensor element.The equal energy of each sensor element Enough it is configured to measure the characteristic of the corresponding Returning beam of multiple Returning beams.Optical system can be configured to according to by illuminating The light that unit is produced forms the two-dimensional pattern of incident beam, the two-dimensional pattern of incident beam and the two-dimensional array by sensor element The Returning beam of measurement is corresponding.Optical system can include optical beam-expanding device unit, and optical beam-expanding device unit is configured to expand The light produced by illumination unit is opened up, to form the two-dimensional pattern of incident beam.Illumination unit can be configured to produce incident light The two-dimensional pattern of beam, the two-dimensional pattern of the incident beam is relative with the Returning beam measured by the two-dimensional array by sensor element Should.
Incident beam can focus on multiple corresponding focal lengths relative to optic probe.In various embodiments, incident light Beam can be disposed in the multirow with the first row and last column.Incident beam in each row can be focused onto accordingly Common focal length.The focal length of the first row and last column can differ predetermined length.For example, predetermined length can be 5mm to 25mm. Sensor element can arrange that in one plane the plane is oriented the focal length of the first wave length component with regard to incident beam Confocal sensing is carried out to Returning beam.In certain embodiments, the plane of sensor element is non-orthogonal with Returning beam.
In various embodiments, optic probe is moved by the multiple different position relative to structure and/or direction. Thus, it is possible to position and/or direction of the optic probe relative to three-dimensional structure is based at least partially on, according to the characteristic weight of measurement Build 3 d surface topography.Relative position and/or the court between optic probe and structure can be determined using any appropriate method To.In various embodiments, processing unit includes more than one processor, and tangible non-transitory memory device.It is tangible Non-transitory memory device can be stored can be by the instruction of more than one computing device, so that more than one process Device processes the data of measurement performance, using detector unit for the multiple different relative position between optic probe and three-dimensional structure Put and/or towards and produce measurement performance data.Data can be processed by more than one processor, to determine optic probe Relative position and/or direction between three-dimensional structure.
In various embodiments, equipment also includes the motion tracer for being configured to collect exercise data.Processing unit More than one processor, and the storage device of tangible nonvolatile can be included.Tangible non-transitory storage device can be deposited Store up by the instruction of more than one computing device, so that more than one processor is processed makes exercise data, to determine light Learn the relative position and/or direction between probe and three-dimensional structure.For example, motion tracer can include video camera, and Exercise data can include view data.In another example, motion tracer can include gyroscope and/or acceleration Meter.Used as another example, motion tracer can include electromagnetic sensor.
Any suitable configuration of multiple incident beams can be used.For example, optical system can be configured to light beam First wave length component focus at least 10 different focal lengths relative to scanner, and focal length can have at least 10mm Scope.
In another aspect, there is provided the method for measuring the surface topography of three-dimensional structure.The method can include producing Multiple incident beams, each incident beam includes first wave length component.The first wave length component of each incident beam can be focused on To each focal position relative to optic probe.For the multiple different relative position between optic probe and three-dimensional structure And/or direction, can measure by irradiating three-dimensional structure with incident beam and each in multiple Returning beams for producing is returned The characteristic of light echo beam.Can process for the multiple different relative positions between optic probe and three-dimensional structure and/or direction Measurement characteristicses, to generate the surface topography data of three-dimensional structure.Surface topography data can be used to generate the surface of three-dimensional structure Pattern.In various embodiments, the characteristic of measurement is intensity.In various embodiments, method includes tracking optic probe and three Relative position and/or the change towards between dimension structure.
Incident beam can be disposed in the multirow with the first row and last column.For example, the incident light in each row Beam can be focused onto corresponding common focal length.The focal length of the first row and last column can differ predetermined length.For example, make a reservation for Length can be at least 10mm.Incident beam can focus on any appropriate respective anchor site relative to probe.For example, light The wavelength component of beam can focus at least 10 different focal lengths relative to scanner, and focal length can have at least 10mm Scope.
Turning now to accompanying drawing, wherein in various figures identical reference represents identical element, Figure 1A and 1B shows Go out the equipment 20 for optical measurement surface topography.Equipment 20 includes being attached to the Optical devices 22 of processor 24.The reality for illustrating Example is applied for the surface topography of measurement patient teeth 26 is particularly advantageous.For example, equipment 20 can be used measurement patient's tooth The surface topography of the such part of the part disappearance of at least one tooth or tooth of tooth, to produce for being subsequently directed to Surface topography data used in the design and/or manufacture of the prosthese (for example, crown or bridge work) of patient.However, it should be noted that this Invention is not limited to measure the surface topography of tooth, also, in addition necessary modification, is also applied for the imaging of the three-dimensional structure of object It is various other application it is (for example all for the imaging of the three-dimensional structure of any suitable items, for the record of archaeology object Such as biological tissue).
In the illustrated embodiment, Optical devices 22 include the light source (for example, semiconductor laser unit 28) of launching light, such as Represented by arrow 30.Light beam 30 can include single wavelength component or multiple wavelength components.In some cases, with many The light of individual wavelength component can be produced by multiple light sources.By polarizer 32, this causes have one by the light of polarizer 32 to light Fixed polarization.Then light enters optical beam-expanding device 34, which increases the diameter of light beam 30.Then light beam 30, should by module 38 Module for example can be the grating or microlens array that female light beam 30 is divided into multiple light beams 36, herein, for ease of diagram, will Light beam 36 is represented with single line.
Optical devices 22 also include partially transparent mirror 40, and it has little center bore.Mirror 40 allows light from laser cell 28 Be transmitted through the optics in downstream, but reflection in the opposite direction it is up enter light.It should be noted that in principle, it is possible to using tool There are other optics (for example, beam splitter) rather than partially transparent mirror of similar functions.Aperture in mirror 40 improves equipment Certainty of measurement.Due to the mirror structure, as long as region is not focused, light beam just produces light on the irradiation area of the object being imaged Ring.When light beam is focused on relative to imaging object, the ring of light becomes the lighting point of sharp focus.Therefore, out of focus with focusing when Difference between measurement intensity is larger.Another advantage of the eka-ytterbium is, with beam splitter conversely, avoiding what is occurred in beam splitter Internal reflection, therefore signal to noise ratio is bigger.
Optical devices 22 also include focusing optics 42, relay optics 44 and endoscope probe part 46.Focus on Optics 42 can include suitable optics, for light beam 36 to be focused on into fixed space position relative to probe component 46 The multiple corresponding focus at place is put, it is as described below.In various embodiments, focusing optics 42 is static so that optics Device 22 does not adopt mechanism come relative to the swept-focus of probe component 46 (for example, axially or transversally).In various embodiments, in The special value aperture of the propagation for being configured to keep light beam after optics 44.
Endoscope probe part 46 can include light transmission medium, and it can be transmission path is defined in it hollow Object or made by light transmissive material (for example, vitreum or pipe) object.Light transmission medium can be rigid or flexible (example Such as, optical fiber).In various embodiments, endoscope probe part 46 includes ensuring that total internal reflection and by incident beam towards patient Tooth 26 guiding such type mirror.So as to endoscope 46 transmitting be radiated on the surface of the tooth 26 of patient it is multiple enter Irradiating light beam 48.
Endoscope 46 can include more than one motion tracking elements 47 (for example, gyroscope, accelerometer, for light Learn the target and electromagnetic sensor of tracking).In various embodiments, movement of the motion tracking elements 47 in response to endoscope 46 And generate motion tracking signal.In various embodiments, motion tracking signal is processed by processor 24, is existed with tracking endoscope 46 The change of the space arrangement in six-freedom degree (that is, three translation freedoms and three rotary freedoms).
In various embodiments, incident beam 48 is formed and arranged in the planes and along Z relative to cartesian reference system 50 The two-dimensional array of the light beam that axle is propagated.Light beam 48 can be focused onto each focus for defining suitable focal plane, described burnt flat Face is, for example, plane (for example, X-Y plane) or non-orthogonal planes orthogonal to Z-axis.When incident beam 48 incides uneven table When on face, the array of produced lighting point 52 is in different (Xi, Yi) displaced from one another along Z axis at position.So as to, although Lighting point 52 at one position can be directed to the given space arrangement between endoscope 46 and tooth 26 and focus on, but Lighting point 52 at other positions is probably out of focus.
Therefore, the luminous intensity of the Returning beam of focus point will be in its peak value, and the luminous intensity at other points will be not at Peak value.So as to for each lighting point, measure the different space cloth that light intensity is used between endoscope 46 and tooth 26 Put.Generally, the derivative of intensity versus time will be obtained, and it is wherein relative between the null endoscope 46 of derivative and tooth 26 Space arrangement can be used for producing data, and the space arrangement between the data and endoscope 26 and tooth 26 is associated and used, To determine the surface topography of tooth.As noted previously, as using the mirror 40 with aperture, incident light shape on the surface in out of focus Into CD, and the hot spot of sharp focus is only formed when focusing on.As a result, when close focusing position, will show apart from derivative Go out larger numerical value change, so as to improve the precision of measurement.
On the rightabout of the light path advanced by incident beam, initial existing is included in from the light of each reflection of lighting point 52 The light beam advanced on Z axis.Each Returning beam 54 both corresponds to an incident beam 36.In view of the asymmetric nature of mirror 40, returns Light echo beam 54 is reflected on the direction of detection components 60.Detection components 60 include polarizer 62, and polarizer 62 has and polarisation The preferred plane of polarization of the plane of polarization vertical orientation of device 32.The light beam 54 of return is by being usually lens or multiple lens Image forming optics 64, and and then by pinhole array 66.Each Returning beam 54 is at least partially through pinhole array 66 each pin hole.It can be the sensor array 68 of charge coupled device (CCD) or any other suitable imageing sensor Including the matrix of sensing element.In various embodiments, the pixel of each sensing element representative image, and each sensing element It is corresponding with a pin hole in array 66.
Sensor array 68 is connected to the image capture module 80 of processor unit 24.Using processor 24 with following description Mode analyze light intensity by measured by each sensing element of sensor array 68.Although in figs. 1 a and 1b by Optical devices 22 are described as measuring light intensity, but device 22 can also be configured to measure other suitable characteristic (for example, wavelength, polarization, phases Move, disturb and dispersion), as described earlier in this article.In various embodiments, the plane of sensor array 68 and Returning beam 54 be just Hand over (for example, orthogonal with the direction of propagation of Returning beam).In certain embodiments, the plane of sensor array 68 not with return light Beam 54 is orthogonal, as mentioned below.
Optical devices 22 include the control module 70 of the operation of control semiconductor laser 28.Obtaining from each sensing element During replacing the data of mass color intensity (or other characteristics), control module 70 makes the operation of image capture module 80 and laser instrument 28 Operation synchronization.Software 82 is processed by the Jing of processor 24 and processes relative empty between intensity data and endoscope 46 and tooth 26 Between arrange data, with obtain represent tooth 26 outer surface three-dimensional appearance data.Described below for treatment characteristic number According to the exemplary embodiment with the method for space layout data.The three dimensional representation of the gained of the structure of measurement can be displayed in On display 84, and operated to watch (for example, from different angles by user's control module 85 (usually computer keyboard) Degree viewing, zooms in or out).In addition, representing the data of surface topography can pass through such as modem 88 or any appropriate Communication network (for example, telephone network, internet) as appropriate FPDP be transferred to recipient (for example, to strange land CAD/CAM equipment).
Arranged (for example, in tooth section for the different space between endoscope 46 and structure by capture In the case of, from cheek side to, tongue side direction and/or alternatively from tooth top) and between the endoscope 46 that measures and structure Relative distance data, are capable of the accurate three dimensional representation of generating structure.Three-dimensional data and/or resulting three dimensional representation can be used In the dummy model for creating the three-dimensional structure in computer environment and/or in any suitable manner (for example, via computer Control milling machine, such as Stereo Lithography Apparatus or rapid forming equipment as 3D printing equipment) manufacture physical model.
With reference now to Fig. 2A and 2B, show the exploring block 90 according to multiple embodiments.In various embodiments, detect Part 90 forms at least a portion of endoscope 46.Exploring block 90 can be by light transmissive material (for example, glass, crystal, plastics Deng) make, and including distal ports 91 and proximal segment 92, the distal ports 91 and proximal segment 92 are tight in the way of printing opacity at 93 It is bonded together.Inclined plane 94 is covered by mirror layer 95.Define the transparent plate 96 of sensing surface 97 (for example, by glass, water Brilliant, plastics or any other suitable transparent material are made) dispose away from mirror layer 95 along light path, with transparent plate 96 with The air gap 98 is reserved between distal ports 91.Transparent plate 96 is secured in place using holding structure (not shown).Schematically Present three light 99.As can be seen that the angle that light 99 is totally reflected with the wall of exploring block 90 is from exploring block 90 Wall reflects, and reflects from mirror layer 95, is then propagated by sensing surface 97.Although light 99 can be with any conjunction of each focal length To outside exploring block 90, but in various embodiments, light 99 is focused on outside exploring block 90 suitable combined focus On focal plane 100.For example, as shown in Figure 2 C, the end-view III-III of exploring block 90 is it illustrates, light 99 is focused to altogether With focal length, so as on the focal plane 100 that is focused on exploring block 90 outside, the propagation side of the focal plane 100 and light 99 It is vertical to (also referred to herein as Z axis).As another example, as shown in Figure 2 D, the end-view of exploring block 90 is it illustrates III-III, light 99 focuses on different focal lengths, so as to be focused on not vertical with Z axis focal plane 100.Although illustrating And two kinds of configurations of focal position are described, but any appropriate configuration of focal position can be adopted.
Fig. 3 A and 3B illustrate the optics of Scan Architecture 202 in global cartesian coordinate system 204 according to multiple embodiments Probe 200.(Fig. 3 B illustrate the section I-I defined in Fig. 3 A).Optic probe 200 can be swept with described herein any appropriate Imaging apparatus or system are used together, such as Optical devices 22.The two-dimensional array of the incident beam 206 sent from optic probe 200 In being arranged in the multirow for extending in the X direction, including the first row 208 and last column 210.Each row of the array of light beam 206 Each common focal length is focused on all along Z axis, so as to define oblique focal plane 212.The first row 208 and last column 210 Focal length differ predetermined length 214 in z-direction.Optic probe 200 can opposed configuration 202 move, to be swept using light beam 206 Retouch structure 202.For example, as described by Fig. 3 B, optic probe 200 can move to second from first position 216 in the Y direction Position 218.
In various embodiments, each row in the array of light beam 206 focuses on different depth each along Z-direction, so as to produce Life focal plane 212 not orthogonal to Z-axis.Therefore, as optic probe 200 is moved relative to structure 202, Jiao of light beam 206 puts down The three-D volumes of structure 202 that face 212 is inswept.For example, as optic probe 200 moves to position 218, focal plane from position 216 The 212 inswept three-D volumes with Z-depth 214.Therefore, by optic probe 200 relative to structure 202 continuous moving, light Learn probe 200 can Scan Architecture 202 in z-direction, each focal length for maintaining light beam 206 is constant.Although Fig. 3 B are retouched The movement in the Y direction of optic probe 200 has been stated, but in various embodiments, optic probe 200 can be in six-freedom degree Upper movement (for example, three translation freedoms and three rotary freedoms) between optic probe 200 and structure 202 it is multiple not Relative position together and/or direction.
Being capable of the array that light beam 206 is set configured in any suitable.For example, the array of light beam 206 can be focused onto Relative to the different focal of any appropriate quantity of optic probe 200, such as 3,5,10,50 or 100 or more not Same focal length.The focal length of the array of light beam 206 can be configured with any appropriate scope, such as at least 5mm, 7.5mm Or more than 10mm.The first row 208 in the array of light beam 206 can differ any appropriate length with the focal length of last column 210 Degree, such as below 5mm, 10mm, 15mm or more than 25mm.For example, the difference of focal length can be in the length of the scope of 5mm to 25mm It is interior.
Can be by suitable for the wavelength component of each light beam be focused on into respective focal position (for example, oblique focal plane 212) any system or device produces the array of light beam 206.In various embodiments, the more than one light of Optical devices 22 Learn the focal position of multiple fixations that device can be used in that the array of light beam is focused on relative probe.For example, it is described herein The suitable embodiment of optics can be included in grating or microlens array 38, focusing optics 42, relay optical device In optics or their suitable combination in part 44, endoscope 46.Optics can be configured to telecentricity and/ Or the confocal focusing optics of non-telecentricity is used together.
Fig. 4 A illustrate the optical module for multiple light beams to be focused on respective focal position according to multiple embodiments 300.In optical module 300, the array of the light beam 302 sent from array of source 304 (for example, microlens array) is by focusing on light Learn device 306 to focus on, and reflect to form focal plane from mirror 308 (for example the mirror, being arranged in endoscope exploring block) 310.Mirror 308 can be positioned as the 45° angle relative to optical axis, to produce orthogonal focal plane 310.
Fig. 4 B illustrate the optical module 320 for multiple light beams to be focused on oblique focal plane according to multiple embodiments. It is similar to optical module 300, system 320 include producing the array of source 324 of beam array 322, focusing optics 326, with And mirror 328.To incline relative to the suitable angle of optical axis, such as 30 ° angles are inclined mirror 328 with producing relative to scanner 332 Focal plane 330.Focal plane 330 can be used in using fixed focus position described herein to scan three-dimensional structure, such as tooth 334。
Fig. 5 illustrates the microlens array for beam array to be focused on oblique focal plane according to multiple each embodiments 400.The lenticule (for example, lenticular lens elements 402) of microlens array 400 is disposed in including the first row 406 and last column In 408 multirow 404.Often row lenticule is each configured to focus of the light beam into different focal lengths, so as to produce oblique focal plane.
Fig. 6 A illustrate the optical module 500 for multiple light beams to be focused on oblique focal plane according to multiple embodiments. Optical module 500 includes inclined array of source 502, and array of source 502 can be inclined with the suitable angle relative to optical axis Oblique microlens array.The array of the light beam 504 produced by inclined array of source 502 passes through focusing optics 506, and Reflect from mirror 508 to form oblique focal plane 501, as described herein suitable for fixed focal position Scan Architecture 512. Fig. 6 B illustrate light path of the Returning beam 514 by optical module 500.Returning beam 514 from the reflection of structure 512 is by focusing on light Learn device 506 to return, and guided on sensor array 518 by beam expander 516.As it was previously stated, sensor array 518 can Including arrangement multiple sensor elements in the planes.In various embodiments, sensor array 518 is relative to Returning beam 514 is non-orthogonal so that the plane of sensor element is inclined relative to the direction of propagation of Returning beam 514.Plane energy Enough to incline with the identical amount of array of source 502, to allow the confocal sensing of Returning beam 502.
Fig. 7 A illustrate the optical module 600 for multiple light beams to be focused on oblique focal plane according to multiple embodiments. Fig. 7 B illustrate the expansion configuration of optical module 600.In optical module 600, the battle array of the light beam 604 sent from array of source 602 Row pass through focusing optics 606.Asymmetrical optic 608 is positioned between focusing optics 606 and mirror 610, and And be configured to focus of the light beam into oblique focal plane 612, the oblique focal plane 612 is suitable to use fixed-focus as described herein Position Scan Architecture 614.The combination of any suitable optical element or optical element can act as asymmetrical optic 608.For example, asymmetrical optic 608 can be included with relative to the inclined off-axis lens of suitable angle of optical axis.As Replace or combine, asymmetrical optic 608 can include Fresnel lens, Fresnel lens includes multiple sections, and this is more Individual section is configured to for each light beam in multiple light beams to be refracted to respective focal position, suitable oblique to produce Focal plane.
The global surface topography of structure can be rebuild by the way that local strength's data are spatially matched each other.Multiple In embodiment, the relative position between optic probe and structure and/or direction during scanning process is used to determine intensity number Spatial relationship according between, and so as to matched data.The combination of any appropriate method or method can be used in tracking light The desired part (for example, the scanning tip of endoscope 46 or exploring block 90) of probe or optic probe is learned relative to structure Position and/or direction, such as suitable estimation or motion tracking method.For example, more than one motion tracer energy It is enough in generation and is applied to determination optic probe relative to the position of three-dimensional structure and/or the exercise data of direction.
In various embodiments, optical tracking method is used to determine sky with regard to six-freedom degree of the probe relative to structure Between arrange.For example, motion tracer can include external camera (or any other suitable imageing sensor), with It moves in multiple different positions and/or towards between and produces the view data of probe during scanning process.Video camera The image of any appropriate part of probe can be captured, such as positioned at the part of patient's oral external.Instead or combination, take the photograph Camera can capture be positioned on the more than one desired part of probe more than one suitable mark (for example, including In motion tracking elements 47) image.Can using any suitable machine vision method (for example, the structure of motion algorithm, Photogrammetric survey method, image registration/alignment methods and/or light stream method of estimation, such as Lucas-Kanade methods) processing figure As position and/or direction to estimate to pop one's head in relative to structure.Alternatively, video camera can be integrated in probe or tie with probe Close, enabling analyzed using suitable self method for estimating as all machine vision methods as described herein The view data captured by video camera, to determine position and/or direction of the probe relative to structure.
Instead or combination, motion tracer can be using determining the relative of probe based on the method for estimation of inertia Position and/or direction.For example, motion sensor can include Inertial Measurement Unit, such as inertial sensor.Inertial sensor energy Enough it is MEMS (MEMS) device.In various embodiments, inertial sensor includes multiple accelerometers and/or multiple tops Spiral shell instrument, it is configured to motion of the detection probe with regard to three translation degree and/or three swings.
In another embodiment, can using electromagnetism track (EMT) system come tracking probe relative to structure position and/ Or direction.For example, EMT field energys are enough is provided by suitable generator or transmitter, and can be based on the electricity detected by sensor Magnetic signal is determining EMT sensors position inside and/or towards (for example, relative to most three rotary freedoms and three Individual translation freedoms).The EMT field generators and EMT sensors of any suitable quantity and configuration can be used.For example, EMT fields are sent out Raw device can be located at the fixed position (for example, being attached to operating table or patientchair) at the place of scanning process, and EMT is passed Sensor can be positioned in probe above (for example, being included in motion tracking elements 47), with the motion of tracking probe.In multiple realities In applying example, EMT sensors be also placed in three-dimensional structure or three-valued structures nearby (head for example, in patient, face, jaw and/or On tooth), with any motion for considering structure during measurement process.Instead or combination, EMT field generators can be put Put in structure, and there is the relative motion of the probe of the EMT sensors for combining for tracking.Conversely, EMT field generator energy It is enough to be located on probe, and EMT sensors can be in structure.
Any appropriate method can be used to process exercise data, to determine position and/or court of the probe relative to structure To.For example, motion tracking algorithms can be applied in combination with Kalman filter and carrys out processing data.Alternatively, process can be used From the exercise data that multiple different types of motion tracking systems described herein and equipment are received.
Fig. 8 is simplified block diagram, is described according to multiple embodiments for measuring the surface topography of three-dimensional structure The step of method 700.Such as embodiment described herein such any appropriate Optical devices or system can be used in practice Method 700.
In step 720, multiple incident beams are generated.In various embodiments, the energy of Optical devices as herein described 22 It is enough in the two-dimensional pattern to form light beam.
In step 720, each incident beam in multiple incident beams is focused on relative to the respective of optic probe Focal position.Can use any appropriate focusing, such as embodiment described herein.In various embodiments, light Beam is focused to form oblique focal plane, to provide Z scannings using the motion of probe, as mentioned before.
In step 730, for the multiple relative positions and/or direction between probe and structure, irradiated with incident beam Three-dimensional structure.In various embodiments, light beam is focused onto oblique focal plane so that probe is by relative to multiple positions of structure Put and/or the movement of direction can realize the 3-D scanning of structure, it is as described herein.Produce by using incident beam irradiating structure Multiple Returning beams are given birth to, each Returning beam is corresponding with incident beam.
In step 740, the characteristic of each light beam of the multiple light beams returned from three-dimensional structure is measured.Such as institute above State, characteristic can be any suitable measurable parameter of light beam, such as intensity, wavelength, polarization, phase shift, interference or dispersion.Energy Enough any appropriate devices using the characteristic for being configured to measure each light beam.For example, can be using such as including sensor Suitable detector cell as the sensor (for example, sensor array 68) of the two-dimensional array of element, as mentioned before.Base In the configuration of focusing optics and array of source, sensor array can be orthogonal with Returning beam or nonopiate.
In step 750, the characteristic and corresponding optic probe and structure measured (for example, using processor 24) is processed Between relative position and/or direction, with for structural generation surface topography data.The characteristic for processing measurement can be used Data any appropriate method, such as embodiment described herein.In various embodiments, based on by as described herein Tracking optic probe relative position and/or towards and obtain data (for example, exercise data and/or view data), come The data of the characteristic with measurement.
In step 760, for example the surface topography for three-dimensional structure is produced using processor described herein 24.Obtain The three dimensional representation of structure can be used in any appropriate application, all teeth as described herein and correction process.
Although the preferred embodiments of the present invention have been illustrated and described herein, to those skilled in the art It is evident that such embodiment is only provided in an illustrative manner.Without departing from the present invention, those skilled in the art It will be appreciated that various changes, change and replacement.It should be appreciated that invention as described herein reality can be adopted when the present invention is implemented Apply the various replacement schemes of example.It is intended that following claims and limits the scope of the present invention, and thus cover these rights and wants Method and structure and its equivalent in the range of asking.

Claims (23)

1. a kind of equipment for measuring the surface topography of three-dimensional structure, the equipment is configured to：A () is by multiple light beams Each light beam focuses on the focal position of respective fixation both with respect to the equipment；B () measures every in multiple Returning beams The characteristic of individual Returning beam, produces the plurality of Returning beam, for institute by irradiating the three-dimensional structure with the light beam State the multiple diverse locations and/or the direction measurement characteristic between equipment and the three-dimensional structure；And (c) set for described Standby multiple described diverse location and/or direction between the three-dimensional structure, is based at least partially on the return of measurement The characteristic of light beam is determining the surface topography of the three-dimensional structure.
2. a kind of equipment for measuring the surface topography of three-dimensional structure, the equipment includes：
Optic probe, the optic probe is configured to be moved relative to the three-dimensional structure；
Illumination unit, the illumination unit is configured to produce multiple incident beams, and each described incident beam includes first wave Long component；
Optical system, the optical system is configured to the first wave length of each incident beam of the plurality of incident beam Component focuses to the focal position of respective fixation relative to the optic probe；
Detector cell, the detector cell is configured to measure the characteristic of each Returning beam in multiple Returning beams, institute State Returning beam to irradiate the three-dimensional structure by using the incident beam and produce；And
Processing unit, the processing unit is connected with detector cell, and is configured to for the optic probe and described three Multiple different relative positions and/or direction between dimension structure, is based at least partially on the plurality of Returning beam of measurement The characteristic determining the surface topography of the three-dimensional structure.
3. equipment according to claim 2, wherein, the characteristic is intensity.
4. equipment according to claim 2, wherein, the detector cell includes the two-dimensional array of sensor element, often Individual sensor element is both configured to the corresponding Returning beam in the plurality of Returning beam and measures the characteristic.
5. equipment according to claim 4, wherein, the optical system is configured to, with being produced by the illumination unit Light form the two-dimensional pattern of the incident beam, the two-dimensional pattern of the incident beam and the two dimension by the sensor element The Returning beam measured by array is corresponding.
6. equipment according to claim 5, wherein, the optical system includes optical beam-expanding device unit, the optical beam-expanding Device unit is configured to extend the light produced by the illumination unit, to form the two-dimensional pattern of the incident beam.
7. equipment according to claim 4, wherein, the illumination unit is configured to produce the two dimension of the incident beam Pattern, the two-dimensional pattern of the incident beam and the Returning beam phase by measured by the two-dimensional array of the sensor element Correspondence.
8. equipment according to claim 4, wherein,
The incident beam is arranged to the multirow with the first row and last column；
The incident beam in each row is focused onto respective common focal length；And
The focal length difference predetermined length of the first row and described last column.
9. equipment according to claim 8, wherein, the predetermined length is 5mm to 25mm.
10. equipment according to claim 4, wherein, the sensor element is arranged in the planes, and the plane is directed It is that the focal length of the first wave length component relative to the incident beam carries out confocal sensing to the Returning beam.
11. equipment according to claim 10, wherein, the plane of the sensor element is with the Returning beam just Hand over.
12. equipment according to claim 4, wherein, the processing unit include more than one processor, and including Tangible non-transitory memory device, the tangible non-transitory memory device storage can be by one computing device above Instruction so that it is one more than processor process measurement the characteristic data, using the detector cell Measurement is generated for the plurality of different relative position between the optic probe and the three-dimensional structure and/or direction The characteristic data, to determine relative position and/or direction between the optic probe and the three-dimensional structure.
13. equipment according to claim 4, also include：Motion tracer, the motion tracer is configured to collection Exercise data, and wherein, the processing unit includes more than one processor, and sets including tangible non-transitory storage Standby, the tangible non-transitory storage device is stored by the instruction of one computing device above, so that one Processor above processes the exercise data, to determine the relative position between the optic probe and the three-dimensional structure And/or direction.
14. equipment according to claim 13, wherein, the motion tracer includes video camera, and the motion Data include view data.
15. equipment according to claim 13, wherein, the motion tracer includes gyroscope and/or accelerometer.
16. equipment according to claim 13, wherein, the motion tracer includes electromagnetic sensor.
17. equipment according to claim 2, wherein, the optical system is configured to described the first of the light beam Wavelength component focuses at least 10 different focal lengths relative to scanner, and wherein, the focal length has at least 10mm Scope.
A kind of 18. methods of the surface topography of measurement three-dimensional structure, the method includes：
Multiple incident beams are produced, each described incident beam includes first wave length component；
The first wave length component of each incident beam is focused on into Jiao of the respective fixation relative to optic probe Point position；
For multiple different relative positions and/or direction between the optic probe and the three-dimensional structure, measurement passes through The characteristic of each Returning beam in the multiple Returning beams for irradiating the three-dimensional structure with the incident beam and producing；
Process for the plurality of different relative positions between the optic probe and the three-dimensional structure and/or towards measurement The characteristic, to generate the surface topography data of the three-dimensional structure；And
The surface topography of the three-dimensional structure is generated using the surface topography data.
19. methods according to claim 18, wherein, the characteristic is intensity.
20. methods according to claim 18, including track relative between the optic probe and the three-dimensional structure Position and/or the change of direction.
21. methods according to claim 20, wherein,
The incident beam is arranged to the multirow with the first row and last column；
The incident beam in each row is focused onto respective common focal length；And
The focal length difference predetermined length of the first row and described last column.
22. methods according to claim 21, wherein, the predetermined length is at least 10mm.
23. methods according to claim 20, wherein, the wavelength component of the light beam is focused at least relative to scanner 10 different focal lengths, and wherein, the focal length has at least scope of 10mm.
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