A test head for a semiconductor integrated circuit tester, the test head includes a housing, a backplane structure attached to the housing in a manner permitting pivotal movement of the backplane structure relative to the housing, and a latch mechanism for forcing the backplane structure towards its...http://www.google.com.au/patents/US6998863?utm_source=gb-gplus-sharePatent US6998863 - Arrangement for providing electrical connections to pin electronics cards in test head
