A carrier for testing an unpackaged semiconductor die is provided. The carrier comprises a base for holding the die, an interconnect for establishing a temporary electrical connection with the die, and a force applying mechanism for biasing the die and interconnect together. The base includes external...http://www.google.com.au/patents/US6060893?utm_source=gb-gplus-sharePatent US6060893 - Carrier having slide connectors for testing unpackaged semiconductor dice
