WO2007149113A3 - Friction reducing aid for cmp - Google Patents
Friction reducing aid for cmp Download PDFInfo
- Publication number
- WO2007149113A3 WO2007149113A3 PCT/US2006/041420 US2006041420W WO2007149113A3 WO 2007149113 A3 WO2007149113 A3 WO 2007149113A3 US 2006041420 W US2006041420 W US 2006041420W WO 2007149113 A3 WO2007149113 A3 WO 2007149113A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- polishing
- cmp
- friction reducing
- provides
- reducing aid
- Prior art date
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B29/00—Machines or devices for polishing surfaces on work by means of tools made of soft or flexible material with or without the application of solid or liquid polishing agents
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
- B24B37/042—Lapping machines or devices; Accessories designed for working plane surfaces operating processes therefor
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/005—Control means for lapping machines or devices
- B24B37/0056—Control means for lapping machines or devices taking regard of the pH-value of lapping agents
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B57/00—Devices for feeding, applying, grading or recovering grinding, polishing or lapping agents
- B24B57/02—Devices for feeding, applying, grading or recovering grinding, polishing or lapping agents for feeding of fluid, sprayed, pulverised, or liquefied grinding, polishing or lapping agents
Abstract
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2008542318A JP2009516928A (en) | 2005-11-22 | 2006-10-24 | Friction reduction aid for CMP |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/287,039 | 2005-11-22 | ||
US11/287,039 US20070117497A1 (en) | 2005-11-22 | 2005-11-22 | Friction reducing aid for CMP |
Publications (3)
Publication Number | Publication Date |
---|---|
WO2007149113A2 WO2007149113A2 (en) | 2007-12-27 |
WO2007149113A9 WO2007149113A9 (en) | 2008-02-28 |
WO2007149113A3 true WO2007149113A3 (en) | 2008-04-10 |
Family
ID=38054171
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2006/041420 WO2007149113A2 (en) | 2005-11-22 | 2006-10-24 | Friction reducing aid for cmp |
Country Status (6)
Country | Link |
---|---|
US (1) | US20070117497A1 (en) |
JP (1) | JP2009516928A (en) |
KR (1) | KR20080070675A (en) |
CN (1) | CN101313388A (en) |
TW (1) | TWI311091B (en) |
WO (1) | WO2007149113A2 (en) |
Families Citing this family (19)
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---|---|---|---|---|
WO2007103578A1 (en) * | 2006-03-09 | 2007-09-13 | Cabot Microelectronics Corporation | Method of polishing a tungsten carbide surface |
EP2634158B1 (en) * | 2011-05-24 | 2016-08-10 | Rohm and Haas Company | Improved quality multi-spectral zinc sulfide |
CN104145324B (en) * | 2011-12-28 | 2017-12-22 | 恩特格里斯公司 | Composition and method for selective etch titanium nitride |
CN102775916B (en) * | 2012-07-16 | 2015-01-07 | 芜湖海森材料科技有限公司 | Polishing composition for improving surface quality of sapphire |
US9259818B2 (en) * | 2012-11-06 | 2016-02-16 | Sinmat, Inc. | Smooth diamond surfaces and CMP method for forming |
JP6007094B2 (en) * | 2012-12-18 | 2016-10-12 | 花王株式会社 | Polishing liquid composition for sapphire plate |
KR20150103169A (en) * | 2013-01-04 | 2015-09-09 | 가부시키가이샤 후지미인코퍼레이티드 | Method for polishing alloy material and method for manufacturing alloy material |
SG11201506102TA (en) * | 2013-02-28 | 2015-09-29 | Fujimi Inc | Polishing slurry for cobalt removal |
US9633831B2 (en) * | 2013-08-26 | 2017-04-25 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Chemical mechanical polishing composition for polishing a sapphire surface and methods of using same |
CN103589344B (en) * | 2013-11-14 | 2015-06-10 | 上海新安纳电子科技有限公司 | Method for preparing alumina polishing solution |
WO2016043089A1 (en) * | 2014-09-16 | 2016-03-24 | 山口精研工業株式会社 | Polishing agent composition for sapphire substrate |
KR102447178B1 (en) | 2015-09-01 | 2022-09-26 | 삼성전자주식회사 | Methods of manufacturing semiconductor devices |
TWI650392B (en) * | 2016-02-16 | 2019-02-11 | 美商卡博特微電子公司 | Method for polishing III to V materials |
US10253216B2 (en) * | 2016-07-01 | 2019-04-09 | Versum Materials Us, Llc | Additives for barrier chemical mechanical planarization |
DE102017110198A1 (en) * | 2017-05-11 | 2018-11-15 | Walter Maschinenbau Gmbh | Grinding and / or EDM machine and method for measuring and / or referencing the machine |
KR102431416B1 (en) | 2017-11-15 | 2022-08-12 | 생-고뱅 세라믹스 앤드 플라스틱스, 인코포레이티드 | Compositions for performing material removal operations and methods for forming same |
CN110358454A (en) * | 2019-07-20 | 2019-10-22 | 大连理工大学 | A kind of general chemistry machine polishing liquor |
EP3916061B1 (en) | 2019-10-03 | 2023-07-05 | Nissan Chemical Corporation | Cation-containing polishing composition for eliminating protrusions at periphery of laser mark |
US11879094B2 (en) | 2022-06-03 | 2024-01-23 | Halliburton Energy Services, Inc. | Enhancing friction reduction and protection of wellbore equipment during hydraulic fracturing |
Citations (3)
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JPH11140427A (en) * | 1997-11-13 | 1999-05-25 | Kobe Steel Ltd | Polishing liquid and polishing |
US6276996B1 (en) * | 1998-11-10 | 2001-08-21 | Micron Technology, Inc. | Copper chemical-mechanical polishing process using a fixed abrasive polishing pad and a copper layer chemical-mechanical polishing solution specifically adapted for chemical-mechanical polishing with a fixed abrasive pad |
US6602117B1 (en) * | 2000-08-30 | 2003-08-05 | Micron Technology, Inc. | Slurry for use with fixed-abrasive polishing pads in polishing semiconductor device conductive structures that include copper and tungsten and polishing methods |
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DE2710997C3 (en) * | 1977-03-14 | 1980-08-14 | Dr. Karl Thomae Gmbh, 7950 Biberach | 4-Alkoxy carbonylamino-phenylethanolamines, their production and their use as pharmaceuticals |
JPH0228112A (en) * | 1988-04-21 | 1990-01-30 | Kaken Pharmaceut Co Ltd | Intraocular tension regulator for instillation |
US5352277A (en) * | 1988-12-12 | 1994-10-04 | E. I. Du Pont De Nemours & Company | Final polishing composition |
DE3902753A1 (en) * | 1989-01-31 | 1990-08-02 | Henkel Kgaa | METHOD FOR THE HYDROTHERMAL PRODUCTION OF POTASSIUM SILICATE SOLUTIONS WITH HIGH SI0 (DOWN ARROW) 2 (DOWN ARROW): K (DOWN ARROW) 2 (DOWN ARROW) 0-MOLE RATIO |
DE3938789A1 (en) * | 1989-11-23 | 1991-05-29 | Henkel Kgaa | METHOD FOR THE HYDROTHERMAL PRODUCTION OF POTASSIUM SILICATE SOLUTIONS |
DE19643592A1 (en) * | 1996-10-22 | 1998-04-23 | Bayer Ag | Process for the preparation of alpha-alkoxy-alpha-trifluoromethyl-arylacetic acid esters and -arylacetic acids |
SG54606A1 (en) * | 1996-12-05 | 1998-11-16 | Fujimi Inc | Polishing composition |
US6322600B1 (en) * | 1997-04-23 | 2001-11-27 | Advanced Technology Materials, Inc. | Planarization compositions and methods for removing interlayer dielectric films |
TW593331B (en) * | 1997-07-25 | 2004-06-21 | Inspire Pharmaceuticals Inc | Method for large-scale production of di(uridine 5')-tetraphosphate and salts thereof |
US6051605A (en) * | 1997-08-08 | 2000-04-18 | Warner-Lambert Company | Method of treating psychosis and schizophrenia |
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US6217416B1 (en) * | 1998-06-26 | 2001-04-17 | Cabot Microelectronics Corporation | Chemical mechanical polishing slurry useful for copper/tantalum substrates |
JP3941284B2 (en) * | 1999-04-13 | 2007-07-04 | 株式会社日立製作所 | Polishing method |
AU1464101A (en) * | 1999-12-21 | 2001-07-03 | Gpi Nil Holdings, Inc. | Hydantoin derivative compounds, pharmaceutical compositions, and methods of using same |
US6551935B1 (en) * | 2000-08-31 | 2003-04-22 | Micron Technology, Inc. | Slurry for use in polishing semiconductor device conductive structures that include copper and tungsten and polishing methods |
US6709316B1 (en) * | 2000-10-27 | 2004-03-23 | Applied Materials, Inc. | Method and apparatus for two-step barrier layer polishing |
US20030032078A1 (en) * | 2001-01-23 | 2003-02-13 | Board Of Regents, The University Of Texas System | Methods and compositions for the treatment of macular and retinal degenerations |
JP3945745B2 (en) * | 2001-03-09 | 2007-07-18 | 三井金属鉱業株式会社 | Cerium-based abrasive and abrasive slurry and method for producing cerium-based abrasive |
US6656241B1 (en) * | 2001-06-14 | 2003-12-02 | Ppg Industries Ohio, Inc. | Silica-based slurry |
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JP4008219B2 (en) * | 2001-09-27 | 2007-11-14 | 触媒化成工業株式会社 | Abrasive |
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PA8557501A1 (en) * | 2001-11-12 | 2003-06-30 | Pfizer Prod Inc | BENZAMIDA, HETEROARILAMIDA AND INVESTED AMIDAS |
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US6827639B2 (en) * | 2002-03-27 | 2004-12-07 | Catalysts & Chemicals Industries Co., Ltd. | Polishing particles and a polishing agent |
US6913517B2 (en) * | 2002-05-23 | 2005-07-05 | Cabot Microelectronics Corporation | Microporous polishing pads |
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EP2327401A3 (en) * | 2003-03-14 | 2011-10-19 | University of Washington | Retinoid Replacements and Opsin Agonists and Methods for the Use Thereof |
JP2005007520A (en) * | 2003-06-19 | 2005-01-13 | Nihon Micro Coating Co Ltd | Abrasive pad, manufacturing method thereof, and grinding method thereof |
US7485241B2 (en) * | 2003-09-11 | 2009-02-03 | Cabot Microelectronics Corporation | Chemical-mechanical polishing composition and method for using the same |
US20050136670A1 (en) * | 2003-12-19 | 2005-06-23 | Ameen Joseph G. | Compositions and methods for controlled polishing of copper |
US7566808B2 (en) * | 2004-02-17 | 2009-07-28 | President And Fellows Of Harvard College | Management of ophthalmologic disorders, including macular degeneration |
US20060252107A1 (en) * | 2005-02-22 | 2006-11-09 | Acucela, Inc. | Compositions and methods for diagnosing and treating retinal diseases |
US20070039926A1 (en) * | 2005-08-17 | 2007-02-22 | Cabot Microelectronics Corporation | Abrasive-free polishing system |
-
2005
- 2005-11-22 US US11/287,039 patent/US20070117497A1/en not_active Abandoned
-
2006
- 2006-10-24 CN CNA2006800437962A patent/CN101313388A/en active Pending
- 2006-10-24 KR KR1020087012131A patent/KR20080070675A/en not_active Application Discontinuation
- 2006-10-24 JP JP2008542318A patent/JP2009516928A/en active Pending
- 2006-10-24 WO PCT/US2006/041420 patent/WO2007149113A2/en active Application Filing
- 2006-11-08 TW TW095141357A patent/TWI311091B/en not_active IP Right Cessation
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH11140427A (en) * | 1997-11-13 | 1999-05-25 | Kobe Steel Ltd | Polishing liquid and polishing |
US6276996B1 (en) * | 1998-11-10 | 2001-08-21 | Micron Technology, Inc. | Copper chemical-mechanical polishing process using a fixed abrasive polishing pad and a copper layer chemical-mechanical polishing solution specifically adapted for chemical-mechanical polishing with a fixed abrasive pad |
US6602117B1 (en) * | 2000-08-30 | 2003-08-05 | Micron Technology, Inc. | Slurry for use with fixed-abrasive polishing pads in polishing semiconductor device conductive structures that include copper and tungsten and polishing methods |
Also Published As
Publication number | Publication date |
---|---|
US20070117497A1 (en) | 2007-05-24 |
TW200734117A (en) | 2007-09-16 |
TWI311091B (en) | 2009-06-21 |
CN101313388A (en) | 2008-11-26 |
WO2007149113A2 (en) | 2007-12-27 |
KR20080070675A (en) | 2008-07-30 |
WO2007149113A9 (en) | 2008-02-28 |
JP2009516928A (en) | 2009-04-23 |
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