A probing test device is provided for contacting a plurality of probes with pads on a semiconductor wafer to be tested and supplying a test signal to a tester comprising a CPU for previously storing, as a reference image, the image signal obtained when the probes are correctly contacted with the electrode...http://www.google.com.au/patents/US5091692?utm_source=gb-gplus-sharePatent US5091692 - Probing test device
