WO2010141702A3 - Wavefront imaging sensor - Google Patents
Wavefront imaging sensor Download PDFInfo
- Publication number
- WO2010141702A3 WO2010141702A3 PCT/US2010/037235 US2010037235W WO2010141702A3 WO 2010141702 A3 WO2010141702 A3 WO 2010141702A3 US 2010037235 W US2010037235 W US 2010037235W WO 2010141702 A3 WO2010141702 A3 WO 2010141702A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- aperture
- light
- light detector
- imaging sensor
- wavefront
- Prior art date
Links
- 238000003384 imaging method Methods 0.000 title abstract 2
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
- G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
- G01J9/0215—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods by shearing interferometric methods
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/0092—Polarisation microscopes
Abstract
Embodiments of the present invention relate to a wavefront imaging sensor (WIS) comprising an aperture layer having an aperture, a light detector having a surface, and a transparent layer between the aperture layer and the light detector. The light detector can receive a light projection at the surface from light passing through the aperture. The light detector can also separately measure amplitude and phase information of a wavefront at the aperture based on the received light projection. The transparent layer has a thickness designed to locate the surface of the light detector approximately at a self-focusing plane in a high Fresnel number regime to narrow the light projection.
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN2010800241756A CN102449454A (en) | 2009-06-03 | 2010-06-03 | Wavefront imaging sensor |
EP10784082A EP2438413A2 (en) | 2009-06-03 | 2010-06-03 | Wavefront imaging sensor |
Applications Claiming Priority (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US18386809P | 2009-06-03 | 2009-06-03 | |
US61/183,868 | 2009-06-03 | ||
US24055609P | 2009-09-08 | 2009-09-08 | |
US61/240,556 | 2009-09-08 | ||
US12/792,177 | 2010-06-02 | ||
US12/792,177 US8416400B2 (en) | 2009-06-03 | 2010-06-02 | Wavefront imaging sensor |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2010141702A2 WO2010141702A2 (en) | 2010-12-09 |
WO2010141702A3 true WO2010141702A3 (en) | 2011-02-17 |
Family
ID=43298510
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2010/037235 WO2010141702A2 (en) | 2009-06-03 | 2010-06-03 | Wavefront imaging sensor |
Country Status (4)
Country | Link |
---|---|
US (1) | US8416400B2 (en) |
EP (1) | EP2438413A2 (en) |
CN (1) | CN102449454A (en) |
WO (1) | WO2010141702A2 (en) |
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-
2010
- 2010-06-02 US US12/792,177 patent/US8416400B2/en active Active
- 2010-06-03 CN CN2010800241756A patent/CN102449454A/en active Pending
- 2010-06-03 WO PCT/US2010/037235 patent/WO2010141702A2/en active Application Filing
- 2010-06-03 EP EP10784082A patent/EP2438413A2/en not_active Withdrawn
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Also Published As
Publication number | Publication date |
---|---|
US8416400B2 (en) | 2013-04-09 |
EP2438413A2 (en) | 2012-04-11 |
CN102449454A (en) | 2012-05-09 |
WO2010141702A2 (en) | 2010-12-09 |
US20100309457A1 (en) | 2010-12-09 |
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