Resistances of signal paths within a interconnect structure for linking input/output (I/O) ports of an integrated circuit (IC) tester to test points of an IC are measured by the IC tester itself. To do so the interconnect structure is used to link the tester's I/O ports to a similar arrangement of test...http://www.google.com.au/patents/US6677744?utm_source=gb-gplus-sharePatent US6677744 - System for measuring signal path resistance for an integrated circuit tester interconnect structure
