Temperature of molten silicon 1 in an infrared image furnace 2 including a halogen lamp 8 as a heating source to grow a single crystal of silicon in a floating-zone method is measured with high precision according to light radiated from the molten silicon 1. By disposing an optical path tube extending...http://www.google.com.au/patents/US7033070?utm_source=gb-gplus-sharePatent US7033070 - Method and apparatus for measuring temperature