This disclosure provides a probe card for electrical testing a chip in a wide temperature range. The probe card includes a circuit board, a cover, a circular supporter positioned on the circuit board, at least a probe needle fixed on the circular supporter by an adhesive, and a flow line positioned in...http://www.google.com.au/patents/US6906543?utm_source=gb-gplus-sharePatent US6906543 - Probe card for electrical testing a chip in a wide temperature range
