WO2011008937A2 - Conductive heating - Google Patents
Conductive heating Download PDFInfo
- Publication number
- WO2011008937A2 WO2011008937A2 PCT/US2010/042111 US2010042111W WO2011008937A2 WO 2011008937 A2 WO2011008937 A2 WO 2011008937A2 US 2010042111 W US2010042111 W US 2010042111W WO 2011008937 A2 WO2011008937 A2 WO 2011008937A2
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- storage device
- test
- test slot
- assembly
- transporter
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B33/00—Constructional parts, details or accessories not provided for in the other groups of this subclass
- G11B33/12—Disposition of constructional parts in the apparatus, e.g. of power supply, of modules
- G11B33/125—Disposition of constructional parts in the apparatus, e.g. of power supply, of modules the apparatus comprising a plurality of recording/reproducing devices, e.g. modular arrangements, arrays of disc drives
- G11B33/127—Mounting arrangements of constructional parts onto a chassis
- G11B33/128—Mounting arrangements of constructional parts onto a chassis of the plurality of recording/reproducing devices, e.g. disk drives, onto a chassis
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G01R31/2608—Circuits therefor for testing bipolar transistors
- G01R31/2619—Circuits therefor for testing bipolar transistors for measuring thermal properties thereof
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B33/00—Constructional parts, details or accessories not provided for in the other groups of this subclass
- G11B33/14—Reducing influence of physical parameters, e.g. temperature change, moisture, dust
- G11B33/1406—Reducing the influence of the temperature
- G11B33/144—Reducing the influence of the temperature by detection, control, regulation of the temperature
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67248—Temperature monitoring
Definitions
- This disclosure relates to the heating of storage devices during testing.
- Disk drive manufacturers typically test manufactured disk drives for compliance with a collection of requirements. Test equipment and techniques exist for testing large numbers of disk drives serially or in parallel. Manufacturers tend to test large numbers of disk drives simultaneously. Disk drive testing systems typically include one or more racks having multiple test slots that receive disk drives for testing.
- the temperature of the storage devices e.g., to ensure that the storage devices are functional over a predetermined temperature range. For this reason, the testing environment immediately around the storage devices is regulated. Minimum temperature fluctuations in the testing environment can be critical for accurate test conditions and for safety of the storage devices. In some known testing systems, the temperature of plural disk drive devices is adjusted by using cooling or heating air which is common to all of the disk drive devices.
- a storage device transporter for transporting a storage device and for mounting a storage device within a test slot.
- the storage device transporter includes a frame that is configured to receive and support a storage device.
- the storage device transporter also includes a conductive heating assembly that is associated with the frame. The conductive heating assembly is arranged to heat a storage device supported by the frame by way of thermal conduction.
- a test slot assembly in another aspect, includes a storage device transporter and a test slot.
- the storage device transporter includes a frame that is configured to receive and support a storage device, and a conductive heating assembly.
- the conductive heating assembly is associated with the frame and is arranged to heat a storage device supported by the frame by way of thermal conduction.
- the test slot includes a test compartment for receiving and supporting the storage device transporter.
- a storage device testing system includes a storage device transporter, a test slot, and test electronics.
- the storage device transporter includes a frame configured to receive and support a storage device, and a conductive heating assembly.
- the conductive heating assembly is associated with the frame and is arranged to heat a storage device supported by the frame by way of thermal conduction.
- the test slot includes a test compartment for receiving and supporting the storage device transporter, and a connection interface board.
- the test electronics are configured to communicate one or more test routines to a storage device disposed within the test compartment.
- the connection interface board is configured to provide electrical communication between the conductive heating assembly and the test electronics when the storage device transporter is disposed within the test compartment.
- a method includes testing functionality of a storage device; and heating the storage device via thermal conduction during the testing.
- Embodiments of the disclosed methods, systems and devices may include one or more of the following features.
- a clamping mechanism is operatively associated with the frame.
- the clamping mechanism is operable to move the conductive heating assembly into contact with a storage device supported by the frame.
- the clamping mechanism can be configured to clamp the storage device transporter within the test compartment of the test slot.
- the conductive heating assembly can include one or more electric heating elements (e.g., resistive heaters).
- the conductive heating assembly can include printed circuitry (e.g., a printed wiring board, flexible printed circuitry, etc.).
- the printed circuitry can include one or more electrically conductive layers.
- the one or more electric heating elements can be integrated in the one or more electrically conductive layers.
- the storage device transporter can also include a temperature sensor (e.g., a thermocouple).
- the temperature sensor can be arranged to contact a storage device supported by the frame for measuring a temperature of the storage device.
- a clamping mechanism is operative Iy associated with the frame. The clamping mechanism is operable to move the conductive heating assembly and the temperature sensor into contact with a storage device supported by the frame.
- the conductive heating assembly can include one or more electric heating elements (e.g., resistive heaters) and contact terminals in electrical
- test slot can include a connection interface circuit and electrically conductive contacts (e.g., spring contacts, pogo pins, etc.) in electrical communication with the connection interface circuit.
- electrically conductive contacts can be arranged to engage the contact terminals of the conductive heating assembly when the storage device transporter is disposed within the test compartment.
- the conductive heating assembly can include one or more electric heating elements (e.g., resistive heaters) and a first blind mate connector in electrical communication with the one or more electric heating elements
- the test slot can include a connection interface circuit and a second blind mate connector in electrical communication with the connection interface circuit.
- the second blind mate connector can be arranged to engage the first blind mate connector when the storage device transporter is disposed within the test compartment.
- the test electronics can be configured to control a current flow to the conductive heating assembly.
- the storage device transporter include a temperature sensor (e.g., a thermocouple) and the connection interface board is configured to provide electrical communication between a temperature sensor and the test electronics when the storage device transporter is disposed within the test compartment, and the test electronics are configured to control a current flow to the conductive heating assembly based, at least in part, on signals received from the temperature sensor.
- a temperature sensor e.g., a thermocouple
- a separate temperature sensor could be provided on the connection interface board that could serve as the control point. It is also possible to have a temperature sensing device that is attached to a ground line that connects to the storage device that correlates to the temperature of the storage device.
- Methods can include heating the storage device with a resistive heater. Methods can also include contacting the storage device with the resistive heater. In some cases, contacting the storage device with the resistive heater can include actuating a clamping mechanism to move the resistive heater into contact with the storage device.
- Methods can also include inserting a storage device transporter, supporting a storage device, into a test slot.
- Heating the storage device can include heating the storage device by way of thermal conduction while the storage device transporter and the supported storage device are disposed within the test slot.
- a test slot assembly for housing a storage device during testing.
- the test slot assembly includes a housing that receives and supports the storage device, and provides a controlled environment for regulating the storage device temperature during testing.
- the test slot assembly also includes a conductive heating assembly that is associated with the housing.
- the conductive heating assembly is arranged to heat a storage device contained by the housing by way of thermal conduction.
- a storage device transporter is provided for transporting a storage device and for mounting a storage device within a test slot.
- the storage device transporter includes a frame that is configured to receive and support a storage device.
- the test slot assembly includes a test compartment for receiving and supporting the storage device transporter.
- a storage device testing system includes a test slot and test electronics.
- the test slot includes a test compartment configured to receive a storage device and a conductive heating assembly.
- the conductive heating assembly is associated with the test compartment and is arranged to heat a storage device contained by the test compartment by way of thermal conduction.
- the test electronics are configured to communicate one or more test routines to a storage device disposed within the test compartment.
- test slot of a storage device testing system is configured to accept and mount a storage device supported by a storage device transporter.
- the storage device transporter includes a frame that is configured to receive and support a storage device.
- a method includes testing functionality of a storage device; and heating the storage device via thermal conduction during the testing.
- Embodiments of the disclosed methods, systems and devices may include one or more of the following features.
- a clamping mechanism is operatively associated with the test slot.
- the clamping mechanism is operable to move the conductive heating assembly into contact with a storage device.
- the clamping mechanism can be configured to clamp the storage device within the test compartment of the test slot.
- a clamping mechanism is operatively associated with the test slot.
- the clamping mechanism can be configured to clamp the storage device and a storage device transporter within the test compartment of the test slot.
- the clamping mechanism is operable to move the conductive heating assembly into contact with a storage device while it is supported by the storage device transporter.
- the conductive heating assembly can include one or more electric heating elements (e.g., resistive heaters).
- the conductive heating assembly can include printed circuitry (e.g., a printed wiring board, flexible printed circuitry, etc.).
- the printed circuitry can include one or more electrically conductive layers.
- the one or more electric heating elements can be integrated in the one or more electrically conductive layers.
- the test slot assembly can also include a temperature sensor (e.g., a thermosensor), e.g., a thermosensor, or a thermosensor.
- thermocouple The temperature sensor can be arranged to measure a temperature of the storage device.
- a clamping mechanism is operatively associated with the test slot. The clamping mechanism is operable to move the conductive heating assembly and the temperature sensor into contact with a storage device supported.
- the conductive heating assembly can include one or more electric heating elements (e.g., resistive heaters), and the test slot can include a connection interface circuit in electrical communication with the connection interface circuit.
- connection interface board can be configured to provide electrical communication with the test electronics, and the test electronics can be configured to control a current flow to the conductive heating assembly.
- the connection interface board can be configured to control a current flow to the conductive heating assembly.
- the test slot assembly includes a temperature sensor (e.g., a thermocouple) and the connection interface board is configured to provide electrical communication between a temperature sensor and the test electronics, and the connection interface board is configured to control a current flow to the conductive heating assembly based, at least in part, on signals received from the temperature sensor.
- a separate temperature sensor could be provided on the connection interface board that could serve as the control point.
- test electronics are configured to measure a power draw of the storage device and compensate for any error between an actual temperature of the storage device and a temperature measured by the temperature sensor.
- connection interface board provides electrical communication with the conductive heating assembly when the storage device is disposed within the test compartment.
- Methods can include heating the storage device with a resistive heater. Methods can also include contacting the storage device with the resistive heater. In some cases, contacting the storage device with the resistive heater can include actuating a clamping mechanism to move the resistive heater into contact with the storage device.
- Methods can also include inserting a storage device into a test slot. Heating the storage device can include heating the storage device by way of thermal conduction while the supported storage device is disposed within the test slot.
- Methods can also include inserting a storage device transporter, supporting a storage device, into a test slot.
- Heating the storage device can include heating the storage device by way of thermal conduction while the storage device transporter and the supported storage device are disposed within the test slot.
- Methods can also include inserting a storage device into a test compartment of a test slot and engaging a clamping mechanism to both clamp the storage device within the test compartment of the test slot and move a conductive heating assembly into physical contact with the storage device.
- Embodiments can include one or more of the following advantages.
- Conductive heating can be provided between a test slot assembly and a storage device supported therein. Conductive heating can be more efficient than known convective heating methods, and thus, can help to reduce energy consumption.
- Conductive heating can be executed without, or with limited/reduced use of, moving parts, such as blowers or fans which are often employed for convective heating, and thus, can help to limit the generation of vibrations.
- FIG. 1 is a perspective view of a storage device testing system.
- FIG. 2 is a perspective view of a test slot assembly.
- FIGS. 3 A and 3B are schematic views of self-test and functional test circuitry.
- FIG. 4 is a perspective view of a transfer station.
- FIG. 5 is a perspective view of a tote and storage device.
- FIG. 6A is a top view of a storage device testing system.
- FIG. 6B is a perspective view of a storage device testing system.
- FIG. 7 is an exploded perspective view of a storage device transporter.
- FIG. 8 is a perspective view of a clamping mechanism.
- FIGS. 9A and 9B are perspective views of a spring clamp.
- FIG. 10 is a perspective view of a pair of actuators.
- FIGS. HA and HB are perspective views of a storage device transporter frame.
- FIG. 12 is a perspective view of a conductive heating assembly.
- FIG. 13 is a plan view of a pair of printed wiring boards from the conductive heating assembly of FIG. 12.
- FIG. 14 is a perspective view of a pair of spring plates.
- FIG. 15A is side view of a storage device transporter.
- FIG. 15B is a cross-sectional view of the storage device transporter of FIG. 15A taken along line 15B-15B.
- FIG. 15C is a detailed view from FIG. 15B.
- FIG. 15D is a cross-sectional view of the storage device transporter of FIG. 15A taken along line 15D-15D.
- FIG. 16A is a sectioned plan view a storage device transporter with spring clamps in an engaged position.
- FIG. 16B is a detailed view from FIG. 16 A.
- FIG. 16C is a sectioned front view a storage device transporter with a conductive heating assembly in an engaged position.
- FIGS. 17A and 17B are perspective and plan views of a storage device transporter supporting a storage device.
- FIG. 18 is a plan view of a storage device transported clamped to a storage device.
- FIG. 19 is a perspective view of a test slot.
- FIG. 20 is a perspective view of a connection interface board.
- FIG. 21 is a perspective view of a test compartment from the test slot of FIG. 19 (with the front cover removed).
- FIG. 22A is a plan view showing a storage device transporter, supporting a storage device, inserted in a test slot.
- FIG. 22B is a detailed view from FIG. 22A.
- FIG. 23 is a plan view of a flexible printed circuit with integrated resistive heaters.
- FIG. 24 is a perspective view of a conductive heating assembly with the flexible printed circuit of FIG. 23.
- FIG. 25 is a perspective view of a conductive heating assembly with the flexible printed circuit of FIG. 23 mounted to a transporter frame (shown in hidden lines).
- FIG. 26 is a perspective view of a storage device transporter, supporting a storage device, aligned for connection with a device interface board.
- FIG. 27 is a perspective view of a storage device transporter, supporting a storage device, aligned for connection (via blind mating connectors) with a device interface board.
- FIG. 28 is a plan view of a pair of printed wiring boards with integrated resistive heaters and thermocouples.
- FIG. 29 is a perspective view of a temperature sensing assembly with a compliant material on exposed surfaces of printed wiring boards.
- FIG. 3OA is a perspective view of a test slot assembly.
- FIG. 3OB is a perspective view of a test slot assembly and a storage device.
- FIGS. 31A and 3 IB are schematic views of self-test and functional test circuitry.
- FIG. 32A is a top view of a storage device testing system.
- FIG. 32B is a perspective view of a storage device testing system.
- FIG. 33 is a perspective view of a test slot.
- FIG. 34 is a perspective view of a connection interface board.
- FIG. 35 A is an exploded perspective view of a test slot.
- FIG. 35B is a perspective view of a test slot.
- FIG. 36 is a perspective view of a clamping mechanism.
- FIG. 37 is a perspective view of a pair of actuators.
- FIG. 38 is a perspective view of a conductive heating assembly.
- FIG. 39 is a plan view of a pair of printed wiring boards from the conductive heating assembly of FIG. 38.
- FIG. 40 is a plan view showing a storage device inserted in a test slot.
- FIG. 41 is a plan view of a flexible printed circuit with integrated resistive heaters.
- FIG. 42 is a perspective view of a conductive heating assembly with the flexible printed circuit of FIG. 41.
- FIG. 43 is a plan view of a pair of printed wiring boards with integrated resistive heaters and thermocouples.
- FIG. 44 is a perspective view of a temperature sensing assembly with a compliant material on exposed surfaces of printed wiring boards.
- a storage device testing system 10 includes a plurality of test racks 100 (e.g., 10 test racks shown), a loading station 200, and a robot 300. Each test rack 100 holds a plurality of test slot assemblies 120. As shown in FIG. 2, each test slot assembly 120 includes a storage device transporter 400 and a test slot 500.
- the storage device transporter 400 is used for capturing storage devices 600 (FIG. 5) (e.g., from the loading station) and for transporting the storage devices 600 to one of the test slots 500 for testing.
- a storage device includes disk drives, solid state drives, memory devices, and any device that requires asynchronous testing for validation.
- a disk drive is generally a non- volatile storage device which stores digitally encoded data on rapidly rotating platters with magnetic surfaces.
- a solid-state drive (SSD) is a data storage device that uses solid-state memory to store persistent data.
- An SSD using SRAM or DRAM (instead of flash memory) is often called a RAM-drive.
- the term solid-state generally distinguishes solid-state electronics from electromechanical devices.
- the storage device testing system 10 also includes at least one computer 130 in communication with the test slots 500.
- the computer 130 may be configured to provide inventory control of the storage devices 600 and/or an automation interface to control the storage device testing system 10.
- test electronics 160 are in communication with each test slot 500.
- the test electronics 160 are configured to communicate with a disk dive 600 received within the test slot 500.
- the test electronics 160 execute test algorithms and monitor the status (e.g., temperature) of storage devices under test.
- a power system 170 supplies power to the storage device testing system 10.
- the power system 170 may monitor and/or regulate power to the received storage device 600 in the test slot 500.
- the test electronics 160 within each test rack 100 include at least one self-testing system 180 in communication with at least one test slot 500.
- the self-testing system 180 tests whether the test rack 100 and/or specific sub-systems, such as the test slot 500, are functioning properly.
- the self-testing system 180 includes a cluster controller 181, one or more connection interface circuits 182 each in electrical communication with a storage device (SD) 600 received within the test slot 500, and one or more block interface circuits 183 in electrical communication with the connection interface circuit 182.
- SD storage device
- the cluster controller 181 in some examples, is configured to run one or more testing programs with a capacity of approximately 120 self-tests and/or 60 functionality test of storage devices 600.
- the connection interface circuits 182 and the block interface circuit(s) 183 are configured to self-test.
- the self-testing system 180 may include a self-test circuit 184 configured to execute and control a self-testing routine on one or more components of the storage device testing system 10.
- the cluster controller 181 may communicate with the self-test circuit 184 via Ethernet (e.g. Gigabit Ethernet), which may communicate with the block interface circuit(s) 183 and onto the connection interface circuit(s) 182 and storage device(s) 600 via universal asynchronous
- UART receiver/transmitter serial links.
- a UART is usually an individual (or part of an) integrated circuit used for serial communications over a computer or peripheral device serial port.
- the block interface circuit(s) 183 is/are configured to control power to and temperature of the test slots 500, and each block interface circuit 183 may control one or more test slots 500 and/or storage devices 600.
- the test electronics 160 can also include at least one functional testing system 190 in communication with at least one test slot 500.
- the functional testing system 190 tests whether a received storage device 600, held and/or supported in the test slot 500 by the storage device transporter 400, is functioning properly.
- a functionality test may include testing the amount of power received by the storage device 600, the operating temperature, the ability to read and write data, and the ability to read and write data at different temperatures (e.g. read while hot and write while cold, or vice versa).
- the functionality test may test every memory sector of the storage device 600 or only random samplings.
- the functionality test may test an operating temperature of the storage device 600 and also the data integrity of communications with the storage device 600.
- the functional testing system 190 includes a cluster controller 181 and at least one functional interface circuit 191 in electrical communication with the cluster controller 181.
- a connection interface circuit 182 is in electrical communication with a storage device 600 received within the test slot 500 and the functional interface circuit 191.
- the functional interface circuit 191 is configured to communicate a functional test routine to the storage device 600.
- the functional testing system 190 may include a communication switch 192 (e.g. Gigabit Ethernet) to provide electrical communication between the cluster controller 181 and the one or more functional interface circuits 191.
- the computer 130, communication switch 192, cluster controller 181, and functional interface circuit 191 communicate on an Ethernet network. However, other forms of communication may be used.
- the functional interface circuit 191 may communicate to the connection interface circuit 182 via Parallel AT Attachment (a hard disk interface also known as IDE, ATA, ATAPI, UDMA and PATA), SATA, or SAS (Serial Attached SCSI).
- Parallel AT Attachment a hard disk interface also known as IDE, ATA, ATA
- the transfer station 200 includes a transfer station housing 210 and multiple tote presentation support systems 220 disposed on the transfer station housing 210.
- Each tote presentation support system 220 is configured to receive and support a storage device tote 260 in a presentation position for servicing by the storage device testing system 10.
- the tote presentation support systems 220 are each disposed on the same side of the transfer station housing 210 and arranged vertically with respect to each other. Each tote presentation support system 220 has a different elevation with respect to the others. In some examples, as shown in FIG. 4, the tote presentation support system 220 includes tote support arms 226 configured to be received by respective arm grooves 266 (FIG. 5) defined by the storage device tote 260.
- a tote mover 230 is disposed on the transfer station housing 210 and is configured to move relative thereto.
- the tote mover 230 is configured to transfer the totes 260 between the tote presentation support systems 220 for servicing by the storage device testing system 10 (e.g. by the robot 300 (FIG. I)) and a staging area 250 where the totes 260 can be loaded into and unloaded from the transfer station 200 (e.g., by an operator).
- the totes 260 include a tote body 262 which defines multiple storage device receptacles 264 (e.g., 18 shown) that are each configured to house a storage device 600.
- Each of the storage device receptacles 264 includes a storage device support 265 configured to support a central portion of a received storage device 600 to allow manipulation of the storage device 600 along non-central portions (e.g., along side, front and/or back edges of the storage device).
- the tote body 262 also defines arm grooves 266 that are configured to engage the tote support arms 226 (FIG. 4) of the transfer station housing 210 thereby to support the tote 260 (e.g., for servicing by the robot 300 (FIG. I)).
- the robot 300 includes a robotic arm 310 and a manipulator 312 (FIG. 6A) disposed at a distal end of the robotic arm 310.
- the robotic arm 310 defines a first axis 314 (FIG. 6B) normal to a floor surface 316 and is operable to rotate through a predetermined arc about and extends radially from the first axis 314 within a robot operating area 318.
- the robotic arm 310 is configured to independently service each test slot 500 by transferring storage devices 600 between the totes 260 at the transfer station 200 and the test racks 100.
- the robotic arm 310 is configured to remove a storage device transporter 400 from one of the test slots 500 with the manipulator 312, then pick up a storage device 600 from one the storage device receptacles 264 at the transfer station 200 with the storage device transporter 400, and then return the storage device transporter 400, with a storage device 600 therein, to the test slot 500 for testing of the storage device 600.
- the robotic arm 310 retrieves the storage device transporter 400, along with the supported storage device 600, from one of the test slots 500 and returns it to one of the storage device receptacles 264 at the transfer station 200 (or moves it to another one of the test slots 500) by manipulation of the storage device transporter 400 (i.e., with the manipulator 312).
- the storage device transporter 400 includes a frame 410, a clamping mechanism 450, and a conductive heating assembly 490.
- the conductive heating assembly allows a storage device supported by the frame to be heated by way of thermal conduction.
- the clamping mechanism 450 includes a pair of clamping assemblies 452 each including an actuator 454 and a pair of spring clamps (i.e., proximal and distal spring clamps 456a, 456b).
- the spring clamps 456a, 456b include a base portion 458 and first and second spring arms 460a, 460b each having a proximal end 462 connected to the base portion 458 and a displaceable distal end 464.
- the spring clamps 456a, 456b can be formed from sheet metal, e.g., stainless steel.
- the spring arms 460a, 460b define a narrow region 466, a broad region 468 and a pair of edges 470 therebetween.
- the first spring arm 460a includes a first engagement member 472 having a damper 474.
- the damper 474 can be formed from, e.g., thermoplastics, thermosets, etc.
- the second spring arm 460b includes a second engagement member 476 which defines a protuberance 478.
- Each of the spring clamps 456a, 456b also includes a pair of mounting tabs 480 that extends outwardly from the base portion 458.
- the mounting tabs 480 help to keep the spring clamps 456a, 456b in position within sidewalls 418 (FIGS. 1 IA and HB) of the frame 410.
- the spring clamps 456a, 456b are mounted to the frame 410 and are operatively associated with the actuators 454 (e.g., for clamping a storage device 600 within the frame and/or for clamping the frame within one of the test slots 500).
- each of the actuators 454 includes inner and outer surfaces 481a, 481b which define actuating features.
- the actuating features include wedges 482 and recesses 483.
- the actuators 454 also define openings 484 which extend between the inner and outer surfaces 481a, 481b.
- the actuators 454 include actuator sockets 486 which are configured to be engageable with the manipulator 312 (FIG. 6A) for controlling movement of the actuators 454 relative to the frame 410.
- the frame 410 includes a face plate 412. Along a first surface 414, the face plate 412 defines an indentation 416.
- the indentation 416 can be releaseably engaged by the manipulator 312 (FIG. 6A) of the robotic arm 310, which allows the robotic arm 310 to grab and move the storage device transporter 400.
- the face plate 412 also includes beveled edges 417 (FIG. 1 IB). When the storage device transporter 400 is inserted into one of the test slots 500, the beveled edges 417 of the face plate 412 abut complimentary beveled edges 515 (FIG.
- the frame 410 also includes a pair of sidewalls 418, which extend outwardly from a second surface 420 of the face plate 412, and a base plate 422 that extends between and connects the sidewalls 418.
- the sidewalls 418 and the base plate 422 together define a substantially U-shaped opening, which allows the storage device transporter 400 to be used to capture a storage device 600 off of the storage device supports 226 in the totes 220.
- the frame 410 also includes a plenum wall 401 that is disposed between a storage device region 402a and a plenum region 402b.
- An air flow (e.g., for cooling a storage device supported in the transporter 400) can be directed into the plenum region 402b via an inlet aperture 403 in one of the sidewalls 418. The air flow can then be delivered towards the storage device region 402a through an air flow aperture 404 in the plenum wall 401.
- the frame 410 can be formed of molded plastic.
- a weight 405 (e.g., a copper block) is disposed within the plenum region 402b and is mounted to the base plate 422.
- the weight 405 can help to inhibit the transmission of vibration between a supported storage device and the test slot 500 during testing.
- the sidewalls 418 are spaced to receive a storage device 600 (FIG. 5)
- the sidewalls 418 also define back hooks 426, which can be useful for extracting the storage device 600 from a test slot 500 (e.g., for separating a connector on the storage device from a mating connector in the test slot 500).
- the back hooks 426 include openings 427, which can help to accommodate the conductive heating assembly 490.
- the sidewalls 418 also define lead-ins 428 (e.g., chamfered edges), which can aid in centering a storage device 600 in the frame 410.
- the sidewalls 418 each define a pair of pass-through apertures 430, which extend between inner and outer surfaces 432a, 432b of the sidewalls 418. Following assembly, a corresponding one of the spring clamps 456a, 456b is associated with each of the pass- through apertures 430.
- the sidewalls 418 also define actuator slots 434 which extend from a proximal end 435 to a distal end 436 of each sidewall 418.
- the face plate 412 defines a pair of apertures 437 (FIG. 1 IA) which extend between the first and second surfaces 414, 420 thereof, and which allow access to the actuator slots 434.
- the actuators 454 (FIG. 8) are slidably disposed within the actuator slots 434 and are arranged to actuate movements of the spring arms 456a, 456b.
- the sidewalls 418 also define through-holes 438.
- the through-holes 438 extend between the inner and outer surfaces 432a, 432b of the sidewalls 418 and allow for access to the actuator slots 434 in the regions between the pass-through apertures 430.
- the conductive heating assembly can be mounted to the frame 410 via these through holes 438.
- the conductive heating assembly 490 includes a pair of printed wiring boards (i.e., first and second printed wiring boards 491a, 491b), a pair of pressure plates 492, and a pair of resilient biasing mechanisms (shown in the form of spring plates 493), which operate to bias the printed wiring boards 491a, 491b toward the sidewalls 418 of the frame 410 following assembly.
- each of the printed wiring boards 491a, 491b includes a resistive heater 487 integrated (e.g., etched) in an electrically conductive (e.g., copper) layer at respective first surfaces 488 of the printed wiring boards 491a, 491b.
- the printed wiring boards 491a, 491b include wiring pads 489 at their respective proximal ends 494a.
- the printed wiring boards 491a, 491b can be electrically connected to each other via wires 495 which are soldered to the printed wiring boards 491a, 491b at the wiring pads 489.
- the first printed wiring board 491a includes a pair of contact terminals 496 at its distal end 494b.
- the contact terminals 496 allow for electrical communication with a connection interface board 520 within the test slot 500.
- the printed wiring boards 491a, 491b can be formed from an FR 4 substrate with and etched copper surface layer. Each of the printed wiring boards 491a, 491b is mounted (e.g., via adhesive or mechanical fasteners) to an associated one of the pressure plates 492.
- the pressure plates 492 are substantially flat and can be formed of metal or rigid plastic.
- the pressure plates 492 are each mounted to a corresponding one of the spring plates 493.
- the spring plates 493 each include a body member 497 and upper and lower edges 498a, 498b extending outwardly from opposing sides of the body member 497.
- the body member 497 is attached to one of the pressure plates 492 (e.g., via adhesive or mechanical fasteners).
- the spring plates 493 can be formed from sheet metal, e.g., stainless steel.
- the actuators 454 are each independently slidable within a corresponding one of the actuator slots 434 (FIG. 1 IA) and are moveable relative to the sidewalls 418 between a released and an engaged position.
- the engagement members 472, 476 are biased towards a rest position in which they are retracted within the recesses 483 (FIG. 15C) of the actuators 454.
- the spring plates 493 force (bias) the pressure plates 492 to rest against the sidewalls 418, as illustrated in FIG. 15D.
- the wedges 482 of the actuators 454 engage the spring clamps 456a, 456b to cause the first and second engagement members 472, 476 of the spring arms 460a, 460b to extend outwardly from the inner and outer surfaces 432a, 432b of the sidewalls 418.
- the dampers 474 engage the pressure plates 492, thereby forcing the pressure plates 492, and the attached printed circuit boards 491a, 491b, away from the sidewalls 418.
- a storage device 600 (shown hidden in FIG. 17B) can be inserted into the frame 410 between the printed wiring boards 491a, 491b.
- the actuators 454 can be moved towards the engaged position to displace the first engagement members 472 into contact with the pressure plates 492, thereby causing displacement of the pressure plates 492 and the attached printed wiring boards 491a, 491b, such that the printed wiring boards engage the storage device 600.
- This provides for direct contact of the printed wiring boards 491a, 491b with the storage device 600 for good conductive heat transfer between the resistive heaters 487 and the storage device 600, and, at the same time, clamps the storage device 600 against movement relative to the frame 410, as shown in FIG. 18.
- the dampers 474 can help to inhibit the transfer of vibrations between storage device transporter 400 and the storage device 600. It is also possible to add a compliant interface material between the heater element and the storage device to accommodate the surface irregularities of the storage device. Test Slot
- the test slot 500 includes a base 510, upstanding walls 512a, 512b and first and second covers 514a, 514b.
- the first cover 514a is integrally molded with the base 510 and the upstanding walls 512a, 512b.
- the test slot 500 includes a rear portion 518 and a front portion 519.
- the rear portion 518 houses a connection interface board 520, which carries the connection interface circuit 182 (FIGS. 3A and 3B).
- the connection interface board 520 includes electrical connectors 522 disposed along a distal end 573 of the connection interface board 520.
- the electrical connectors 522 provide for electrical communication between the connection interface circuit 182 (FIGS.
- connection interface board 520 also includes a test slot connector 524, which provides for electrical communication between the connection interface circuit 182 and a storage device in the test slot 500.
- the connection interface board 520 also includes spring contacts 529.
- the spring contacts 529 are arranged to engage the contact terminals 496 on the first printed wiring board 491a when the storage device transporter 400 is inserted in the test slot 500, thereby providing electrical communication between the printed wiring boards 491a, 491b and the connection interface board 520.
- Pogo pins can also be used as an alternative to, or in combination with, the spring contacts 529.
- mating (i.e., male and female) blind mate connectors can be utilized to provide electrical communication between the printed wiring boards 491a, 491b and the connection interface board 520.
- the front portion 519 of the test slot 500 defines a test compartment 526 for receiving and supporting one of the storage device transporters 400.
- the base 510, upstanding walls 512a, 512b, and the first cover 514a together define a first open end 525, which provides access to the test compartment 526 (e.g., for inserting and removing the storage device transporter 400), and the beveled edges 515, which abut the face plate 412 of a storage device transporter 400 inserted in the test slot 500 to provide a seal that inhibits the flow of air into and out of the test slot 500 via the first open end 525.
- the upstanding walls 512a, 512b define engagement features 527, which provide mating surfaces for the spring clamps 456a, 456b of the storage device transporter 400 allowing the storage device transporter 400 to be clamped within the test slot 500.
- the storage device transporter 400 can be inserted into a test slot 500 until a connector 610 (FIG. 17A) on the storage device 600 mates with the test slot connector 524.
- the actuators 454 can be moved towards the engaged position to displace the first and second engagement members 472, 476 of the spring clamps 456a, 456b to extend outwardly from the inner and outer surfaces 432a, 432b of the sidewalls 418.
- the second engagement members 476 extend outwardly from the outer surfaces 432b of sidewalls 418 and engage the engagement features 527 in the test slot 500 to clamp the storage device transporter 400 against movement relative to the test slot 500.
- the first engagement members 472 extend outwardly from the inner surfaces 432a of the sidewalls 418 and displace the printed wiring boards 491a, 491b of the conductive heating assembly 490 towards the storage device 600 to clamp the storage device 600 against movement relative to the storage device transporter 400 and to provide good thermal contact between the printed wiring boards 491a, 491b and the storage device 600.
- This good thermal contact allows for efficient, conductive heating of the storage device 600 via the resistive heaters 487 during testing.
- This clamping effect also brings the contact terminals 496 of the first printed wiring board 491a into firm contact with the spring contacts 529 on the connection interface board 520.
- the robotic arm 310 removes a storage device transporter 400 from one of the test slots 500 with the manipulator 312, then picks up a storage device 600 from one the storage device receptacles 264 at the transfer station 200 with the storage device transporter 400, and then returns the storage device transporter 400, with a storage device 600 therein, to the associated test slot 500 for testing of the storage device 600.
- the test electronics 160 execute a test algorithm that includes, inter alia, adjusting the temperature of the storage device 600 under test. For example, during testing the storage devices 600 are each heated to a temperature of about 7O 0 C.
- the test electronics 160 can adjust the heating of the storage device 600 under test by controlling the flow of electrical current to the resistive heaters 487 of the conductive heating assembly 490.
- highly efficient conductive heating of the storage device 600 can be achieved using primarily only passive components (e.g., the resistive heaters 487).
- the robotic arm 310 retrieves the storage device transporter 400, along with the supported storage device 600, from the test slot 500 and returns it to one of the storage device receptacles 224 at the transfer station 200 (or moves it to another one of the test slots 500) by manipulation of the storage device transporter 400 (i.e., with the manipulator 312).
- FIG. 23 illustrates a flexible printed circuit 700 that includes a pair of circuit portions (i.e., first and second circuit portions 702a, 702b) and a connecting portion 704 that is integral with the first and second circuit portions 702a, 702b.
- Each of the first and second circuit portions 702a, 702b includes a resistive heater 706 that is defined by electrically conductive traces.
- the connecting portion 704 also includes electrically conductive traces 708 which provide an electrical connection between the resistive heaters 706 of the first and second circuit portions 702a, 702b.
- the first circuit portion 702a includes a pair of contact terminals 710 at its distal end 712. The contact terminals 710 allow for electrical communication with the connection interface board 520 in the test slot 500. Suitable flexible printed circuits with integrated resistive heating are available from Watlow Electric Manufacturing Company of
- each of the first and second circuit portions 702a, 702b is mounted (e.g., via adhesive or mechanical fasteners) to an associated one of the pressure plates 492.
- the pressure plates 492 can extend along the entire back surfaces of the first and second circuit portions 702a, 702b for added stiffness and stability, e.g., to help provide good electrical connection between the contact terminals 710 on the flexible printed circuit 700 and the spring contacts 529 (FIG. 20) on the connection interface board 520 when the storage device transporter 400 is inserted into the test slot 500.
- connection interface board 520 can, in some embodiments, include pogo pins 530 for electrical contact with the contact terminals 710 of the flexible printed circuit 700.
- FIG. 27 illustrates an embodiment in which mating blind mate connectors (i.e., male blind mate connector 721 and female blind mate connector 722) are provided for electrical communication between the printed circuitry 700 of the storage device transporter 400 and the connection interface board 520.
- the conductive heating assembly 490 can also include one or more temperature sensors for monitoring the temperature of a storage device supported in the storage device transporter during testing.
- FIG. 28 illustrates one embodiment in which the printed wiring boards 491a, 491b include a thermocouple 720 that is arranged to measure the temperature of a storage device supported in the storage device transporter.
- thermocouple 720 contacts a surface of the storage device 600, thereby allowing a temperature of the storage device 600 to be measured.
- the first printed wiring board 491a is also provided with thermocouple contact terminals 722 that are electrically connected to the thermocouple 720. Additional spring contacts or pogo pins can also be provided on the connection interface board 520 (FIG. 20) to provide electrical communication between the connection interface board 520 and the thermocouple 720.
- the thermocouple 720 can be placed in electrical communication with the test electronics 160 (FIGS. 3A and 3B) via the connection interface board 520.
- the test electronics 160 can be configured to control flows of electrical current to the resistive heaters 487 based, at least in part, on signals received from the thermocouple 720.
- thermocouple 720 can be provided in the form of a discrete device that is mounted to one of the printed wiring boards 491a, 491b or it can be integrated into the electrically conductive layers of the printed wiring boards 491a, 491b. Furthermore, although an embodiment has been described in which a thermocouple is provided on a rigid printed wiring board, a thermocouple can also be incorporated in embodiments employing flexible printed circuits, such as the embodiment described above with regard to FIGS. 24-26. Flexible printed circuits with integrated thermocouples and/or resistive heaters are available from Watlow Electric Manufacturing Company of Columbia, Missouri.
- the conductive heating assembly 490 can also include a compliant material, such as Sil-Pad manufactured by Bergquist Company of Chanhassen, MN, as an additional layer between the resistive heaters 487 and a storage device supported in the storage device transporter 400.
- a compliant material such as Sil-Pad manufactured by Bergquist Company of Chanhassen, MN
- FIG. 29 illustrates an embodiment in which a layer of compliant material 730 is adhered the first surfaces 488 of the printed wiring boards 491a, 491b.
- the compliant material 730 can help to inhibit scratching of a supported storage device when clamped within the storage device transporter 400.
- the compliant material 730 can also help to further inhibit the transmission of vibrations between the storage device transporter 400 and a supported storage device.
- the compliant material between the resistive heaters and the storage device also accommodates the surface irregularities of the storage device and allows for more efficient heat transfer.
- each test slot assembly 120 may include at least a test slot 500a for receiving a storage device 600 to be tested.
- the test slot assembly 120 may include an optional storage device transporter 400.
- the storage device transporter 400 can be used for capturing storage devices 600 (e.g., from the loading station) and for transporting the storage devices 600 to one of the test slots 500a for testing.
- the storage device transporter 400 may have integrated sidewalls 418. In some implementations, the sidewalls are absent from the storage device transporter 400.
- the storage device testing system 10 also includes at least one computer 130 in communication with the test slots 500a.
- the computer 130 may be configured to provide inventory control of the storage devices 600 and/or an automation interface to control the storage device testing system 10.
- test electronics 160 are in communication with each test slot 500a.
- the test electronics 160 are configured to communicate with a disk dive 600 received within the test slot 500a.
- the test electronics 160 execute test algorithms and monitor the status (e.g., temperature) of storage devices under test.
- a power system 170 supplies power to the storage device testing system 10.
- the power system 170 may monitor and/or regulate power to the received storage device 600 in the test slot 500a.
- the test electronics 160 within each test rack 100 include at least one self-testing system 180 in communication with at least one test slot 500a.
- the self-testing system 180 supports the self-testing of the storage device 600 received within the test slot 500a.
- the self-testing system 180 includes a cluster controller 181, one or more connection interface circuits 182 each in electrical communication with a storage device (SD) 600 received within the test slot 500a, and one or more block interface circuits 183 in electrical communication with the connection interface circuit 182.
- SD storage device
- the cluster controller 181 is configured to run one or more testing programs with a capacity of approximately 120 self-tests and/or 60 functionality test of storage devices 600.
- the connection interface circuits 182 and the block interface circuit(s) 183 are configured to support storage device self-test.
- a storage device self-test may include testing the amount of power received by the storage device 600, the operating temperature, the ability to read and write data, and the ability to read and write data at different temperatures (e.g. read while hot and write while cold, or vice versa).
- the storage device self-test may test every memory sector of the storage device 600 or only random samplings.
- the functionality test may test an operating temperature of the storage device 600 and also the data integrity of communications with the storage device 600.
- the cluster controller 181 may communicate with the self-test circuit 184 via Ethernet (e.g. Gigabit Ethernet), which may communicate with the block interface circuit(s) 183 and onto the connection interface circuit(s) 182 and storage device(s) 600 via universal asynchronous receiver/transmitter (UART) serial links.
- Ethernet e.g. Gigabit Ethernet
- UART universal asynchronous receiver/transmitter
- a UART is usually an individual (or part of an) integrated circuit used for serial communications over a computer or peripheral device serial port.
- the block interface circuit(s) 183 is/are configured to control power to and temperature of the test slots 500a and each block interface circuit 183 may control one or more test slots 500a and/or storage devices 600.
- the test electronics 160 can also include at least one functional testing system 190 in communication with at least one test slot 500a.
- the functional testing system 190 tests whether a received storage device 600, held and/or supported in the test slot 500a by the storage device transporter 400, is functioning properly.
- a functionality test may include testing the amount of power received by the storage device 600, the operating temperature, the ability to read and write data, and the ability to read and write data at different temperatures (e.g. read while hot and write while cold, or vice versa).
- the functionality test may test every memory sector of the storage device 600 or only random samplings.
- the functionality test may test an operating temperature of the storage device 600 and also the data integrity of communications with the storage device 600.
- the functional testing system 190 includes a cluster controller 181 and at least one functional interface circuit 191 in electrical communication with the cluster controller 181.
- a connection interface circuit 182 is in electrical communication with a storage device 600 received within the test slot 500a and the functional interface circuit 191.
- the functional interface circuit 191 is configured to communicate a functional test routine to the storage device 600.
- the functional testing system 190 may include a communication switch 192 (e.g. Gigabit Ethernet) to provide electrical communication between the cluster controller 181 and the one or more functional interface circuits 191.
- the computer 130, communication switch 192, cluster controller 181, and functional interface circuit 191 communicate on an Ethernet network.
- the functional interface circuit 191 may communicate to the connection interface circuit 182 via Parallel AT Attachment (a hard disk interface also known as IDE, ATA, ATAPI, UDMA and PATA), SATA, or SAS (Serial Attached SCSI).
- the robot 300 includes a robotic arm 310 and a manipulator 312 (FIG. 32A) disposed at a distal end of the robotic arm 310.
- the robotic arm 310 defines a first axis 314 (FIG. 32B) normal to a floor surface 316 and is operable to rotate through a predetermined arc about and extends radially from the first axis 314 within a robot operating area 318.
- the robotic arm 310 is configured to independently service each test slot 500a by transferring storage devices 600, for example, between totes 260 at the transfer station 200 and the test racks 100.
- the robotic arm 310 is configured to pick up a storage device 600 from one the storage device receptacles 264 at the transfer station 200 and load the storage device 600 into the test slot 500a for testing of the storage device 600.
- the robotic arm 310 is configured to remove a storage device transporter 400 from one of the test slots 500a with the manipulator 312, then pick up a storage device 600 from one the storage device receptacles 264 at the transfer station 200 with the storage device transporter 400, and then return the storage device transporter 400, with a storage device 600 therein, to the test slot 500a for testing of the storage device 600.
- the robotic arm 310 retrieves the supported storage device 600 (and, if applicable, the storage device transporter 400) from one of the test slots 500a and returns it to one of the storage device receptacles 264 at the transfer station 200 (or moves it to another one of the test slots 500a).
- the test slot 500a includes a base 510, upstanding walls
- the test slot 500a includes a rear portion 518 and a front portion 519.
- the rear portion 518 houses a connection interface board 520, which carries the connection interface circuit 182 (FIGS. 3 IA and 3 IB).
- the connection interface board 520 includes electrical connectors 522 disposed along a distal end 573 of the connection interface board 520.
- the electrical connectors 522 provide for electrical communication between the connection interface circuit 182 (FIGS.
- connection interface board 520 also includes a test slot connector 524, which provides for electrical communication between the connection interface circuit 182 and a storage device in the test slot 500a.
- the front portion 519 of the test slot 500a defines a test compartment 526 for receiving and supporting a storage device 600 or, optionally, a storage device transporter 400 for carrying a storage device 600.
- the base 510, upstanding walls 512a, 512b, and the first cover 514a together define a first open end 525, which provides access to the test compartment 526 (e.g., for inserting and removing the storage device 600 or storage device transporter 400), and the beveled edges 515.
- the beveled edges 515 abut the face plate of a storage device transporter 400 inserted in the test slot 500a to provide a seal that inhibits the flow of air into and out of the test slot 500a via the first open end 525.
- the test slot 500a includes a clamping mechanism 450 and a conductive heating assembly 490.
- the conductive heating assembly 490 allows a storage device supported by the test slot to be heated by way of thermal conduction.
- the clamping mechanism 450 and conductive heating assembly 490 can be included in the test slot 500a in any of several possible configurations.
- the clamping mechanism 450 abuts the upstanding walls 512a, 512b of the test slot 500a.
- the clamping mechanism 450 secures the storage device 600 in place and lessens some movement of the storage device 600 relative to the test slot 500a.
- the conductive heating assembly 490 can be positioned to abut the clamping mechanism 450, such that the clamping mechanism 450, when engaged, will apply pressure on the conductive heating assembly 490, which in turn applies pressure on the storage device 600.
- the conductive heating assembly 490 contacts the storage device 600 at a different location than at the location of clamping mechanism 450 pressure.
- the clamping mechanism 450 may apply pressure directly onto the storage device 600, or the clamping mechanism 450 may apply pressure to a storage device transporter 400 containing the storage device 600.
- the conductive heating assembly 490 is arranged within the test slot 500a such that, when the storage device transporter 400 is inserted in the test slot 500a, the conductive heating assembly 490 is received by the storage device transporter 400 (e.g. through a pair of ports or holes in the transporter) and comes into direct contact with the storage device 600.
- the clamping mechanism 450 includes a pair of clamping assemblies 452 each including an actuator 454 and a pair of spring clamps (i.e., proximal and distal spring clamps 456a, 456b).
- the portions of the spring clamps at the inner surfaces 432 of the clamping assemblies 452 include an engagement member 472 having a damper 474.
- the spring clamps 456a, 456b are operatively associated with the actuators 454, e.g., for clamping a storage device 600 within a test slot 500a.
- each of the actuators 454 includes inner and outer surfaces 481a, 481b which define actuating features.
- the actuating features include wedges 482 and recesses 483.
- the actuators 454 also define openings 484 which extend between the inner and outer surfaces 481a, 481b.
- the actuators 454 include actuator sockets 486 which are configured to be engageable with the manipulator 312 (FIG. 32A) for controlling movement of the actuators 454 relative to the test slot 500a.
- the manipulator 312 can engage the actuators 454 to engage the spring clamps 456a, 456b, securing a storage device 500a in place.
- the conductive heating assembly 490 includes a pair of printed wiring boards (i.e., first and second printed wiring boards 491a, 491b), a pair of pressure plates 492, and a pair of resilient biasing mechanisms (shown in the form of spring plates 493), which operate to bias the printed wiring boards 491a, 491b toward the inner surfaces 432 of the clamping assemblies 452 following assembly.
- each of the printed wiring boards 491a, 491b includes a resistive heater 487 integrated (e.g., etched) in an electrically conductive (e.g., copper) layer at respective first surfaces 488 of the printed wiring boards 491a, 491b.
- the printed wiring boards 491a, 491b include wiring pads 489 at their respective proximal ends 494a.
- the printed wiring boards 491a, 491b can be electrically connected to each other via wires 495 which are soldered to the printed wiring boards 491a, 491b at the wiring pads 489.
- the first printed wiring board 491a includes a pair of contact terminals 496 at its distal end 494b.
- the contact terminals 496 allow for electrical communication with a connection interface board 520 within the test slot 500a.
- the contact terminals 496 are permanently connected, e.g. soldered, to the connection interface board 520.
- the printed wiring boards 491a, 491b can be formed from an FR 4 substrate with and etched copper surface layer. Each of the printed wiring boards 491a, 491b is mounted (e.g., via adhesive or mechanical fasteners) to an associated one of the pressure plates 492.
- the pressure plates 492 are substantially flat and can be formed of metal or rigid plastic. The pressure plates 492 are each mounted to a corresponding one of the spring plates 493.
- the actuators 454 can be moved towards the engaged position to displace the engagement members 472 of the spring clamps 456a, 456b to extend outwardly from the inner surfaces 432 of the clamping assemblies 452.
- the engagement members 472 displace the printed wiring boards 491a, 491b of the conductive heating assembly 490 towards the storage device 600 to provide good thermal contact between the printed wiring boards 491a, 491b and the storage device 600. This good thermal contact allows for efficient, conductive heating of the storage device 600 via the resistive heaters 487 during testing.
- this clamping effect also brings the contact terminals 496 of the first printed wiring board 491a into firm contact with spring contacts 529 on the connection interface board 520.
- the storage device 600 is housed within a storage device transporter 400, and the clamping mechanism 450 clamps the storage device 600 against movement relative to the storage device transporter 400.
- the robotic arm 310 picks up a storage device 600 from one of the storage device receptacles 264 at the transfer station 200 and loads the storage device 600 into the associated test slot 500a for testing of the storage device 600.
- the robotic arm 310 removes a storage device transporter 400 from the test slot 500a with the manipulator 312, retrieves the storage device 600 with the storage device transporter 400, and then and then returns the storage device transporter 400 to the test slot 500a for testing of the storage device 600.
- the test electronics 160 execute a test algorithm that includes, inter alia, adjusting the temperature of the storage device 600 under test. For example, during testing the storage devices 600 are each heated to a temperature of about 7O 0 C.
- the test electronics 160 can adjust the heating of the storage device 600 under test by controlling the flow of electrical current to the resistive heaters 487 of the conductive heating assembly 490.
- highly efficient conductive heating of the storage device 600 can be achieved using primarily only passive components (e.g., the resistive heaters 487).
- the robotic arm 310 retrieves the storage device 600 (and, in some examples, the storage device transporter 400) from the test slot 500a and returns it to one of the storage device receptacles 264 at the transfer station 200 (or moves it to another one of the test slots 500a).
- FIG. 41 illustrates a flexible printed circuit 700 that includes a pair of circuit portions (i.e., first and second circuit portions 702a, 702b) and a connecting portion 704 that is integral with the first and second circuit portions 702a, 702b.
- Each of the first and second circuit portions 702a, 702b includes a resistive heater 706 that is defined by electrically conductive traces.
- the connecting portion 704 also includes electrically conductive traces 708 which provide an electrical connection between the resistive heaters 706 of the first and second circuit portions 702a, 702b.
- the first circuit portion 702a includes a pair of contact terminals 710 at its distal end 712. The contact terminals 710 allow for electrical communication with the connection interface board 520 in the test slot 500a. Suitable flexible printed circuits with integrated resistive heating are available from Watlow Electric Manufacturing Company of Columbia, Missouri.
- each of the first and second circuit portions 702a, 702b is mounted (e.g., via adhesive or mechanical fasteners) to an associated one of the pressure plates 492.
- the pressure plates 492 can extend along the entire back surfaces of the first and second circuit portions 702a, 702b for added stiffness and stability, e.g., to help provide good electrical connection between the contact terminals 710 on the flexible printed circuit 700 and the spring contacts 529 (FIG. 12) on the connection interface board 520.
- the conductive heating assembly 490 can also include one or more temperature sensors for monitoring the temperature of a storage device supported in the storage device transporter during testing. For example, FIG.
- thermocouple 720 that is arranged to measure the temperature of a storage device 600.
- the thermocouple 720 contacts a surface of the storage device 600, thereby allowing a temperature of the storage device 600 to be measured.
- the thermocouple 720 may be physically separated or otherwise thermally insulated from the resistive heaters 487, to limit the influence of the resistive heaters 487 on the temperature of the thermocouple 720.
- the thermocouple 720 measures the temperature of the storage device 600 when in proximity but without having direct contact with the storage device 600.
- the first printed wiring board 491a is also provided with thermocouple contact terminals 722 that are electrically connected to the thermocouple 720.
- thermocouple contact terminals 722 that are electrically connected to the thermocouple 720.
- spring contacts or pogo pins can also be provided on the connection interface board 520 (FIG. 34) to provide electrical communication between the connection interface board 520 and the thermocouple 720.
- the thermocouple 720 can be placed in electrical communication with the test electronics 160 (FIGS. 31A and 31B) via the connection interface board 520.
- the test electronics 160 can be configured to control flows of electrical current to the resistive heaters 487 based, at least in part, on signals received from the thermocouple 720.
- connection interface board 520 can be configured to directly control flows of electrical current to the resistive heaters 487 based, at least in part, on signals received from the thermocouple 720.
- the test electronics 160 can compensate for any error between an actual temperature of the storage device and the temperature measured by the thermocouple 720. For example, power drawn by the storage device 600 will be dissipated as heat and increase the temperature inside the storage device, but this temperature increase may not be fully measured by the thermocouple 720.
- the test electronics 160 can measure the power drawn by the storage device 600 and use this measurement to calculate an offset for the temperature measured by the thermocouple 720 to estimate the actual temperature of the storage device 600.
- the thermocouple 720 can be provided in the form of a discrete device that is mounted to one of the printed wiring boards 491a, 491b or it can be integrated into the electrically conductive layers of the printed wiring boards 491a, 491b.
- thermocouple is provided on a rigid printed wiring board
- a thermocouple can also be incorporated in embodiments employing flexible printed circuits, such as the embodiment described above with regard to FIG. 42.
- Flexible printed circuits with integrated thermocouples and/or resistive heaters are available from Watlow Electric Manufacturing Company of Columbia, Missouri.
- the conductive heating assembly 490 can also include a compliant material, such as Sil-Pad manufactured by Bergquist Company of Chanhassen, MN, as an additional layer between the resistive heaters 487 and a storage device supported in the storage device transporter 400.
- a compliant material such as Sil-Pad manufactured by Bergquist Company of Chanhassen, MN
- FIG. 44 illustrates an embodiment in which a layer of compliant material 730 is adhered the first surfaces 488 of the printed wiring boards 491a, 491b.
- the compliant material 730 can help to inhibit scratching of a supported storage device 600 when clamped within the test slot 500a.
- the compliant material between the resistive heaters and the storage device also includes Sil-Pad manufactured by Bergquist Company of Chanhassen, MN, as an additional layer between the resistive heaters 487 and a storage device supported in the storage device transporter 400.
- FIG. 44 illustrates an embodiment in which a layer of compliant material 730 is adhered the first surfaces 488 of the printed
Abstract
Description
Claims
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
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CN201080031424.4A CN102473436B (en) | 2009-07-15 | 2010-07-15 | Conductive heating |
JP2012520773A JP2012533834A (en) | 2009-07-15 | 2010-07-15 | Conduction heating |
MYPI2011006145A MY184066A (en) | 2009-07-15 | 2010-07-15 | Conductive heating |
SG2011092533A SG176843A1 (en) | 2009-07-15 | 2010-07-15 | Conductive heating |
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US12/503,593 | 2009-07-15 | ||
US12/503,593 US8466699B2 (en) | 2009-07-15 | 2009-07-15 | Heating storage devices in a testing system |
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WO2011008937A2 true WO2011008937A2 (en) | 2011-01-20 |
WO2011008937A3 WO2011008937A3 (en) | 2011-04-14 |
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PCT/US2010/042111 WO2011008937A2 (en) | 2009-07-15 | 2010-07-15 | Conductive heating |
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Also Published As
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US20110012631A1 (en) | 2011-01-20 |
US7932734B2 (en) | 2011-04-26 |
US20110011844A1 (en) | 2011-01-20 |
JP2012533834A (en) | 2012-12-27 |
KR20120036365A (en) | 2012-04-17 |
US8466699B2 (en) | 2013-06-18 |
MY184066A (en) | 2021-03-17 |
WO2011008937A3 (en) | 2011-04-14 |
SG176843A1 (en) | 2012-01-30 |
CN102473436A (en) | 2012-05-23 |
CN102473436B (en) | 2014-12-03 |
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