We disclose measurement systems and methods for measuring analytes in target regions of samples that also include features overlying the target regions. The systems include: (a) a light source; (b) a detection system; (c) a set of at least first, second, and third light ports which transmit light from...http://www.google.com.au/patents/US20070038041?utm_source=gb-gplus-sharePatent US20070038041 - Systems and methods for correcting optical reflectance measurements
