To limit the current in heavy current testing of semiconductor components with test needles, upstream of each needle a circuit is connected which has low resistance in the range of allowable currents and has high resistance above a given limit current in order to limit the current. The current source...http://www.google.com.au/patents/US7295021?utm_source=gb-gplus-sharePatent US7295021 - Process and circuit for protection of test contacts in high current measurement of semiconductor components
