WO2009129400A3 - Temperature control within storage device testing systems - Google Patents

Temperature control within storage device testing systems Download PDF

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Publication number
WO2009129400A3
WO2009129400A3 PCT/US2009/040829 US2009040829W WO2009129400A3 WO 2009129400 A3 WO2009129400 A3 WO 2009129400A3 US 2009040829 W US2009040829 W US 2009040829W WO 2009129400 A3 WO2009129400 A3 WO 2009129400A3
Authority
WO
WIPO (PCT)
Prior art keywords
test
storage device
electronics
device testing
slots
Prior art date
Application number
PCT/US2009/040829
Other languages
French (fr)
Other versions
WO2009129400A2 (en
Inventor
Brian S. Merrow
Original Assignee
Teradyne, Inc.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Teradyne, Inc. filed Critical Teradyne, Inc.
Priority to US12/937,918 priority Critical patent/US8451608B2/en
Priority to CN200980123145.8A priority patent/CN102089726B/en
Publication of WO2009129400A2 publication Critical patent/WO2009129400A2/en
Publication of WO2009129400A3 publication Critical patent/WO2009129400A3/en

Links

Classifications

    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05D—SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
    • G05D23/00—Control of temperature
    • G05D23/19—Control of temperature characterised by the use of electric means
    • G05D23/1927—Control of temperature characterised by the use of electric means using a plurality of sensors
    • G05D23/193—Control of temperature characterised by the use of electric means using a plurality of sensors sensing the temperaure in different places in thermal relationship with one or more spaces
    • G05D23/1932—Control of temperature characterised by the use of electric means using a plurality of sensors sensing the temperaure in different places in thermal relationship with one or more spaces to control the temperature of a plurality of spaces
    • G05D23/1934—Control of temperature characterised by the use of electric means using a plurality of sensors sensing the temperaure in different places in thermal relationship with one or more spaces to control the temperature of a plurality of spaces each space being provided with one sensor acting on one or more control means

Abstract

A storage device testing system cooling circuit (20) includes a plurality of test racks (100). Each of the test racks include a test slot compartment (700) and a test electronics compartment (800). Each of the test slot compartments includes multiple test slots (500, 500a, 500b, 540), and one or more cooling conduits (710) configured to convey a cooling liquid toward the test slots. Each of the test electronics compartments includes test electronics (160) configured to communicate with the test slots for executing a test algorithm, and a heat exchanger (810) in fluid communication with the one or more cooling conduits. The heat exchanger is configured to cool an air flow directed toward the test electronics.
PCT/US2009/040829 2008-04-17 2009-04-16 Temperature control within storage device testing systems WO2009129400A2 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
US12/937,918 US8451608B2 (en) 2008-04-17 2009-04-16 Temperature control within storage device testing systems
CN200980123145.8A CN102089726B (en) 2008-04-17 2009-04-16 Temperature control within storage device testing systems

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US12/105,061 US7848106B2 (en) 2008-04-17 2008-04-17 Temperature control within disk drive testing systems
US12/105,061 2008-04-17

Publications (2)

Publication Number Publication Date
WO2009129400A2 WO2009129400A2 (en) 2009-10-22
WO2009129400A3 true WO2009129400A3 (en) 2009-12-23

Family

ID=41199429

Family Applications (2)

Application Number Title Priority Date Filing Date
PCT/US2009/040058 WO2009129118A1 (en) 2008-04-17 2009-04-09 Temperature control within disk drive testing systems
PCT/US2009/040829 WO2009129400A2 (en) 2008-04-17 2009-04-16 Temperature control within storage device testing systems

Family Applications Before (1)

Application Number Title Priority Date Filing Date
PCT/US2009/040058 WO2009129118A1 (en) 2008-04-17 2009-04-09 Temperature control within disk drive testing systems

Country Status (4)

Country Link
US (2) US7848106B2 (en)
CN (1) CN102089726B (en)
MY (1) MY147299A (en)
WO (2) WO2009129118A1 (en)

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US8451608B2 (en) 2013-05-28
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