WO2008048624A3 - Crystal oscillator emulator - Google Patents

Crystal oscillator emulator Download PDF

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Publication number
WO2008048624A3
WO2008048624A3 PCT/US2007/022117 US2007022117W WO2008048624A3 WO 2008048624 A3 WO2008048624 A3 WO 2008048624A3 US 2007022117 W US2007022117 W US 2007022117W WO 2008048624 A3 WO2008048624 A3 WO 2008048624A3
Authority
WO
WIPO (PCT)
Prior art keywords
temperature
calibration parameters
calibration
crystal oscillator
oscillator emulator
Prior art date
Application number
PCT/US2007/022117
Other languages
French (fr)
Other versions
WO2008048624A2 (en
Inventor
Sehat Sutardja
Original Assignee
Marvell World Trade Ltd
Sehat Sutardja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US11/649,433 external-priority patent/US7768360B2/en
Priority claimed from US11/732,435 external-priority patent/US7760039B2/en
Application filed by Marvell World Trade Ltd, Sehat Sutardja filed Critical Marvell World Trade Ltd
Publication of WO2008048624A2 publication Critical patent/WO2008048624A2/en
Publication of WO2008048624A3 publication Critical patent/WO2008048624A3/en

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION, OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
    • H03L1/00—Stabilisation of generator output against variations of physical values, e.g. power supply
    • H03L1/02—Stabilisation of generator output against variations of physical values, e.g. power supply against variations of temperature only
    • H03L1/022—Stabilisation of generator output against variations of physical values, e.g. power supply against variations of temperature only by indirect stabilisation, i.e. by generating an electrical correction signal which is a function of the temperature
    • H03L1/027—Stabilisation of generator output against variations of physical values, e.g. power supply against variations of temperature only by indirect stabilisation, i.e. by generating an electrical correction signal which is a function of the temperature by using frequency conversion means which is variable with temperature, e.g. mixer, frequency divider, pulse add/substract logic circuit
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION, OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
    • H03L7/00—Automatic control of frequency or phase; Synchronisation
    • H03L7/06—Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
    • H03L7/16—Indirect frequency synthesis, i.e. generating a desired one of a number of predetermined frequencies using a frequency- or phase-locked loop
    • H03L7/18—Indirect frequency synthesis, i.e. generating a desired one of a number of predetermined frequencies using a frequency- or phase-locked loop using a frequency divider or counter in the loop
    • H03L7/197—Indirect frequency synthesis, i.e. generating a desired one of a number of predetermined frequencies using a frequency- or phase-locked loop using a frequency divider or counter in the loop a time difference being used for locking the loop, the counter counting between numbers which are variable in time or the frequency divider dividing by a factor variable in time, e.g. for obtaining fractional frequency division
    • H03L7/1974—Indirect frequency synthesis, i.e. generating a desired one of a number of predetermined frequencies using a frequency- or phase-locked loop using a frequency divider or counter in the loop a time difference being used for locking the loop, the counter counting between numbers which are variable in time or the frequency divider dividing by a factor variable in time, e.g. for obtaining fractional frequency division for fractional frequency division
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION, OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
    • H03L7/00—Automatic control of frequency or phase; Synchronisation
    • H03L7/06—Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
    • H03L7/16—Indirect frequency synthesis, i.e. generating a desired one of a number of predetermined frequencies using a frequency- or phase-locked loop
    • H03L7/18—Indirect frequency synthesis, i.e. generating a desired one of a number of predetermined frequencies using a frequency- or phase-locked loop using a frequency divider or counter in the loop
    • H03L7/197—Indirect frequency synthesis, i.e. generating a desired one of a number of predetermined frequencies using a frequency- or phase-locked loop using a frequency divider or counter in the loop a time difference being used for locking the loop, the counter counting between numbers which are variable in time or the frequency divider dividing by a factor variable in time, e.g. for obtaining fractional frequency division
    • H03L7/1974—Indirect frequency synthesis, i.e. generating a desired one of a number of predetermined frequencies using a frequency- or phase-locked loop using a frequency divider or counter in the loop a time difference being used for locking the loop, the counter counting between numbers which are variable in time or the frequency divider dividing by a factor variable in time, e.g. for obtaining fractional frequency division for fractional frequency division
    • H03L7/1976—Indirect frequency synthesis, i.e. generating a desired one of a number of predetermined frequencies using a frequency- or phase-locked loop using a frequency divider or counter in the loop a time difference being used for locking the loop, the counter counting between numbers which are variable in time or the frequency divider dividing by a factor variable in time, e.g. for obtaining fractional frequency division for fractional frequency division using a phase accumulator for controlling the counter or frequency divider
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/30—Technical effects
    • H01L2924/301—Electrical effects
    • H01L2924/3011—Impedance

Abstract

A crystal oscillator emulator integrated circuit, comprises a first temperature sensor that senses a first temperature of the integrated circuit; memory that stores calibration parameters and that selects at least one of the calibration parameters based on the first temperature; a semiconductor oscillator that generates an output signal having a frequency that is based on the calibration parameters; and an adaptive calibration circuit that adaptively adjusts a calibration approach for generating the calibration parameters based on a number of temperature test points input thereto.
PCT/US2007/022117 2006-10-17 2007-10-17 Crystal oscillator emulator WO2008048624A2 (en)

Applications Claiming Priority (10)

Application Number Priority Date Filing Date Title
US82971006P 2006-10-17 2006-10-17
US60/829,710 2006-10-17
US86880706P 2006-12-06 2006-12-06
US60/868,807 2006-12-06
US86980706P 2006-12-13 2006-12-13
US60/869,807 2006-12-13
US11/649,433 US7768360B2 (en) 2002-10-15 2007-01-04 Crystal oscillator emulator
US11/649,433 2007-01-04
US11/732,435 US7760039B2 (en) 2002-10-15 2007-04-03 Crystal oscillator emulator
US11/732,435 2007-04-03

Publications (2)

Publication Number Publication Date
WO2008048624A2 WO2008048624A2 (en) 2008-04-24
WO2008048624A3 true WO2008048624A3 (en) 2008-10-02

Family

ID=44819658

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2007/022117 WO2008048624A2 (en) 2006-10-17 2007-10-17 Crystal oscillator emulator

Country Status (2)

Country Link
TW (1) TWI433465B (en)
WO (1) WO2008048624A2 (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8605543B2 (en) 2007-09-21 2013-12-10 Fairfield Industries Incorporated Method and apparatus for correcting the timing function in a nodal seismic data acquisition unit
CA2996790C (en) 2007-09-21 2022-03-08 Fairfield Industries, Inc. Method and apparatus for correcting the timing function in a nodal seismic data acquisition unit
CN103064109B (en) * 2008-11-04 2017-07-18 费尔菲尔德工业公司 Method and apparatus for correcting the clocking capability in nodal seismic data acquisition unit
US10325644B1 (en) * 2018-04-30 2019-06-18 Nanya Technology Corporation Pump circuit in a DRAM, and method for generating a pump current

Citations (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5081431A (en) * 1990-01-26 1992-01-14 Nihon Dempa Kogyo Co., Ltd. Digital temperature-compensated oscillator
US5225771A (en) * 1988-05-16 1993-07-06 Dri Technology Corp. Making and testing an integrated circuit using high density probe points
DE4209843A1 (en) * 1992-03-26 1993-11-18 Telefunken Microelectron Temp. compensated oscillator circuit - stores tuning element setting signal and corresponding temp. signal during calibration phase for subsequent provision of correction signal
US5309090A (en) * 1990-09-06 1994-05-03 Lipp Robert J Apparatus for heating and controlling temperature in an integrated circuit chip
EP0878909A1 (en) * 1997-04-25 1998-11-18 Matsushita Electric Industrial Co., Ltd. Apparatus and method for adjusting temperature compensated quarz oscillator
US5888851A (en) * 1990-05-01 1999-03-30 Mitsubishi Denki Kabushiki Kaisha Method of manufacturing a semiconductor device having a circuit portion and redundant circuit portion coupled through a meltable connection
US6160458A (en) * 1998-03-23 2000-12-12 Dallas Semiconductor Corporation Temperature compensated crystal oscillator
WO2003073629A1 (en) * 2002-02-22 2003-09-04 Global Locate, Inc. Method and apparatus for compensating an oscillator in a location-enabled wireless device
US6718816B2 (en) * 2001-08-13 2004-04-13 The United States Of America As Represented By The Secretary Of The Navy Monolithic I.C. implemented calibration circuit
US20050151592A1 (en) * 2004-01-09 2005-07-14 Aaron Partridge Frequency and/or phase compensated microelectromechanical oscillator
US20050218917A1 (en) * 2004-03-30 2005-10-06 Infineon Technologies Ag Semiconductor component with internal heating
US20060113639A1 (en) * 2002-10-15 2006-06-01 Sehat Sutardja Integrated circuit including silicon wafer with annealed glass paste

Patent Citations (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5225771A (en) * 1988-05-16 1993-07-06 Dri Technology Corp. Making and testing an integrated circuit using high density probe points
US5081431A (en) * 1990-01-26 1992-01-14 Nihon Dempa Kogyo Co., Ltd. Digital temperature-compensated oscillator
US5888851A (en) * 1990-05-01 1999-03-30 Mitsubishi Denki Kabushiki Kaisha Method of manufacturing a semiconductor device having a circuit portion and redundant circuit portion coupled through a meltable connection
US5309090A (en) * 1990-09-06 1994-05-03 Lipp Robert J Apparatus for heating and controlling temperature in an integrated circuit chip
DE4209843A1 (en) * 1992-03-26 1993-11-18 Telefunken Microelectron Temp. compensated oscillator circuit - stores tuning element setting signal and corresponding temp. signal during calibration phase for subsequent provision of correction signal
EP0878909A1 (en) * 1997-04-25 1998-11-18 Matsushita Electric Industrial Co., Ltd. Apparatus and method for adjusting temperature compensated quarz oscillator
US6160458A (en) * 1998-03-23 2000-12-12 Dallas Semiconductor Corporation Temperature compensated crystal oscillator
US6718816B2 (en) * 2001-08-13 2004-04-13 The United States Of America As Represented By The Secretary Of The Navy Monolithic I.C. implemented calibration circuit
WO2003073629A1 (en) * 2002-02-22 2003-09-04 Global Locate, Inc. Method and apparatus for compensating an oscillator in a location-enabled wireless device
US20060113639A1 (en) * 2002-10-15 2006-06-01 Sehat Sutardja Integrated circuit including silicon wafer with annealed glass paste
US20050151592A1 (en) * 2004-01-09 2005-07-14 Aaron Partridge Frequency and/or phase compensated microelectromechanical oscillator
US20050218917A1 (en) * 2004-03-30 2005-10-06 Infineon Technologies Ag Semiconductor component with internal heating

Also Published As

Publication number Publication date
TWI433465B (en) 2014-04-01
TW200835158A (en) 2008-08-16
WO2008048624A2 (en) 2008-04-24

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