WO2008100409A3 - Method and apparatus for determining reflectance data of a subject - Google Patents

Method and apparatus for determining reflectance data of a subject Download PDF

Info

Publication number
WO2008100409A3
WO2008100409A3 PCT/US2008/001627 US2008001627W WO2008100409A3 WO 2008100409 A3 WO2008100409 A3 WO 2008100409A3 US 2008001627 W US2008001627 W US 2008001627W WO 2008100409 A3 WO2008100409 A3 WO 2008100409A3
Authority
WO
WIPO (PCT)
Prior art keywords
reflectance data
light field
mapping
subject
brdf
Prior art date
Application number
PCT/US2008/001627
Other languages
French (fr)
Other versions
WO2008100409A9 (en
WO2008100409A2 (en
Inventor
Jefferson Y Han
Kenneth Perlin
Original Assignee
Univ New York
Jefferson Y Han
Kenneth Perlin
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Univ New York, Jefferson Y Han, Kenneth Perlin filed Critical Univ New York
Publication of WO2008100409A2 publication Critical patent/WO2008100409A2/en
Publication of WO2008100409A9 publication Critical patent/WO2008100409A9/en
Publication of WO2008100409A3 publication Critical patent/WO2008100409A3/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G01N21/474—Details of optical heads therefor, e.g. using optical fibres
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity

Abstract

An apparatus for obtaining reflectance data of an object Includes a diffuser having a surface The apparatus Includes a mapping portion that effects a mapping between a light field at the object's surface and a light field at the diffuser surface for bi-directional reflectance distribution function (BRDF) capture of the object A method for obtaining reflectance data usable to determine a plurality of values of the BRDF of an object The method includes the steps of illuminating the object There is the step of effecting a mapping between a light field at the object is surface and a light field at a diffuser surface for BRDF capture of the object with a mapping portion An apparatus and a method for measuring an 8 dimension reflectance field of an object or a 3D object
PCT/US2008/001627 2007-02-12 2008-02-07 Method and apparatus for determining reflectance data of a subject WO2008100409A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/705,195 US7830522B2 (en) 2002-09-25 2007-02-12 Method and apparatus for determining reflectance data of a subject
US11/705,195 2007-02-12

Publications (3)

Publication Number Publication Date
WO2008100409A2 WO2008100409A2 (en) 2008-08-21
WO2008100409A9 WO2008100409A9 (en) 2008-10-09
WO2008100409A3 true WO2008100409A3 (en) 2008-11-27

Family

ID=38517433

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2008/001627 WO2008100409A2 (en) 2007-02-12 2008-02-07 Method and apparatus for determining reflectance data of a subject

Country Status (2)

Country Link
US (2) US7830522B2 (en)
WO (1) WO2008100409A2 (en)

Families Citing this family (53)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7009663B2 (en) 2003-12-17 2006-03-07 Planar Systems, Inc. Integrated optical light sensitive active matrix liquid crystal display
US7053967B2 (en) 2002-05-23 2006-05-30 Planar Systems, Inc. Light sensitive display
AU2002336341A1 (en) 2002-02-20 2003-09-09 Planar Systems, Inc. Light sensitive display
US7830522B2 (en) * 2002-09-25 2010-11-09 New York University Method and apparatus for determining reflectance data of a subject
US20080084374A1 (en) 2003-02-20 2008-04-10 Planar Systems, Inc. Light sensitive display
US7773139B2 (en) 2004-04-16 2010-08-10 Apple Inc. Image sensor with photosensitive thin film transistors
US8066384B2 (en) 2004-08-18 2011-11-29 Klip Collective, Inc. Image projection kit and method and system of distributing image content for use with the same
JP4924114B2 (en) * 2007-03-09 2012-04-25 株式会社ニコン Image processing program and image processing method
US7929142B2 (en) * 2007-09-25 2011-04-19 Microsoft Corporation Photodiode-based bi-directional reflectance distribution function (BRDF) measurement
US10180714B1 (en) 2008-04-24 2019-01-15 Pixar Two-handed multi-stroke marking menus for multi-touch devices
US8836646B1 (en) 2008-04-24 2014-09-16 Pixar Methods and apparatus for simultaneous user inputs for three-dimensional animation
US20090295912A1 (en) * 2008-05-12 2009-12-03 Coinsecure, Inc. Coin edge imaging device
US8243075B2 (en) * 2008-10-14 2012-08-14 Autodesk, Inc. Graphics processing unit accelerated dynamic radial tessellation
KR101582607B1 (en) * 2009-04-30 2016-01-19 삼성전자주식회사 Semiconductor memory device
US9098945B2 (en) * 2009-05-01 2015-08-04 Microsoft Technology Licensing, Llc Modeling anisotropic surface reflectance with microfacet synthesis
US8248613B2 (en) 2010-04-29 2012-08-21 Microsoft Corporation Capturing reflected light from a sampling surface
US9662047B2 (en) 2010-08-05 2017-05-30 Massachusetts Institute Of Technology Portable raman diagnostic system
US9310923B2 (en) 2010-12-03 2016-04-12 Apple Inc. Input device for touch sensitive devices
US8928635B2 (en) 2011-06-22 2015-01-06 Apple Inc. Active stylus
US9329703B2 (en) 2011-06-22 2016-05-03 Apple Inc. Intelligent stylus
US8638320B2 (en) 2011-06-22 2014-01-28 Apple Inc. Stylus orientation detection
WO2013096003A1 (en) * 2011-12-20 2013-06-27 3M Innovative Properties Company Sensor for measuring surface non-uniformity
KR101913317B1 (en) * 2012-03-20 2018-10-30 삼성전자주식회사 Method and apparatus for obtaining and information of scene
US9202291B1 (en) * 2012-06-27 2015-12-01 Pixar Volumetric cloth shader
US9176604B2 (en) 2012-07-27 2015-11-03 Apple Inc. Stylus device
US9652090B2 (en) 2012-07-27 2017-05-16 Apple Inc. Device for digital communication through capacitive coupling
US9557845B2 (en) 2012-07-27 2017-01-31 Apple Inc. Input device for and method of communication with capacitive devices through frequency variation
US20140071121A1 (en) * 2012-09-11 2014-03-13 Digital Signal Corporation System and Method for Off Angle Three-Dimensional Face Standardization for Robust Performance
TWI484442B (en) * 2012-09-20 2015-05-11 Univ Nat Taiwan Science Tech Optical illusion image generating device and the method thereof
EP2957099B1 (en) * 2013-02-13 2018-08-29 Universität des Saarlandes Plenoptic imaging device
US10255318B2 (en) * 2013-02-25 2019-04-09 Facebook, Inc. Sampling a set of data
US10048775B2 (en) 2013-03-14 2018-08-14 Apple Inc. Stylus detection and demodulation
GB2514583B (en) * 2013-05-29 2015-03-04 Imagination Tech Ltd Relightable texture for use in rendering an image
US9939935B2 (en) 2013-07-31 2018-04-10 Apple Inc. Scan engine for touch controller architecture
US8805088B1 (en) * 2013-12-16 2014-08-12 Google Inc. Specularity determination from images
US9773342B2 (en) * 2014-01-27 2017-09-26 Nvidia Corporation Barycentric filtering for measured biderectional scattering distribution function
US9210335B2 (en) * 2014-03-19 2015-12-08 Konica Minolta Laboratory U.S.A., Inc. Method for generating HDR images using modified weight
US8982125B1 (en) * 2014-05-15 2015-03-17 Chaos Software Ltd. Shading CG representations of materials
WO2015174927A1 (en) * 2014-05-15 2015-11-19 Emage Vision Pte. Ltd. System and method for inspecting opthalmic lenses
US9752991B2 (en) 2014-06-13 2017-09-05 Canon Kabushiki Kaisha Devices, systems, and methods for acquisition of an angular-dependent material feature
EP3016368A1 (en) * 2014-10-27 2016-05-04 Thomson Licensing Method and apparatus for handling a defect object in an image
US10067618B2 (en) 2014-12-04 2018-09-04 Apple Inc. Coarse scan and targeted active mode scan for touch
CN104729428B (en) * 2015-02-27 2018-12-14 湖北文理学院 Mirror face part three dimensional shape measurement system and measurement method based on coaxial configuration light
WO2016153850A1 (en) * 2015-03-26 2016-09-29 Otoy, Inc. Relightable holograms
US10481553B2 (en) 2015-03-26 2019-11-19 Otoy, Inc. Relightable holograms
US10474277B2 (en) 2016-05-31 2019-11-12 Apple Inc. Position-based stylus communication
DE102016121662A1 (en) * 2016-11-11 2018-05-17 Saurer Germany Gmbh & Co. Kg Method and device for assessing the quality of a longitudinally moved strand-like material
US11057542B2 (en) 2017-04-26 2021-07-06 Hewlett-Packard Development Company, L.P. Color calibration
US11043025B2 (en) * 2018-09-28 2021-06-22 Arizona Board Of Regents On Behalf Of Arizona State University Illumination estimation for captured video data in mixed-reality applications
CN109932341B (en) * 2019-03-11 2021-03-23 北京环境特性研究所 Bidirectional reflection distribution function measuring method of typical target in field environment
CN110208218A (en) * 2019-07-08 2019-09-06 莱森光学（深圳）有限公司 A kind of two-way dispersion distribution function spectral measurement system
LU102085B1 (en) * 2020-09-22 2022-03-23 K/Lens Gmbh Imaging system, in particular for a camera
CN112730336A (en) * 2020-12-25 2021-04-30 温州晶彩光电有限公司 Spectral reflectivity reconstruction method and system based on color sensor

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040061784A1 (en) * 2002-07-17 2004-04-01 Kenneth Perlin BRDF analyzer
US20050068537A1 (en) * 2002-07-17 2005-03-31 New York University Method and apparatus for determining a bidirectional reflectance distribution function of a subject

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5517315A (en) * 1993-10-29 1996-05-14 The United States Of America As Represented By The Secretary Of The Navy Reflectometer employing an integrating sphere and lens-mirror concentrator
US5637873A (en) * 1995-06-07 1997-06-10 The Boeing Company Directional reflectometer for measuring optical bidirectional reflectance
US6122042A (en) * 1997-02-07 2000-09-19 Wunderman; Irwin Devices and methods for optically identifying characteristics of material objects
DE10143602B4 (en) 2001-09-06 2007-08-23 Display-Messtechnik & Systeme Gmbh & Co.Kg Device for the metrological evaluation of reflective objects, in particular of reflective displays
US20040036882A1 (en) * 2002-07-17 2004-02-26 Kenneth Perlin BRDF analyzer
US7830522B2 (en) * 2002-09-25 2010-11-09 New York University Method and apparatus for determining reflectance data of a subject

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040061784A1 (en) * 2002-07-17 2004-04-01 Kenneth Perlin BRDF analyzer
US20050068537A1 (en) * 2002-07-17 2005-03-31 New York University Method and apparatus for determining a bidirectional reflectance distribution function of a subject

Also Published As

Publication number Publication date
US8094318B2 (en) 2012-01-10
WO2008100409A9 (en) 2008-10-09
US7830522B2 (en) 2010-11-09
US20110043812A1 (en) 2011-02-24
US20070216905A1 (en) 2007-09-20
WO2008100409A2 (en) 2008-08-21

Similar Documents

Publication Publication Date Title
WO2008100409A3 (en) Method and apparatus for determining reflectance data of a subject
WO2005025894A3 (en) Tire inspection apparatus and method
WO2008105322A1 (en) Optical refractometry measuring method and device
WO2009046218A3 (en) Combined object capturing system and display device and associated method
WO2004046645A3 (en) Fast 3d height measurement method and system
WO2007087485A3 (en) Method and apparatus for photographic measurement
EP1777493A3 (en) Methods and apparatus for inspecting an object using structured light
WO2004063709A8 (en) Biomarkers and methods for determining sensitivity to epidermal growth factor receptor modulators
WO2007101180A3 (en) Method for optical characterization and evaluation of optically variable devices and media
TW200624860A (en) Systems and methods for measuring color and contrast in specular reflective devices
WO2008040939A3 (en) Measuring brillouin backscatter from an optical fibre using a tracking signal
WO2008058281A3 (en) Method and apparatus for obtaining the distance from an optical measurement instrument to and object under test
WO2006052634A3 (en) Non-invasive measurement system and method for measuring the concentration of an optically-active substance
WO2008017878A3 (en) Optical imaging of physical objects
WO2008115991A3 (en) A method and apparatus for estimating a property of a fluid downhole
EP2189941A3 (en) Methods and apparatus for measuring 3D dimensions on 2D images
WO2008128978A3 (en) Method and apparatus for dimensionally measuring by means of coordinate measuring instruments
WO2010083269A3 (en) Optical imaging for optical device inspection
EP2772738A3 (en) Optical fiber temperature distribution measurement device and method of measuring optical fiber temperature distribution
EP1736731A3 (en) Three- dimensional measuring system
WO2005067667A3 (en) Biomarkers and methods for determining sensitivity to epidermal growth factor receptor modulators
WO2007112215A3 (en) Optical design of a measurement system having multiple sensor or multiple light source paths
ATE400791T1 (en) DEVICE AND METHOD FOR MONITORING MOVING OBJECTS
ATE506889T1 (en) DEVICE AND METHOD FOR MEASURING COLLAGEN THICKNESS
ATE409846T1 (en) METHOD AND DEVICE FOR DETECTING THE SURFACE SHAPE OF A PARTIALLY REFLECTIVE SURFACE

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 08725278

Country of ref document: EP

Kind code of ref document: A2

NENP Non-entry into the national phase

Ref country code: DE

122 Ep: pct application non-entry in european phase

Ref document number: 08725278

Country of ref document: EP

Kind code of ref document: A2