WO2007146285A3 - Differential signal probe with integral balun - Google Patents
Differential signal probe with integral balun Download PDFInfo
- Publication number
- WO2007146285A3 WO2007146285A3 PCT/US2007/013778 US2007013778W WO2007146285A3 WO 2007146285 A3 WO2007146285 A3 WO 2007146285A3 US 2007013778 W US2007013778 W US 2007013778W WO 2007146285 A3 WO2007146285 A3 WO 2007146285A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- differential signal
- signal probe
- integral balun
- balun
- integral
- Prior art date
Links
- 239000000523 sample Substances 0.000 title abstract 2
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06772—High frequency probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06766—Input circuits therefor
Abstract
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE112007001399T DE112007001399T5 (en) | 2006-06-09 | 2007-06-11 | Transducer for differential signals with integrated balun |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US81215006P | 2006-06-09 | 2006-06-09 | |
US60/812,150 | 2006-06-09 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2007146285A2 WO2007146285A2 (en) | 2007-12-21 |
WO2007146285A3 true WO2007146285A3 (en) | 2008-10-09 |
Family
ID=38832485
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2007/013778 WO2007146285A2 (en) | 2006-06-09 | 2007-06-11 | Differential signal probe with integral balun |
Country Status (3)
Country | Link |
---|---|
US (1) | US7609077B2 (en) |
DE (2) | DE112007001399T5 (en) |
WO (1) | WO2007146285A2 (en) |
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US7795889B2 (en) * | 2008-01-25 | 2010-09-14 | Infineon Technologies Ag | Probe device |
US8410804B1 (en) * | 2009-02-24 | 2013-04-02 | Keithley Instruments, Inc. | Measurement system with high frequency ground switch |
US9244145B2 (en) * | 2011-06-30 | 2016-01-26 | Amber Precision Instruments, Inc. | System and method for measuring near field information of device under test |
US20130265117A1 (en) * | 2012-04-06 | 2013-10-10 | Stanley Yu Tao Ng | Rf and high-speed data cable |
TWI493201B (en) | 2012-11-09 | 2015-07-21 | Ind Tech Res Inst | Method and system for pins detection and insertion of electrical component |
CN103852662A (en) * | 2012-12-07 | 2014-06-11 | 上海华虹宏力半导体制造有限公司 | Method for extracting model parameters of four-port transformer by using two-port network analyzer |
US9435855B2 (en) | 2013-11-19 | 2016-09-06 | Teradyne, Inc. | Interconnect for transmitting signals between a device and a tester |
US9594114B2 (en) | 2014-06-26 | 2017-03-14 | Teradyne, Inc. | Structure for transmitting signals in an application space between a device under test and test electronics |
CN104166396B (en) * | 2014-08-27 | 2016-09-28 | 深圳创维-Rgb电子有限公司 | A kind of intelligent home furnishing control method and system |
US10302676B2 (en) * | 2016-03-18 | 2019-05-28 | Tektronix, Inc. | Flexible resistive tip cable assembly for differential probing |
US9977052B2 (en) | 2016-10-04 | 2018-05-22 | Teradyne, Inc. | Test fixture |
US10698039B2 (en) * | 2017-10-12 | 2020-06-30 | The Government Of The United States, As Represented By The Secretary Of The Army | Electrical current connector |
US10677815B2 (en) | 2018-06-08 | 2020-06-09 | Teradyne, Inc. | Test system having distributed resources |
US11363746B2 (en) | 2019-09-06 | 2022-06-14 | Teradyne, Inc. | EMI shielding for a signal trace |
US11862901B2 (en) | 2020-12-15 | 2024-01-02 | Teradyne, Inc. | Interposer |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3193712A (en) * | 1962-03-21 | 1965-07-06 | Clarence A Harris | High voltage cable |
US5506515A (en) * | 1994-07-20 | 1996-04-09 | Cascade Microtech, Inc. | High-frequency probe tip assembly |
US6806724B2 (en) * | 2002-11-13 | 2004-10-19 | Cascaded Microtech, Inc. | Probe for combined signals |
Family Cites Families (141)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US491783A (en) | 1893-02-14 | Bolster-plate | ||
US1337866A (en) | 1917-09-27 | 1920-04-20 | Griffiths Ethel Grace | System for protecting electric cables |
US2142625A (en) | 1932-07-06 | 1939-01-03 | Hollandsche Draad En Kabelfab | High tension cable |
US2376101A (en) | 1942-04-01 | 1945-05-15 | Ferris Instr Corp | Electrical energy transmission |
US2389668A (en) | 1943-03-04 | 1945-11-27 | Barnes Drill Co | Indexing mechanism for machine tables |
US2545258A (en) | 1945-03-22 | 1951-03-13 | Marcel L Cailloux | Device for telecontrol of spatial movement |
US2762234A (en) | 1952-09-08 | 1956-09-11 | Dodd Roy Frank | Search-track radar control |
US2901696A (en) | 1953-11-25 | 1959-08-25 | Ingeniors N Magnetic Ab Fa | Arrangement for automatic and continuous measuring of the noise factor of an electric device |
US2921276A (en) | 1955-08-30 | 1960-01-12 | Cutler Hammer Inc | Microwave circuits |
US2947939A (en) * | 1956-09-24 | 1960-08-02 | Libbey Owens Ford Glass Co | Testing electrically conductive articles |
US3230299A (en) | 1962-07-18 | 1966-01-18 | Gen Cable Corp | Electrical cable with chemically bonded rubber layers |
US3176091A (en) * | 1962-11-07 | 1965-03-30 | Helmer C Hanson | Controlled multiple switching unit |
US3262593A (en) | 1963-07-10 | 1966-07-26 | Gen Mills Inc | Wall-mounted support structure |
GB1031068A (en) | 1963-09-23 | 1966-05-25 | George Vincent Grispo | Improvements in or relating to motion reduction mechanisms |
US3218584A (en) | 1964-01-02 | 1965-11-16 | Sanders Associates Inc | Strip line connection |
US3429040A (en) | 1965-06-18 | 1969-02-25 | Ibm | Method of joining a component to a substrate |
US3401126A (en) | 1965-06-18 | 1968-09-10 | Ibm | Method of rendering noble metal conductive composition non-wettable by solder |
US3445770A (en) | 1965-12-27 | 1969-05-20 | Philco Ford Corp | Microelectronic test probe with defect marker access |
US3484679A (en) | 1966-10-03 | 1969-12-16 | North American Rockwell | Electrical apparatus for changing the effective capacitance of a cable |
US3573617A (en) | 1967-10-27 | 1971-04-06 | Aai Corp | Method and apparatus for testing packaged integrated circuits |
GB1240866A (en) | 1968-08-22 | 1971-07-28 | Amf Inc | Control device |
US3609539A (en) | 1968-09-28 | 1971-09-28 | Ibm | Self-aligning kelvin probe |
US3541222A (en) | 1969-01-13 | 1970-11-17 | Bunker Ramo | Connector screen for interconnecting adjacent surfaces of laminar circuits and method of making |
JPS497756B1 (en) | 1969-01-24 | 1974-02-22 | ||
NL7003475A (en) | 1969-03-28 | 1970-09-30 | ||
US3648169A (en) | 1969-05-26 | 1972-03-07 | Teledyne Inc | Probe and head assembly |
US3596228A (en) | 1969-05-29 | 1971-07-27 | Ibm | Fluid actuated contactor |
US3611199A (en) | 1969-09-30 | 1971-10-05 | Emerson Electric Co | Digital electromagnetic wave phase shifter comprising switchable reflectively terminated power-dividing means |
US3686624A (en) | 1969-12-15 | 1972-08-22 | Rca Corp | Coax line to strip line end launcher |
US3654585A (en) | 1970-03-11 | 1972-04-04 | Brooks Research And Mfg Inc | Coordinate conversion for the testing of printed circuit boards |
US3622915A (en) | 1970-03-16 | 1971-11-23 | Meca Electronics Inc | Electrical coupler |
US3740900A (en) | 1970-07-01 | 1973-06-26 | Signetics Corp | Vacuum chuck assembly for semiconductor manufacture |
US3700998A (en) | 1970-08-20 | 1972-10-24 | Computer Test Corp | Sample and hold circuit with switching isolation |
US3714572A (en) | 1970-08-21 | 1973-01-30 | Rca Corp | Alignment and test fixture apparatus |
US4009456A (en) | 1970-10-07 | 1977-02-22 | General Microwave Corporation | Variable microwave attenuator |
US3680037A (en) | 1970-11-05 | 1972-07-25 | Tech Wire Prod Inc | Electrical interconnector |
US3662318A (en) | 1970-12-23 | 1972-05-09 | Comp Generale Electricite | Transition device between coaxial and microstrip lines |
US3710251A (en) | 1971-04-07 | 1973-01-09 | Collins Radio Co | Microelectric heat exchanger pedestal |
US3705379A (en) | 1971-05-14 | 1972-12-05 | Amp Inc | Connector for interconnection of symmetrical and asymmetrical transmission lines |
US3766470A (en) | 1971-05-24 | 1973-10-16 | Unit Process Assemblies | Apparatus for testing the integrity of a thru-hole plating in circuit board workpieces or the like by measuring the effective thickness thereof |
US3725829A (en) | 1971-07-14 | 1973-04-03 | Itek Corp | Electrical connector |
GB1387587A (en) | 1971-07-22 | 1975-03-19 | Plessey Co Ltd | Electrical interconnectors and connector assemblies |
US3810016A (en) * | 1971-12-17 | 1974-05-07 | Western Electric Co | Test probe for semiconductor devices |
US3882597A (en) * | 1971-12-17 | 1975-05-13 | Western Electric Co | Method for making a test probe for semiconductor devices |
US3829076A (en) | 1972-06-08 | 1974-08-13 | H Sofy | Dial index machine |
US3858212A (en) | 1972-08-29 | 1974-12-31 | L Tompkins | Multi-purpose information gathering and distribution system |
US3952156A (en) | 1972-09-07 | 1976-04-20 | Xerox Corporation | Signal processing system |
CA970849A (en) | 1972-09-18 | 1975-07-08 | Malcolm P. Macmartin | Low leakage isolating transformer for electromedical apparatus |
US3806801A (en) | 1972-12-26 | 1974-04-23 | Ibm | Probe contactor having buckling beam probes |
US3839672A (en) | 1973-02-05 | 1974-10-01 | Belden Corp | Method and apparatus for measuring the effectiveness of the shield in a coaxial cable |
US3867698A (en) * | 1973-03-01 | 1975-02-18 | Western Electric Co | Test probe for integrated circuit chips |
US3803709A (en) * | 1973-03-01 | 1974-04-16 | Western Electric Co | Test probe for integrated circuit chips |
US3833852A (en) | 1973-08-16 | 1974-09-03 | Owens Illinois Inc | Inspection head mounting apparatus |
US3930809A (en) | 1973-08-21 | 1976-01-06 | Wentworth Laboratories, Inc. | Assembly fixture for fixed point probe card |
US3849728A (en) | 1973-08-21 | 1974-11-19 | Wentworth Labor Inc | Fixed point probe card and an assembly and repair fixture therefor |
US4001685A (en) | 1974-03-04 | 1977-01-04 | Electroglas, Inc. | Micro-circuit test probe |
US3936743A (en) | 1974-03-05 | 1976-02-03 | Electroglas, Inc. | High speed precision chuck assembly |
US3971610A (en) | 1974-05-10 | 1976-07-27 | Technical Wire Products, Inc. | Conductive elastomeric contacts and connectors |
US3976959A (en) | 1974-07-22 | 1976-08-24 | Gaspari Russell A | Planar balun |
US3970934A (en) | 1974-08-12 | 1976-07-20 | Akin Aksu | Printed circuit board testing means |
US4038599A (en) | 1974-12-30 | 1977-07-26 | International Business Machines Corporation | High density wafer contacting and test system |
US4123706A (en) | 1975-03-03 | 1978-10-31 | Electroglas, Inc. | Probe construction |
US4038894A (en) | 1975-07-18 | 1977-08-02 | Springfield Tool And Die, Inc. | Piercing apparatus |
SE407115B (en) | 1975-10-06 | 1979-03-12 | Kabi Ab | PROCEDURES AND METAL ELECTRODES FOR THE STUDY OF ENZYMATIC AND OTHER BIOCHEMICAL REACTIONS |
US4035723A (en) | 1975-10-16 | 1977-07-12 | Xynetics, Inc. | Probe arm |
US3992073A (en) | 1975-11-24 | 1976-11-16 | Technical Wire Products, Inc. | Multi-conductor probe |
US4116523A (en) | 1976-01-23 | 1978-09-26 | James M. Foster | High frequency probe |
US4049252A (en) | 1976-02-04 | 1977-09-20 | Bell Theodore F | Index table |
US4008900A (en) | 1976-03-15 | 1977-02-22 | John Freedom | Indexing chuck |
US4063195A (en) | 1976-03-26 | 1977-12-13 | Hughes Aircraft Company | Parametric frequency converter |
US4099120A (en) | 1976-04-19 | 1978-07-04 | Akin Aksu | Probe head for testing printed circuit boards |
US4027935A (en) | 1976-06-21 | 1977-06-07 | International Business Machines Corporation | Contact for an electrical contactor assembly |
US4074201A (en) | 1976-07-26 | 1978-02-14 | Gte Sylvania Incorporated | Signal analyzer with noise estimation and signal to noise readout |
US4115735A (en) | 1976-10-14 | 1978-09-19 | Faultfinders, Inc. | Test fixture employing plural platens for advancing some or all of the probes of the test fixture |
US4093988A (en) | 1976-11-08 | 1978-06-06 | General Electric Company | High speed frequency response measurement |
US4124787A (en) | 1977-03-11 | 1978-11-07 | Atari, Inc. | Joystick controller mechanism operating one or plural switches sequentially or simultaneously |
US4151465A (en) | 1977-05-16 | 1979-04-24 | Lenz Seymour S | Variable flexure test probe for microelectronic circuits |
US4161692A (en) | 1977-07-18 | 1979-07-17 | Cerprobe Corporation | Probe device for integrated circuit wafers |
US4312117A (en) | 1977-09-01 | 1982-01-26 | Raytheon Company | Integrated test and assembly device |
US4184729A (en) | 1977-10-13 | 1980-01-22 | Bunker Ramo Corporation | Flexible connector cable |
US4135131A (en) | 1977-10-14 | 1979-01-16 | The United States Of America As Represented By The Secretary Of The Army | Microwave time delay spectroscopic methods and apparatus for remote interrogation of biological targets |
US4184133A (en) | 1977-11-28 | 1980-01-15 | Rockwell International Corporation | Assembly of microwave integrated circuits having a structurally continuous ground plane |
US4216467A (en) | 1977-12-22 | 1980-08-05 | Westinghouse Electric Corp. | Hand controller |
US4232398A (en) | 1978-02-09 | 1980-11-04 | Motorola, Inc. | Radio receiver alignment indicator |
US4177421A (en) | 1978-02-27 | 1979-12-04 | Xerox Corporation | Capacitive transducer |
US4302146A (en) | 1978-08-23 | 1981-11-24 | Westinghouse Electric Corp. | Probe positioner |
US4225819A (en) | 1978-10-12 | 1980-09-30 | Bell Telephone Laboratories, Incorporated | Circuit board contact contamination probe |
US4306235A (en) | 1978-11-02 | 1981-12-15 | Cbc Corporation | Multiple frequency microwave antenna |
DE2849119A1 (en) | 1978-11-13 | 1980-05-14 | Siemens Ag | METHOD AND CIRCUIT FOR DAMPING MEASUREMENT, ESPECIALLY FOR DETERMINING THE DAMPING AND / OR GROUP DISTANCE DISTORTION OF A MEASURED OBJECT |
US4251772A (en) | 1978-12-26 | 1981-02-17 | Pacific Western Systems Inc. | Probe head for an automatic semiconductive wafer prober |
US4280112A (en) | 1979-02-21 | 1981-07-21 | Eisenhart Robert L | Electrical coupler |
US4287473A (en) | 1979-05-25 | 1981-09-01 | The United States Of America As Represented By The United States Department Of Energy | Nondestructive method for detecting defects in photodetector and solar cell devices |
US4277741A (en) | 1979-06-25 | 1981-07-07 | General Motors Corporation | Microwave acoustic spectrometer |
US4327180A (en) | 1979-09-14 | 1982-04-27 | Board Of Governors, Wayne State Univ. | Method and apparatus for electromagnetic radiation of biological material |
US4284033A (en) | 1979-10-31 | 1981-08-18 | Rca Corporation | Means to orbit and rotate target wafers supported on planet member |
US4330783A (en) | 1979-11-23 | 1982-05-18 | Toia Michael J | Coaxially fed dipole antenna |
SE441640B (en) * | 1980-01-03 | 1985-10-21 | Stiftelsen Inst Mikrovags | PROCEDURE AND DEVICE FOR HEATING BY MICROVAGS ENERGY |
US4284682A (en) | 1980-04-30 | 1981-08-18 | Nasa | Heat sealable, flame and abrasion resistant coated fabric |
DE3267983D1 (en) * | 1981-04-25 | 1986-01-30 | Toshiba Kk | Apparatus for measuring noise factor and available gain |
DE3175044D1 (en) * | 1981-10-30 | 1986-09-04 | Ibm Deutschland | Test apparatus for testing runs of a circuit board with at least one test head comprising a plurality of flexible contacts |
US4480223A (en) * | 1981-11-25 | 1984-10-30 | Seiichiro Aigo | Unitary probe assembly |
US4502028A (en) * | 1982-06-15 | 1985-02-26 | Raytheon Company | Programmable two-port microwave network |
US4653174A (en) * | 1984-05-02 | 1987-03-31 | Gte Products Corporation | Method of making packaged IC chip |
US4894612A (en) * | 1987-08-13 | 1990-01-16 | Hypres, Incorporated | Soft probe for providing high speed on-wafer connections to a circuit |
US4851767A (en) * | 1988-01-15 | 1989-07-25 | International Business Machines Corporation | Detachable high-speed opto-electronic sampling probe |
US4965514A (en) * | 1989-06-05 | 1990-10-23 | Tektronix, Inc. | Apparatus for probing a microwave circuit |
US5007163A (en) * | 1990-04-18 | 1991-04-16 | International Business Machines Corporation | Non-destructure method of performing electrical burn-in testing of semiconductor chips |
DE4120839C1 (en) * | 1991-06-25 | 1993-01-21 | Du Pont De Nemours (Deutschland) Gmbh, 6380 Bad Homburg, De | |
US5170930A (en) * | 1991-11-14 | 1992-12-15 | Microelectronics And Computer Technology Corporation | Liquid metal paste for thermal and electrical connections |
USRE37130E1 (en) * | 1992-05-08 | 2001-04-10 | David Fiori, Jr. | Signal conditioning apparatus |
US5561378A (en) * | 1994-07-05 | 1996-10-01 | Motorola, Inc. | Circuit probe for measuring a differential circuit |
US5565788A (en) | 1994-07-20 | 1996-10-15 | Cascade Microtech, Inc. | Coaxial wafer probe with tip shielding |
WO1996013728A1 (en) * | 1994-10-28 | 1996-05-09 | Nitto Denko Corporation | Probe structure |
US5608874A (en) * | 1994-12-02 | 1997-03-04 | Autoentry Online, Inc. | System and method for automatic data file format translation and transmission having advanced features |
US5471185A (en) * | 1994-12-06 | 1995-11-28 | Eaton Corporation | Electrical circuit protection devices comprising conductive liquid compositions |
US5625299A (en) * | 1995-02-03 | 1997-04-29 | Uhling; Thomas F. | Multiple lead analog voltage probe with high signal integrity over a wide band width |
GB9503953D0 (en) * | 1995-02-28 | 1995-04-19 | Plessey Semiconductors Ltd | An mcm-d probe tip |
EP0882239B1 (en) * | 1996-02-06 | 2009-06-03 | Telefonaktiebolaget LM Ericsson (publ) | Assembly and method for testing integrated circuit devices |
US5877452A (en) * | 1997-03-13 | 1999-03-02 | Mcconnell; David E. | Coaxial cable connector |
US6121836A (en) * | 1998-05-08 | 2000-09-19 | Lucent Technologies | Differential amplifier |
US6259260B1 (en) * | 1998-07-30 | 2001-07-10 | Intest Ip Corporation | Apparatus for coupling a test head and probe card in a wafer testing system |
EP1047947B1 (en) * | 1998-08-21 | 2005-01-19 | Koninklijke Philips Electronics N.V. | Test device for testing a module for a data carrier intended for contactless communication |
GB2342148B (en) | 1998-10-01 | 2000-12-20 | Nippon Kokan Kk | Method and apparatus for preventing snow from melting and for packing snow in artificial ski facility |
US6201453B1 (en) * | 1998-11-19 | 2001-03-13 | Trw Inc. | H-plane hermetic sealed waveguide probe |
US6812718B1 (en) * | 1999-05-27 | 2004-11-02 | Nanonexus, Inc. | Massively parallel interface for electronic circuits |
US6396371B2 (en) * | 2000-02-02 | 2002-05-28 | Raytheon Company | Microelectromechanical micro-relay with liquid metal contacts |
US6407542B1 (en) * | 2000-03-23 | 2002-06-18 | Avaya Technology Corp. | Implementation of a multi-port modal decomposition system |
JP4684461B2 (en) * | 2000-04-28 | 2011-05-18 | パナソニック株式会社 | Method for manufacturing magnetic element |
US20050068054A1 (en) * | 2000-05-23 | 2005-03-31 | Sammy Mok | Standardized layout patterns and routing structures for integrated circuit wafer probe card assemblies |
DE10039928B4 (en) * | 2000-08-16 | 2004-07-15 | Infineon Technologies Ag | Device for automated testing, calibration and characterization of test adapters |
US7259043B2 (en) * | 2002-05-14 | 2007-08-21 | Texas Instruments Incorporated | Circular test pads on scribe street area |
US6815963B2 (en) * | 2002-05-23 | 2004-11-09 | Cascade Microtech, Inc. | Probe for testing a device under test |
US6913476B2 (en) * | 2002-08-06 | 2005-07-05 | Micron Technology, Inc. | Temporary, conformable contacts for microelectronic components |
CN1685240A (en) * | 2002-08-27 | 2005-10-19 | Jsr株式会社 | Anisotropic conductive sheet and probe for measuring impedances |
US6856126B2 (en) * | 2003-01-21 | 2005-02-15 | Agilent Technologies, Inc. | Differential voltage probe |
US7057404B2 (en) * | 2003-05-23 | 2006-06-06 | Sharp Laboratories Of America, Inc. | Shielded probe for testing a device under test |
US20050229053A1 (en) * | 2003-07-25 | 2005-10-13 | Logicvision, Inc., 101 Metro Drive, 3Rd Floor, San Jose, Ca, 95110 | Circuit and method for low frequency testing of high frequency signal waveforms |
US7250626B2 (en) * | 2003-10-22 | 2007-07-31 | Cascade Microtech, Inc. | Probe testing structure |
US7981362B2 (en) * | 2003-11-04 | 2011-07-19 | Meso Scale Technologies, Llc | Modular assay plates, reader systems and methods for test measurements |
US6897668B1 (en) * | 2003-11-28 | 2005-05-24 | Premtek International Inc. | Double-faced detecting devices for an electronic substrate |
TWI232938B (en) * | 2004-02-11 | 2005-05-21 | Star Techn Inc | Probe card |
-
2007
- 2007-06-11 US US11/811,682 patent/US7609077B2/en not_active Expired - Fee Related
- 2007-06-11 DE DE112007001399T patent/DE112007001399T5/en not_active Withdrawn
- 2007-06-11 WO PCT/US2007/013778 patent/WO2007146285A2/en active Application Filing
- 2007-06-11 DE DE202007018733U patent/DE202007018733U1/en not_active Expired - Lifetime
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3193712A (en) * | 1962-03-21 | 1965-07-06 | Clarence A Harris | High voltage cable |
US5506515A (en) * | 1994-07-20 | 1996-04-09 | Cascade Microtech, Inc. | High-frequency probe tip assembly |
US6806724B2 (en) * | 2002-11-13 | 2004-10-19 | Cascaded Microtech, Inc. | Probe for combined signals |
Also Published As
Publication number | Publication date |
---|---|
DE202007018733U1 (en) | 2009-03-26 |
US7609077B2 (en) | 2009-10-27 |
WO2007146285A2 (en) | 2007-12-21 |
US20080012591A1 (en) | 2008-01-17 |
DE112007001399T5 (en) | 2009-05-07 |
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