With respect to two pattern sets obtained on different conditions, a feature-extraction matrix, which maximizes between-class scatter and minimizes within-class scatter, is found respectively. A first feature amount is calculated using one of the feature-extraction matrices. The first feature amount...http://www.google.com.au/patents/US6865296?utm_source=gb-gplus-sharePatent US6865296 - Pattern recognition method, pattern check method and pattern recognition apparatus as well as pattern check apparatus using the same methods
