WO2007044786A3 - Interferometry method and system including spectral decomposition - Google Patents

Interferometry method and system including spectral decomposition Download PDF

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Publication number
WO2007044786A3
WO2007044786A3 PCT/US2006/039681 US2006039681W WO2007044786A3 WO 2007044786 A3 WO2007044786 A3 WO 2007044786A3 US 2006039681 W US2006039681 W US 2006039681W WO 2007044786 A3 WO2007044786 A3 WO 2007044786A3
Authority
WO
WIPO (PCT)
Prior art keywords
light
measurement
measurement light
system including
spatially
Prior art date
Application number
PCT/US2006/039681
Other languages
French (fr)
Other versions
WO2007044786A2 (en
Inventor
Lega Xavier Colonna De
Groot Peter De
Original Assignee
Zygo Corp
Lega Xavier Colonna De
Groot Peter De
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Zygo Corp, Lega Xavier Colonna De, Groot Peter De filed Critical Zygo Corp
Publication of WO2007044786A2 publication Critical patent/WO2007044786A2/en
Publication of WO2007044786A3 publication Critical patent/WO2007044786A3/en

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02041—Interferometers characterised by particular imaging or detection techniques
    • G01B9/02044—Imaging in the frequency domain, e.g. by using a spectrometer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02015—Interferometers characterised by the beam path configuration
    • G01B9/02022—Interferometers characterised by the beam path configuration contacting one object by grazing incidence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02034—Interferometers characterised by particularly shaped beams or wavefronts
    • G01B9/02035—Shaping the focal point, e.g. elongated focus
    • G01B9/02037—Shaping the focal point, e.g. elongated focus by generating a transverse line focus
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02055—Reduction or prevention of errors; Testing; Calibration
    • G01B9/0207—Error reduction by correction of the measurement signal based on independently determined error sources, e.g. using a reference interferometer
    • G01B9/02072—Error reduction by correction of the measurement signal based on independently determined error sources, e.g. using a reference interferometer by calibration or testing of interferometer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/0209—Low-coherence interferometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/70—Using polarization in the interferometer

Abstract

A method that includes directing measurement light to reflect from a measurement surface and combining the reflected measurement light with reference light, where the measurement light and reference light are derived from a common source, and there is a non-zero optical path length difference between the measurement light and reference light that is greater than a coherence length of the measurement light. The method further includes spectrally dispersing the combined light onto a multi-element detector to detect a spatially-varying intensity pattern, determining spatial information about the measurement surface based.on the spatially-varying intensity pattern, and outputting the spatial information.
PCT/US2006/039681 2005-10-11 2006-10-11 Interferometry method and system including spectral decomposition WO2007044786A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US72600505P 2005-10-11 2005-10-11
US60/726,005 2005-10-11

Publications (2)

Publication Number Publication Date
WO2007044786A2 WO2007044786A2 (en) 2007-04-19
WO2007044786A3 true WO2007044786A3 (en) 2008-01-10

Family

ID=37943497

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2006/039681 WO2007044786A2 (en) 2005-10-11 2006-10-11 Interferometry method and system including spectral decomposition

Country Status (2)

Country Link
US (1) US7636168B2 (en)
WO (1) WO2007044786A2 (en)

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