WO2008073159A3 - Nanoscopic assurance coating for lead-free solders - Google Patents
Nanoscopic assurance coating for lead-free solders Download PDFInfo
- Publication number
- WO2008073159A3 WO2008073159A3 PCT/US2007/018121 US2007018121W WO2008073159A3 WO 2008073159 A3 WO2008073159 A3 WO 2008073159A3 US 2007018121 W US2007018121 W US 2007018121W WO 2008073159 A3 WO2008073159 A3 WO 2008073159A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- lead
- nanoscopic
- free solders
- assurance coating
- assurance
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
- H01L23/29—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the material, e.g. carbon
- H01L23/293—Organic, e.g. plastic
- H01L23/296—Organo-silicon compounds
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D—PROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D3/00—Pretreatment of surfaces to which liquids or other fluent materials are to be applied; After-treatment of applied coatings, e.g. intermediate treating of an applied coating preparatory to subsequent applications of liquids or other fluent materials
- B05D3/02—Pretreatment of surfaces to which liquids or other fluent materials are to be applied; After-treatment of applied coatings, e.g. intermediate treating of an applied coating preparatory to subsequent applications of liquids or other fluent materials by baking
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G77/00—Macromolecular compounds obtained by reactions forming a linkage containing silicon with or without sulfur, nitrogen, oxygen or carbon in the main chain of the macromolecule
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D183/00—Coating compositions based on macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing silicon, with or without sulfur, nitrogen, oxygen, or carbon only; Coating compositions based on derivatives of such polymers
- C09D183/04—Polysiloxanes
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/22—Secondary treatment of printed circuits
- H05K3/28—Applying non-metallic protective coatings
- H05K3/285—Permanent coating compositions
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y30/00—Nanotechnology for materials or surface science, e.g. nanocomposites
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G77/00—Macromolecular compounds obtained by reactions forming a linkage containing silicon with or without sulfur, nitrogen, oxygen or carbon in the main chain of the macromolecule
- C08G77/04—Polysiloxanes
- C08G77/045—Polysiloxanes containing less than 25 silicon atoms
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/01—Dielectrics
- H05K2201/0137—Materials
- H05K2201/0162—Silicon containing polymer, e.g. silicone
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/10—Details of components or other objects attached to or integrated in a printed circuit board
- H05K2201/10613—Details of electrical connections of non-printed components, e.g. special leads
- H05K2201/10954—Other details of electrical connections
- H05K2201/10977—Encapsulated connections
Abstract
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2009525565A JP5221539B2 (en) | 2006-08-18 | 2007-08-15 | Nanoscopic guarantee coating for lead-free solder |
EP07870739A EP2059349A4 (en) | 2006-08-18 | 2007-08-15 | Nanoscopic assurance coating for lead-free solders |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US82279206P | 2006-08-18 | 2006-08-18 | |
US60/822,792 | 2006-08-18 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2008073159A2 WO2008073159A2 (en) | 2008-06-19 |
WO2008073159A3 true WO2008073159A3 (en) | 2008-08-07 |
Family
ID=39512240
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2007/018121 WO2008073159A2 (en) | 2006-08-18 | 2007-08-15 | Nanoscopic assurance coating for lead-free solders |
Country Status (6)
Country | Link |
---|---|
EP (1) | EP2059349A4 (en) |
JP (1) | JP5221539B2 (en) |
KR (1) | KR20090051741A (en) |
SG (1) | SG176498A1 (en) |
TW (1) | TW200831623A (en) |
WO (1) | WO2008073159A2 (en) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20100012708A1 (en) * | 2008-07-16 | 2010-01-21 | Schlumberger Technology Corporation | Oilfield tools comprising modified-soldered electronic components and methods of manufacturing same |
DE102008036090B4 (en) * | 2008-08-04 | 2020-01-30 | Te Connectivity Germany Gmbh | Electrical contact pairing and method for producing and contacting such |
CN102019514A (en) * | 2010-06-01 | 2011-04-20 | 重庆大学 | Trimethyl-silyl polysilsesquioxane particle reinforced type tin-silver-copper composite soldering paste and preparation method thereof |
US10162393B2 (en) | 2016-01-13 | 2018-12-25 | Seagate Technology Llc | Electrical connector with force balancing |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5730851A (en) * | 1995-02-24 | 1998-03-24 | International Business Machines Corporation | Method of making electronic housings more reliable by preventing formation of metallic whiskers on the sheets used to fabricate them |
US5753374A (en) * | 1995-11-27 | 1998-05-19 | Dow Corning Corporation | Protective electronic coating |
US6376769B1 (en) * | 1999-05-18 | 2002-04-23 | Amerasia International Technology, Inc. | High-density electronic package, and method for making same |
US20050013990A1 (en) * | 2003-07-10 | 2005-01-20 | Motorola, Inc. | Silicone dispensing with a conformal film |
US20060104855A1 (en) * | 2004-11-15 | 2006-05-18 | Metallic Resources, Inc. | Lead-free solder alloy |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6045665B2 (en) * | 1980-04-21 | 1985-10-11 | 日立化成工業株式会社 | Moisture-proof insulation paint composition for mounted circuit boards |
JP2738303B2 (en) * | 1994-07-15 | 1998-04-08 | 株式会社デンソー | Manufacturing method of electronic component mounted circuit board |
JP2001189109A (en) * | 2000-01-05 | 2001-07-10 | Sumitomo Bakelite Co Ltd | Resin composition for insulator, and insulator using the same |
JP3975329B2 (en) * | 2001-12-14 | 2007-09-12 | 信越化学工業株式会社 | MOUNTING CIRCUIT BOARD PROTECTION COATING AGENT, MOUNTING SURFACE PREVENTION METHOD, |
JP2005322659A (en) * | 2004-05-06 | 2005-11-17 | Matsushita Electric Ind Co Ltd | Wiring board, its manufacturing method and semiconductor device |
TW200630447A (en) * | 2004-11-19 | 2006-09-01 | Showa Denko Kk | Resin cured film for flexible printed wiring board and production process thereof |
EP1848762A4 (en) * | 2005-02-14 | 2010-07-21 | Hybrid Plastics Inc | Porosity control with polyhedral oligomeric silsesquioxanes |
-
2007
- 2007-08-15 WO PCT/US2007/018121 patent/WO2008073159A2/en active Application Filing
- 2007-08-15 KR KR1020097003324A patent/KR20090051741A/en active IP Right Grant
- 2007-08-15 JP JP2009525565A patent/JP5221539B2/en not_active Expired - Fee Related
- 2007-08-15 EP EP07870739A patent/EP2059349A4/en not_active Withdrawn
- 2007-08-15 SG SG2011085412A patent/SG176498A1/en unknown
- 2007-08-17 TW TW096130502A patent/TW200831623A/en unknown
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5730851A (en) * | 1995-02-24 | 1998-03-24 | International Business Machines Corporation | Method of making electronic housings more reliable by preventing formation of metallic whiskers on the sheets used to fabricate them |
US5753374A (en) * | 1995-11-27 | 1998-05-19 | Dow Corning Corporation | Protective electronic coating |
US6376769B1 (en) * | 1999-05-18 | 2002-04-23 | Amerasia International Technology, Inc. | High-density electronic package, and method for making same |
US20050013990A1 (en) * | 2003-07-10 | 2005-01-20 | Motorola, Inc. | Silicone dispensing with a conformal film |
US20060104855A1 (en) * | 2004-11-15 | 2006-05-18 | Metallic Resources, Inc. | Lead-free solder alloy |
Non-Patent Citations (1)
Title |
---|
See also references of EP2059349A4 * |
Also Published As
Publication number | Publication date |
---|---|
JP5221539B2 (en) | 2013-06-26 |
TW200831623A (en) | 2008-08-01 |
EP2059349A4 (en) | 2010-12-22 |
EP2059349A2 (en) | 2009-05-20 |
JP2010502011A (en) | 2010-01-21 |
SG176498A1 (en) | 2011-12-29 |
WO2008073159A2 (en) | 2008-06-19 |
KR20090051741A (en) | 2009-05-22 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
MY149145A (en) | A particle-containing etching paste for silicon surfaces and layers | |
TW200734437A (en) | Polishing liquid for barrier layer | |
WO2006088533A3 (en) | Method and composition for electro-chemical-mechanical polishing | |
SG116648A1 (en) | Surface protecting film for semiconductor wafer and method of protecting semiconductor wafer using the same. | |
GB2427071B (en) | Semiconductor device having SiC substrate and method for manufacturing the same | |
TWI348710B (en) | Conductive compositions and processes for use in the manufacture of semiconductor devices | |
EP2075847A4 (en) | Silicon carbide semiconductor device and method for fabricating the same | |
WO2008073159A3 (en) | Nanoscopic assurance coating for lead-free solders | |
TWI370496B (en) | Bonding pad on ic substrate and method for making the same | |
WO2006112995A3 (en) | Glass-based semiconductor on insulator structures and methods of making same | |
SG129354A1 (en) | Method to engineer etch profiles in si substrate for advanced semiconductor devices | |
EP1871153A3 (en) | Wiring substrate and manufacturing method thereof, and semiconductor apparatus | |
EP1780774A4 (en) | Heat treatment jig for semiconductor silicon substrate | |
IL193308A0 (en) | Method and compositions for direct copper plating and filling to form interconnects in the fabrication of semiconductor devices | |
WO2007050287A3 (en) | Semiconductor structure and method of assembly | |
GB0611269D0 (en) | Bond coat for corrosion resistant EBL for silicon-containing substrate and processes for preparing same | |
ATE497419T1 (en) | WIRE AND SOLDER JOINT PRODUCTION PROCESS | |
EP1879223A4 (en) | Composition for copper wiring polishing and method of polishing surface of semiconductor integrated circuit | |
DE602006006370D1 (en) | Process for the surface treatment of III-V semiconductor substrates and process for the preparation of III-V compound semiconductors | |
WO2007117829A3 (en) | Method for bonding a semiconductor substrate to a metal substrate | |
HK1117272A1 (en) | Semiconductor wafer surface protecting sheet and semiconductor wafer protecting method using such protecting sheet | |
TWI368943B (en) | Semiconductor wafer including semiconductor chips divided by scribe line and process-monitor electrode pads formed on scribe line | |
WO2007135604A3 (en) | Interconnection arrangement and method for interconnecting a high-cuurent carrying cable with a metal thin-film | |
TWI257125B (en) | A method for preventing metal line bridging in a semiconductor device | |
EP2077257A4 (en) | Semiconductor ceramic composition and method for producing the same |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
121 | Ep: the epo has been informed by wipo that ep was designated in this application |
Ref document number: 07870739 Country of ref document: EP Kind code of ref document: A2 |
|
WWE | Wipo information: entry into national phase |
Ref document number: 2009525565 Country of ref document: JP Ref document number: 1020097003324 Country of ref document: KR |
|
NENP | Non-entry into the national phase |
Ref country code: DE |
|
WWE | Wipo information: entry into national phase |
Ref document number: 2007870739 Country of ref document: EP |
|
NENP | Non-entry into the national phase |
Ref country code: RU |