WO2011016651A2 - Photocurable resin composition for imprint lithography and method for manufacturing an imprint mold using same - Google Patents

Photocurable resin composition for imprint lithography and method for manufacturing an imprint mold using same Download PDF

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WO2011016651A2
WO2011016651A2 PCT/KR2010/005035 KR2010005035W WO2011016651A2 WO 2011016651 A2 WO2011016651 A2 WO 2011016651A2 KR 2010005035 W KR2010005035 W KR 2010005035W WO 2011016651 A2 WO2011016651 A2 WO 2011016651A2
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group
acrylate
meth
resin composition
mold
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PCT/KR2010/005035
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French (fr)
Korean (ko)
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WO2011016651A9 (en
WO2011016651A3 (en
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김병욱
유재원
김운용
곽은진
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주식회사 동진쎄미켐
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    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/0002Lithographic processes using patterning methods other than those involving the exposure to radiation, e.g. by stamping
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29CSHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C59/00Surface shaping of articles, e.g. embossing; Apparatus therefor
    • B29C59/02Surface shaping of articles, e.g. embossing; Apparatus therefor by mechanical means, e.g. pressing
    • B29C59/022Surface shaping of articles, e.g. embossing; Apparatus therefor by mechanical means, e.g. pressing characterised by the disposition or the configuration, e.g. dimensions, of the embossments or the shaping tools therefor
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y10/00Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y40/00Manufacture or treatment of nanostructures
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08FMACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
    • C08F220/00Copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and only one being terminated by only one carboxyl radical or a salt, anhydride ester, amide, imide or nitrile thereof
    • C08F220/02Monocarboxylic acids having less than ten carbon atoms; Derivatives thereof
    • C08F220/10Esters
    • C08F220/12Esters of monohydric alcohols or phenols
    • C08F220/14Methyl esters, e.g. methyl (meth)acrylate
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08FMACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
    • C08F220/00Copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and only one being terminated by only one carboxyl radical or a salt, anhydride ester, amide, imide or nitrile thereof
    • C08F220/02Monocarboxylic acids having less than ten carbon atoms; Derivatives thereof
    • C08F220/10Esters
    • C08F220/22Esters containing halogen
    • C08F220/24Esters containing halogen containing perhaloalkyl radicals
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08FMACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
    • C08F222/00Copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by a carboxyl radical and containing at least one other carboxyl radical in the molecule; Salts, anhydrides, esters, amides, imides, or nitriles thereof
    • C08F222/10Esters
    • C08F222/1006Esters of polyhydric alcohols or polyhydric phenols
    • C08F222/103Esters of polyhydric alcohols or polyhydric phenols of trialcohols, e.g. trimethylolpropane tri(meth)acrylate
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08FMACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
    • C08F222/00Copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by a carboxyl radical and containing at least one other carboxyl radical in the molecule; Salts, anhydrides, esters, amides, imides, or nitriles thereof
    • C08F222/10Esters
    • C08F222/1006Esters of polyhydric alcohols or polyhydric phenols
    • C08F222/106Esters of polycondensation macromers
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/0017Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor for the production of embossing, cutting or similar devices; for the production of casting means
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/0046Photosensitive materials with perfluoro compounds, e.g. for dry lithography
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/027Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/075Silicon-containing compounds
    • G03F7/0751Silicon-containing compounds used as adhesion-promoting additives or as means to improve adhesion
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08FMACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
    • C08F222/00Copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by a carboxyl radical and containing at least one other carboxyl radical in the molecule; Salts, anhydrides, esters, amides, imides, or nitriles thereof
    • C08F222/10Esters
    • C08F222/1006Esters of polyhydric alcohols or polyhydric phenols
    • C08F222/102Esters of polyhydric alcohols or polyhydric phenols of dialcohols, e.g. ethylene glycol di(meth)acrylate or 1,4-butanediol dimethacrylate

Definitions

  • the present invention relates to a photocurable resin composition for imprint lithography and a method of manufacturing an imprint mold using the same for forming patterns of various sizes ranging from several nanometers to several centimeters on a substrate, wherein the resin composition has excellent adhesiveness and stain resistance, It exhibits high resilience and transmittance along with release properties, non-swelling properties and mechanical properties for organic solvents, making them useful in the manufacture of molds for imprint lithography.
  • Photolithography is widely used as a method for forming a fine pattern on a substrate.
  • the photolithography method has the advantage of uniformly and stably forming a fine pattern on a substrate, but has a disadvantage of having to go through several steps (resin coating, heat treatment, exposure, development, cleaning, etching, etc.).
  • This complex process requires expensive equipment in each step, and has a disadvantage in that it takes a lot of time to control patterns and pattern formation due to margins in each process. This, in turn, is a fundamental cause of an increase in manufacturing costs and a decrease in productivity.
  • Imprint lithography technology is one of several methods introduced to overcome the limitations of the conventional photolithography method and is recognized as a next generation lithography technology.
  • Imprint lithography technology is an economical and effective technique for producing microstructures by transferring a stamped stamp of microstructures onto a surface of a spincoated or dispensed resist onto a substrate to transfer the microstructures.
  • Technology Early imprint techniques used a method in which the surface of a resist-coated substrate was stamped with a stamp of microstructures, pressed at a high pressure at a high temperature above the glass transition temperature, and then cooled and separated. However, this method has the advantages of easy process and low equipment cost, while long process time and high pressure are required. In particular, since high temperature and high pressure are required, there is a risk of substrate damage, and separation of the mold and the substrate is not easy.
  • polydimethylsiloxane which is a polymer elastomer
  • PDMS polydimethylsiloxane
  • Molds made using polydimethylsiloxane not only have high light transmittance, but also are elastic, so that they can be uniformly contacted with the surface of the substrate to form a pattern, and the surface of the resist applied due to the low surface energy of polydimethylsiloxane
  • the adhesion force with is small and it is easy to separate from the substrate surface after pattern formation.
  • the high gas permeability due to the three-dimensional network structure has the advantage of easy absorption of the solvent.
  • the polydimethylsiloxane resin mold has low mechanical strength, so that deformation easily occurs, and stain resistance is reduced by foreign substances such as dust, and it is easily swelled by a general organic solvent so that deformation can be used for pattern formation.
  • a general organic solvent so that deformation can be used for pattern formation.
  • a fluorine resin having low surface energy and excellent light transmittance and excellent chemical resistance such as polydimethylsiloxane, or a urethane resin having a low swelling phenomenon due to an organic solvent is used.
  • the fluorine-based resin has low surface energy when forming a mold, so that high release property can be realized, but the adhesion to the supporting substrate is low, which limits the selection of a substrate to form a mold, and must process a primer on the substrate. .
  • a method of mixing a polymer material, an oligomer, a monomer, and the like is used to improve adhesion to the support substrate, but there is a problem in that releasability is lowered due to an increase in surface energy caused by the introduced material.
  • the urethane-based resin is not only excellent in durability, but also excellent in chemical resistance and substrate adhesion, but is widely used, but it is difficult to release mold and thermosetting or photocuring resin after patterning with high surface energy.
  • a separate surface treatment or release agent adjuvant must be additionally applied to the mold for smooth separation.
  • the present invention is not only excellent in stain resistance, but also excellent in adhesion, can be applied to various substrates such as plastic, metal, glass, etc., and shows excellent release property by adjusting surface energy of the mold surface. It is an object of the present invention to provide a photocurable resin composition for imprint lithography that has non-swelling properties, excellent mechanical properties, and high resilience and transmittance with respect to an organic solvent.
  • the present invention also provides a method for manufacturing an imprint mold using the photocurable resin composition and an imprint manufactured by the method, which can stably and easily form micropatterns necessary for various electronic device industrial processes including semiconductors, displays, and the like. It is an object to provide a mold.
  • the present invention also provides a cured polymer resin to which the pattern of the disc mold is transferred by coating and curing the photocurable resin composition on one surface of the disc mold on which the pattern is formed, and the cured polymer resin transferred to the pattern from the disc mold. It provides a method of manufacturing an imprint mold comprising the step of releasing.
  • the present invention provides an imprint mold manufactured by the manufacturing method.
  • the manufacturing time can be shortened to reduce manufacturing cost and improve productivity.
  • the photocurable resin composition according to the present invention has a non-swelling property with respect to an organic solvent, and has a large mechanical property, a high restoring force and a transmittance, so that a fine pattern necessary for various electronic device industrial processes including semiconductors and displays can be stably and easily Can be formed.
  • the photocurable resin composition according to the present invention has excellent wettability and releasability with the thermosetting or photocurable resin for pattern formation regardless of whether or not additional surface treatment, and at the same time, excellent adhesion between the mold-forming substrate and the mold. Indicates.
  • the photocurable resin composition according to the present invention includes a fluorine-based monomer, a polymer, or a mixture thereof, thereby having a significantly lower viscosity than the polymer resin compositions used in the conventional imprint mold, thereby easily forming a micropattern. Molds with completeness can be prepared.
  • FIG. 1 is a cross-sectional view schematically showing a method for producing a resin mold according to the present invention.
  • FIG. 2A is an electron microscope photograph of a pattern forming mold manufactured using a disc mold having a hole shape (spacing: 2 ⁇ m, width: 2 ⁇ m, height: 1.5 ⁇ m).
  • 2B is an electron microscope photograph of a pattern forming mold manufactured using a disc mold having a hole shape (spacing: 200 nm, width: 700 nm).
  • FIG. 2C is an electron microscope photograph of a pattern forming mold manufactured using a disc mold having a line width of 300 nm to 500 nm.
  • FIG. 2D is an electron micrograph of a pattern forming mold manufactured using a disc mold in which lines of 550 nm are formed at 100 nm intervals.
  • the photocurable resin composition Preferably the photocurable resin composition,
  • the photocurable fluorine-based polymer or oligomer (1) forms dense crosslinks upon curing of the mold to provide non-swelling properties for organic solvents and thermoset or photocurable resins, and also provides high surface energy to provide thermoset or It serves to impart releasability with the photocurable resin.
  • the photocurable fluorine-based polymer or oligomer (1) may be used a fluorine-based polymer or oligomer including a reactive functional group, preferably an aliphatic or aromatic fluorine-based polymer or oligomer containing two or more reactive functional groups Can be used.
  • photocurable fluorine-based polymer or oligomer (1) examples include urethane (meth) acrylate, ester (meth) acrylate, ether (meth) acrylate, epoxy (meth) acrylate, carbonate (meth) acrylate, and Mixtures or copolymers thereof.
  • the photocurable fluorine-based polymer or oligomer (1) is preferably included in an amount of 20-80% by weight based on the total weight of the photocurable resin composition. If the content of the photocurable fluorine-based polymer and oligomer (1) is less than 20% by weight, it is difficult to form a dense crosslink, resulting in poor mechanical strength, deterioration of chemical resistance, and swelling or breakage of organic solvents, and also fluorine. As the content decreases, the surface energy rises, which may lower the release property. In addition, when the content exceeds 80% by weight, the adhesive strength with the support is low, making the mold difficult.
  • the resin composition according to the present invention is a component (1) for improving the physical properties such as wear resistance, heat resistance, weather resistance, surface hardness, flexibility, high elasticity and bendability of the final mold Together with photocurable fluorine-based polymers or oligomers, such as polyurethane (meth) acrylate, polyester (meth) acrylate, polyether (meth) acrylate, polyepoxy (meth) acrylate and polycarbonate (meth) acrylate At least one polymer selected from the group consisting of: may further comprise 1-30% by weight based on the total weight of the component (1).
  • At least one polyfunctional free radically polymerizable compound (2) containing fluorine serves to adjust the crosslinking density by reaction with the component (1).
  • the functional group, the multifunctional free radical polymerizable group portion improves adhesion to the mold support, and the fluorine group portion is increased due to the large amount of functional groups. Offsets the surface energy of the mold to facilitate mold release with thermosetting or photocuring resins.
  • the multifunctional free radically polymerizable compound (2) of the component (2) serves as a diluent of the component (1) to facilitate the formation of a micropattern and to improve the completeness of the mold.
  • polyfunctional free radically polymerizable compound is meant herein monomers, oligomers and polymers comprising functional groups that participate in a crosslinking reaction upon exposure to a suitable source of free radicals.
  • it is a monomer having at least one multifunctional free radically polymerizable group.
  • Preferred free radically polymerizable groups are (meth) acrylic groups comprising a (meth) acrylate group or a (meth) acrylamide group optionally substituted with fluorine or sulfur, more preferably an acrylate group.
  • the at least one multifunctional free radically polymerizable compound (2) including fluorine usable in the present invention may have a different component depending on the component (1), but preferably a compound having a structure represented by the following Chemical Formula 1 have:
  • R f is a (per) fluoro group
  • T is a bonding group
  • d is an integer of 1-6
  • e is an integer of 1 or 2.
  • R f means a linear, branched or cyclic (per) fluoro group, and may be saturated or unsaturated.
  • R represents a fluorine atom, a hydrogen atom, or a methyl group here, and a fluorine atom is preferable.
  • P is an integer of 1-10 and varies depending on component (1), all of which may be linear, branched or cyclic.
  • Z is a perfluoroalkyl group, a perfluoroether group, a perfluoropolyether group, or a perfluoroalkoxy group, all of which may be linear, branched or cyclic.
  • the Z group contains 1-12 carbon atoms and may optionally include 1-4 oxygen atoms or no oxygen atoms. In such perfluoropolyether structures, different repeat units can be randomly distributed along the chain.
  • the bonding group T between the perfluoro group and the free radical polymerizable group is a divalent group selected from the group consisting of alkylene, arylene, heteroalkylene, and combinations thereof, or carbonyl, ester, amide, sulfon amide, and these And a divalent group selected from the group consisting of T may be unsubstituted or substituted with alkyl, aryl, halogen or a combination thereof.
  • T may be alkylene, alkylene substituted with aryl groups, arylene, or alkylene in combination with alkyl ether or alkyl thioether linking groups.
  • the at least one multifunctional free radically polymerizable compound (2) containing fluorine include perfluorobutyl ethylene, perfluorohexyl ethylene, perfluorooctyl ethylene, perfluorodecyl ethylene, 2,2, 2-trifluoroethyl (meth) acrylate, 2,2,3,3,3, -pentafluoropropyl (meth) acrylate, 2-perfluorobutylethyl (meth) acrylate, 3-perflow Orobutyl-2-hydroxypropyl (meth) acrylate, 2-perfluorohexylethyl (meth) acrylate, 3-perfluorohexyl-2-hydroxypropyl (meth) acrylate, 2-perfluoro Octylethyl (meth) acrylate, 3-perfluorooctyl-2-hydroxypropyl (meth) acrylate, 2-perfluorodecylethyl (meth)
  • At least one polyfunctional free radically polymerizable compound (2) including fluorine also includes reaction products of the polymerizable compounds and even mixtures thereof.
  • the at least one polyfunctional free radically polymerizable compound (2) containing fluorine preferably has a weight average molecular weight of 3,000 or more, and a weight average of 3,000-20,000 in consideration of the difficulty in forming a micropattern due to a decrease in chemical resistance and high viscosity. It is more preferable to have a molecular weight.
  • the at least one multifunctional free radically polymerizable compound (2) containing fluorine is preferably included in an amount of 20-80 wt% based on the total weight of the photocurable resin composition. If the content of the component (2) is less than 20% by weight, the adhesive strength with the support of the mold is lowered, and the high viscosity of the resin composition is not preferable for forming a micropattern, and if it is more than 80% by weight, the surface energy is reduced as the fluorine content decreases. Rises and the releasability decreases, which is not preferable.
  • the component (3) not only functions as a diluent, but also increases crosslinking density to prevent swelling and breakage caused by an organic solvent and to increase release property when forming a fine pattern.
  • a compound having a polyester structure having a weight average molecular weight of 150 or more, preferably 150-50,000 and containing at least one reactive functional group together with a carboxy group is preferable.
  • the reactive functional group include photo-curable (meth) acryl groups, -SH, allyl groups, and vinyl groups, and these may be fluorinated.
  • olefinically unsaturated compound examples include methyl methacrylate, ethyl methacrylate, n-butyl methacrylate, 2-propylheptyl acrylate, sec-butyl methacrylate, tert-butyl methacrylate, methyl Acrylate, isopropyl acrylate, cyclohexyl methacrylate, 2-methylcyclohexyl methacrylate, dicyclopentenyl acrylate, dicyclopentanyl acrylate, dicyclopentenyl methacrylate, dicyclopentanyl methacrylate , 1-adamantyl acrylate, 1-adamantyl methacrylate, dicyclopentanyloxyethyl methacrylate, isoboroyl methacrylate, dicyclohexyl acrylate, 2-methylcyclohexyl acrylate, di Cyclopentanyloxyethyl acrylate, isoboroyl methacrylate, di
  • the a) olefinically unsaturated compound may be included in an amount of 70 parts by weight or less, preferably 5-70 parts by weight, even more preferably 5-50 parts by weight, based on 100 parts by weight of the total amount of the components (1) and (2). have.
  • the olefinically unsaturated compound is included in the content range, the adhesion to the mold support is excellent, and at the same time it can significantly reduce the breakage phenomenon when exposed to organic solvents for a long time.
  • it exceeds 70 parts by weight the surface energy is increased, there is a fear that the releasability between the mold and the resin is reduced.
  • the unsaturated compound containing the epoxy group of b) may include a phenyl epoxy (meth) acrylate oligomer having at least one reactive functional group, a bisphenol A epoxy di (meth) acrylate oligomer, an aliphatic alkyl epoxy di (meth) acrylate oligomer, And a compound selected from the group consisting of aliphatic alkyl epoxy tri (meth) acrylate oligomers.
  • the said reactive functional group means the (meth) acryl group, -SH, allyl group, or vinyl group which can be photocured.
  • the unsaturated compound containing the epoxy group of b) are glycidyl acrylate, glycidyl methacrylate, glycidyl ⁇ -ethyl acrylate, glycidyl ⁇ -propyl acrylate, ⁇ -n-butyl acrylic acid Glycidyl, acrylic acid-beta -methyl glycidyl, methacrylic acid-beta -methyl glycidyl, acrylic acid-beta -ethylglycidyl, methacrylic acid-beta -ethylglycidyl, acrylic acid -3,4- Epoxybutyl, methacrylic acid-3,4-epoxybutyl, acrylic acid-6,7-epoxyheptyl, methacrylic acid-6,7-epoxyheptyl, ⁇ -ethylacrylic acid-6,7-epoxyheptyl, acrylic acid-3, 4-epoxy cyclo
  • the unsaturated compound containing the epoxy group of b) is 70 parts by weight or less, preferably 5-70 parts by weight, even more preferably 5-50 parts by weight based on 100 parts by weight of the total amount of the components (1) and (2). It may be included in parts by weight.
  • the swelling phenomenon due to the organic solvent can be reduced, but also surface hardness, wear resistance, heat resistance, and the like can be improved.
  • the surface energy is increased to reduce the mold release properties of the mold and the resin, and the surface hardness is increased to reduce the surface properties such as the restoring force after stamping the mold.
  • the unsaturated compound containing the ether group or glycol group of c) is 70 parts by weight or less, preferably 5-70 parts by weight, and even more preferably, based on 100 parts by weight of the total amount of the components (1) and (2). It may be included in 5-50 parts by weight.
  • the swelling phenomenon due to the organic solvent can be reduced but also surface hardness, wear resistance, heat resistance, and the like can be improved.
  • the surface energy is high, and the mold and the resin are not easily released.
  • severe shrinkage that occurs during photoreaction results in undesirable mold patterns.
  • a silicone compound containing an epoxy group, an amine group, or a fluorine group, or an unsaturated silicone compound can be used.
  • Specific examples include (3-glycidoxypropyl) trimethoxy silane, (3-glycidoxyoxy) triethoxysilane, (3-glycidoxypropyl) methyldimethoxysilane, (3-glycidoxyoxy) ) Trimethoxysilane, (3-glycidoxypropyl) dimethylethoxysilane, (3-glycidoxyoxy) dimethylethoxysilane, 3- (methacryloxy) propyltrimethoxysilane, 3,4 -Epoxybutyl trimethoxysilane, 3,4-epoxybutyltriethoxysilane, 2- (3,4-epoxycyclohexyl) ethyltrimethoxysilane, 2- (3,4-epoxycyclohexyl) ethyltriethyltrie
  • the d) silicone compound may be included in an amount of 70 parts by weight or less, preferably 5-70 parts by weight, even more preferably 5-50 parts by weight, based on 100 parts by weight of the total amount of the components (1) and (2). .
  • the diluent by increasing the crosslinking density to prevent swelling and breakage phenomenon by the organic solvent, to mitigate the shrinkage of the polymer due to the photoreaction, it can increase the releasability when forming a fine pattern.
  • Component (3) as described above may include a mixture of two or more selected from one or more selected from each group, even when used in combination of two or more of the total weight of the components (1) and (2) It is preferable that it is 5-70 weight part with respect to 100 weight part of total sum total, More preferably, it is 5-50 weight part. When the content of the component (3) exceeds 70 parts by weight, there is a fear that the mechanical strength and flexibility are lowered.
  • Irgacure 369 (hereinafter referred to as Shiva Specialty Chemical Co., Ltd.), Irgacure 651, Irgacure 907, Irgacure 819, diphenyl- (2,4,6-trimethylbenzoyl) phosphine oxide, methylbenzoyl formate, ethyl (2) , 4,6-trimethylbenzoyl) phenylphosphinate, 2,4-bistrichloromethyl-6-p-methoxystyryl-s-triazine, 2-p-methoxystyryl-4,6-bis Trichloromethyl-s-triazine, 2,4-trichloromethyl-6-triazine, 2,4-trichloromethyl-4-methylnaphthyl-6-triazine, benzophenone, p- (diethylamino ) Benzophenone, 2,2-dichloro-4-phenoxyacetophen
  • the photoinitiator (4) is preferably included in an amount of 0.1-10 parts by weight based on 100 parts by weight of the total amount of the components (1), (2), and (3). Permeability and storage stability can be satisfied at the same time.
  • the photocurable resin composition according to the present invention comprising the above components may further include a surfactant in order to improve applicability and to further improve releasability when removing the original mold and stripping.
  • surfactant examples include polyoxyethylene octylphenyl ether, polyoxyethylene nonylphenyl ether, F171 (hereinafter referred to as Nippon Ink Co., Ltd.), F172, F173 FC430 (hereinafter referred to as Sumitomo Trim Corporation), FC431, KP341 (Shin-Etsu Chemical Co., Ltd. And the like, and the content thereof is preferably contained in an amount of 0.01-2 parts by weight based on 100 parts by weight of the total amount of the components (1), (2) and (3).
  • the present invention provides a method for producing a mold using the photocurable resin composition and a mold prepared by the method.
  • the method of manufacturing a mold according to the present invention comprises applying a cured photocurable resin composition to one surface of a disk mold on which a pattern is formed and preparing a cured polymer resin to which the pattern of the disk mold is transferred, and the cured polymer resin to which the pattern is transferred. Releasing from the disc mold.
  • FIG. 1 is a cross-sectional view schematically showing a method for manufacturing a mold according to the present invention.
  • step S1 the pattern of the disc mold 101 to be manufactured is turned upward, and then the photocurable resin composition 102a according to the present invention is applied (step S1).
  • the coating process may be carried out by a method such as spin coating, slit coating, it is preferable to apply the photocurable resin composition 102a to a thickness of 5-60 ⁇ m on the original mold.
  • the photocurable resin composition 102a is cured by irradiating with light in an atmosphere of nitrogen or air (step S2).
  • the back support 103 is a transparent glass plate (bare glass), ITO (indium tin oxide) substrate, COC (cyclic olefin copolymer), PAc (polyacrylate), PC ( polycarbonate, PE (polyethylene), PEEK (polyetheretherketone), PEI (polyetherimide), PEN (polyethylenenaphthalate), PES (polyethersulfone), PET (polyethyleneterephtalate), PI (polyimide), PO (polyolefin), PMMA (polymethylmethacrylate), PSF ( polysulfone, polyvinylalcohol (PVA), polyvinylcinnamate (PVC), triacetylcellulose (TAC), polysilicone (polysilicone), polyurethane (polyurethane), epoxy resin (epoxy Resin) and the like can be used.
  • the transmittance is 97-99.9% in the light source of 500 nm wavelength.
  • step S3 the cured polymer resin 102b to which the pattern of the disc mold 101 transferred to the back support 103 is transferred is released from the disc mold 101.
  • a pattern transferred from the disc mold 101 is formed on one surface of the release cured polymer resin 102b.
  • the molding mold 104 is completed by aging the mold having the patterned cured polymer resin 102b (step S4).
  • aging means that the surface of the cured polymer resin mold on which the pattern is formed is excessively exposed to ultraviolet rays to improve the hardness of the mold and to completely extinguish the remaining reactors against ultraviolet rays or to extinguish the remaining reactors through heat treatment and at the same time, the surface flatness. And it means a process for further improving the adhesion with the support.
  • the aging step is preferably a process of improving the hardness of the mold by excessively exposing the surface of the mold to ultraviolet rays, may be carried out by selecting one of the exposure and heat treatment, or both may be carried out step by step.
  • a mold having a high degree of completeness can be produced by the method according to the present invention.
  • the imprint lithography process using the mold replaces the conventional photolithography process for forming a fine pattern, thereby simplifying various steps such as exposure, development, and cleaning of the existing photolithography process, as well as manufacturing time (tact time). ), The manufacturing cost can be reduced and the productivity can be improved.
  • oligomer of 40% by weight of the photocurable fluorine-based urethane acrylate 40% by weight of 2-perfluorooctylethyl methacrylate and 20% by weight of 3-perfluorobutyl-2-hydroxypropyl (meth) acrylate
  • 40 parts by weight of a mixture of 10 parts by weight of phenylepoxy acrylate, 20 parts by weight of diethylene glycol dimethacrylate and 30 parts by weight of methacrylate propyltrimethoxysilane, and ethyl (2,4,6-trimethyl as a photoinitiator 40 parts by weight of a mixture of 10 parts by weight of phenylepoxy acrylate, 20 parts by weight of diethylene glycol dimethacrylate and 30 parts by weight of methacrylate propyltrimethoxysilane, and ethyl (2,4,6-trimethyl as a photoinitiator.
  • the pattern of the disc mold 101 was turned upward, and the photocurable resin composition 102a prepared above was slit-coated so that the thickness was 30 micrometers.
  • the back support 103 is bonded onto the disc mold to which the photocurable resin composition is applied, and then irradiated with ultraviolet rays in a nitrogen atmosphere to cure, and the back support on which the cured polymer resin 102b to which the pattern of the disc mold 101 is transferred is attached. (103) was released from the disc mold (101). Ultraviolet rays were irradiated for complete curing of the adhesive cured polymer resin 102b.
  • Polymer resin was carried out in the same manner as in Example 1, except that 60% by weight of 2-perfluorooctylethyl methacrylate was used as the multifunctional free radically polymerizable compound of component (2) in Example 1 Mold was prepared.
  • Example 1 30 wt% of EGC-1700 (Fluorochemical acrylate polymer, manufactured by 3M), a fluorine acrylate polymer, and 30 wt% of 2-perfluorooctylethyl methacrylate as the multifunctional free-radically polymerizable compound of component (2) in Example 1
  • EGC-1700 Fluorochemical acrylate polymer, manufactured by 3M
  • fluorine acrylate polymer a fluorine acrylate polymer
  • 2-perfluorooctylethyl methacrylate 2-perfluorooctylethyl methacrylate
  • a polymer resin mold was prepared in the same manner as in Example 1, except that 30 parts by weight and 50 parts by weight of phenylepoxy acrylate and diethylene glycol dimethacrylate were used in Example 1, respectively.
  • a polymer resin mold was prepared in the same manner as in Example 1, except that 20 parts by weight of methacrylate propyltrimethoxysilane and 20 parts by weight of trifluoropropyl trimethoxysilane were used as the silicon compound in Example 1. Prepared.
  • a polymer resin mold was prepared in the same manner as in Example 1, except that the photocurable resin composition was manufactured by using 100 wt% of fluorine-based urethane acrylate alone in Example 1.
  • a polymer resin mold was prepared in the same manner as in Example 1, except that 100 wt% of the fluorine-based urethane acrylate was used in Example 1, and the polyfunctional free radical polymerizable compound of Component (2) was not used. Prepared.
  • PDMS Density Polymer
  • sylgard (R) 184 silicone elastomer kit which is a material of a conventional polymer resin mold, was prepared in the same manner as in Example 1 101) was applied to a thickness of 100 ⁇ m and cured by baking in an oven at 60 ° C. for 180 minutes, and then the cured resin was released from the disc mold to prepare a polymer resin mold.
  • Adhesive force The coating film surfaces of the final polymer resin molds prepared in Examples 1 to 5 and Comparative Examples 1 to 3 were divided into 100 cells at regular intervals, and then slowly peeled off after attaching 3M 610 tape. When counting the remaining cells, expressed as%.
  • the average of the force constantly applied is less than 70 mN, it is represented by ⁇ , 70-100 mN, ⁇ , X is greater than 100 mN.
  • a polymer resin mold was prepared in the same manner as in Example 1, except that a disc mold having various shapes was used. The prepared mold was observed using a scanning electron microscope, and the results are shown in FIGS. 2A-2D.
  • FIG. 2A is an electron microscope photograph of a dot-shaped pattern mold manufactured using a hole-shaped disk mold having a thickness of 2 ⁇ m, a width of 2 ⁇ m, and a height of 1.5 ⁇ m.
  • 2B is an electron microscope photograph of a dot-shaped pattern mold manufactured using a hole-shaped disk mold having a gap of 200 nm and a width of 700 nm.
  • FIG. 2C is an electron micrograph of a pattern forming mold manufactured using a disc mold having various nanometer sizes having a line width of 300 nm to 500 nm and irregular shapes different from each other.
  • FIG. 2D is an electron micrograph of a pattern forming mold manufactured using a disc mold in which 550 nm lines are formed at 100 nm intervals.
  • the photocurable resin composition for imprint lithography according to the present invention exhibits low surface energy and low viscosity due to the addition of fluorine-based compounds, it was possible to manufacture molds for pattern formation of various shapes and sizes. It can be seen that the nanometer level micropattern can be easily formed.
  • the manufacturing time can be shortened to reduce manufacturing cost and improve productivity.
  • the photocurable resin composition according to the present invention has a non-swelling property with respect to an organic solvent, and has a large mechanical property, a high restoring force and a transmittance, so that a fine pattern necessary for various electronic device industrial processes including semiconductors and displays can be stably and easily Can be formed.
  • the photocurable resin composition according to the present invention has excellent wettability and releasability with the thermosetting or photocuring resin for pattern formation, regardless of whether or not additional surface treatment, and at the same time provides excellent adhesion between the mold-forming substrate and the mold. Indicates.
  • the photocurable resin composition according to the present invention includes a fluorine-based monomer, a polymer, or a mixture thereof, thereby having a significantly lower viscosity than the polymer resin compositions used in the conventional imprint mold, thereby easily forming a micropattern. Molds with completeness can be prepared.

Abstract

The present invention relates to a photocurable resin composition for imprint lithography for forming patterns of various sizes on a substrate, and to a method for manufacturing an imprint mold using same. The photocurable resin composition has superior adhesive properties, and thus can be applied to a variety of materials such as plastic, metal, glass, etc. The photocurable resin composition not only has excellent contamination resistance, but also controls the surface energy of a mold to exhibit superior releasing properties for enabling the mold to be easily released from the substrate. The photocurable resin composition of the present invention has excellent crosslinkability, and thus exhibits non-swelling properties when exposed to an organic solvent. The photocurable resin composition of the present invention has superior mechanical properties, and high restoring force and permeability, and thus can be effectively used in manufacturing a mold for imprint lithography.

Description

임프린트 리소그래피용 광경화형 수지 조성물 및 이를 이용한 임프린트 몰드의 제조 방법Photocurable resin composition for imprint lithography and manufacturing method of imprint mold using same
본 발명은 기판 상에 수 나노미터에서 수 센티미터의 다양한 크기의 패턴을 형성하기 위한 임프린트 리소그래피용 광경화형 수지 조성물 및 이를 이용한 임프린트 몰드의 제조방법에 관한 것으로, 상기 수지 조성물은 우수한 접착성과 내오염성, 이형성, 유기 용매에 대한 비팽윤 특성 및 기계적 특성과 함께 높은 복원력과 투과율을 나타내어 임프린트 리소그래피용 몰드의 제조에 유용하다.The present invention relates to a photocurable resin composition for imprint lithography and a method of manufacturing an imprint mold using the same for forming patterns of various sizes ranging from several nanometers to several centimeters on a substrate, wherein the resin composition has excellent adhesiveness and stain resistance, It exhibits high resilience and transmittance along with release properties, non-swelling properties and mechanical properties for organic solvents, making them useful in the manufacture of molds for imprint lithography.
기판 상에 미세패턴을 형성하기 위한 방법으로 포토리소그래피(photolithography) 방법이 널리 사용되고 있다. 포토리소그래피 방법은 기판 위에 미세패턴을 균일하고 안정적으로 형성할 수 있다는 장점이 있으나, 여러 단계의 공정(수지 도포, 열처리, 노광, 현상, 세정, 식각 등)을 거쳐야 한다는 단점이 있다. 이러한 복잡한 공정은 각 단계별로 고가의 장비를 필요로 하고, 각 공정상의 마진으로 인한 컨트롤의 어려움, 패턴 형성까지 많은 시간을 소비하게 하는 단점이 있다. 이는 결국 제조 원가의 상승 및 생산성 저하를 야기하는 근본적인 원인이 된다. Photolithography is widely used as a method for forming a fine pattern on a substrate. The photolithography method has the advantage of uniformly and stably forming a fine pattern on a substrate, but has a disadvantage of having to go through several steps (resin coating, heat treatment, exposure, development, cleaning, etching, etc.). This complex process requires expensive equipment in each step, and has a disadvantage in that it takes a lot of time to control patterns and pattern formation due to margins in each process. This, in turn, is a fundamental cause of an increase in manufacturing costs and a decrease in productivity.
종래 포토리소그래피 방식의 한계를 극복하기 위해 소개된 여러 방식들 중 차세대 리소그래피 기술로 인식되고 있는 기술로서 임프린트 리소그래피 기술이 있다. 임프린트 리소그래피 기술은 경제적이고도 효과적으로 미세 구조물을 제작할 수 있는 기술로, 미세 구조물이 각인된 스탬프를 기재 위에 스핀코팅(spincoating) 또는 디스펜싱(dispensing)된 레지스트(resist)의 표면에 눌러 미세 구조물을 전사하는 기술이다. 초기의 임프린트 기술은 레지스트가 도포되어 있는 기판 표면을 미세 구조물이 각인된 스탬프로 유리전이온도 이상의 고온에서 고압으로 누른 후 냉각시켜 분리하는 방법을 사용하였다. 하지만 이 방식은 공정이 쉽고 장비 가격이 저렴한 장점이 있는 반면에, 공정시간이 길고 고압이 필요한 단점이 있다. 특히, 고온, 고압을 필요로 하기 때문에 기판 훼손의 우려가 있고, 몰드와 기판의 분리가 용이하지 않다. Imprint lithography technology is one of several methods introduced to overcome the limitations of the conventional photolithography method and is recognized as a next generation lithography technology. Imprint lithography technology is an economical and effective technique for producing microstructures by transferring a stamped stamp of microstructures onto a surface of a spincoated or dispensed resist onto a substrate to transfer the microstructures. Technology. Early imprint techniques used a method in which the surface of a resist-coated substrate was stamped with a stamp of microstructures, pressed at a high pressure at a high temperature above the glass transition temperature, and then cooled and separated. However, this method has the advantages of easy process and low equipment cost, while long process time and high pressure are required. In particular, since high temperature and high pressure are required, there is a risk of substrate damage, and separation of the mold and the substrate is not easy.
종래 임프린트 리소그래피용 몰드 제조를 위하여 고분자 탄성체인 폴리다이메틸실록산(polydimethylsiloxane, PDMS)을 주로 사용하였다. 폴리다이메틸실록산을 이용하여 제조된 몰드는 광투과율이 높을 뿐만 아니라, 탄성체이기 때문에 패턴을 형성할 기판 표면과의 균일한 접촉이 가능하며, 폴리다이메틸실록산의 낮은 표면에너지로 인해 도포된 레지스트 표면과의 접착력이 작아 패턴형성 후 기판 표면으로부터의 분리가 용이하다. 또한, 3차원 그물 구조에 기인한 높은 기체 투과성으로 인해 용매의 흡수가 용이하다는 장점이 있다. 그러나, 폴리다이메틸실록산 수지 몰드는 기계적 강도가 낮아 변형이 쉽게 일어나고, 먼지 등 외부물질에 의한 내오염성이 떨어질 뿐만 아니라, 일반적인 유기용매에 의해 쉽게 팽윤(swelling)되어 변형이 발생하므로 패턴 형성에 사용할 고분자 및 용매의 선정에 상당한 제약이 따른다는 문제가 있다. In order to manufacture a mold for conventional imprint lithography, polydimethylsiloxane (PDMS), which is a polymer elastomer, is mainly used. Molds made using polydimethylsiloxane not only have high light transmittance, but also are elastic, so that they can be uniformly contacted with the surface of the substrate to form a pattern, and the surface of the resist applied due to the low surface energy of polydimethylsiloxane The adhesion force with is small and it is easy to separate from the substrate surface after pattern formation. In addition, the high gas permeability due to the three-dimensional network structure has the advantage of easy absorption of the solvent. However, the polydimethylsiloxane resin mold has low mechanical strength, so that deformation easily occurs, and stain resistance is reduced by foreign substances such as dust, and it is easily swelled by a general organic solvent so that deformation can be used for pattern formation. There is a problem that the selection of a polymer and a solvent has a considerable limitation.
상기와 같은 수지 몰드의 문제점을 해결하기 위해, 폴리다이메틸실록산처럼 표면 에너지가 낮고 광 투과성이 우수한 동시에 내화학성 또한 우수한 불소계 수지를 사용하거나, 유기 용매에 의한 팽윤 현상이 적은 우레탄계 수지를 적용하였다. 하지만, 상기 불소계 수지는 몰드 형성 시 표면 에너지가 낮아 높은 이형성 구현은 가능하지만, 지지 기판과의 접착력이 낮아 몰드를 형성하고자 하는 기판 선택에 제약이 있으며, 또한 기판에 프라이머(primer)를 처리해야만 한다. 또한, 지지 기판과의 접착력 향상을 위해 고분자 물질이나 올리고머, 단량체 등을 혼합하는 방법이 사용되고 있으나, 도입되는 물질에 의한 표면 에너지의 상승으로 이형성이 저하되는 문제가 있다. 또한, 상기 우레탄계 수지는 내구성이 좋을 뿐 아니라 내화학성과 기판 접착력 또한 우수하여 많이 사용되고 있지만, 높은 표면 에너지로 패터닝 후 몰드와 열경화 또는 광경화 수지와의 이형에 어려움이 있다. 그 결과 원활한 분리를 위해 몰드에 별도의 표면 처리 또는 이형제 보조제를 추가 도포해야만 하는 단점이 있다. 이러한 추가적인 공정들은 패터닝시 정확성을 저하시킬 뿐 아니라, 추가적인 공정 시간과 고가의 공정 장비들을 필요로 한다는 문제가 있으며, 이러한 문제로 인해 제조 원가의 상승 및 생산성 저하가 초래되는 문제가 있다. In order to solve the above problems of the resin mold, a fluorine resin having low surface energy and excellent light transmittance and excellent chemical resistance, such as polydimethylsiloxane, or a urethane resin having a low swelling phenomenon due to an organic solvent is used. However, the fluorine-based resin has low surface energy when forming a mold, so that high release property can be realized, but the adhesion to the supporting substrate is low, which limits the selection of a substrate to form a mold, and must process a primer on the substrate. . In addition, a method of mixing a polymer material, an oligomer, a monomer, and the like is used to improve adhesion to the support substrate, but there is a problem in that releasability is lowered due to an increase in surface energy caused by the introduced material. In addition, the urethane-based resin is not only excellent in durability, but also excellent in chemical resistance and substrate adhesion, but is widely used, but it is difficult to release mold and thermosetting or photocuring resin after patterning with high surface energy. As a result, there is a disadvantage that a separate surface treatment or release agent adjuvant must be additionally applied to the mold for smooth separation. These additional processes not only reduce accuracy in patterning, but also require additional processing time and expensive process equipment, and these problems result in an increase in manufacturing cost and a decrease in productivity.
상기와 같은 문제점을 해결하기 위해, 본 발명은 내오염성이 우수할 뿐만 아니라 접착성이 우수하여 플라스틱, 금속, 유리 등의 다양한 기재에 적용될 수 있고, 몰드 표면의 표면 에너지 조정으로 뛰어난 이형성을 나타내며, 유기용매에 대해 비팽윤 특성을 가지고, 기계적 특성이 우수하며, 높은 복원력과 투과율 등의 특성을 갖는 임프린트 리소그래피용 광경화형 수지 조성물을 제공하는 것을 목적으로 한다.In order to solve the above problems, the present invention is not only excellent in stain resistance, but also excellent in adhesion, can be applied to various substrates such as plastic, metal, glass, etc., and shows excellent release property by adjusting surface energy of the mold surface. It is an object of the present invention to provide a photocurable resin composition for imprint lithography that has non-swelling properties, excellent mechanical properties, and high resilience and transmittance with respect to an organic solvent.
본 발명은 또한, 반도체, 디스플레이 등을 포함한 각종 전자 디바이스 산업 공정에 필요한 미세패턴을 안정적이고 용이하게 형성할 수 있는, 상기 광경화형 수지 조성물을 이용한 임프린트 몰드의 제조방법 및 상기 방법에 의해 제조된 임프린트 몰드를 제공하는 것을 목적으로 한다.The present invention also provides a method for manufacturing an imprint mold using the photocurable resin composition and an imprint manufactured by the method, which can stably and easily form micropatterns necessary for various electronic device industrial processes including semiconductors, displays, and the like. It is an object to provide a mold.
상기 목적을 달성하기 위해 본 발명은, The present invention to achieve the above object,
(1) 광경화형 불소계 고분자 또는 올리고머 ;(1) photocurable fluorine-based polymers or oligomers;
(2) 불소를 포함한 적어도 하나의 다작용성 자유 라디칼 중합성 화합물; (2) at least one multifunctional free radically polymerizable compound including fluorine;
(3) a) 올레핀계 불포화 화합물, b) 에폭시기를 포함하는 불포화 화합물, c) 에테르기 또는 글리콜기를 포함하는 불포화 화합물, 및 d) 에폭시기, 아민기, 또는 불소기를 포함하는 실리콘계 화합물, 또는 불포화 실리콘계 화합물로 이루어진 군으로부터 선택된 1종 이상의 화합물; 및(3) a) an olefinically unsaturated compound, b) an unsaturated compound containing an epoxy group, c) an unsaturated compound containing an ether group or a glycol group, and d) a silicone compound containing an epoxy group, an amine group, or a fluorine group, or an unsaturated silicone type At least one compound selected from the group consisting of compounds; And
(4) 광개시제(4) photoinitiator
를 포함하는 임프린트 리소그래피용 광경화형 수지 조성물을 제공한다.It provides a photocurable resin composition for imprint lithography comprising a.
본 발명은 또한, 패턴이 형성된 원판 몰드 일면에 상기 광경화형 수지 조성물을 도포하고 경화시켜 원판 몰드의 패턴이 전사된 경화 고분자 수지를 제조하는 단계, 및 상기 패턴이 전사된 경화 고분자 수지를 원판 몰드로부터 이형시키는 단계를 포함하는 임프린트 몰드의 제조방법을 제공한다.The present invention also provides a cured polymer resin to which the pattern of the disc mold is transferred by coating and curing the photocurable resin composition on one surface of the disc mold on which the pattern is formed, and the cured polymer resin transferred to the pattern from the disc mold. It provides a method of manufacturing an imprint mold comprising the step of releasing.
또한, 본 발명은 상기 제조방법에 의하여 제조된 임프린트 몰드를 제공한다.In addition, the present invention provides an imprint mold manufactured by the manufacturing method.
본 발명에 따르면, 기존 포토 리소그래피 공정의 여러 단계를 단순화 할 수 있을 뿐만 아니라, 제조 시간을 단축하여 제조원가를 절감하고 생산성을 향상시킬 수 있다.According to the present invention, not only can the various steps of the existing photolithography process be simplified, but also the manufacturing time can be shortened to reduce manufacturing cost and improve productivity.
본 발명에 따른 광경화형 수지 조성물은 유기용매에 대해 비팽윤 특성을 가지며, 큰 기계적 특성, 높은 복원력과 투과율을 가져 반도체, 디스플레이 등을 포함하는 각종 전자 디바이스 산업 공정에 필요한 미세 패턴을 안정적이고 용이하게 형성할 수 있다.The photocurable resin composition according to the present invention has a non-swelling property with respect to an organic solvent, and has a large mechanical property, a high restoring force and a transmittance, so that a fine pattern necessary for various electronic device industrial processes including semiconductors and displays can be stably and easily Can be formed.
또한 본 발명에 따른 광경화형 수지 조성물은 추가적인 표면처리 여부와 상관없이, 패턴 형성을 위한 열경화 또는 광경화 수지와의 젖음성 및 이형성이 우수할 뿐만 아니라, 동시에 몰드 형성 기판과 몰드사이에 뛰어난 접착력을 나타낸다.In addition, the photocurable resin composition according to the present invention has excellent wettability and releasability with the thermosetting or photocurable resin for pattern formation regardless of whether or not additional surface treatment, and at the same time, excellent adhesion between the mold-forming substrate and the mold. Indicates.
본 발명에 따른 광경화형 수지 조성물은 불소계 단량체, 중합체 또는 이들의 혼합물을 포함함으로써, 기존 임프린트 몰드에 사용되는 고분자 수지 조성물들에 비해 현격히 낮은 점도를 가짐으로써 미세패턴을 용이하게 형성할 수 있으며, 높은 완성도를 갖는 몰드를 제조할 수 있다.The photocurable resin composition according to the present invention includes a fluorine-based monomer, a polymer, or a mixture thereof, thereby having a significantly lower viscosity than the polymer resin compositions used in the conventional imprint mold, thereby easily forming a micropattern. Molds with completeness can be prepared.
도 1은 본 발명에 따른 수지 몰드의 제조방법을 개략적으로 도시하는 단면도이다.1 is a cross-sectional view schematically showing a method for producing a resin mold according to the present invention.
도 2a는 홀 모양(간격: 2μm, 너비: 2μm, 높이: 1.5μm)의 원판 몰드를 이용하여 제조한 패턴 형성용 몰드에 대한 전자 현미경 관찰 사진이다.FIG. 2A is an electron microscope photograph of a pattern forming mold manufactured using a disc mold having a hole shape (spacing: 2 μm, width: 2 μm, height: 1.5 μm).
도 2b는 홀 모양(간격: 200nm, 너비: 700nm)의 원판 몰드를 이용하여 제조한 패턴 형성용 몰드에 대한 전자 현미경 관찰 사진이다.2B is an electron microscope photograph of a pattern forming mold manufactured using a disc mold having a hole shape (spacing: 200 nm, width: 700 nm).
도 2c는 선폭이 300nm 내지 500nm인 원판 몰드를 이용하여 제조한 패턴 형성용 몰드에 대한 전자 현미경 관찰 사진이다.FIG. 2C is an electron microscope photograph of a pattern forming mold manufactured using a disc mold having a line width of 300 nm to 500 nm. FIG.
도 2d는 550nm의 선이 100nm간격으로 형성되어있는 원판 몰드를 이용하여 제조한 패턴 형성용 몰드에 대한 전자 현미경 관찰 사진이다.FIG. 2D is an electron micrograph of a pattern forming mold manufactured using a disc mold in which lines of 550 nm are formed at 100 nm intervals.
이하, 본 발명을 상세히 설명한다. Hereinafter, the present invention will be described in detail.
본 발명에 따른 임프린트 리소그래피용 광경화형 수지 조성물은,The photocurable resin composition for imprint lithography according to the present invention,
(1) 광경화형 불소계 고분자 또는 올리고머;(1) photocurable fluorine-based polymers or oligomers;
(2) 불소를 포함한 적어도 하나의 다작용성 자유 라디칼 중합성 화합물;(2) at least one multifunctional free radically polymerizable compound including fluorine;
(3) a) 올레핀계 불포화 화합물, b) 에폭시기를 포함하는 불포화 화합물, c) 에테르기 또는 글리콜기를 포함하는 불포화 화합물, 및 d) 실리콘계 화합물로 이루어진 군으로부터 선택된 1종 이상의 화합물; 및 (3) at least one compound selected from the group consisting of a) an olefinically unsaturated compound, b) an unsaturated compound comprising an epoxy group, c) an unsaturated compound comprising an ether group or a glycol group, and d) a silicone compound; And
(4) 광개시제를 포함한다.(4) It contains a photoinitiator.
바람직하게는 상기 광경화형 수지 조성물은,Preferably the photocurable resin composition,
(1) 광경화형 불소계 고분자 또는 올리고머 20-80 중량%; (1) 20-80 wt% of a photocurable fluorine-based polymer or oligomer;
(2) 불소를 포함한 적어도 하나의 다작용성 자유 라디칼 중합성 화합물 20-80 중량%;(2) 20-80% by weight of at least one multifunctional free radically polymerizable compound including fluorine;
(3) 상기 성분 (1) 및 (2)의 총 합계량 100 중량부에 대하여, a) 올레핀계 불포화 화합물, b) 에폭시기를 포함하는 불포화 화합물, c) 에테르기 또는 글리콜기를 포함하는 불포화 화합물, 및 d) 실리콘계 화합물로 이루어진 군으로부터 선택된 1종 이상의 화합물 5-70 중량부, 및(3) 100 parts by weight of the total amount of the components (1) and (2), a) an olefinically unsaturated compound, b) an unsaturated compound containing an epoxy group, c) an unsaturated compound containing an ether group or a glycol group, and d) 5-70 parts by weight of at least one compound selected from the group consisting of silicone-based compounds, and
(4) 상기 성분 (1), (2) 및 (3)의 총 합계량 100 중량부에 대하여 광개시제 0.1-10 중량부를 포함한다.(4) 0.1-10 weight part of photoinitiators are included with respect to 100 weight part of total amounts of the said components (1), (2), and (3).
이하 각 성분들에 대하여 설명한다.Each component is demonstrated below.
(1) 광경화형 불소계 고분자 또는 올리고머(1) Photocurable fluorine-based polymer or oligomer
상기 광경화형 불소계 고분자 또는 올리고머(1)는 몰드의 경화시 조밀한 가교 결합을 형성하여 유기 용매 및 열경화 또는 광경화 수지에 대한 비팽윤 특성을 제공하며, 또한 높은 표면 에너지를 제공하여 열경화 또는 광경화 수지와의 이형성을 부여하는 역할을 한다.The photocurable fluorine-based polymer or oligomer (1) forms dense crosslinks upon curing of the mold to provide non-swelling properties for organic solvents and thermoset or photocurable resins, and also provides high surface energy to provide thermoset or It serves to impart releasability with the photocurable resin.
상기 광경화형 불소계 고분자 또는 올리고머(1)로는 반응성 관능기를 포함하는 불소계 고분자 또는 올리고머를 사용할 수 있으며, 바람직하게는 2개 이상의 반응성 관능기를 포함하는 지방족(aliphatic) 또는 방향족(aromatic) 불소계 고분자 또는 올리고머를 사용할 수 있다. 상기 반응성 관능기로는 (메타)아크릴기, -SH, 알릴기 또는 비닐기 등을 들 수 있으며, 이들 반응성 관능기는 -COCF=CH2와 같이 불소로 할로겐화될 수도 있다. The photocurable fluorine-based polymer or oligomer (1) may be used a fluorine-based polymer or oligomer including a reactive functional group, preferably an aliphatic or aromatic fluorine-based polymer or oligomer containing two or more reactive functional groups Can be used. The reactive functional group may be a (meth) acryl group, -SH, allyl group or vinyl group, and these reactive functional groups may be halogenated with fluorine such as -COCF = CH2.
상기 광경화형 불소계 고분자 또는 올리고머(1)의 구체적인 예로는 우레탄 (메타)아크릴레이트, 에스테르 (메타)아크릴레이트, 에테르 (메타)아크릴레이트, 에폭시 (메타)아크릴레이트, 카보네이트 (메타)아크릴레이트, 및 이들의 혼합물 또는 공중합체 등을 들 수 있다.Specific examples of the photocurable fluorine-based polymer or oligomer (1) include urethane (meth) acrylate, ester (meth) acrylate, ether (meth) acrylate, epoxy (meth) acrylate, carbonate (meth) acrylate, and Mixtures or copolymers thereof.
상기 광경화형 불소계 고분자 또는 올리고머(1)는 광경화형 수지 조성물 총 중량에 대하여 20-80 중량%의 양으로 포함되는 것이 바람직하다. 상기 광경화형 불소계 고분자 및 올리고머(1)의 함유량이 20 중량% 미만이면 조밀한 가교 결합 형성이 어려워 기계적 강도가 떨어지고, 내화학성이 저하되어 유기 용매에 의한 팽윤 또는 부서짐 현상이 발생할 수 있으며, 또한 불소 함량이 적어짐에 따라 표면 에너지가 상승하여 이형성이 저하될 우려가 있다. 또한 함유량이 80 중량%를 초과할 경우 지지체와의 접착력이 낮아져 몰드 형성이 어렵다.The photocurable fluorine-based polymer or oligomer (1) is preferably included in an amount of 20-80% by weight based on the total weight of the photocurable resin composition. If the content of the photocurable fluorine-based polymer and oligomer (1) is less than 20% by weight, it is difficult to form a dense crosslink, resulting in poor mechanical strength, deterioration of chemical resistance, and swelling or breakage of organic solvents, and also fluorine. As the content decreases, the surface energy rises, which may lower the release property. In addition, when the content exceeds 80% by weight, the adhesive strength with the support is low, making the mold difficult.
본 발명에 따른 수지 조성물은 최종 몰드의 내마모성, 내열성, 내후성, 표면 경도(surface hardness), 유연성(flexibility), 탄성력(high elasticity)과 휨성(bendability) 등의 물성 향상을 위해, 상기 성분 (1)의 광경화형 불소계 고분자 또는 올리고머와 함께, 폴리우레탄 (메타)아크릴레이트, 폴리에스테르 (메타)아크릴레이트, 폴리에테르 (메타)아크릴레이트, 폴리에폭시 (메타)아크릴레이트 및 폴리카보네이트 (메타)아크릴레이트로 이루어진 군에서 선택된 1종 이상의 고분자를, 상기 성분 (1)의 총 중량에 대하여 1-30 중량%의 양으로 더 포함할 수 있다. The resin composition according to the present invention is a component (1) for improving the physical properties such as wear resistance, heat resistance, weather resistance, surface hardness, flexibility, high elasticity and bendability of the final mold Together with photocurable fluorine-based polymers or oligomers, such as polyurethane (meth) acrylate, polyester (meth) acrylate, polyether (meth) acrylate, polyepoxy (meth) acrylate and polycarbonate (meth) acrylate At least one polymer selected from the group consisting of: may further comprise 1-30% by weight based on the total weight of the component (1).
(2) 불소를 포함한 적어도 하나의 다작용성 자유 라디칼 중합성 화합물(2) at least one multifunctional free radically polymerizable compound including fluorine
상기 불소를 포함한 적어도 하나의 다작용성 자유 라디칼 중합성 화합물(2)은, 상기 성분 (1)과의 반응으로 가교밀도를 조정하는 역할을 한다. 상기 성분(2)의 다작용성 자유 라디칼 중합성 화합물(2)에 있어서, 관능기인 다작용성 자유 라디칼 중합성 기 부분은 몰드 지지체와의 접착력을 향상시키고, 불소기 부분은 다량의 관능기로 인해 증가된 몰드의 표면 에너지를 상쇄시켜 주어 열경화 또는 광경화 수지와의 이형성을 용이하게 한다. 뿐만 아니라, 상기 성분 (2)의 다작용성 자유 라디칼 중합성 화합물(2)은 성분 (1)의 희석제로서의 역할을 하여 미세패턴 형성을 더욱 용이하게 하며, 몰드의 완성도를 향상시켜 준다. At least one polyfunctional free radically polymerizable compound (2) containing fluorine serves to adjust the crosslinking density by reaction with the component (1). In the multifunctional free radically polymerizable compound (2) of the component (2), the functional group, the multifunctional free radical polymerizable group portion, improves adhesion to the mold support, and the fluorine group portion is increased due to the large amount of functional groups. Offsets the surface energy of the mold to facilitate mold release with thermosetting or photocuring resins. In addition, the multifunctional free radically polymerizable compound (2) of the component (2) serves as a diluent of the component (1) to facilitate the formation of a micropattern and to improve the completeness of the mold.
본 명세서에서 “다작용성 자유 라디칼 중합성 화합물”이란, 자유 라디칼의 적합한 공급원에 노출시 가교 결합 반응에 참여하는 관능기를 포함하는 단량체, 올리고머 및 중합체를 의미한다. 바람직하게는 적어도 하나의 다작용성 자유 라디칼 중합성 기를 갖는 단량체이다. 상기 자유 라디칼 중합성 기는 (메타)아크릴기, -SH, 알릴기 또는 비닐기 등을 포함하며, -COCF=CH2의 경우에서와 같이 이들 자유 라디칼 중합성 기는 불소로 할로겐화될 수도 있다. 바람직한 자유 라디칼 중합성 기는 선택적으로 불소 또는 황으로 치환된 (메타)아크릴레이트기 또는 (메타)아크릴아미드기를 포함하는 (메타)아크릴기이며, 아크릴레이트기인 것이 보다 바람직하다. By “polyfunctional free radically polymerizable compound” is meant herein monomers, oligomers and polymers comprising functional groups that participate in a crosslinking reaction upon exposure to a suitable source of free radicals. Preferably it is a monomer having at least one multifunctional free radically polymerizable group. The free radically polymerizable groups include (meth) acrylic groups, -SH, allyl groups or vinyl groups and the like, and as in the case of -COCF = CH2, these free radically polymerizable groups may be halogenated with fluorine. Preferred free radically polymerizable groups are (meth) acrylic groups comprising a (meth) acrylate group or a (meth) acrylamide group optionally substituted with fluorine or sulfur, more preferably an acrylate group.
본 발명에서 사용가능한 불소를 포함한 적어도 하나의 다작용성 자유 라디칼 중합성 화합물(2)은 상기 성분 (1)에 따라 그 성분이 달라질 수 있으나, 바람직하게는 하기 화학식 1의 구조를 갖는 화합물을 사용할 수 있다:The at least one multifunctional free radically polymerizable compound (2) including fluorine usable in the present invention may have a different component depending on the component (1), but preferably a compound having a structure represented by the following Chemical Formula 1 have:
[화학식 1][Formula 1]
(Rf)-[(T)-(RA)d]e (R f )-[(T)-(R A ) d ] e
상기 식에서, Rf는 (퍼)플루오로기이고, T는 결합기이며, RA는 자유 라디칼 중합성 기, 예를 들어, (메타)아크릴기, -SH, 아릴기, 또는 비닐기이며, 바람직하게는 (메타)아크릴레이트기 또는 -COCF=CH2 기이며, d는 1-6의 정수이고, e는 1 또는 2의 정수이다. Wherein R f is a (per) fluoro group, T is a bonding group, and R A is a free radical polymerizable group such as a (meth) acrylic group, -SH, an aryl group, or a vinyl group, preferably Preferably it is a (meth) acrylate group or -COCF = CH2 group, d is an integer of 1-6, e is an integer of 1 or 2.
상기 Rf는 선형, 분지형 또는 환형의 (퍼)플루오로기를 의미하며, 포화 또는 불포화될 수 있다. 예를 들면, R-(CPF2P)-, R-(CPF2PO)-,R-(CF(Z))-, R-(CF(Z)O)-, R-(CF(Z)CPF2PO)-, R-(CPF2PCF(Z)O)-, R-(CF2CF(Z)O)-, 및 이들의 조합으로 이루어진 군에서 선택되는 불소화 반복 단위를 갖는 것을 포함하지만, 이에 한정되지 않는다. 여기서 R은 불소 원자, 수소 원자, 또는 메틸기를 나타내며, 불소 원자가 바람직하다. 상기 p는 1-10의 정수이며, 상기 성분 (1)에 따라 변화되며, 이들 모두는 선형, 분지형 또는 환형일 수 있다. 상기 Z는 퍼플루오로알킬기, 퍼플루오로에테르기, 퍼플루오로폴리에테르기, 또는 퍼플루오로알콕시기이며, 이들 모두는 선형, 분지형 또는 환형일 수 있다. 상기 Z기는 1-12의 탄소 원자를 포함하며, 선택적으로 1-4의 산소 원자를 포함하거나, 포함하지 않을 수 있다. 이러한 퍼플루오로폴리에테르 구조에서, 상이한 반복 단위가 사슬을 따라 무작위로 분포할 수 있다. R f means a linear, branched or cyclic (per) fluoro group, and may be saturated or unsaturated. For example, R- (C P F 2P )-, R- (C P F 2P O)-, R- (CF (Z))-, R- (CF (Z) O)-, R- (CF (Z) CPF2PO)-, R- (C P F 2P CF (Z) O)-, R- (CF 2 CF (Z) O)-, and combinations thereof having fluorinated repeat units But it is not limited thereto. R represents a fluorine atom, a hydrogen atom, or a methyl group here, and a fluorine atom is preferable. P is an integer of 1-10 and varies depending on component (1), all of which may be linear, branched or cyclic. Z is a perfluoroalkyl group, a perfluoroether group, a perfluoropolyether group, or a perfluoroalkoxy group, all of which may be linear, branched or cyclic. The Z group contains 1-12 carbon atoms and may optionally include 1-4 oxygen atoms or no oxygen atoms. In such perfluoropolyether structures, different repeat units can be randomly distributed along the chain.
상기 퍼플루오로기와 자유 라디칼 중합성기 사이의 결합기 T는 알킬렌, 아릴렌, 헤테로알킬렌, 및 이들의 조합으로 이루어진 군에서 선택된 2가의 기, 또는 카르보닐, 에스테르, 아미드, 설폰 아미드, 및 이들의 조합으로 이루어진 군에서 선택된 2가 기를 포함한다. T는 비치환되거나 또는 알킬, 아릴, 할로겐 또는 이들의 조합으로 치환될 수 있다. 바람직하게는 T는 알킬렌, 아릴기로 치환된 알킬렌, 아릴렌, 또는 알킬 에테르 또는 알킬 티오에테르 결합기와 조합된 알킬렌일 수 있다. The bonding group T between the perfluoro group and the free radical polymerizable group is a divalent group selected from the group consisting of alkylene, arylene, heteroalkylene, and combinations thereof, or carbonyl, ester, amide, sulfon amide, and these And a divalent group selected from the group consisting of T may be unsubstituted or substituted with alkyl, aryl, halogen or a combination thereof. Preferably T may be alkylene, alkylene substituted with aryl groups, arylene, or alkylene in combination with alkyl ether or alkyl thioether linking groups.
상기 불소를 포함한 적어도 하나의 다작용성 자유 라디칼 중합성 화합물(2)의 구체적인 예로는, 퍼플루오로부틸 에틸렌, 퍼플루오로헥실 에틸렌, 퍼플루오로옥틸 에틸렌, 퍼플루오로데실 에틸렌, 2,2,2-트리플루오로에틸 (메타)아크릴레이트, 2,2,3,3,3,-펜타플루오로프로필 (메타)아크릴레이트, 2-퍼플루오로부틸에틸 (메타)아크릴레이트, 3-퍼플로오로부틸-2-하이드록시프로필 (메타)아크릴레이트, 2-퍼플로오로헥실에틸 (메타)아크릴레이트, 3-퍼플루오로헥실-2-하이드록시프로필 (메타)아크릴레이트, 2-퍼플루오로옥틸에틸 (메타)아크릴레이트, 3-퍼플루오로옥틸-2-하이드록시프로필 (메타)아크릴레이트, 2-퍼플루오로데실에틸 (메타)아크릴레이트, 1H,1H,3H-테트라플루오로프로필 (메타)아크릴레이트, 1H,1H,5H-옥타플루오로펜틸 (메타)아크릴레이트, 1H,1H,7H-도데카플루오로헵틸 (메타)아크릴레이트, 1H,1H,9H-헥사데카플루오로노닐 (메타)아크릴레이트, 1H-1-트리플루오로메틸트리플루오로에틸 (메타)아크릴레이트, 1H,1H,3H-헥사플루오로부틸 (메타)아크릴레이트, 1-메틸-2,2,3,3,3-펜타플루오로프로틸 (메타)아크릴레이트, 1-메틸-2,2,3,3,4,4,4,-헵타플루오로부틸 (메타)아크릴레이트, 2,2,3,3,4,4,-헥사플루오로사이클로부틸 (메타)아크릴레이트, 2,2,3,3,4,4,5,5,-옥타플루오로사이클로펜틸 (메타)아크릴레이트, 2,2,3,3,4,4,5,5,6,6,-데카플루오로사이클로헥실 (메타)아크릴레이트, 2,2,3,3,4,4,5,5,6,6,7,7-도데카플루오로사이클로헵틸 (메타)아크릴레이트, 2,2,3,3,4,4,5,5,6,6,7,7,8,8-테트라데카플루오로사이클로옥틸 (메타)아크릴레이트, 2-트라이플루오로메틸 사이클로펜틸 (메타)아크릴레이트, 3-트라이플루오로메틸 사이클로펜틸 (메타)아크릴레이트, 4-트라이플루오로메틸 사이클로헥실 (메타)아크릴레이트, 2-트라이플루오로메틸 사이클로헵틸 (메타)아크릴레이트, 3-트라이플루오로메틸 사이클로헵틸 (메타)아크릴레이트, 또는 4-트라이플루오로메틸 사이클로헵틸 (메타)아크릴레이트 등을 들 수 있으나, 이에 한정되지는 않는다.Specific examples of the at least one multifunctional free radically polymerizable compound (2) containing fluorine include perfluorobutyl ethylene, perfluorohexyl ethylene, perfluorooctyl ethylene, perfluorodecyl ethylene, 2,2, 2-trifluoroethyl (meth) acrylate, 2,2,3,3,3, -pentafluoropropyl (meth) acrylate, 2-perfluorobutylethyl (meth) acrylate, 3-perflow Orobutyl-2-hydroxypropyl (meth) acrylate, 2-perfluorohexylethyl (meth) acrylate, 3-perfluorohexyl-2-hydroxypropyl (meth) acrylate, 2-perfluoro Octylethyl (meth) acrylate, 3-perfluorooctyl-2-hydroxypropyl (meth) acrylate, 2-perfluorodecylethyl (meth) acrylate, 1H, 1H, 3H-tetrafluoropropyl ( Meta) acrylate, 1H, 1H, 5H-octafluoropentyl (meth) acrylate, 1H, 1H, 7H-dode Fluoroheptyl (meth) acrylate, 1H, 1H, 9H-hexadecafluorononyl (meth) acrylate, 1H-1-trifluoromethyltrifluoroethyl (meth) acrylate, 1H, 1H, 3H- Hexafluorobutyl (meth) acrylate, 1-methyl-2,2,3,3,3-pentafluoropropyl (meth) acrylate, 1-methyl-2,2,3,3,4,4 , 4, -heptafluorobutyl (meth) acrylate, 2,2,3,3,4,4, -hexafluorocyclobutyl (meth) acrylate, 2,2,3,3,4,4, 5,5, -octafluorocyclopentyl (meth) acrylate, 2,2,3,3,4,4,5,5,6,6, -decafluorocyclohexyl (meth) acrylate, 2, 2,3,3,4,4,5,5,6,6,7,7-dodecafluorocycloheptyl (meth) acrylate, 2,2,3,3,4,4,5,5, 6,6,7,7,8,8-tetradecafluorocyclooctyl (meth) acrylate, 2-trifluoromethyl cyclopentyl (meth) acrylate, 3-trifluoromethyl cyclopentyl (meth) acrylic re , 4-trifluoromethyl cyclohexyl (meth) acrylate, 2-trifluoromethyl cycloheptyl (meth) acrylate, 3-trifluoromethyl cycloheptyl (meth) acrylate, or 4-trifluoro Methyl cycloheptyl (meth) acrylate, and the like, but are not limited thereto.
또한 본 발명에서 상기 불소를 포함한 적어도 하나의 다작용성 자유 라디칼 중합성 화합물(2)은 상기 중합성 화합물의 반응 생성물 및 이들의 혼합물까지도 포함한다.In the present invention, at least one polyfunctional free radically polymerizable compound (2) including fluorine also includes reaction products of the polymerizable compounds and even mixtures thereof.
상기 불소를 포함한 적어도 하나의 다작용성 자유 라디칼 중합성 화합물(2)은 3,000 이상의 중량평균분자량을 갖는 것이 바람직하며, 내화학성 저하 및 고점도로 인한 미세패턴 형성의 어려움을 고려할 때 3,000-20,000의 중량평균분자량을 갖는 것이 보다 바람직하다.The at least one polyfunctional free radically polymerizable compound (2) containing fluorine preferably has a weight average molecular weight of 3,000 or more, and a weight average of 3,000-20,000 in consideration of the difficulty in forming a micropattern due to a decrease in chemical resistance and high viscosity. It is more preferable to have a molecular weight.
상기 불소를 포함한 적어도 하나의 다작용성 자유 라디칼 중합성 화합물(2)은 광경화형 수지 조성물 총 중량에 대하여 20-80 중량%의 양으로 포함되는 것이 바람직하다. 상기 성분 (2)의 함유량이 20 중량% 미만이면 몰드의 지지체와의 접착력이 낮아지며 수지 조성물의 높은 점도로 미세패턴형성에 바람직하지 않고, 80 중량%를 초과할 경우 불소 함량이 적어짐에 따라 표면 에너지가 상승하여 이형성이 저하되어 바람직하지 않다.The at least one multifunctional free radically polymerizable compound (2) containing fluorine is preferably included in an amount of 20-80 wt% based on the total weight of the photocurable resin composition. If the content of the component (2) is less than 20% by weight, the adhesive strength with the support of the mold is lowered, and the high viscosity of the resin composition is not preferable for forming a micropattern, and if it is more than 80% by weight, the surface energy is reduced as the fluorine content decreases. Rises and the releasability decreases, which is not preferable.
(3) a) 올레핀계 불포화 화합물, b) 에폭시기를 포함하는 불포화 화합물, c) 에테르기 또는 글리콜기를 포함하는 불포화 화합물, 및 d) 실리콘계 화합물로 이루어진 군으로부터 선택된 1종 이상의 화합물(3) at least one compound selected from the group consisting of a) an olefinically unsaturated compound, b) an unsaturated compound comprising an epoxy group, c) an unsaturated compound comprising an ether group or a glycol group, and d) a silicone compound
상기 성분 (3)은 희석제로서의 역할을 할 뿐만 아니라, 가교 밀도를 높여 유기용매에 의한 팽윤 및 부서짐 현상을 방지하고, 미세패턴 형성시 이형성을 증가시키는 작용을 한다.The component (3) not only functions as a diluent, but also increases crosslinking density to prevent swelling and breakage caused by an organic solvent and to increase release property when forming a fine pattern.
a) 올레핀계 불포화 화합물 a) olefinically unsaturated compounds
상기 a)의 올레핀계 불포화 화합물로는 중량평균 분자량이 150 이상, 바람직하게는 150-50,000이고, 카르복시(carboxy)기와 함께 1개 이상의 반응성 관능기를 포함하는 폴리에스터 구조를 갖는 화합물이 바람직하다. 상기 반응성 관능기로는 광경화가 가능한 (메타)아크릴기, -SH, 알릴기 또는 비닐기 등을 들 수 있으며, 이들은 불소화될 수도 있다.As the olefinically unsaturated compound of a), a compound having a polyester structure having a weight average molecular weight of 150 or more, preferably 150-50,000 and containing at least one reactive functional group together with a carboxy group is preferable. Examples of the reactive functional group include photo-curable (meth) acryl groups, -SH, allyl groups, and vinyl groups, and these may be fluorinated.
상기 a) 올레핀계 불포화 화합물의 구체적인 예로는 메틸메타크릴레이트, 에틸메타크릴레이트, n-부틸 메타크릴레이트, 2-프로필헵틸아크릴레이트, sec-부틸 메타크릴레이트, tert-부틸 메타크릴레이트, 메틸아크릴레이트, 이소프로필 아크릴레이트, 사이클로헥실 메타크릴레이트, 2-메틸시클로 헥실메타크릴레이트, 다이사이클로펜테닐아크릴레이트, 다이사이클로펜타닐아크릴레이트, 다이사이클로펜테닐메타크릴레이트, 다이사이클로펜타닐메타크릴레이트, 1-아다만틸 아크릴레이트, 1-아다만틸 메타크릴레이트, 다이사이클로펜타닐옥시에틸메타크릴레이트, 이소보로닐메타크릴레이트, 다이사이클로헥실아크릴레이트, 2-메틸시클로헥실아크릴레이트, 다이사이클로펜타닐옥시에틸아크릴레이트, 이소보로닐아크릴레이트, 페닐메타크릴레이트, 페닐아크릴레이트, 벤질아크릴레이트, 2-하이드록시에틸메타크릴레이트, 또는 1,6-헥산다이올다이아크릴레이트 등을 사용할 수 있다.Specific examples of the a) olefinically unsaturated compound include methyl methacrylate, ethyl methacrylate, n-butyl methacrylate, 2-propylheptyl acrylate, sec-butyl methacrylate, tert-butyl methacrylate, methyl Acrylate, isopropyl acrylate, cyclohexyl methacrylate, 2-methylcyclohexyl methacrylate, dicyclopentenyl acrylate, dicyclopentanyl acrylate, dicyclopentenyl methacrylate, dicyclopentanyl methacrylate , 1-adamantyl acrylate, 1-adamantyl methacrylate, dicyclopentanyloxyethyl methacrylate, isoboroyl methacrylate, dicyclohexyl acrylate, 2-methylcyclohexyl acrylate, di Cyclopentanyloxyethyl acrylate, isoboroyl acrylate, phenyl methacrylate, phenyl It may be used methacrylate, benzyl acrylate, 2-hydroxyethyl methacrylate, or 1,6-hexanediol diacrylate and the like.
상기 a) 올레핀계 불포화 화합물은 성분 (1) 및 (2)의 총 합계량 100중량부에 대하여 70 중량부 이하, 바람직하게는 5-70 중량부, 보다 더 바람직하게는 5-50 중량부로 포함될 수 있다. 상기 올레핀계 불포화 화합물이 상기 함량 범위로 포함되는 경우 몰드 지지체에 대한 접착력이 우수하며, 동시에 유기용매에 오랜 시간 노출시 부서짐 현상을 현저히 줄일 수 있다. 그러나 70 중량부를 초과할 경우 표면 에너지가 높아져 몰드와 수지 간의 이형성이 저하될 우려가 있다. The a) olefinically unsaturated compound may be included in an amount of 70 parts by weight or less, preferably 5-70 parts by weight, even more preferably 5-50 parts by weight, based on 100 parts by weight of the total amount of the components (1) and (2). have. When the olefinically unsaturated compound is included in the content range, the adhesion to the mold support is excellent, and at the same time it can significantly reduce the breakage phenomenon when exposed to organic solvents for a long time. However, if it exceeds 70 parts by weight, the surface energy is increased, there is a fear that the releasability between the mold and the resin is reduced.
b) 에폭시기를 포함하는 불포화 화합물 b) unsaturated compounds containing epoxy groups
상기 b)의 에폭시기를 포함하는 불포화 화합물은, 1개 이상의 반응성 관능기를 가진 페닐 에폭시 (메타)아크릴레이트 올리고머, 비스페놀A 에폭시 다이(메타)아크릴레이트 올리고머, 지방족 알킬 에폭시 다이(메타)아크릴레이트 올리고머, 및 지방족 알킬 에폭시 트리(메타)아크릴레이트 올리고머로 이루어지는 군에서 1종 이상 선택되는 화합물을 사용할 수 있다. 상기 반응성 관능기란 광경화가 가능한 (메타)아크릴기, -SH, 알릴기 또는 비닐기를 말한다. 상기 b)의 에폭시기를 포함하는 불포화 화합물의 구체적인 예로는 아크릴산 글리시딜, 메타크릴산 글리시딜, α-에틸아크릴산 글리시딜, α-n-프로필아크릴산 글리시딜, α-n-부틸아크릴산 글리시딜, 아크릴산-β-메틸글리시딜, 메타크릴산-β-메틸글리시딜, 아크릴산-β-에틸글리시딜, 메타크릴산-β-에틸글리시딜, 아크릴산-3,4-에폭시부틸, 메타크릴산-3,4-에폭시부틸, 아크릴산-6,7-에폭시헵틸, 메타크릴산-6,7-에폭시헵틸, α-에틸아크릴산-6,7-에폭시헵틸, 아크릴산-3,4-에폭시 시클로헥실메틸, 메타크릴산-3,4-에폭시 시클로헥실메틸, 4-비닐시클로헥센옥사이드, o-비닐벤질글리시딜에테르, m-비닐벤질글리시딜에테르, 또는 p-비닐벤질글리시딜에테르 등을 들 수 있으나, 이에 한정되지는 않는다.The unsaturated compound containing the epoxy group of b) may include a phenyl epoxy (meth) acrylate oligomer having at least one reactive functional group, a bisphenol A epoxy di (meth) acrylate oligomer, an aliphatic alkyl epoxy di (meth) acrylate oligomer, And a compound selected from the group consisting of aliphatic alkyl epoxy tri (meth) acrylate oligomers. The said reactive functional group means the (meth) acryl group, -SH, allyl group, or vinyl group which can be photocured. Specific examples of the unsaturated compound containing the epoxy group of b) are glycidyl acrylate, glycidyl methacrylate, glycidyl α-ethyl acrylate, glycidyl α-propyl acrylate, α-n-butyl acrylic acid Glycidyl, acrylic acid-beta -methyl glycidyl, methacrylic acid-beta -methyl glycidyl, acrylic acid-beta -ethylglycidyl, methacrylic acid-beta -ethylglycidyl, acrylic acid -3,4- Epoxybutyl, methacrylic acid-3,4-epoxybutyl, acrylic acid-6,7-epoxyheptyl, methacrylic acid-6,7-epoxyheptyl, α-ethylacrylic acid-6,7-epoxyheptyl, acrylic acid-3, 4-epoxy cyclohexylmethyl, methacrylic acid-3,4-epoxy cyclohexylmethyl, 4-vinylcyclohexene oxide, o-vinylbenzyl glycidyl ether, m-vinylbenzyl glycidyl ether, or p-vinylbenzyl Glycidyl ether and the like, but are not limited thereto.
상기 b)의 에폭시기를 포함하는 불포화 화합물은 상기 성분 (1) 및 (2)의 총 합계량 100 중량부에 대하여 70 중량부 이하, 바람직하게는 5-70 중량부, 보다 더 바람직하게는 5-50 중량부로 포함될 수 있다. 상기 범위 내인 경우 유기용매에 의한 팽윤(swelling) 현상을 줄일 수 있을 뿐 아니라, 표면 경도, 내마모성, 내열성 등을 향상시킬 수 있다. 그러나, 상기 범위를 초과할 경우 표면 에너지가 높아져 몰드와 수지의 이형성이 저하되게 되며, 표면 경도가 높아져 몰드의 스탬핑 후 복원력과 같은 표면 특성이 저하되게 될 우려가 있다. The unsaturated compound containing the epoxy group of b) is 70 parts by weight or less, preferably 5-70 parts by weight, even more preferably 5-50 parts by weight based on 100 parts by weight of the total amount of the components (1) and (2). It may be included in parts by weight. Within the above range, not only the swelling phenomenon due to the organic solvent can be reduced, but also surface hardness, wear resistance, heat resistance, and the like can be improved. However, if the above range is exceeded, the surface energy is increased to reduce the mold release properties of the mold and the resin, and the surface hardness is increased to reduce the surface properties such as the restoring force after stamping the mold.
c) 에테르기 또는 글리콜기를 포함하는 불포화 화합물 c) unsaturated compounds containing ether groups or glycol groups
상기 c)의 에테르기 또는 글리콜기를 포함하는 불포화 화합물로는, 페놀에틸렌글리콜 (메타)아크릴레이트, 다이에틸렌글리콜 다이메타크릴레이트, 에틸렌글리콜 다이아크릴레이트, 폴리에틸렌글리콜 200 다이메타크릴레이트, 1,6-헥산다이올에틸렌글리콜, 네오펜틸글리콜 다이아크릴레이트, 에틸렌글리콜페닐에테르 (메타)아크릴레이트, 에틸렌글리콜메틸에테르 (메타)아크릴레이트, 2-하이드록시에테르 (메타)아크릴레이트, 트리에틸렌글리콜 다이비닐에테르, 1,4-사이클로헥산다이메탄올 다이비닐에테르 다이아크릴레이트, 1,3-부틸렌글리콜 다이아크릴레이트, 다이에틸렌글리콜 다이아크릴레이트, 네오펜틸글리콜 하이드록시피발레이트 다이아크릴레이트, 네오펜틸글리콜 다이아크릴레이트, 테트라에틸렌글리콜 다이아크릴레이트 또는 다이프로필렌글리콜 다이아크릴레이트 등을 들 수 있으나, 이에 한정되지는 않는다.As an unsaturated compound containing the ether group or glycol group of said c), phenol ethylene glycol (meth) acrylate, diethylene glycol dimethacrylate, ethylene glycol diacrylate, polyethyleneglycol 200 dimethacrylate, 1,6 -Hexanediol ethylene glycol, neopentyl glycol diacrylate, ethylene glycol phenyl ether (meth) acrylate, ethylene glycol methyl ether (meth) acrylate, 2-hydroxy ether (meth) acrylate, triethylene glycol divinyl Ether, 1,4-cyclohexanedimethanol divinylether diacrylate, 1,3-butylene glycol diacrylate, diethylene glycol diacrylate, neopentyl glycol hydroxy pivalate diacrylate, neopentyl glycol diacrylate Acrylate, tetraethyleneglycol diacrylate or dipro Glycol and the like, but diacrylate, but is not limited to this.
상기 c)의 에테르기 또는 글리콜기를 포함하는 불포화 화합물은 상기 성분 (1) 및 (2)의 총 합계량 100 중량부에 대하여 70 중량부 이하, 바람직하게는 5-70 중량부, 보다 더 바람직하게는 5-50 중량부로 포함될 수 있다. 상기 범위 내인 경우 유기용매에 의한 팽윤(swelling) 현상을 줄일 수 있을 뿐 아니라 표면 경도, 내마모성, 내열성 등을 향상시킬 수 있다. 그러나, 상기 범위를 초과할 경우 표면 에너지가 높아져 몰드와 수지의 이형이 용이하지 못하다. 또한, 광반응시에 발생하는 심한 수축으로 인해 바람직하지 못한 몰드 패턴을 얻게 된다. The unsaturated compound containing the ether group or glycol group of c) is 70 parts by weight or less, preferably 5-70 parts by weight, and even more preferably, based on 100 parts by weight of the total amount of the components (1) and (2). It may be included in 5-50 parts by weight. Within the above range, not only the swelling phenomenon due to the organic solvent can be reduced but also surface hardness, wear resistance, heat resistance, and the like can be improved. However, if the above range is exceeded, the surface energy is high, and the mold and the resin are not easily released. In addition, severe shrinkage that occurs during photoreaction results in undesirable mold patterns.
d) 실리콘계 화합물 d) silicone compounds
상기 d)의 실리콘계 화합물로는, 에폭시기, 아민기, 또는 불소기를 포함하는 실리콘계 화합물, 또는 불포화 실리콘계 화합물을 사용할 수 있다. 구체적인 예로는 (3-글리시드옥시프로필)트리메톡시 실란, (3-글리시드옥시프로필)트리에톡시실란, (3-글리시드옥시프로필)메틸다이메톡시실란, (3-글리시드옥시프로필)트리메톡시실란, (3-글리시드옥시프로필)다이메틸에톡시실란, (3-글리시드옥시프로필)다이메틸에톡시실란, 3-(메타아크릴옥시)프로필트리메톡시실란, 3,4-에폭시부틸트리메톡시실란, 3,4-에폭시부틸트리에톡시실란, 2-(3,4-에폭시시클로헥실)에틸트리메톡시실란, 2-(3,4-에폭시사이클로헥실)에틸트리에톡시실란, 아미노프로필트리메톡시실란, 페닐트리메톡시실란, 다이페닐다이메톡시실란, 비스-트리에톡시실릴프로필 테트라설파이드, 3-이소시아네이트프로필트리에톡시실란,3-유레이도프로필트리에톡시실란, 3-트리에톡시실릴-N-1,3-다이메틸부틸리덴프로필아민, N-페닐-3-아미노프로필트리메톡시실란, 트리플루오로프로필트리메톡시실란, 헥사메틸다이실라잔, 비닐트리에톡시실란, 비닐트리-t-부톡시실란, 비닐트리 아이소부톡시실란, 비닐트리아이소프로텐옥시실란, 또는 비닐트리페녹시실란, 머캡토프로필트리메톡시실란 등을 들 수 있으나, 이에 한정되지는 않는다. As the silicone compound of d), a silicone compound containing an epoxy group, an amine group, or a fluorine group, or an unsaturated silicone compound can be used. Specific examples include (3-glycidoxypropyl) trimethoxy silane, (3-glycidoxyoxy) triethoxysilane, (3-glycidoxypropyl) methyldimethoxysilane, (3-glycidoxyoxy) ) Trimethoxysilane, (3-glycidoxypropyl) dimethylethoxysilane, (3-glycidoxyoxy) dimethylethoxysilane, 3- (methacryloxy) propyltrimethoxysilane, 3,4 -Epoxybutyl trimethoxysilane, 3,4-epoxybutyltriethoxysilane, 2- (3,4-epoxycyclohexyl) ethyltrimethoxysilane, 2- (3,4-epoxycyclohexyl) ethyltrie Methoxysilane, aminopropyltrimethoxysilane, phenyltrimethoxysilane, diphenyldimethoxysilane, bis-triethoxysilylpropyl tetrasulfide, 3-isocyanatepropyltriethoxysilane, 3-ureidopropyltriethoxy Silane, 3-triethoxysilyl-N-1,3-dimethylbutylidenepropylamine, N-phenyl-3-aminopropyl Limethoxysilane, trifluoropropyltrimethoxysilane, hexamethyldisilazane, vinyltriethoxysilane, vinyltri-t-butoxysilane, vinyltri isobutoxysilane, vinyltriisoprotenoxysilane, or Vinyltriphenoxysilane, mercaptopropyltrimethoxysilane, and the like, but are not limited thereto.
상기 d) 실리콘계 화합물은 상기 성분 (1) 및 (2) 총 합계량 100 중량부에 대하여 70 중량부 이하, 바람직하게는 5-70 중량부, 보다 더 바람직하게는 5-50 중량부로 포함되는 것이 좋다. 상기 범위 내인 경우 희석제의 역할 뿐 아니라, 가교 밀도를 높여 유기용매에 의한 팽윤 및 부서짐 현상을 방지하고, 광반응에 의한 고분자 수축을 완화시켜주며, 미세패턴 형성시 이형성을 증가시킬 수 있다.The d) silicone compound may be included in an amount of 70 parts by weight or less, preferably 5-70 parts by weight, even more preferably 5-50 parts by weight, based on 100 parts by weight of the total amount of the components (1) and (2). . Within the above range, as well as the role of the diluent, by increasing the crosslinking density to prevent swelling and breakage phenomenon by the organic solvent, to mitigate the shrinkage of the polymer due to the photoreaction, it can increase the releasability when forming a fine pattern.
상기와 같은 (3)의 성분은 각 군에서 1 종 이상 선택된 것을 2군 이상을 혼합하여 포함할 수 있으며, 2종 이상을 혼합하여 사용하는 경우에도 합계 중량이 상기 성분 (1) 및 (2)의 총 합계량 100 중량부에 대하여 5-70 중량부인 것이 바람직하며, 보다 바람직하게는 5-50 중량부이다. 상기 성분 (3)의 함량이 70 중량부를 초과할 경우에는 기계적 강도 및 유연성이 떨어질 우려가 있다.Component (3) as described above may include a mixture of two or more selected from one or more selected from each group, even when used in combination of two or more of the total weight of the components (1) and (2) It is preferable that it is 5-70 weight part with respect to 100 weight part of total sum total, More preferably, it is 5-50 weight part. When the content of the component (3) exceeds 70 parts by weight, there is a fear that the mechanical strength and flexibility are lowered.
(4) 광개시제(4) photoinitiator
상기 광개시제(4)로는 Irgacure 369(이하, 시바스페셜티케미컬사제), Irgacure 651, Irgacure 907, Irgacure819, 다이페닐-(2,4,6-트리메틸벤조일)포스핀옥사이드, 메틸벤조일포르메이트, 에틸(2,4,6-트리메틸벤조일)페닐포스피네이트, 2,4-비스트리클로로메틸-6-p-메톡시스티릴-s-트리아진, 2-p-메톡시스티릴-4,6-비스트리클로로메틸-s-트리아진, 2,4-트리클로로메틸-6-트리아진, 2,4-트리클로로메틸-4-메틸나프틸-6-트리아진, 벤조페논, p-(다이에틸아미노)벤조페논, 2,2-다이클로로-4-페녹시아세토페논, 2,2-다이에톡시아세토페논, 2-도데실티오크산톤, 2,4-다이메틸티오크산톤, 2,4-다이에틸티오크산톤, 또는 2,2-비스-2-클로로페닐-4,5,4,5-테트라페닐-2-1,2-다이이미다졸 등을 단독으로 또는 2 종 이상 혼합하여 사용할 수 있다. As the photoinitiator (4), Irgacure 369 (hereinafter referred to as Shiva Specialty Chemical Co., Ltd.), Irgacure 651, Irgacure 907, Irgacure 819, diphenyl- (2,4,6-trimethylbenzoyl) phosphine oxide, methylbenzoyl formate, ethyl (2) , 4,6-trimethylbenzoyl) phenylphosphinate, 2,4-bistrichloromethyl-6-p-methoxystyryl-s-triazine, 2-p-methoxystyryl-4,6-bis Trichloromethyl-s-triazine, 2,4-trichloromethyl-6-triazine, 2,4-trichloromethyl-4-methylnaphthyl-6-triazine, benzophenone, p- (diethylamino ) Benzophenone, 2,2-dichloro-4-phenoxyacetophenone, 2,2-diethoxyacetophenone, 2-dodecyl thioxanthone, 2,4-dimethyl thioxanthone, 2,4-di Ethyl thioxanthone or 2,2-bis-2-chlorophenyl-4,5,4,5-tetraphenyl-2-1,2-diimidazole etc. can be used individually or in mixture of 2 or more types. .
상기 광개시제(4)는 상기 성분 (1), (2), 및 (3)의 총 합계량 100 중량부에 대하여 0.1-10 중량부로 포함되는 것이 바람직하며, 상기 범위 내인 경우 경화 후 제작된 수지 몰드의 투과도 및 보존안정성을 동시에 만족시킬 수 있다.The photoinitiator (4) is preferably included in an amount of 0.1-10 parts by weight based on 100 parts by weight of the total amount of the components (1), (2), and (3). Permeability and storage stability can be satisfied at the same time.
(5) 계면활성제(5) surfactant
상기와 같은 성분으로 이루어지는 본 발명에 따른 광경화형 수지 조성물은, 도포성을 향상시키고 원판몰드와 탈거시 이형성을 더욱 좋게 하기 위해 계면활성제를 더 포함할 수 있다.The photocurable resin composition according to the present invention comprising the above components may further include a surfactant in order to improve applicability and to further improve releasability when removing the original mold and stripping.
상기 계면활성제로는 폴리옥시에틸렌옥틸페닐에테르, 폴리옥시에틸렌노닐페닐에테르, F171(이하, 대일본잉크사제), F172, F173 FC430(이하, 쓰미또모트리엠사), FC431, KP341(신에쓰가가쿠고쿄사제) 등을 들 수 있으며, 그 함량은 상기 성분 (1), (2) 및 (3)의 총 합계량 100 중량부에 대하여 0.01-2 중량부로 포함되는 것이 바람직하다.Examples of the surfactant include polyoxyethylene octylphenyl ether, polyoxyethylene nonylphenyl ether, F171 (hereinafter referred to as Nippon Ink Co., Ltd.), F172, F173 FC430 (hereinafter referred to as Sumitomo Trim Corporation), FC431, KP341 (Shin-Etsu Chemical Co., Ltd. And the like, and the content thereof is preferably contained in an amount of 0.01-2 parts by weight based on 100 parts by weight of the total amount of the components (1), (2) and (3).
또한 본 발명은 상기의 광경화형 수지 조성물을 이용한 몰드의 제조방법 및 상기 방법에 의하여 제조된 몰드를 제공한다. In another aspect, the present invention provides a method for producing a mold using the photocurable resin composition and a mold prepared by the method.
본 발명에 따른 몰드의 제조방법은 패턴이 형성된 원판 몰드 일면에 상기 광경화형 수지 조성물을 도포하고 경화시켜 원판 몰드의 패턴이 전사된 경화 고분자 수지를 제조하는 단계, 및 상기 패턴이 전사된 경화 고분자 수지를 원판 몰드로부터 이형시키는 단계를 포함한다. The method of manufacturing a mold according to the present invention comprises applying a cured photocurable resin composition to one surface of a disk mold on which a pattern is formed and preparing a cured polymer resin to which the pattern of the disk mold is transferred, and the cured polymer resin to which the pattern is transferred. Releasing from the disc mold.
이하 첨부된 도 1을 참조하여 본 발명에 따른 몰드의 제조방법을 상세히 설명한다.Hereinafter, a method of manufacturing a mold according to the present invention will be described in detail with reference to FIG. 1.
도 1은 본 발명에 따른 몰드의 제조방법을 개략적으로 도시하는 단면도이다.1 is a cross-sectional view schematically showing a method for manufacturing a mold according to the present invention.
도 1을 참조하면, 먼저 제조하고자 하는 원판 몰드(101)의 패턴이 위로 향하도록 한 다음 본 발명에 따른 광경화형 수지 조성물(102a)을 도포한다(단계 S1). Referring to FIG. 1, first, the pattern of the disc mold 101 to be manufactured is turned upward, and then the photocurable resin composition 102a according to the present invention is applied (step S1).
이때, 상기 도포 공정은 스핀코팅, 슬릿 코팅 등의 방법으로 수행할 수 있으며, 원판 몰드에 5-60 ㎛의 두께가 되도록 광경화형 수지 조성물(102a)을 도포하는 것이 바람직하다.At this time, the coating process may be carried out by a method such as spin coating, slit coating, it is preferable to apply the photocurable resin composition 102a to a thickness of 5-60 ㎛ on the original mold.
원판 몰드(101)에 도포된 광경화형 수지 조성물(102a) 위에 배면 지지체(103)를 합착시킨 후, 질소 또는 대기 중 분위기에서 광조사하여 광경화형 수지 조성물(102a)을 경화시킨다(단계 S2).After bonding the back support 103 onto the photocurable resin composition 102a applied to the disc mold 101, the photocurable resin composition 102a is cured by irradiating with light in an atmosphere of nitrogen or air (step S2).
이때, 상기 배면 지지체(103)로는 500 ㎚ 파장의 광원에서 투과율이 적어도 85 % 이상인 투명 유리판(bare glass), ITO(indium tin oxide) 기판, COC(cyclic olefin copolymer), PAc(polyacrylate), PC(polycarbonate), PE(polyethylene), PEEK(polyetheretherketone), PEI(polyetherimide), PEN(polyethylenenaphthalate), PES(polyethersulfone), PET(polyethyleneterephtalate), PI(polyimide), PO(polyolefin), PMMA(polymethylmethacrylate), PSF(polysulfone), PVA(polyvinylalcohol), PVCi(polyvinylcinnamate), TAC(triacetylcellulose), 폴리실리콘(polysilicone), 폴리우레탄(polyurethane), 에폭시 수지(epoxy Resin) 등을 사용할 수 있다. 바람직하게는 상기 500 ㎚ 파장의 광원에서 투과율이 97-99.9 %인 것이 좋다.At this time, the back support 103 is a transparent glass plate (bare glass), ITO (indium tin oxide) substrate, COC (cyclic olefin copolymer), PAc (polyacrylate), PC ( polycarbonate, PE (polyethylene), PEEK (polyetheretherketone), PEI (polyetherimide), PEN (polyethylenenaphthalate), PES (polyethersulfone), PET (polyethyleneterephtalate), PI (polyimide), PO (polyolefin), PMMA (polymethylmethacrylate), PSF ( polysulfone, polyvinylalcohol (PVA), polyvinylcinnamate (PVC), triacetylcellulose (TAC), polysilicone (polysilicone), polyurethane (polyurethane), epoxy resin (epoxy Resin) and the like can be used. Preferably, the transmittance is 97-99.9% in the light source of 500 nm wavelength.
다음으로 배면 지지체(103)에 붙어있는, 원판몰드(101)의 패턴이 전사된 경화 고분자 수지(102b)를 원판몰드(101)로부터 이형시킨다(단계 S3).Next, the cured polymer resin 102b to which the pattern of the disc mold 101 transferred to the back support 103 is transferred is released from the disc mold 101 (step S3).
상기 이형된 경화 고분자 수지(102b)의 일면에는 원판몰드(101)로부터 전사된 패턴이 형성되어 있다. A pattern transferred from the disc mold 101 is formed on one surface of the release cured polymer resin 102b.
선택적으로 상기 패턴이 형성된 경화 고분자 수지(102b) 몰드를 에이징시킴으로써 성형 몰드(104)를 완성한다(단계 S4). Optionally, the molding mold 104 is completed by aging the mold having the patterned cured polymer resin 102b (step S4).
이때 에이징이란 패턴이 형성된 경화 고분자 수지 몰드의 표면을 자외선에 과다하게 노출시켜 몰드의 경도를 향상시키는 동시에 자외선에 대한 잔여 반응기를 완전 소멸시키거나, 열처리를 통하여 잔여 반응기를 소멸시킴과 동시에 표면 평도 및 지지체와의 접착력을 더욱 향상시키는 과정을 의미한다. 여기서 에이징 단계는 몰드의 표면을 자외선에 과다하게 노출시켜 몰드의 경도를 향상시키는 공정이 바람직하며, 노광과 열처리중 한 가지를 선택하여 실시하거나 또는 둘 모두를 단계적으로 진행할 수 있다. In this case, aging means that the surface of the cured polymer resin mold on which the pattern is formed is excessively exposed to ultraviolet rays to improve the hardness of the mold and to completely extinguish the remaining reactors against ultraviolet rays or to extinguish the remaining reactors through heat treatment and at the same time, the surface flatness. And it means a process for further improving the adhesion with the support. Here, the aging step is preferably a process of improving the hardness of the mold by excessively exposing the surface of the mold to ultraviolet rays, may be carried out by selecting one of the exposure and heat treatment, or both may be carried out step by step.
상기와 같이 본 발명에 따른 방법에 의해 높은 완성도를 갖는 몰드를 제조할 수 있다. As described above, a mold having a high degree of completeness can be produced by the method according to the present invention.
또한 본 발명의 광경화형 수지 조성물을 이용하여 제조된 상기 몰드를 이용하여 반도체, 디스플레이를 포함하는 각종 전자 디바이스 산업 공정에 필요한 미세 패턴을 안정적이고 용이하게 형성할 수 있다.In addition, by using the mold manufactured using the photocurable resin composition of the present invention, it is possible to stably and easily form fine patterns required for various electronic device industrial processes including semiconductors and displays.
또한 상기 몰드를 이용한 임프린트 리소그래피 공정이, 종래 미세 패턴 형성을 위한 포토 리소그래피 공정을 대체함으로써 기존 포토리소그래피 공정의 노광, 현상, 세정 등의 여러 단계를 단순화 할 수 있을 뿐만 아니라, 제조 공정 시간(tact time)을 단축하여, 제조원가를 절감하고 생산성을 향상시킬 수 있다.In addition, the imprint lithography process using the mold replaces the conventional photolithography process for forming a fine pattern, thereby simplifying various steps such as exposure, development, and cleaning of the existing photolithography process, as well as manufacturing time (tact time). ), The manufacturing cost can be reduced and the productivity can be improved.
이하, 본 발명의 이해를 돕기 위하여 바람직한 실시예를 제시하나, 하기 실시예는 본 발명을 예시하는 것일 뿐 본 발명의 범위가 하기 실시예에 한정되는 것은 아니다.Hereinafter, preferred examples are provided to help understanding of the present invention, but the following examples are merely to illustrate the present invention, and the scope of the present invention is not limited to the following examples.
[실시예 1]Example 1
광경화형 불소계 우레탄 아크릴레이트 40 중량%, 2-퍼플루오로옥틸에틸 메타아크릴레이트 40 중량% 및 3-퍼플로오로부틸-2-하이드록시프로필 (메타)아크릴레이트 20 중량%의 올리고머 100 중량부에 대하여, 페닐에폭시 아크릴레이트 10 중량부, 다이에틸렌글리콜 다이메타크릴레이트 20 중량부 및 메타아크릴레이트 프로필트리메톡시실란 30 중량부를 혼합한 혼합물 40중량부, 광개시제로서 에틸(2,4,6-트리메틸벤조일)페닐포스피네이트 1 중량부와 메틸벤조일포르메이트 0.5 중량부, 및 계면활성제로 KP341(신에쓰가가쿠고교사제) 0.01 중량부를 투입하고 상온에서 300-400 rpm으로 20 시간 동안 균일하게 교반하여 투명한 액상의 고분자 수지 용액(102a)을 제조하였다.To 100 parts by weight of oligomer of 40% by weight of the photocurable fluorine-based urethane acrylate, 40% by weight of 2-perfluorooctylethyl methacrylate and 20% by weight of 3-perfluorobutyl-2-hydroxypropyl (meth) acrylate 40 parts by weight of a mixture of 10 parts by weight of phenylepoxy acrylate, 20 parts by weight of diethylene glycol dimethacrylate and 30 parts by weight of methacrylate propyltrimethoxysilane, and ethyl (2,4,6-trimethyl as a photoinitiator. 1 part by weight of benzoyl) phenylphosphinate, 0.5 part by weight of methyl benzoyl formate, and 0.01 part by weight of KP341 (manufactured by Shin-Etsu Chemical Co., Ltd.) as a surfactant, and stirred at 300-400 rpm at room temperature for 20 hours. A transparent liquid polymer resin solution 102a was prepared.
그 다음, 도 1에 나타난 바와 같이, 원판 몰드(101)의 패턴이 위로 향하도록 하고, 상기 제조한 광경화형 수지 조성물(102a)을 그 두께가 30 ㎛가 되도록 슬릿 코팅하였다. 광경화형 수지 조성물이 도포된 원판 몰드 위로 배면 지지체(103)를 합착한 후 질소 분위기에서 자외선을 조사하여 경화시키고, 원판 몰드(101)의 패턴이 전사된 경화 고분자 수지(102b)가 붙어있는 배면 지지체(103)를 원판몰드(101)로부터 이형하였다. 상기 점착된 경화 고분자 수지(102b)의 완전 경화를 위해 자외선을 과조사하였다. 또한 배면 지지체(103)의 완전한 접착을 위해 100 ℃의 컨벤션 오븐(convection oven)에 넣어 추가적으로 1 시간 동안 열을 가하여 최종 고분자 수지 몰드(104)를 완성하였다.Then, as shown in FIG. 1, the pattern of the disc mold 101 was turned upward, and the photocurable resin composition 102a prepared above was slit-coated so that the thickness was 30 micrometers. The back support 103 is bonded onto the disc mold to which the photocurable resin composition is applied, and then irradiated with ultraviolet rays in a nitrogen atmosphere to cure, and the back support on which the cured polymer resin 102b to which the pattern of the disc mold 101 is transferred is attached. (103) was released from the disc mold (101). Ultraviolet rays were irradiated for complete curing of the adhesive cured polymer resin 102b. In addition, in order to completely adhere the back support 103, it was put in a convention oven at 100 ° C. and heated for an additional hour to complete the final polymer resin mold 104.
[실시예 2]Example 2
상기 실시예 1에서 성분 (2)의 다작용성 자유 라디칼 중합성 화합물로서 2-퍼플루오로옥틸에틸 메타아크릴레이트를 60 중량% 사용한 것을 제외하고는, 상기 실시예 1과 동일한 방법으로 실시하여 고분자 수지 몰드를 제조하였다.Polymer resin was carried out in the same manner as in Example 1, except that 60% by weight of 2-perfluorooctylethyl methacrylate was used as the multifunctional free radically polymerizable compound of component (2) in Example 1 Mold was prepared.
[실시예 3]Example 3
상기 실시예 1에서 성분 (2)의 다작용성 자유 라디칼 중합성 화합물로서 불소계 아크릴레이트 중합체인 EGC-1700(Fluorochemical acrylate polymer, 3M사제) 30 중량% 및 2-퍼플루오로옥틸에틸 메타아크릴레이트 30 중량%를 사용한 것을 제외하고는, 상기 실시예 1과 동일한 방법으로 실시하여 고분자 수지 몰드를 제조하였다.30 wt% of EGC-1700 (Fluorochemical acrylate polymer, manufactured by 3M), a fluorine acrylate polymer, and 30 wt% of 2-perfluorooctylethyl methacrylate as the multifunctional free-radically polymerizable compound of component (2) in Example 1 A polymer resin mold was prepared in the same manner as in Example 1, except that% was used.
[실시예 4]Example 4
상기 실시예 1에서 페닐에폭시 아크릴레이트와 다이에틸렌글리콜 다이메타크릴레이트를 각각 30 중량부 및 50 중량부로 사용한 것을 제외하고는 상기 실시예 1과 동일한 방법으로 실시하여 고분자 수지 몰드를 제조하였다.A polymer resin mold was prepared in the same manner as in Example 1, except that 30 parts by weight and 50 parts by weight of phenylepoxy acrylate and diethylene glycol dimethacrylate were used in Example 1, respectively.
[실시예 5]Example 5
상기 실시예 1에서 실리콘계 화합물로서 메타아크릴레이트 프로필트리메톡시실란 20 중량부 및 트리플루오로프로필 트리메톡시실란 20 중량부를 사용한 것을 제외하고는 상기 실시예 1과 동일한 방법으로 실시하여 고분자 수지 몰드를 제조하였다.A polymer resin mold was prepared in the same manner as in Example 1, except that 20 parts by weight of methacrylate propyltrimethoxysilane and 20 parts by weight of trifluoropropyl trimethoxysilane were used as the silicon compound in Example 1. Prepared.
[비교예 1]Comparative Example 1
상기 실시예 1에서 불소계 우레탄 아크릴레이트를 100 중량% 단독으로 사용하여 광경화형 수지 조성물을 제조한 것을 제외하고는 상기 실시예 1과 동일한 방법으로 실시하여 고분자 수지 몰드를 제조하였다. A polymer resin mold was prepared in the same manner as in Example 1, except that the photocurable resin composition was manufactured by using 100 wt% of fluorine-based urethane acrylate alone in Example 1.
[비교예 2]Comparative Example 2
상기 실시예 1에서 불소계 우레탄 아크릴레이트를 100 중량% 사용하고, 성분 (2)의 다작용성 자유 라디칼 중합성 화합물을 사용하지 않은 것을 제외하고는 상기 실시예 1과 동일한 방법으로 실시하여 고분자 수지 몰드를 제조하였다.A polymer resin mold was prepared in the same manner as in Example 1, except that 100 wt% of the fluorine-based urethane acrylate was used in Example 1, and the polyfunctional free radical polymerizable compound of Component (2) was not used. Prepared.
[비교예 3]Comparative Example 3
상기 실시예 1에서 제조한 광경화형 수지 조성물 대신에 종래 고분자 수지 몰드의 재료인 PDMS(다우코닝(Dow-Corning)사제, sylgard(R) 184 silicone elastomer kit)를 상기 실시예 1과 같이 원판몰드(101)에 100 ㎛ 두께로 도포하고 60 ℃의 오븐에서 180 분 동안 소성시켜 경화한 후, 원판몰드로부터 경화된 수지를 이형하여 고분자 수지 몰드를 제조하였다.Instead of the photocurable resin composition prepared in Example 1, PDMS (Dow-Corning, sylgard (R) 184 silicone elastomer kit), which is a material of a conventional polymer resin mold, was prepared in the same manner as in Example 1 101) was applied to a thickness of 100 μm and cured by baking in an oven at 60 ° C. for 180 minutes, and then the cured resin was released from the disc mold to prepare a polymer resin mold.
[시험예 1] [Test Example 1]
상기 실시예 1 내지 5, 및 비교예 1 내지 3에서 제조한 고분자 수지 몰드를 이용하여 하기와 같은 방법으로 지지체와의 접착력, 투과율, 표면 에너지, 이형성 및 내화학성을 측정하고, 그 결과를 하기 표 1에 나타내었다.Using the polymer resin molds prepared in Examples 1 to 5 and Comparative Examples 1 to 3, the adhesion to the support, the transmittance, the surface energy, the releasability and the chemical resistance were measured, and the results are shown in the following table. 1 is shown.
가) 접착력 : 상기 실시예 1 내지 5, 및 비교예 1 내지 3에서 제조한 최종 고분자 수지 몰드의 도막 표면을 일정한 간격으로 100개의 셀(Cell)로 나누고, 3M사 610 테이프를 붙인 다음 천천히 떼어냈을 때 남아있는 칸 수를 세어 %로 나타내었다.A) Adhesive force: The coating film surfaces of the final polymer resin molds prepared in Examples 1 to 5 and Comparative Examples 1 to 3 were divided into 100 cells at regular intervals, and then slowly peeled off after attaching 3M 610 tape. When counting the remaining cells, expressed as%.
나) 투과율 : 상기 실시예 1 내지 5, 및 비교예 1 내지 3에서 제조한 고분자 수지 몰드에 대하여 가시광선의 광흡수 스펙트럼(spectrum)을 측정하고, 400 ㎚에 있어서 광선 투과율을 측정하여 기재하였다.B) Transmittance: The light absorption spectrum of visible light was measured for the polymer resin molds prepared in Examples 1 to 5 and Comparative Examples 1 to 3, and the light transmittance was measured and described at 400 nm.
다) 표면 에너지 : 상기 실시예 1 내지 5, 및 비교예 1 내지 3에서 제조한 고분자 수지 몰드의 표면에서의 물과 헥사테칸에 대한 접촉각(contact angle)을 KRUSS사의 DSA100으로 각각 5회 측정하고 산출된 표면 에너지(mJ/m2)의 평균값을 기재하였다.C) Surface energy: The contact angles of water and hexadecane on the surfaces of the polymer resin molds prepared in Examples 1 to 5 and Comparative Examples 1 to 3 were measured and calculated five times with DSA100 of KRUSS, respectively. The average value of the surface energy (mJ / m 2 ) obtained is described.
라) 이형성 : 상기 실시예 1 내지 5, 및 비교예 1 내지 3에서 제조한 고분자 수지 몰드에 적량의 광경화제가 배합된 일반 상용화 아크릴계 수지를 전면에 도포한 후 폴리에틸렌테레프탈레이트(PET) 필름을 덮어 질소분위기하에서 자외선 램프로 완전히 경화시키고, 고분자 수지 몰드에서 경화된 아크릴계 수지가 접착되어 있는 PET 필름의 한쪽 말단을 인스트로사의 5560 만능시험기를 이용해 수지몰드와 직각으로 이형하였다.D) Releasability: After applying a commercially available acrylic resin containing a suitable amount of a photocuring agent to the polymer resin molds prepared in Examples 1 to 5 and Comparative Examples 1 to 3 on the entire surface, cover the polyethylene terephthalate (PET) film One end of the PET film to which the cured acrylic resin was completely cured with an ultraviolet lamp under a nitrogen atmosphere, and the cured acrylic resin in the polymer resin mold was released at right angles to the resin mold using an Instro 5560 universal testing machine.
이때 일정하게 가해지는 힘의 평균이 70 mN 미만이면 ○, 70-100 mN이면 △, 100 mN 초과이면 X로 나타내었다.At this time, if the average of the force constantly applied is less than 70 mN, it is represented by ○, 70-100 mN, △, X is greater than 100 mN.
마) 내화학성 : 아세톤에 상기 실시예 1 내지 5, 및 비교예 1 내지 3에서 제조한 고분자 수지 몰드를 완전히 침적하고 7 일을 방치한 후 수지 몰드의 중량변화를 측정하였다. E) Chemical resistance: After the polymer resin molds prepared in Examples 1 to 5 and Comparative Examples 1 to 3 were completely deposited on acetone and left for 7 days, the weight change of the resin mold was measured.
초기 대비 중량의 변화비가 0-3 %인 경우 우수, 3-5 %인 경우 양호, 5 % 이상인 경우 불량으로 나타내었다. When the ratio of weight change to initial stage is 0-3%, it is excellent, when 3-5% is good, and when 5% or more, it is indicated as bad.
표 1
접착력(%) 투과율(%) 표면 에너지 (mJ/m2) 이형성 내화학성
실시예 1 100 96.3 20.95 우수
실시예 2 90 96.8 23.43 우수
실시예 3 95 95.7 19.92 양호
실시예 4 100 97.1 27.79 우수
실시예 5 100 97.2 18.61 우수
비교예 1 0 93.8 19.42 - 양호
비교예 2 100 97.5 35.71 우수
비교예 3 100 99.1 20.59 불량
Table 1
Adhesion (%) Transmittance (%) Surface energy (mJ / m 2 ) Dysplasia Chemical resistance
Example 1 100 96.3 20.95 Great
Example 2 90 96.8 23.43 Great
Example 3 95 95.7 19.92 Good
Example 4 100 97.1 27.79 Great
Example 5 100 97.2 18.61 Great
Comparative Example 1 0 93.8 19.42 - Good
Comparative Example 2 100 97.5 35.71 Great
Comparative Example 3 100 99.1 20.59 Bad
상기 표 1에 나타난 바와 같이, 광경화형 불소계 화합물 단독을 사용한 비교예 1의 몰드의 경우 지지체와의 접착력이 전혀 없었으며, 비교예 2에서와 같이 성분 (2)의 다작용성 자유 라디칼 중합성 화합물을 사용하지 않은 경우 표면 에너지가 상승하여 이형성이 현저히 감소하였다. 또한 종래 몰드 재료로 제조된 비교예 3의 몰드는 접착력, 투과율, 표면 에너지 특성 및 이형성은 우수한 반면, 내화학성은 현저히 떨어졌다. 이에 반해 본 발명에 따른 광경화형 수지 조성물에 의해 제조된 실시예 1 내지 5의 몰드는 접착력, 투과율, 표면 에너지 특성, 이형성 및 내화학성 면에서 모두 우수한 효과를 나타내었다. 특히 실란계 화합물 첨가시 불소계 실란을 추가 첨가하여 전체적인 불소 함량을 높인 실시예 5의 경우 기본 특성을 유지하면서도 더욱 감소된 표면 에너지를 나타내었다.As shown in Table 1, in the mold of Comparative Example 1 using the photocurable fluorine-based compound alone, there was no adhesive force with the support, and as in Comparative Example 2, the multifunctional free radically polymerizable compound of Component (2) When not used, surface energy increased and the releasability was markedly reduced. In addition, the mold of Comparative Example 3 made of a conventional mold material was excellent in adhesion, transmittance, surface energy characteristics and releasability, while the chemical resistance was remarkably inferior. On the contrary, the molds of Examples 1 to 5 prepared by the photocurable resin composition according to the present invention showed excellent effects in terms of adhesion, transmittance, surface energy properties, mold release properties, and chemical resistance. In particular, Example 5, in which the fluorine-based silane was added to increase the overall fluorine content when the silane compound was added, further reduced surface energy while maintaining basic properties.
[시험예 2][Test Example 2]
다양한 모양의 원판 몰드를 이용하는 것을 제외하고는 상기 실시예 1에서와 동일한 방법으로 실시하여 고분자 수지 몰드를 제조하였다. 제조된 몰드를 주사 전자 현미경을 이용하여 관찰하고, 그 결과를 도 2a-도 2d에 나타내었다. A polymer resin mold was prepared in the same manner as in Example 1, except that a disc mold having various shapes was used. The prepared mold was observed using a scanning electron microscope, and the results are shown in FIGS. 2A-2D.
도 2a는 간격 2 μm, 너비 2 μm, 높이 1.5 μm의 홀 모양의 원판 몰드를 이용하여 제조한 도트(dot) 모양의 패턴 몰드에 대한 전자 현미경 관찰 사진이다. 도 2b는 간격 200 nm, 너비 700 nm의 홀 모양의 원판 몰드를 이용하여 제조한 도트 모양의 패턴 몰드에 대한 전자 현미경 관찰 사진이다. 도 2c는 선폭이 300 nm 내지 500 nm의 다양한 나노미터 크기와 서로 상이한 불규칙한 모양을 갖는 원판 몰드를 이용하여 제조한 패턴 형성용 몰드에 대한 전자 현미경 관찰 사진이다. 도 2d는 550 nm의 선이 100 nm 간격으로 형성되어 있는 원판 몰드를 이용하여 제조한 패턴 형성용 몰드에 대한 전자 현미경 관찰 사진이다.FIG. 2A is an electron microscope photograph of a dot-shaped pattern mold manufactured using a hole-shaped disk mold having a thickness of 2 μm, a width of 2 μm, and a height of 1.5 μm. 2B is an electron microscope photograph of a dot-shaped pattern mold manufactured using a hole-shaped disk mold having a gap of 200 nm and a width of 700 nm. FIG. 2C is an electron micrograph of a pattern forming mold manufactured using a disc mold having various nanometer sizes having a line width of 300 nm to 500 nm and irregular shapes different from each other. FIG. 2D is an electron micrograph of a pattern forming mold manufactured using a disc mold in which 550 nm lines are formed at 100 nm intervals.
이와 같은 실험결과로부터 본 발명에 따른 임프린트 리소그래피용 광경화형 수지 조성물은 불소계 화합물의 첨가로 인해 낮은 표면 에너지와 낮은 점도를 나타내기 때문에, 다양한 모양과 크기의 패턴 형성용 몰드의 제조가 가능했으며, 특히 나노미터 수준의 미세패턴도 용이하게 형성가능함을 알 수 있다. From the above experimental results, since the photocurable resin composition for imprint lithography according to the present invention exhibits low surface energy and low viscosity due to the addition of fluorine-based compounds, it was possible to manufacture molds for pattern formation of various shapes and sizes. It can be seen that the nanometer level micropattern can be easily formed.
본 발명에 따르면, 기존 포토 리소그래피 공정의 여러 단계를 단순화 할 수 있을 뿐만 아니라, 제조 시간을 단축하여 제조원가를 절감하고 생산성을 향상시킬 수 있다.According to the present invention, not only can the various steps of the existing photolithography process be simplified, but also the manufacturing time can be shortened to reduce manufacturing cost and improve productivity.
본 발명에 따른 광경화형 수지 조성물은 유기용매에 대해 비팽윤 특성을 가지며, 큰 기계적 특성, 높은 복원력과 투과율을 가져 반도체, 디스플레이 등을 포함하는 각종 전자 디바이스 산업 공정에 필요한 미세 패턴을 안정적이고 용이하게 형성할 수 있다.The photocurable resin composition according to the present invention has a non-swelling property with respect to an organic solvent, and has a large mechanical property, a high restoring force and a transmittance, so that a fine pattern necessary for various electronic device industrial processes including semiconductors and displays can be stably and easily Can be formed.
또한 본 발명에 따른 광경화형 수지 조성물은 추가적인 표면처리 여부와 상관없이, 패턴 형성을 위한 열경화 또는 광경화 수지와의 젖음성 및 이형성이 우수할 뿐만 아니라, 동시에 몰드 형성 기판과 몰드사이에 뛰어난 접착력을 나타낸다.In addition, the photocurable resin composition according to the present invention has excellent wettability and releasability with the thermosetting or photocuring resin for pattern formation, regardless of whether or not additional surface treatment, and at the same time provides excellent adhesion between the mold-forming substrate and the mold. Indicates.
본 발명에 따른 광경화형 수지 조성물은 불소계 단량체, 중합체 또는 이들의 혼합물을 포함함으로써, 기존 임프린트 몰드에 사용되는 고분자 수지 조성물들에 비해 현격히 낮은 점도를 가짐으로써 미세패턴을 용이하게 형성할 수 있으며, 높은 완성도를 갖는 몰드를 제조할 수 있다.The photocurable resin composition according to the present invention includes a fluorine-based monomer, a polymer, or a mixture thereof, thereby having a significantly lower viscosity than the polymer resin compositions used in the conventional imprint mold, thereby easily forming a micropattern. Molds with completeness can be prepared.

Claims (15)

  1. (1) 광경화형 불소계 고분자 또는 올리고머 ;(1) photocurable fluorine-based polymers or oligomers;
    (2) 불소를 포함한 적어도 하나의 다작용성 자유 라디칼 중합성 화합물; (2) at least one multifunctional free radically polymerizable compound including fluorine;
    (3) a) 올레핀계 불포화 화합물, b) 에폭시기를 포함하는 불포화 화합물, c) 에테르기 또는 글리콜기를 포함하는 불포화 화합물, 및 d) 에폭시기, 아민기, 또는 불소기를 포함하는 실리콘계 화합물, 또는 불포화 실리콘계 화합물로 이루어진 군으로부터 선택된 1종 이상의 화합물; 및(3) a) an olefinically unsaturated compound, b) an unsaturated compound containing an epoxy group, c) an unsaturated compound containing an ether group or a glycol group, and d) a silicone compound containing an epoxy group, an amine group, or a fluorine group, or an unsaturated silicone type At least one compound selected from the group consisting of compounds; And
    (4) 광개시제(4) photoinitiator
    를 포함하는 임프린트 리소그래피용 광경화형 수지 조성물.Photocurable resin composition for imprint lithography comprising a.
  2. 제1항에 있어서,The method of claim 1,
    상기 광경화형 수지 조성물은,The photocurable resin composition,
    (1) 광경화형 불소계 고분자 또는 올리고머 20-80 중량%;(1) 20-80 wt% of a photocurable fluorine-based polymer or oligomer;
    (2) 불소를 포함한 적어도 하나의 다작용성 자유 라디칼 중합성 화합물 20-80 중량%;(2) 20-80% by weight of at least one multifunctional free radically polymerizable compound including fluorine;
    (3) 상기 성분 (1) 및 (2)의 총 합계량 100 중량부에 대하여, a) 올레핀계 불포화 화합물, b) 에폭시기를 포함하는 불포화 화합물, c) 에테르기 또는 글리콜기를 포함하는 불포화 화합물, 및 d) 에폭시기, 아민기, 또는 불소기를 포함하는 실리콘계 화합물, 또는 불포화 실리콘계 화합물로 이루어진 군으로부터 선택된 1종 이상의 화합물 5-70 중량부, 및(3) 100 parts by weight of the total amount of the components (1) and (2), a) an olefinically unsaturated compound, b) an unsaturated compound containing an epoxy group, c) an unsaturated compound containing an ether group or a glycol group, and d) 5-70 parts by weight of at least one compound selected from the group consisting of a silicone compound containing an epoxy group, an amine group, or a fluorine group, or an unsaturated silicone compound, and
    (4) 상기 성분 (1), (2) 및 (3)의 총 합계량 100 중량부에 대하여 광개시제 0.1-10 중량부(4) 0.1-10 parts by weight of photoinitiator based on 100 parts by weight of the total amount of components (1), (2) and (3)
    를 포함하는 것을 특징으로 하는 임프린트 리소그래피용 광경화형 수지 조성물.Photocurable resin composition for imprint lithography comprising a.
  3. 제1항에 있어서,The method of claim 1,
    상기 (1) 광경화형 불소계 고분자 또는 올리고머가, 우레탄 (메타)아크릴레이트, 에스테르 (메타)아크릴레이트, 에테르 (메타)아크릴레이트, 에폭시 (메타)아크릴레이트, 카보네이트 (메타)아크릴레이트, 이들의 혼합물 및 공중합체로 이루어진 군에서 선택되는 것을 특징으로 하는 임프린트 리소그래피용 광경화형 수지 조성물.Said (1) photocurable fluorine-type polymer or oligomer is urethane (meth) acrylate, ester (meth) acrylate, ether (meth) acrylate, epoxy (meth) acrylate, carbonate (meth) acrylate, and mixtures thereof And a photocurable resin composition for imprint lithography, characterized in that selected from the group consisting of copolymers.
  4. 제1항에 있어서,The method of claim 1,
    상기 (2) 불소를 포함한 적어도 하나의 다작용성 자유 라디칼 중합성 화합물이 하기 화학식 1로 표시되는 화합물인 것을 특징으로 하는 임프린트 리소그래피용 광경화형 수지 조성물:The photocurable resin composition for imprint lithography, wherein the at least one multifunctional free radical polymerizable compound including (2) fluorine is a compound represented by the following general formula (1):
    [화학식 1][Formula 1]
    (Rf)-[(T)-(RA)d]e (R f )-[(T)-(R A ) d ] e
    상기 식에서, Where
    Rf는 (퍼)플루오로기이고, R f is a (per) fluoro group,
    T는 알킬렌, 아릴렌, 헤테로알킬렌, 카르보닐, 에스테르, 아미드, 설폰 아미드, 및 이들의 조합으로 이루어진 군에서 선택된 2가의 기이며, T is a divalent group selected from the group consisting of alkylene, arylene, heteroalkylene, carbonyl, ester, amide, sulfon amide, and combinations thereof,
    RA는 선택적으로 불소화된 (메타)아크릴기, -SH, 아릴기, 및 비닐기로 이루어진 군에서 선택되는 자유 라디칼 중합성 기이며, R A is a free radically polymerizable group selected from the group consisting of a optionally fluorinated (meth) acryl group, -SH, an aryl group, and a vinyl group,
    d는 1-6의 정수이고, d is an integer from 1-6,
    e는 1 또는 2의 정수이다. e is an integer of 1 or 2.
  5. 제1항에 있어서,The method of claim 1,
    상기 (2) 불소를 포함한 적어도 하나의 다작용성 자유 라디칼 중합성 화합물이 3,000 이상의 중량평균 분자량을 갖는 것을 특징으로 하는 임프린트 리소그래피용 광경화형 수지 조성물.The photocurable resin composition for imprint lithography, wherein the at least one multifunctional free radically polymerizable compound including (2) fluorine has a weight average molecular weight of 3,000 or more.
  6. 제1항에 있어서,The method of claim 1,
    상기 (3) 성분이, 상기 성분 (1) 및 (2)의 총 합계량 100 중량부에 대하여 The component (3) is based on 100 parts by weight of the total amount of the components (1) and (2).
    a) 올레핀계 불포화 화합물 5-70 중량부a) 5-70 parts by weight of olefinically unsaturated compound
    b) 에폭시기를 포함하는 불포화 화합물 5-70 중량부b) 5-70 parts by weight of an unsaturated compound containing an epoxy group
    c) 에테르기 또는 글리콜기를 포함하는 불포화 화합물 5-70 중량부, 및c) 5-70 parts by weight of an unsaturated compound comprising an ether group or a glycol group, and
    d) 에폭시기, 아민기 또는 불소기를 포함하는 실리콘계 화합물 또는 불포화 실리콘계 화합물 5-70 중량부로 이루어진 군에서 1종 이상 선택되는 것을 특징으로 하는 임프린트 리소그래피용 광경화형 수지 조성물.d) Photo-curable resin composition for imprint lithography, characterized in that at least one selected from the group consisting of 5-70 parts by weight of a silicone compound or an unsaturated silicone compound containing an epoxy group, an amine group or a fluorine group.
  7. 제1항에 있어서,The method of claim 1,
    상기 a) 올레핀계 불포화 화합물이 메틸메타크릴레이트, 에틸메타크릴레이트, n-부틸메타크릴레이트, 2-프로필헵틸아크릴레이트, sec-부틸메타크릴레이트, tert-부틸메타크릴레이트, 메틸아크릴레이트, 이소프로필아크릴레이트, 사이클로헥실메타크릴레이트, 2-메틸시클로헥실메타크릴레이트, 다이사이클로펜테닐아크릴레이트, 다이사이클로펜타닐아크릴레이트, 다이사이클로펜테닐메타크릴레이트, 다이사이클로펜타닐메타크릴레이트, 1-아다만틸 아크릴레이트, 1-아다만틸 메타크릴레이트, 다이사이클로펜타닐옥시에틸메타크릴레이트, 이소보로닐메타크릴레이트, 다이사이클로헥실아크릴레이트, 2-메틸시클로헥실아크릴레이트, 다이사이클로펜타닐옥시에틸아크릴레이트, 이소보로닐아크릴레이트, 페닐메타크릴레이트, 페닐아크릴레이트, 벤질아크릴레이트, 2-하이드록시에틸메타크릴레이트, 및 1,6-헥산다이올다이아크릴레이트로 이루어진 군에서 1종 이상 선택되는 것을 특징으로 하는 임프린트 리소그래피용 광경화형 수지 조성물.A) the olefinically unsaturated compound is methyl methacrylate, ethyl methacrylate, n-butyl methacrylate, 2-propylheptyl acrylate, sec-butyl methacrylate, tert-butyl methacrylate, methyl acrylate, Isopropyl acrylate, cyclohexyl methacrylate, 2-methylcyclohexyl methacrylate, dicyclopentenyl acrylate, dicyclopentanyl acrylate, dicyclopentenyl methacrylate, dicyclopentanyl methacrylate, 1- Adamantyl acrylate, 1-adamantyl methacrylate, dicyclopentanyloxyethyl methacrylate, isoboroyl methacrylate, dicyclohexyl acrylate, 2-methylcyclohexyl acrylate, dicyclopentanyloxy Ethyl acrylate, Isoboroyl acrylate, Phenyl methacrylate, Phenyl acrylate, Benzyl Relate, 2-hydroxyethyl methacrylate, and 1,6-hexane diol sight for imprint lithography, characterized in that the at least one selected from the group consisting of diacrylate photosetting resin composition.
  8. 제1항에 있어서,The method of claim 1,
    상기 b) 에폭시기를 포함하는 불포화 화합물이, 1개 이상의 반응성 관능기를 가진 페닐 에폭시 (메타)아크릴레이트 올리고머, 비스페놀A 에폭시 다이(메타)아크릴레이트 올리고머, 지방족 알킬 에폭시 다이(메타)아크릴레이트 올리고머, 및 지방족 알킬 에폭시 트리(메타)아크릴레이트 올리고머로 이루어진 군에서 1종 이상 선택되는 것을 특징으로 하는 임프린트 리소그래피용 광경화형 수지 조성물.B) an unsaturated compound comprising an epoxy group, a phenyl epoxy (meth) acrylate oligomer having at least one reactive functional group, a bisphenol A epoxy di (meth) acrylate oligomer, an aliphatic alkyl epoxy di (meth) acrylate oligomer, and Photocurable resin composition for imprint lithography, characterized in that at least one selected from the group consisting of aliphatic alkyl epoxy tri (meth) acrylate oligomers.
  9. 제1항에 있어서,The method of claim 1,
    상기 c) 에테르기 또는 글리콜기를 포함하는 불포화 화합물이, 페놀에틸렌글리콜 (메타)아크릴레이트, 다이에틸렌글리콜 다이메타크릴레이트, 에틸렌글리콜 다이아크릴레이트, 폴리에틸렌글리콜 200 다이메타크릴레이트, 1,6-헥산다이올에틸렌글리콜, 네오펜틸글리콜 다이아크릴레이트, 에틸렌글리콜페닐에테르 (메타)아크릴레이트, 에틸렌글리콜메틸에테르 (메타)아크릴레이트, 2-하이드록시에테르 (메타)아크릴레이트, 트리에틸렌글리콜 다이비닐에테르, 1,4-사이클로헥산다이메탄올 다이비닐에테르 다이아크릴레이트, 1,3-부틸렌글리콜 다이아크릴레이트, 다이에틸렌글리콜 다이아크릴레이트, 네오펜틸글리콜 하이드록시피발레이트 다이아크릴레이트, 네오펜틸글리콜 다이아크릴레이트, 테트라에틸렌글리콜 다이아크릴레이트 및 다이프로필렌글리콜 다이아크릴레이트로 이루어진 군에서 1종 이상 선택되는 것을 특징으로 하는 임프린트 리소그래피용 광경화형 수지 조성물.C) The unsaturated compound containing an ether group or a glycol group is phenol ethylene glycol (meth) acrylate, diethylene glycol dimethacrylate, ethylene glycol diacrylate, polyethyleneglycol 200 dimethacrylate, 1,6-hexane Diol ethylene glycol, neopentyl glycol diacrylate, ethylene glycol phenyl ether (meth) acrylate, ethylene glycol methyl ether (meth) acrylate, 2-hydroxyether (meth) acrylate, triethylene glycol divinyl ether, 1,4-cyclohexanedimethanol divinyl ether diacrylate, 1,3-butylene glycol diacrylate, diethylene glycol diacrylate, neopentyl glycol hydroxy pivalate diacrylate, neopentyl glycol diacrylate , Tetraethylene glycol diacrylate and dipropylene article Call sight for imprint lithography, characterized in that the at least one selected from the group consisting of diacrylate photosetting resin composition.
  10. 제1항에 있어서,The method of claim 1,
    상기 d) 에폭시기, 아민기 또는 불소기를 포함하는 실리콘계 화합물 또는 불포화 실리콘계 화합물이, (3-글리시드옥시프로필)트리메톡시 실란, (3-글리시드옥시프로필)트리에톡시실란, (3-글리시드옥시프로필)메틸다이메톡시실란, (3-글리시드옥시프로필)트리메톡시실란, (3-글리시드옥시프로필)다이메틸에톡시실란, (3-글리시드옥시프로필)다이메틸에톡시실란, 3-(메타아크릴옥시)프로필트리메톡시실란, 3,4-에폭시부틸트리메톡시실란, 3,4-에폭시부틸트리에톡시실란, 2-(3,4-에폭시시클로헥실)에틸트리메톡시실란, 2-(3,4-에폭시사이클로헥실)에틸트리에톡시실란, 아미노프로필트리메톡시실란, 페닐트리메톡시실란, 다이페닐다이메톡시실란, 비스-트리에톡시실릴프로필 테트라설파이드, 3-이소시아네이트프로필트리에톡시실란,3-유레이도프로필트리에톡시실란, 3-트리에톡시실릴-N-1,3-다이메틸부틸리덴프로필아민, N-페닐-3-아미노프로필트리메톡시실란, 트리플루오로프로필트리메톡시실란, 헥사메틸다이실라잔, 비닐트리에톡시실란, 비닐트리-t-부톡시실란, 비닐트리 아이소부톡시실란, 비닐트리아이소프로텐옥시실란, 및 비닐트리페녹시실란, 머캡토프로필트리메톡시실란으로 이루어진 군에서 1종 이상 선택되는 것을 특징으로 하는 임프린트 리소그래피용 광경화형 수지 조성물.The said d) silicone type compound or unsaturated silicone type compound containing an epoxy group, an amine group, or a fluorine group is (3-glycidoxy propyl) trimethoxy silane, (3-glycidoxy propyl) triethoxysilane, (3-gly Seedoxypropyl) methyldimethoxysilane, (3-glycidoxypropyl) trimethoxysilane, (3-glycidoxypropyl) dimethylethoxysilane, (3-glycidoxypropyl) dimethylethoxysilane , 3- (methacryloxy) propyltrimethoxysilane, 3,4-epoxybutyltrimethoxysilane, 3,4-epoxybutyltriethoxysilane, 2- (3,4-epoxycyclohexyl) ethyltrimeth Methoxysilane, 2- (3,4-epoxycyclohexyl) ethyltriethoxysilane, aminopropyltrimethoxysilane, phenyltrimethoxysilane, diphenyldimethoxysilane, bis-triethoxysilylpropyl tetrasulfide, 3-isocyanatepropyltriethoxysilane, 3-ureidopropyltriethoxy Silane, 3-triethoxysilyl-N-1,3-dimethylbutylidenepropylamine, N-phenyl-3-aminopropyltrimethoxysilane, trifluoropropyltrimethoxysilane, hexamethyldisilazane , Vinyltriethoxysilane, vinyltri-t-butoxysilane, vinyltri isobutoxysilane, vinyltriisoprotenoxysilane, and vinyltriphenoxysilane, mercaptopropyltrimethoxysilane in the group consisting of 1 Photo-curable resin composition for imprint lithography, characterized in that at least one species is selected.
  11. 제1항에 있어서,The method of claim 1,
    상기 (4) 광개시제가 다이페닐-(2,4,6-트리메틸벤조일)포스핀옥사이드, 메틸벤조일포르메이트, 에틸(2,4,6-트리메틸벤조일)페닐포스피네이트, 2,4-비스트리클로로메틸-6-p-메톡시스티릴-s-트리아진, 2-p-메톡시스티릴-4,6-비스트리클로로메틸-s-트리아진, 2,4-트리클로로메틸-6-트리아진, 2,4-트리클로로메틸-4-메틸나프틸-6-트리아진, 벤조페논, p-(다이에틸아미노)벤조페논, 2,2-다이클로로-4-페녹시아세토페논, 2,2-다이에톡시아세토페논, 2-도데실티오크산톤, 2,4-다이메틸티오크산톤, 2,4-다이에틸티오크산톤, 및 2,2-비스-2-클로로페닐-4,5,4,5-테트라페닐-2-1,2-다이이미다졸로 이루어진 군에서 1종 이상 선택되는 것을 특징으로 하는 임프린트 리소그래피용 광경화형 수지 조성물.Said (4) photoinitiator is diphenyl- (2,4,6-trimethylbenzoyl) phosphine oxide, methylbenzoyl formate, ethyl (2,4,6-trimethylbenzoyl) phenylphosphinate, 2,4-bistrichloro Romethyl-6-p-methoxystyryl-s-triazine, 2-p-methoxystyryl-4,6-bistrichloromethyl-s-triazine, 2,4-trichloromethyl-6- Triazine, 2,4-trichloromethyl-4-methylnaphthyl-6-triazine, benzophenone, p- (diethylamino) benzophenone, 2,2-dichloro-4-phenoxyacetophenone, 2 , 2-diethoxyacetophenone, 2-dodecyl thioxanthone, 2,4-dimethyl thioxanthone, 2,4-diethyl thioxanthone, and 2,2-bis-2-chlorophenyl-4, Photocurable resin composition for imprint lithography, characterized in that at least one member is selected from the group consisting of 5,4,5-tetraphenyl-2-1,2-diimidazole.
  12. 제1항에 있어서,The method of claim 1,
    상기 수지 조성물이 폴리우레탄 (메타)아크릴레이트, 폴리에스테르 (메타)아크릴레이트, 폴리에테르 (메타)아크릴레이트, 폴리에폭시 (메타)아크릴레이트 및 폴리카보네이트 (메타)아크릴레이트로 이루어진 군에서 1종 이상 선택된 고분자를 더 포함하는 것을 특징으로 하는 임프린트 리소그래피용 광경화형 수지 조성물.The resin composition is at least one member of the group consisting of polyurethane (meth) acrylate, polyester (meth) acrylate, polyether (meth) acrylate, polyepoxy (meth) acrylate and polycarbonate (meth) acrylate. A photocurable resin composition for imprint lithography, further comprising a selected polymer.
  13. 제1항에 있어서,The method of claim 1,
    상기 수지 조성물이 폴리옥시에틸렌옥틸페닐에테르, 폴리옥시에틸렌노닐페닐에테르 및 이들의 혼합물로 이루어진 군에서 선택되는 계면활성제를 포함하는 것을 특징으로 하는 임프린트 리소그래피용 광경화형 수지 조성물.The photocurable resin composition for imprint lithography, wherein the resin composition comprises a surfactant selected from the group consisting of polyoxyethylene octylphenyl ether, polyoxyethylene nonylphenyl ether, and mixtures thereof.
  14. 패턴이 형성된 원판 몰드 일면에 제1항에 따른 광경화형 수지 조성물을 도포하고 경화시켜 원판 몰드의 패턴이 전사된 경화 고분자 수지를 제조하는 단계, 및 Preparing a cured polymer resin to which the pattern of the disc mold is transferred by applying and curing the photocurable resin composition according to claim 1 on one surface of the disc mold on which the pattern is formed, and
    상기 패턴이 전사된 경화 고분자 수지를 원판 몰드로부터 이형시키는 단계Releasing the cured polymer resin to which the pattern was transferred from a disc mold
    를 포함하는 임프린트 몰드의 제조방법.Method of manufacturing an imprint mold comprising a.
  15. 제14항에 따른 제조방법에 의해 제조된 임프린트 몰드.An imprint mold manufactured by the manufacturing method according to claim 14.
PCT/KR2010/005035 2009-08-07 2010-07-30 Photocurable resin composition for imprint lithography and method for manufacturing an imprint mold using same WO2011016651A2 (en)

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105103329A (en) * 2013-09-30 2015-11-25 株式会社Lg化学 Method for manufacturing organic electronic device
US9619741B1 (en) 2011-11-21 2017-04-11 Dynamics Inc. Systems and methods for synchronization mechanisms for magnetic cards and devices
EP4160312A1 (en) * 2021-10-04 2023-04-05 Joanneum Research Forschungsgesellschaft mbH Elastic embossing lacquer having high optical dispersion

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2013154112A1 (en) 2012-04-10 2013-10-17 ダイキン工業株式会社 Resin mold material composition for imprinting
WO2013154582A1 (en) * 2012-04-13 2013-10-17 Nanogriptech, Llc Method of molding simple or complex micro and/or nanopatterned features on both planar or non-planar molded objects and surfaces and the molded objects produced using same
CN104932197B (en) * 2015-05-26 2020-01-17 南方科技大学 Expansion polymerization imprinting adhesive for nanoimprint
KR102206859B1 (en) * 2015-09-23 2021-01-22 코오롱인더스트리 주식회사 Composition for overcoat layer and organic light emitting diode comprising the same
KR20180014287A (en) 2016-07-28 2018-02-08 삼성디스플레이 주식회사 Method for preparing patterned cured product

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040059013A1 (en) * 2000-01-14 2004-03-25 Takayoshi Tanabe Photocurable resin composition and optical parts
KR20050073017A (en) * 2004-01-08 2005-07-13 삼성전자주식회사 Pdms elastomer stamp and method of forming minute pattern using the same
US20050160934A1 (en) * 2004-01-23 2005-07-28 Molecular Imprints, Inc. Materials and methods for imprint lithography
EP1808447A1 (en) * 2006-01-12 2007-07-18 Hitachi Chemical Co., Ltd. Photocurable resin composition and a method for forming a pattern
WO2008091114A1 (en) * 2007-01-24 2008-07-31 Samsung Electronics Co., Ltd. Photo-curable composition having inherently excellent releasing property and pattern transfer property, method for transferring pattern using the composition and light recording medium having polymer pattern layer produced using the composition
KR20090084340A (en) * 2008-02-01 2009-08-05 주식회사 동진쎄미켐 Photocurable resin composition and method for preparing of mold using the same
US20090256287A1 (en) * 2008-04-09 2009-10-15 Peng-Fei Fu UV Curable Silsesquioxane Resins For Nanoprint Lithography
KR20090131648A (en) * 2008-06-18 2009-12-29 후지필름 가부시키가이샤 Curable composition for nanoimprint and patterning method

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040059013A1 (en) * 2000-01-14 2004-03-25 Takayoshi Tanabe Photocurable resin composition and optical parts
KR20050073017A (en) * 2004-01-08 2005-07-13 삼성전자주식회사 Pdms elastomer stamp and method of forming minute pattern using the same
US20050160934A1 (en) * 2004-01-23 2005-07-28 Molecular Imprints, Inc. Materials and methods for imprint lithography
EP1808447A1 (en) * 2006-01-12 2007-07-18 Hitachi Chemical Co., Ltd. Photocurable resin composition and a method for forming a pattern
WO2008091114A1 (en) * 2007-01-24 2008-07-31 Samsung Electronics Co., Ltd. Photo-curable composition having inherently excellent releasing property and pattern transfer property, method for transferring pattern using the composition and light recording medium having polymer pattern layer produced using the composition
KR20090084340A (en) * 2008-02-01 2009-08-05 주식회사 동진쎄미켐 Photocurable resin composition and method for preparing of mold using the same
US20090256287A1 (en) * 2008-04-09 2009-10-15 Peng-Fei Fu UV Curable Silsesquioxane Resins For Nanoprint Lithography
KR20090131648A (en) * 2008-06-18 2009-12-29 후지필름 가부시키가이샤 Curable composition for nanoimprint and patterning method

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9619741B1 (en) 2011-11-21 2017-04-11 Dynamics Inc. Systems and methods for synchronization mechanisms for magnetic cards and devices
CN105103329A (en) * 2013-09-30 2015-11-25 株式会社Lg化学 Method for manufacturing organic electronic device
EP4160312A1 (en) * 2021-10-04 2023-04-05 Joanneum Research Forschungsgesellschaft mbH Elastic embossing lacquer having high optical dispersion

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