WO2009014940A3 - Multi-unit process spatial synchronization of image inspection systems - Google Patents

Multi-unit process spatial synchronization of image inspection systems Download PDF

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Publication number
WO2009014940A3
WO2009014940A3 PCT/US2008/070069 US2008070069W WO2009014940A3 WO 2009014940 A3 WO2009014940 A3 WO 2009014940A3 US 2008070069 W US2008070069 W US 2008070069W WO 2009014940 A3 WO2009014940 A3 WO 2009014940A3
Authority
WO
WIPO (PCT)
Prior art keywords
anomaly information
manufacturing process
web
process lines
image inspection
Prior art date
Application number
PCT/US2008/070069
Other languages
French (fr)
Other versions
WO2009014940A2 (en
Inventor
Steven P Floeder
Kenneth G Brittain
James A Masterman
Carl J Skeps
Original Assignee
3M Innovative Properties Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 3M Innovative Properties Co filed Critical 3M Innovative Properties Co
Priority to EP08781849A priority Critical patent/EP2176834A2/en
Priority to CN2008801079210A priority patent/CN101802869B/en
Priority to JP2010518289A priority patent/JP2010534835A/en
Priority to KR1020107004131A priority patent/KR101494929B1/en
Publication of WO2009014940A2 publication Critical patent/WO2009014940A2/en
Publication of WO2009014940A3 publication Critical patent/WO2009014940A3/en
Priority to IL203386A priority patent/IL203386A/en

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30124—Fabrics; Textile; Paper
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
    • Y02P90/02—Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]

Abstract

A conversion control system is described that includes a database to store data defining a set of rules and an interface to receive local anomaly information from a plurality of different analysis machines associated with a plurality of manufacturing process lines that perform a plurality of operations on a web of material, and each of the manufacturing process lines includes position data for a set of regions on the web containing anomalies. The system also includes a computer that registers the position data of the local anomaly information for the plurality of manufacturing process lines to produce aggregate anomaly information. The system further includes a conversion control engine that applies the rules to the aggregate anomaly information to determine which anomalies represent actual defects in the web for a plurality of different products.
PCT/US2008/070069 2007-07-26 2008-07-15 Multi-unit process spatial synchronization of image inspection systems WO2009014940A2 (en)

Priority Applications (5)

Application Number Priority Date Filing Date Title
EP08781849A EP2176834A2 (en) 2007-07-26 2008-07-15 Multi-unit process spatial synchronization of image inspection systems
CN2008801079210A CN101802869B (en) 2007-07-26 2008-07-15 Multi-unit process spatial synchronization of image inspection systems
JP2010518289A JP2010534835A (en) 2007-07-26 2008-07-15 Spatial synchronization method of multiple processes in image inspection system
KR1020107004131A KR101494929B1 (en) 2007-07-26 2008-07-15 Multi-unit process spatial synchronization of image inspection systems
IL203386A IL203386A (en) 2007-07-26 2010-01-19 Multi-unit process spatial synchronization of image inspection systems

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/828,383 US7542821B2 (en) 2007-07-26 2007-07-26 Multi-unit process spatial synchronization of image inspection systems
US11/828,383 2007-07-26

Publications (2)

Publication Number Publication Date
WO2009014940A2 WO2009014940A2 (en) 2009-01-29
WO2009014940A3 true WO2009014940A3 (en) 2009-03-12

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2008/070069 WO2009014940A2 (en) 2007-07-26 2008-07-15 Multi-unit process spatial synchronization of image inspection systems

Country Status (8)

Country Link
US (1) US7542821B2 (en)
EP (1) EP2176834A2 (en)
JP (3) JP2010534835A (en)
KR (1) KR101494929B1 (en)
CN (1) CN101802869B (en)
IL (1) IL203386A (en)
TW (1) TWI428779B (en)
WO (1) WO2009014940A2 (en)

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US7542821B2 (en) 2009-06-02
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