WO2008009074A3 - Compact catadioptric spectrometer - Google Patents

Compact catadioptric spectrometer Download PDF

Info

Publication number
WO2008009074A3
WO2008009074A3 PCT/BE2007/000083 BE2007000083W WO2008009074A3 WO 2008009074 A3 WO2008009074 A3 WO 2008009074A3 BE 2007000083 W BE2007000083 W BE 2007000083W WO 2008009074 A3 WO2008009074 A3 WO 2008009074A3
Authority
WO
WIPO (PCT)
Prior art keywords
optical element
illumination beam
optical
detector
receiving
Prior art date
Application number
PCT/BE2007/000083
Other languages
French (fr)
Other versions
WO2008009074A2 (en
Inventor
Ronny Bockstaele
Bert Luyssaert
Kris Naessens
Original Assignee
Imec Inter Uni Micro Electr
Univ Gent
Ronny Bockstaele
Bert Luyssaert
Kris Naessens
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Imec Inter Uni Micro Electr, Univ Gent, Ronny Bockstaele, Bert Luyssaert, Kris Naessens filed Critical Imec Inter Uni Micro Electr
Priority to CA002658187A priority Critical patent/CA2658187A1/en
Priority to CN2007800325707A priority patent/CN101548162B/en
Priority to EP07784900A priority patent/EP2047220A2/en
Priority to US12/374,247 priority patent/US7864317B2/en
Priority to AU2007276718A priority patent/AU2007276718A1/en
Priority to JP2009519753A priority patent/JP2009544015A/en
Publication of WO2008009074A2 publication Critical patent/WO2008009074A2/en
Publication of WO2008009074A3 publication Critical patent/WO2008009074A3/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/12—Generating the spectrum; Monochromators
    • G01J3/18—Generating the spectrum; Monochromators using diffraction elements, e.g. grating
    • G01J3/1804—Plane gratings
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0208—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using focussing or collimating elements, e.g. lenses or mirrors; performing aberration correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0256—Compact construction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0264—Electrical interface; User interface
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0294—Multi-channel spectroscopy
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/12—Generating the spectrum; Monochromators
    • G01J3/18—Generating the spectrum; Monochromators using diffraction elements, e.g. grating

Abstract

An optical characterisation system is described for characterising optical material. The system typically comprises a diffractive element (104), a detector (106) and an optical element (102). The optical element (102) thereby typically is adapted for receiving an illumination beam, which may be an illumination response of the material. The optical element (102) typically has a refractive surface for refractively collimating the illumination beam on the diffractive element (104) and a reflective surface for reflecting the diffracted illumination beam on the detector (106). The optical element (102) furthermore is adapted for cooperating with the diffractive element (104) and the detector (106) being positioned at a same side of the optical element (102) opposite to the receiving side for receiving the illumination beam.
PCT/BE2007/000083 2006-07-20 2007-07-20 Compact catadioptric spectrometer WO2008009074A2 (en)

Priority Applications (6)

Application Number Priority Date Filing Date Title
CA002658187A CA2658187A1 (en) 2006-07-20 2007-07-20 Compact catadioptric spectrometer
CN2007800325707A CN101548162B (en) 2006-07-20 2007-07-20 Compact catadioptric spectrometer
EP07784900A EP2047220A2 (en) 2006-07-20 2007-07-20 Compact catadioptric spectrometer
US12/374,247 US7864317B2 (en) 2006-07-20 2007-07-20 Compact catadioptric spectrometer
AU2007276718A AU2007276718A1 (en) 2006-07-20 2007-07-20 Compact catadioptric spectrometer
JP2009519753A JP2009544015A (en) 2006-07-20 2007-07-20 Compact catadioptric spectrometer

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
EP06015122A EP1882916A1 (en) 2006-07-20 2006-07-20 Compact catadioptric spectrometer
EP06015122.2 2006-07-20
US83779906P 2006-08-11 2006-08-11
US60/837,799 2006-08-11

Publications (2)

Publication Number Publication Date
WO2008009074A2 WO2008009074A2 (en) 2008-01-24
WO2008009074A3 true WO2008009074A3 (en) 2008-03-06

Family

ID=37309005

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/BE2007/000083 WO2008009074A2 (en) 2006-07-20 2007-07-20 Compact catadioptric spectrometer

Country Status (7)

Country Link
US (1) US7864317B2 (en)
EP (2) EP1882916A1 (en)
JP (1) JP2009544015A (en)
CN (1) CN101548162B (en)
AU (1) AU2007276718A1 (en)
CA (1) CA2658187A1 (en)
WO (1) WO2008009074A2 (en)

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JP2009300417A (en) * 2008-05-15 2009-12-24 Hamamatsu Photonics Kk Spectroscopic module and its manufacturing method
JP2009300418A (en) * 2008-05-15 2009-12-24 Hamamatsu Photonics Kk Spectroscopic module
JP5512961B2 (en) * 2008-05-15 2014-06-04 浜松ホトニクス株式会社 Spectroscopic module and manufacturing method thereof
JP2009300422A (en) * 2008-05-15 2009-12-24 Hamamatsu Photonics Kk Spectroscopic module
JP5205242B2 (en) * 2008-05-15 2013-06-05 浜松ホトニクス株式会社 Spectrometer manufacturing method
JP5205243B2 (en) * 2008-05-15 2013-06-05 浜松ホトニクス株式会社 Spectrometer
JP5415060B2 (en) 2008-05-15 2014-02-12 浜松ホトニクス株式会社 Spectroscopic module
JP5207938B2 (en) 2008-05-15 2013-06-12 浜松ホトニクス株式会社 Spectroscopic module and method for manufacturing spectral module
JP5205240B2 (en) * 2008-05-15 2013-06-05 浜松ホトニクス株式会社 Spectroscopic module manufacturing method and spectroscopic module
JP5205239B2 (en) * 2008-05-15 2013-06-05 浜松ホトニクス株式会社 Spectrometer
JP5205241B2 (en) * 2008-05-15 2013-06-05 浜松ホトニクス株式会社 Spectroscopic module
FI20095065A0 (en) * 2009-01-26 2009-01-26 Wallac Oy Combination of lens and reflector and optical device using the same
JP5672709B2 (en) 2010-02-04 2015-02-18 セイコーエプソン株式会社 Biological information detector, biological information measuring device, and method for designing reflector in biological information detector
US20130206448A1 (en) 2010-07-19 2013-08-15 Dsm Ip Assets B.V. Flame retardant insulated electrical wire
JP5765081B2 (en) * 2011-06-22 2015-08-19 ソニー株式会社 Image sensor, electronic device, manufacturing method, and inspection apparatus
WO2013102661A1 (en) * 2012-01-04 2013-07-11 Carsten Thirstrup Spectroscopic sensor for bio-sensing
EP2825857B8 (en) * 2012-03-14 2016-05-04 FOSS Analytical AB Dispersion spectrometer
CN103398778B (en) * 2013-08-19 2015-07-29 深圳先进技术研究院 Micro spectrometer and preparation assembly method thereof
JP6325268B2 (en) * 2014-02-05 2018-05-16 浜松ホトニクス株式会社 Spectrometer and method of manufacturing the spectrometer
JP6251073B2 (en) * 2014-02-05 2017-12-20 浜松ホトニクス株式会社 Spectrometer and method of manufacturing the spectrometer
EP2913663A1 (en) * 2014-02-28 2015-09-02 IMEC vzw Optical spectrometer with matched étendue
CN104296871B (en) * 2014-10-22 2016-03-02 清华大学深圳研究生院 The method for designing of a kind of pair of entrance slit spectrometer and two entrance slit spectrometer
CN104716899B (en) * 2015-03-17 2017-08-15 河海大学常州校区 Polygon prism refraction type light gathering Tracking Integrative solar module
US11867556B2 (en) 2015-07-29 2024-01-09 Samsung Electronics Co., Ltd. Spectrometer including metasurface
US11268854B2 (en) 2015-07-29 2022-03-08 Samsung Electronics Co., Ltd. Spectrometer including metasurface
US10514296B2 (en) 2015-07-29 2019-12-24 Samsung Electronics Co., Ltd. Spectrometer including metasurface
JP6833426B2 (en) * 2016-09-23 2021-02-24 大塚電子株式会社 Spectroscopy device
CN106525235A (en) * 2016-09-30 2017-03-22 西北工业大学 Chip type spectral imaging system
CZ2016661A3 (en) * 2016-10-21 2018-02-14 Fyzikální Ústav Av Čr, V. V. I. A compact system for characterization of the spectrum and of the profile of shortwave radiation beam intensity
EP3372966B1 (en) * 2017-03-10 2021-09-01 Hitachi High-Tech Analytical Science Limited A portable analyzer using optical emission spectoscopy
US11207870B2 (en) * 2017-07-24 2021-12-28 Oak Analytics Inc Refractive-index matching optical window
US11092486B2 (en) 2017-12-08 2021-08-17 California Institute Of Technology Compact folded metasurface spectrometer
DE102018100622B4 (en) * 2018-01-12 2019-10-10 Ernst-Abbe-Hochschule Jena Simultaneous spectrometer with a plane reflective diffraction grating
US11187582B2 (en) 2019-04-30 2021-11-30 California Institute Of Technology Folded metasurface hyperspectral imager
US11639873B2 (en) * 2020-04-15 2023-05-02 Viavi Solutions Inc. High resolution multi-pass optical spectrum analyzer
CN113485020B (en) * 2021-05-31 2023-06-20 上海悠睿光学有限公司 Light splitter based on transmission grating

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Also Published As

Publication number Publication date
JP2009544015A (en) 2009-12-10
CN101548162A (en) 2009-09-30
EP2047220A2 (en) 2009-04-15
CA2658187A1 (en) 2008-01-24
EP1882916A1 (en) 2008-01-30
AU2007276718A1 (en) 2008-01-24
US20090310135A1 (en) 2009-12-17
US7864317B2 (en) 2011-01-04
CN101548162B (en) 2011-05-11
WO2008009074A2 (en) 2008-01-24

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