WO2009056127A3 - Inspection device - Google Patents
Inspection device Download PDFInfo
- Publication number
- WO2009056127A3 WO2009056127A3 PCT/DE2008/001790 DE2008001790W WO2009056127A3 WO 2009056127 A3 WO2009056127 A3 WO 2009056127A3 DE 2008001790 W DE2008001790 W DE 2008001790W WO 2009056127 A3 WO2009056127 A3 WO 2009056127A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- support element
- optical sensor
- inspection device
- contact
- sensitive
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/94—Investigating contamination, e.g. dust
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/9501—Semiconductor wafers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N21/03—Cuvette constructions
- G01N2021/0339—Holders for solids, powders
Abstract
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN2008801143147A CN102239403A (en) | 2007-11-01 | 2008-10-31 | Inspection device |
JP2010531413A JP5502740B2 (en) | 2007-11-01 | 2008-10-31 | Inspection device |
US12/741,110 US20120327402A1 (en) | 2007-11-01 | 2008-10-31 | Inspection device |
EP08846098.5A EP2269041B1 (en) | 2007-11-01 | 2008-10-31 | Inspection device |
US13/898,122 US8836933B2 (en) | 2007-11-01 | 2013-05-20 | Inspection device |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102007052530A DE102007052530A1 (en) | 2007-11-01 | 2007-11-01 | Devices for inspection and irradiation of sheet materials |
DE102007052530.5 | 2007-11-01 |
Related Child Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US12/741,110 A-371-Of-International US20120327402A1 (en) | 2007-11-01 | 2008-10-31 | Inspection device |
US13/898,122 Continuation US8836933B2 (en) | 2007-11-01 | 2013-05-20 | Inspection device |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2009056127A2 WO2009056127A2 (en) | 2009-05-07 |
WO2009056127A3 true WO2009056127A3 (en) | 2010-07-29 |
Family
ID=40530440
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/DE2008/001790 WO2009056127A2 (en) | 2007-11-01 | 2008-10-31 | Inspection device |
Country Status (7)
Country | Link |
---|---|
US (2) | US20120327402A1 (en) |
EP (1) | EP2269041B1 (en) |
JP (1) | JP5502740B2 (en) |
KR (1) | KR101545761B1 (en) |
CN (1) | CN102239403A (en) |
DE (2) | DE202007019013U1 (en) |
WO (1) | WO2009056127A2 (en) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102008053684B4 (en) * | 2008-10-29 | 2010-10-14 | Graphikon Gesellschaft für Bildverarbeitung und Computergraphik mbH | Backlight device for semiconductor products |
KR101888280B1 (en) * | 2013-07-22 | 2018-08-13 | 제트에스-핸들링 게엠베하 | Device for treating or machining a surface |
EP3025145B1 (en) | 2013-07-22 | 2017-06-28 | ZS-Handling GmbH | Device for inspecting workpiece surfaces and strip materials |
DE102023103520B3 (en) | 2023-02-14 | 2024-03-21 | Isra Vision Gmbh | Device and method for inspecting a plate-shaped or web-shaped object |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2004059695A2 (en) * | 2002-12-23 | 2004-07-15 | Mattson Thermal Products Gmbh | Ultrasonic levitation in a rapid thermal processing plant for wafers |
US20040174518A1 (en) * | 2001-09-21 | 2004-09-09 | Olympus Corporation | Defect inspection apparatus |
WO2004076320A1 (en) * | 2003-02-25 | 2004-09-10 | Technische Universität München | Device for contactlessly conveying and positioning components |
US6810297B2 (en) * | 2001-12-27 | 2004-10-26 | Orbotech Ltd. | System and methods for imaging employing a levitating conveyor |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0634679Y2 (en) * | 1989-02-14 | 1994-09-07 | 日本アルミニウム工業株式会社 | Powder sample inspection device |
US5061679A (en) * | 1989-03-17 | 1991-10-29 | The University Of Arkansas | Drive system employing frictionless bearings including superconducting matter |
US5890580A (en) * | 1993-07-12 | 1999-04-06 | Kaijo Corporation | Object levitating apparatus, object transporting apparatus, and object levitating bearing along with an object levitating process and object transporting process |
JP2001027610A (en) * | 1999-07-13 | 2001-01-30 | Mitsui Chemicals Inc | Method and apparatus for inspecting resin pellets |
DE10039482B4 (en) * | 2000-08-08 | 2016-03-24 | Zs-Handling Gmbh | Handler for transporting flat substrates used in the semiconductor industry |
US6802220B2 (en) * | 2000-10-26 | 2004-10-12 | Kabushiki Kaisha Toyota Jidoshokki | Apparatus for transporting levitated objects |
US6781684B1 (en) * | 2000-11-07 | 2004-08-24 | Donald L. Ekhoff | Workpiece levitation using alternating positive and negative pressure flows |
WO2002040970A1 (en) * | 2000-11-15 | 2002-05-23 | Real Time Metrology, Inc. | Optical method and apparatus for inspecting large area planar objects |
JP2005239392A (en) * | 2004-02-27 | 2005-09-08 | Toyota Industries Corp | Object levitation carrying device |
JP4554397B2 (en) * | 2005-02-23 | 2010-09-29 | 東京エレクトロン株式会社 | Stage device and coating treatment device |
US7391510B2 (en) * | 2006-01-26 | 2008-06-24 | Orbotech Ltd | System and method for inspecting patterned devices having microscopic conductors |
US7529338B2 (en) * | 2006-02-22 | 2009-05-05 | Focalspot, Inc. | Method and apparatus for inspecting circuit boards |
US8461022B2 (en) * | 2009-04-20 | 2013-06-11 | Applied Materials, Inc. | Methods and apparatus for aligning a substrate in a process chamber |
-
2007
- 2007-11-01 DE DE202007019013U patent/DE202007019013U1/en not_active Expired - Lifetime
- 2007-11-01 DE DE102007052530A patent/DE102007052530A1/en not_active Ceased
-
2008
- 2008-10-31 CN CN2008801143147A patent/CN102239403A/en active Pending
- 2008-10-31 US US12/741,110 patent/US20120327402A1/en not_active Abandoned
- 2008-10-31 JP JP2010531413A patent/JP5502740B2/en active Active
- 2008-10-31 WO PCT/DE2008/001790 patent/WO2009056127A2/en active Application Filing
- 2008-10-31 EP EP08846098.5A patent/EP2269041B1/en active Active
- 2008-10-31 KR KR1020107012115A patent/KR101545761B1/en active IP Right Grant
-
2013
- 2013-05-20 US US13/898,122 patent/US8836933B2/en active Active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20040174518A1 (en) * | 2001-09-21 | 2004-09-09 | Olympus Corporation | Defect inspection apparatus |
US6810297B2 (en) * | 2001-12-27 | 2004-10-26 | Orbotech Ltd. | System and methods for imaging employing a levitating conveyor |
WO2004059695A2 (en) * | 2002-12-23 | 2004-07-15 | Mattson Thermal Products Gmbh | Ultrasonic levitation in a rapid thermal processing plant for wafers |
WO2004076320A1 (en) * | 2003-02-25 | 2004-09-10 | Technische Universität München | Device for contactlessly conveying and positioning components |
Also Published As
Publication number | Publication date |
---|---|
JP5502740B2 (en) | 2014-05-28 |
DE202007019013U1 (en) | 2010-04-29 |
JP2011502257A (en) | 2011-01-20 |
US20120327402A1 (en) | 2012-12-27 |
KR101545761B1 (en) | 2015-08-19 |
EP2269041A2 (en) | 2011-01-05 |
EP2269041B1 (en) | 2017-08-23 |
WO2009056127A2 (en) | 2009-05-07 |
US20130321796A1 (en) | 2013-12-05 |
US8836933B2 (en) | 2014-09-16 |
CN102239403A (en) | 2011-11-09 |
KR20100105566A (en) | 2010-09-29 |
DE102007052530A1 (en) | 2009-05-14 |
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