A method is provided for improving performance testing in semiconductor lasers via an accelerated life model. By using an accelerated life model, operating conditions for performance tests, such as burn-in procedures and wafer qualification, are optimized with reduced cost and effort. The method is also...http://www.google.com.au/patents/US6977517?utm_source=gb-gplus-sharePatent US6977517 - Laser production and product qualification via accelerated life testing based on statistical modeling
