A probe holder in which the probe needle has a slight horizontal offset under the action of a vertical force, includes a probe holder for a probe needle, wherein the holder is adapted, for fastening and electrical contact-connection, on a carrier device of a test apparatus and has a holder arm having...http://www.google.com.au/patents/US7579849?utm_source=gb-gplus-sharePatent US7579849 - Probe holder for a probe for testing semiconductor components
