WO2007146504A3 - Cantilever with control of vertical and lateral position of contact probe tip - Google Patents

Cantilever with control of vertical and lateral position of contact probe tip Download PDF

Info

Publication number
WO2007146504A3
WO2007146504A3 PCT/US2007/067805 US2007067805W WO2007146504A3 WO 2007146504 A3 WO2007146504 A3 WO 2007146504A3 US 2007067805 W US2007067805 W US 2007067805W WO 2007146504 A3 WO2007146504 A3 WO 2007146504A3
Authority
WO
WIPO (PCT)
Prior art keywords
cantilever
contact probe
probe tip
vertical
control
Prior art date
Application number
PCT/US2007/067805
Other languages
French (fr)
Other versions
WO2007146504A2 (en
Inventor
Nicolai Belov
Zebulah Nathan Rapp
Original Assignee
Nanochip Inc
Nicolai Belov
Zebulah Nathan Rapp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US11/553,408 external-priority patent/US20070291623A1/en
Priority claimed from US11/553,449 external-priority patent/US20070121477A1/en
Application filed by Nanochip Inc, Nicolai Belov, Zebulah Nathan Rapp filed Critical Nanochip Inc
Publication of WO2007146504A2 publication Critical patent/WO2007146504A2/en
Publication of WO2007146504A3 publication Critical patent/WO2007146504A3/en

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B9/00—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor
    • G11B9/12—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor
    • G11B9/14—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor using microscopic probe means, i.e. recording or reproducing by means directly associated with the tip of a microscopic electrical probe as used in Scanning Tunneling Microscopy [STM] or Atomic Force Microscopy [AFM] for inducing physical or electrical perturbations in a recording medium; Record carriers or media specially adapted for such transducing of information
    • G11B9/1418—Disposition or mounting of heads or record carriers
    • G11B9/1427—Disposition or mounting of heads or record carriers with provision for moving the heads or record carriers relatively to each other or for access to indexed parts without effectively imparting a relative movement
    • G11B9/1436—Disposition or mounting of heads or record carriers with provision for moving the heads or record carriers relatively to each other or for access to indexed parts without effectively imparting a relative movement with provision for moving the heads or record carriers relatively to each other
    • G11B9/1445—Disposition or mounting of heads or record carriers with provision for moving the heads or record carriers relatively to each other or for access to indexed parts without effectively imparting a relative movement with provision for moving the heads or record carriers relatively to each other switching at least one head in operating function; Controlling the relative spacing to keep the head operative, e.g. for allowing a tunnel current flow
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q80/00—Applications, other than SPM, of scanning-probe techniques

Abstract

An embodiment of a probe storage device in accordance with the present invention can include an electrostatic actuator for controlling the z-position of a cantilever having a contact probe tip extending therefrom. The electrostatic actuator can comprise two electrodes: the cantilever and a conductive portion in overlapping proximity to the cantilever. By controlling the z-position of the cantilever, the contact probe tip can be selectively engaged and disengaged from a surface of a memory media, thereby allowing the contact probe to selectively read from and/or write to the memory media.
PCT/US2007/067805 2006-06-15 2007-04-30 Cantilever with control of vertical and lateral position of contact probe tip WO2007146504A2 (en)

Applications Claiming Priority (6)

Application Number Priority Date Filing Date Title
US81395906P 2006-06-15 2006-06-15
US60/813,959 2006-06-15
US11/553,408 US20070291623A1 (en) 2006-06-15 2006-10-26 Cantilever with control of vertical and lateral position of contact probe tip
US11/553,449 2006-10-26
US11/553,449 US20070121477A1 (en) 2006-06-15 2006-10-26 Cantilever with control of vertical and lateral position of contact probe tip
US11/553,408 2006-10-26

Publications (2)

Publication Number Publication Date
WO2007146504A2 WO2007146504A2 (en) 2007-12-21
WO2007146504A3 true WO2007146504A3 (en) 2008-04-24

Family

ID=39315138

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2007/067805 WO2007146504A2 (en) 2006-06-15 2007-04-30 Cantilever with control of vertical and lateral position of contact probe tip

Country Status (1)

Country Link
WO (1) WO2007146504A2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2017037715A1 (en) * 2015-09-02 2017-03-09 Shlomo OREN Security system for solid-state electronics
MY185304A (en) * 2017-05-18 2021-04-30 Jf Microtechnology Sdn Bhd High precision vertical motion kelvin contact assembly

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20030133324A1 (en) * 2001-03-13 2003-07-17 Paul Scherrer Institut (Psi) Memory element, method for structuring a surface, and storage device
US20050128927A1 (en) * 2003-12-15 2005-06-16 Hewlett-Packard Development Co., L.P. Electrostatic actuator for contact probe storage device
US20050281174A1 (en) * 2004-06-22 2005-12-22 International Business Machines Corporation Data storage device and control
US20060043288A1 (en) * 2002-01-22 2006-03-02 Binnig Gerd K Scanning probe for data storage and microscopy

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20030133324A1 (en) * 2001-03-13 2003-07-17 Paul Scherrer Institut (Psi) Memory element, method for structuring a surface, and storage device
US20060043288A1 (en) * 2002-01-22 2006-03-02 Binnig Gerd K Scanning probe for data storage and microscopy
US20050128927A1 (en) * 2003-12-15 2005-06-16 Hewlett-Packard Development Co., L.P. Electrostatic actuator for contact probe storage device
US20050281174A1 (en) * 2004-06-22 2005-12-22 International Business Machines Corporation Data storage device and control

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
LAPSHIN R.V.: "Digital data feedback for a probe storage device", REVIEW OF SCIENTIFIC INSTRUMENTS, vol. 71, no. 12, December 2000 (2000-12-01), pages 4607 - 4610, XP012037894, Retrieved from the Internet <URL:http://www.nanoworld.org/homepages/lapshin/publications/R.%20V.%20Lapshin,%20Digital%20data%20readback%20for%20a%20probe%20storage%20device.pdf> DOI: doi:10.1063/1.1322575 *
VETTIGER P. ET AL.: "The Millipede -more than one thousand tips for future AFM data storage", IN THE IBM JOURNAL OF RESEARCH AND DEVELOPMENT, vol. 44, no. 3, May 2000 (2000-05-01), pages 323 - 340, Retrieved from the Internet <URL:http://www.research.ibm.com/journal/rd/442/vettiger.pdf> *

Also Published As

Publication number Publication date
WO2007146504A2 (en) 2007-12-21

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