WO2006058030A3 - Semiconductor package including die interposed between cup-shaped lead frame and lead frame having mesas and valleys - Google Patents

Semiconductor package including die interposed between cup-shaped lead frame and lead frame having mesas and valleys Download PDF

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Publication number
WO2006058030A3
WO2006058030A3 PCT/US2005/042376 US2005042376W WO2006058030A3 WO 2006058030 A3 WO2006058030 A3 WO 2006058030A3 US 2005042376 W US2005042376 W US 2005042376W WO 2006058030 A3 WO2006058030 A3 WO 2006058030A3
Authority
WO
WIPO (PCT)
Prior art keywords
lead frame
die
mesas
semiconductor package
contacts
Prior art date
Application number
PCT/US2005/042376
Other languages
French (fr)
Other versions
WO2006058030A2 (en
Inventor
Mohammed Kasem
Frank Kuo
Serge Robert Jaunay
Sen Mao
Oscar Ou
Peter Wang
Chang-Sheng Chen
Original Assignee
Siliconix Inc
Owyang King
Mohammed Kasem
Frank Kuo
Serge Robert Jaunay
Sen Mao
Oscar Ou
Peter Wang
Chang-Sheng Chen
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US10/996,149 external-priority patent/US7238551B2/en
Priority claimed from US10/996,148 external-priority patent/US7394150B2/en
Application filed by Siliconix Inc, Owyang King, Mohammed Kasem, Frank Kuo, Serge Robert Jaunay, Sen Mao, Oscar Ou, Peter Wang, Chang-Sheng Chen filed Critical Siliconix Inc
Priority to JP2007543413A priority Critical patent/JP4575955B2/en
Priority to DE112005002899.2T priority patent/DE112005002899B4/en
Priority to CN2005800467643A priority patent/CN101443906B/en
Publication of WO2006058030A2 publication Critical patent/WO2006058030A2/en
Publication of WO2006058030A3 publication Critical patent/WO2006058030A3/en

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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L24/31—Structure, shape, material or disposition of the layer connectors after the connecting process
    • H01L24/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
    • H01L23/31—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape
    • H01L23/3107—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
    • H01L23/495—Lead-frames or other flat leads
    • H01L23/49503—Lead-frames or other flat leads characterised by the die pad
    • H01L23/49513—Lead-frames or other flat leads characterised by the die pad having bonding material between chip and die pad
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
    • H01L23/495—Lead-frames or other flat leads
    • H01L23/49541—Geometry of the lead-frame
    • H01L23/49548—Cross section geometry
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
    • H01L23/495—Lead-frames or other flat leads
    • H01L23/49541—Geometry of the lead-frame
    • H01L23/49562—Geometry of the lead-frame for devices being provided for in H01L29/00
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
    • H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
    • H01L2224/3205—Shape
    • H01L2224/32057—Shape in side view
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
    • H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
    • H01L2224/321—Disposition
    • H01L2224/32151—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/32221—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/32245—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/731—Location prior to the connecting process
    • H01L2224/73151—Location prior to the connecting process on different surfaces
    • H01L2224/73153—Bump and layer connectors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
    • H01L2224/8338—Bonding interfaces outside the semiconductor or solid-state body
    • H01L2224/83385—Shape, e.g. interlocking features
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01—Chemical elements
    • H01L2924/01005—Boron [B]
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    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01—Chemical elements
    • H01L2924/01006—Carbon [C]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01—Chemical elements
    • H01L2924/0101—Neon [Ne]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01—Chemical elements
    • H01L2924/01019—Potassium [K]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01—Chemical elements
    • H01L2924/01029—Copper [Cu]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01—Chemical elements
    • H01L2924/01033—Arsenic [As]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01—Chemical elements
    • H01L2924/01082—Lead [Pb]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/013—Alloys
    • H01L2924/014—Solder alloys
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10—Details of semiconductor or other solid state devices to be connected
    • H01L2924/11—Device type
    • H01L2924/13—Discrete devices, e.g. 3 terminal devices
    • H01L2924/1304—Transistor
    • H01L2924/1306—Field-effect transistor [FET]
    • H01L2924/13091—Metal-Oxide-Semiconductor Field-Effect Transistor [MOSFET]
    • H—ELECTRICITY
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    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10—Details of semiconductor or other solid state devices to be connected
    • H01L2924/11—Device type
    • H01L2924/14—Integrated circuits
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/181—Encapsulation

Abstract

A semiconductor package (20) includes a die (14) that is interposed, flip-chip style, between an upper lead frame and a lower lead frame (12). The lower lead frame has contacts that are aligned with terminals on the bottom surface of the die. The upper lead frame contacts a terminal on the top side of the die, and the edges of the upper lead frame are bent downward around the edges of the die, giving the upper lead frame a cup shape. The edge of the upper lead frame contact another portion of the lower lead frame, so that all of the contacts of the package are coplanar and can be surface-mounted on a printed circuit board. The terminals of the die are electrically connected to the lead frames by means of solder layers (16,18). The thicknesses of the respective solder layers that connect the die to the lead frames are predetermined to optimize the performance of the package through numerous thermal cycles. This is done by fabricating the lower lead frame with a plurality of mesas 121 and using a double solder reflow process.
PCT/US2005/042376 2004-11-23 2005-11-22 Semiconductor package including die interposed between cup-shaped lead frame and lead frame having mesas and valleys WO2006058030A2 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2007543413A JP4575955B2 (en) 2004-11-23 2005-11-22 Semiconductor package and manufacturing method thereof
DE112005002899.2T DE112005002899B4 (en) 2004-11-23 2005-11-22 Semiconductor device with a chip, which is arranged between a cup-shaped printed circuit board and a circuit board with mesas and valleys, and method for its preparation
CN2005800467643A CN101443906B (en) 2004-11-23 2005-11-22 Semiconductor package including die interposed between cup-shaped lead frame and lead frame having mesas and valleys

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US10/996,148 2004-11-23
US10/996,149 US7238551B2 (en) 2004-11-23 2004-11-23 Method of fabricating semiconductor package including die interposed between cup-shaped lead frame having mesas and valleys
US10/996,149 2004-11-23
US10/996,148 US7394150B2 (en) 2004-11-23 2004-11-23 Semiconductor package including die interposed between cup-shaped lead frame and lead frame having mesas and valleys

Publications (2)

Publication Number Publication Date
WO2006058030A2 WO2006058030A2 (en) 2006-06-01
WO2006058030A3 true WO2006058030A3 (en) 2009-04-02

Family

ID=36498476

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2005/042376 WO2006058030A2 (en) 2004-11-23 2005-11-22 Semiconductor package including die interposed between cup-shaped lead frame and lead frame having mesas and valleys

Country Status (3)

Country Link
JP (1) JP4575955B2 (en)
DE (1) DE112005002899B4 (en)
WO (1) WO2006058030A2 (en)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7663211B2 (en) * 2006-05-19 2010-02-16 Fairchild Semiconductor Corporation Dual side cooling integrated power device package and module with a clip attached to a leadframe in the package and the module and methods of manufacture
JPWO2010147201A1 (en) * 2009-06-19 2012-12-06 株式会社安川電機 Power converter
US8586419B2 (en) * 2010-01-19 2013-11-19 Vishay-Siliconix Semiconductor packages including die and L-shaped lead and method of manufacture
US8723311B2 (en) 2011-06-30 2014-05-13 Stmicroelectronics S.R.L. Half-bridge electronic device with common heat sink on mounting surface
ITMI20111219A1 (en) 2011-06-30 2012-12-31 St Microelectronics Srl SYSTEM WITH SHARED HEAT SINK
ITMI20111213A1 (en) 2011-06-30 2012-12-31 St Microelectronics Srl SEMI-BRIDGE ELECTRONIC DEVICE WITH COMMON AUXILIARY HEAT SINK
ITMI20111208A1 (en) 2011-06-30 2012-12-31 St Microelectronics Srl SYSTEM WITH STABILIZED HEAT SINK
ITMI20111217A1 (en) 2011-06-30 2012-12-31 St Microelectronics Srl CONTAINER / SINK SYSTEM FOR ELECTRONIC COMPONENT
ITMI20111218A1 (en) * 2011-06-30 2012-12-31 St Microelectronics Srl HIGH SPEED POWER DEVICE? OF SWITCHING
ITMI20111214A1 (en) 2011-06-30 2012-12-31 St Microelectronics Srl POWER REDUCED THICKNESS DEVICE
ITMI20111216A1 (en) 2011-06-30 2012-12-31 St Microelectronics Srl ELECTRONIC POWER DEVICE WITH HIGH HEAT DISSIPATION AND STABILITY?
WO2013157172A1 (en) * 2012-04-20 2013-10-24 パナソニック株式会社 Semiconductor package and method for producing same, semiconductor module, and semiconductor device
IT202000032267A1 (en) 2020-12-23 2022-06-23 St Microelectronics Srl ENCAPSULATED ELECTRONIC DEVICE WITH HIGH THERMAL DISSIPATION AND RELATED MANUFACTURING PROCEDURE

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US6777800B2 (en) * 2002-09-30 2004-08-17 Fairchild Semiconductor Corporation Semiconductor die package including drain clip

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US6870254B1 (en) * 2000-04-13 2005-03-22 Fairchild Semiconductor Corporation Flip clip attach and copper clip attach on MOSFET device
JP4085563B2 (en) * 2000-08-24 2008-05-14 富士電機ホールディングス株式会社 Power semiconductor module manufacturing method
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US6777800B2 (en) * 2002-09-30 2004-08-17 Fairchild Semiconductor Corporation Semiconductor die package including drain clip

Also Published As

Publication number Publication date
JP2008533694A (en) 2008-08-21
DE112005002899B4 (en) 2016-11-17
WO2006058030A2 (en) 2006-06-01
DE112005002899T5 (en) 2007-10-04
JP4575955B2 (en) 2010-11-04

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