WO2008129010A3 - Test equipment for automated quality control of thin film solar modules - Google Patents

Test equipment for automated quality control of thin film solar modules Download PDF

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Publication number
WO2008129010A3
WO2008129010A3 PCT/EP2008/054762 EP2008054762W WO2008129010A3 WO 2008129010 A3 WO2008129010 A3 WO 2008129010A3 EP 2008054762 W EP2008054762 W EP 2008054762W WO 2008129010 A3 WO2008129010 A3 WO 2008129010A3
Authority
WO
WIPO (PCT)
Prior art keywords
photovoltaic cells
thin film
solar module
different regions
measured value
Prior art date
Application number
PCT/EP2008/054762
Other languages
French (fr)
Other versions
WO2008129010A2 (en
WO2008129010A9 (en
Inventor
Oliver Kluth
Jiri Springer
Michael Mohr
Andreas Huegli
Original Assignee
Oc Oerlikon Balzers Ag
Oliver Kluth
Jiri Springer
Michael Mohr
Andreas Huegli
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Oc Oerlikon Balzers Ag, Oliver Kluth, Jiri Springer, Michael Mohr, Andreas Huegli filed Critical Oc Oerlikon Balzers Ag
Priority to CN2008800124651A priority Critical patent/CN101688893B/en
Priority to JP2010503525A priority patent/JP2010525311A/en
Priority to AT08749611T priority patent/ATE545036T1/en
Priority to EP08749611A priority patent/EP2137543B1/en
Publication of WO2008129010A2 publication Critical patent/WO2008129010A2/en
Publication of WO2008129010A9 publication Critical patent/WO2008129010A9/en
Publication of WO2008129010A3 publication Critical patent/WO2008129010A3/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G01R31/2808Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
    • HELECTRICITY
    • H02GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02SGENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
    • H02S50/00Monitoring or testing of PV systems, e.g. load balancing or fault identification
    • H02S50/10Testing of PV devices, e.g. of PV modules or single PV cells
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy

Abstract

Provided is a method and test system (26) for identifying a defective region of a photovoltaic cell from among a plurality of photovoltaic cells (12) collectively forming a thin film solar module (10). A probe (28) includes a plurality of test fingers (30) arranged to be simultaneously placed adjacent to an electric contact provided to different regions of photovoltaic cells. A light source (42) emits light to be converted by the photovoltaic cells into the electrical output during testing. A measurement circuit (36) measures a property of the electrical output received from the different regions of the photovoltaic cells and transmits a measured value signal indicative of the property measured by the measurement circuit. And a control unit (38) receives the measured value signal and generates a visible display (40) indicating that at least one of the different regions of the solar module is a defective region based at least in part on the measured value signal, and also indicates a location of the defective region on the solar module.
PCT/EP2008/054762 2007-04-19 2008-04-18 Test equipment for automated quality control of thin film solar modules WO2008129010A2 (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
CN2008800124651A CN101688893B (en) 2007-04-19 2008-04-18 Test equipment for automated quality control of thin film solar modules
JP2010503525A JP2010525311A (en) 2007-04-19 2008-04-18 Thin film solar module automatic quality control test equipment
AT08749611T ATE545036T1 (en) 2007-04-19 2008-04-18 TEST EQUIPMENT FOR AUTOMATED QUALITY CONTROL OF THIN FILM SOALR MODULES
EP08749611A EP2137543B1 (en) 2007-04-19 2008-04-18 Test equipment for automated quality control of thin film solar modules

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US91279907P 2007-04-19 2007-04-19
US60/912,799 2007-04-19
US94369407P 2007-06-13 2007-06-13
US60/943,694 2007-06-13

Publications (3)

Publication Number Publication Date
WO2008129010A2 WO2008129010A2 (en) 2008-10-30
WO2008129010A9 WO2008129010A9 (en) 2009-01-08
WO2008129010A3 true WO2008129010A3 (en) 2009-03-26

Family

ID=39773113

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/EP2008/054762 WO2008129010A2 (en) 2007-04-19 2008-04-18 Test equipment for automated quality control of thin film solar modules

Country Status (7)

Country Link
US (1) US7554346B2 (en)
EP (1) EP2137543B1 (en)
JP (1) JP2010525311A (en)
CN (1) CN101688893B (en)
AT (1) ATE545036T1 (en)
TW (1) TWI429925B (en)
WO (1) WO2008129010A2 (en)

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Also Published As

Publication number Publication date
US20080258747A1 (en) 2008-10-23
ATE545036T1 (en) 2012-02-15
WO2008129010A2 (en) 2008-10-30
JP2010525311A (en) 2010-07-22
WO2008129010A9 (en) 2009-01-08
CN101688893A (en) 2010-03-31
EP2137543A2 (en) 2009-12-30
TWI429925B (en) 2014-03-11
TW200900708A (en) 2009-01-01
EP2137543B1 (en) 2012-02-08
US7554346B2 (en) 2009-06-30
CN101688893B (en) 2012-08-08

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