In one embodiment of the invention, circuitry and hardware for connectivity testing are fabricated on an IC, and in particular an IC containing a flash memory array. This testing circuitry is electrically connected to the bond pads of the IC. In some embodiments, the testing circuitry includes a boundary...http://www.google.com.au/patents/US7631231?utm_source=gb-gplus-sharePatent US7631231 - Method and apparatus for testing the connectivity of a flash memory chip
