WO2005121819A1 - Electric potential measuring instrument and image forming apparatus - Google Patents
Electric potential measuring instrument and image forming apparatus Download PDFInfo
- Publication number
- WO2005121819A1 WO2005121819A1 PCT/JP2005/010758 JP2005010758W WO2005121819A1 WO 2005121819 A1 WO2005121819 A1 WO 2005121819A1 JP 2005010758 W JP2005010758 W JP 2005010758W WO 2005121819 A1 WO2005121819 A1 WO 2005121819A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- electrode
- electric potential
- measurement
- image forming
- measuring instrument
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/12—Measuring electrostatic fields or voltage-potential
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R5/00—Instruments for converting a single current or a single voltage into a mechanical displacement
- G01R5/28—Electrostatic instruments
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Control Or Security For Electrophotography (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Electrostatic Charge, Transfer And Separation In Electrography (AREA)
Abstract
Description
Claims
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
AT05748126T ATE499616T1 (en) | 2004-06-08 | 2005-06-07 | ELECTRICAL POTENTIAL MEASURING INSTRUMENT AND IMAGE PRODUCING DEVICE |
DE602005026522T DE602005026522D1 (en) | 2004-06-08 | 2005-06-07 | MEASURING INSTRUMENT FOR ELECTRICAL POTENTIAL AND IMAGE GENERATING DEVICE |
EP05748126A EP1756598B1 (en) | 2004-06-08 | 2005-06-07 | Electric potential measuring instrument and image forming apparatus |
US11/579,769 US7489135B2 (en) | 2004-06-08 | 2005-06-07 | Electric potential measuring instrument and image forming apparatus |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004-169274 | 2004-06-08 | ||
JP2004169274A JP4794828B2 (en) | 2004-06-08 | 2004-06-08 | Potential measuring apparatus and image forming apparatus |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2005121819A1 true WO2005121819A1 (en) | 2005-12-22 |
Family
ID=35064659
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2005/010758 WO2005121819A1 (en) | 2004-06-08 | 2005-06-07 | Electric potential measuring instrument and image forming apparatus |
Country Status (8)
Country | Link |
---|---|
US (1) | US7489135B2 (en) |
EP (1) | EP1756598B1 (en) |
JP (1) | JP4794828B2 (en) |
KR (1) | KR100852331B1 (en) |
CN (1) | CN100549706C (en) |
AT (1) | ATE499616T1 (en) |
DE (1) | DE602005026522D1 (en) |
WO (1) | WO2005121819A1 (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP2169700A1 (en) | 2008-09-26 | 2010-03-31 | Siemens Aktiengesellschaft | Method and device for monitoring a switching procedure and relay component group |
WO2010034334A1 (en) * | 2008-09-26 | 2010-04-01 | Siemens Aktiengesellschaft | Method and microelectromechanical system for capturing a measurement variable for an electric current flowing through an electrical conductor, and an arrangement |
DE102008052477A1 (en) | 2008-10-20 | 2010-06-10 | Siemens Aktiengesellschaft | Electrical field strength measuring sensor for use as microelectromechanical system sensor, has electrode arrangement including electrode strips located in spaces between electrode strips of another electrode arrangement |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7382137B2 (en) * | 2005-05-27 | 2008-06-03 | Canon Kabushiki Kaisha | Potential measuring apparatus |
CN101330656A (en) * | 2008-07-08 | 2008-12-24 | 华为技术有限公司 | Tracing method according to terminal capability |
JP6030926B2 (en) * | 2012-11-14 | 2016-11-24 | 矢崎総業株式会社 | Continuity testing device |
JP6624122B2 (en) * | 2017-03-02 | 2019-12-25 | 京セラドキュメントソリューションズ株式会社 | Electric field sensor and image forming apparatus having the same |
CN109523881B (en) * | 2018-12-25 | 2020-09-08 | 东北大学 | Electrostatic field plotter and application method thereof |
Citations (2)
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EP1003044A2 (en) * | 1998-11-10 | 2000-05-24 | Xerox Corporation | Method and apparatus for using shuttered windows in a micro-electro-mechanical system |
US20030057977A1 (en) * | 2001-09-27 | 2003-03-27 | Xerox Corporation | Spacing compensating electrostatic voltmeter |
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DE4339190B4 (en) | 1992-11-16 | 2006-04-13 | Denso Corp., Kariya | Semiconductor accelerometer |
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JP3331648B2 (en) | 1992-12-25 | 2002-10-07 | 株式会社デンソー | Semiconductor acceleration sensor |
DE4328083A1 (en) * | 1993-08-20 | 1994-03-31 | Ignaz Eisele | Microscopic measuring of surface topography and potential distribution - laterally displacing field effect structure relative to scanned surface |
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US5517123A (en) * | 1994-08-26 | 1996-05-14 | Analog Devices, Inc. | High sensitivity integrated micromechanical electrostatic potential sensor |
JPH08110361A (en) * | 1994-10-07 | 1996-04-30 | Ricoh Co Ltd | Surface potential measuring instrument |
JPH10208623A (en) * | 1997-01-25 | 1998-08-07 | Canon Inc | Manufacture of field emission type electron emitting element, and image forming device using the same, field emission type electron emitting element or image forming device formed thereof, and substrate used for image forming device |
CN100507729C (en) | 1998-04-20 | 2009-07-01 | 株式会社理光 | Image forming apparatus and method |
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DE10044887A1 (en) | 1999-09-18 | 2001-05-17 | Stephan Buschnakowski | Micromechanical drive to transport or position bodies; has actuators controlled in groups, each with leaf-spring type structure arranged in magnetic field and having electrical contacts on both sides |
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JP5027984B2 (en) | 2003-03-28 | 2012-09-19 | キヤノン株式会社 | Potential measuring apparatus using oscillator, potential measuring method, and image forming apparatus |
JP2004294350A (en) | 2003-03-28 | 2004-10-21 | Canon Inc | Electric potential sensor and image forming apparatus |
JP2006003131A (en) | 2004-06-15 | 2006-01-05 | Canon Inc | Potential sensor |
US7049804B2 (en) * | 2004-07-12 | 2006-05-23 | Canon Kabushiki Kaisha | Electric potential measuring apparatus, and image forming apparatus |
US7382137B2 (en) | 2005-05-27 | 2008-06-03 | Canon Kabushiki Kaisha | Potential measuring apparatus |
-
2004
- 2004-06-08 JP JP2004169274A patent/JP4794828B2/en not_active Expired - Fee Related
-
2005
- 2005-06-07 DE DE602005026522T patent/DE602005026522D1/en active Active
- 2005-06-07 AT AT05748126T patent/ATE499616T1/en not_active IP Right Cessation
- 2005-06-07 US US11/579,769 patent/US7489135B2/en not_active Expired - Fee Related
- 2005-06-07 EP EP05748126A patent/EP1756598B1/en not_active Not-in-force
- 2005-06-07 KR KR1020077000336A patent/KR100852331B1/en not_active IP Right Cessation
- 2005-06-07 WO PCT/JP2005/010758 patent/WO2005121819A1/en active Application Filing
- 2005-06-07 CN CNB2005800185416A patent/CN100549706C/en not_active Expired - Fee Related
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1003044A2 (en) * | 1998-11-10 | 2000-05-24 | Xerox Corporation | Method and apparatus for using shuttered windows in a micro-electro-mechanical system |
US20030057977A1 (en) * | 2001-09-27 | 2003-03-27 | Xerox Corporation | Spacing compensating electrostatic voltmeter |
Non-Patent Citations (1)
Title |
---|
PARAK W J ET AL: "The field-effect-addressable potentiometric sensor/stimulator (FAPS)-a new concept for a surface potential sensor and stimulator with spatial resolution", SENSORS AND ACTUATORS B, ELSEVIER SEQUOIA S.A., LAUSANNE, CH, vol. 58, no. 1-3, 21 September 1999 (1999-09-21), pages 497 - 504, XP004253054, ISSN: 0925-4005 * |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP2169700A1 (en) | 2008-09-26 | 2010-03-31 | Siemens Aktiengesellschaft | Method and device for monitoring a switching procedure and relay component group |
WO2010034334A1 (en) * | 2008-09-26 | 2010-04-01 | Siemens Aktiengesellschaft | Method and microelectromechanical system for capturing a measurement variable for an electric current flowing through an electrical conductor, and an arrangement |
US20100082268A1 (en) * | 2008-09-26 | 2010-04-01 | Peter Fischer | Method and apparatus for monitoring a switching process and relay module |
DE102008052477A1 (en) | 2008-10-20 | 2010-06-10 | Siemens Aktiengesellschaft | Electrical field strength measuring sensor for use as microelectromechanical system sensor, has electrode arrangement including electrode strips located in spaces between electrode strips of another electrode arrangement |
Also Published As
Publication number | Publication date |
---|---|
KR20070030265A (en) | 2007-03-15 |
DE602005026522D1 (en) | 2011-04-07 |
CN100549706C (en) | 2009-10-14 |
JP2005351627A (en) | 2005-12-22 |
KR100852331B1 (en) | 2008-08-14 |
US7489135B2 (en) | 2009-02-10 |
EP1756598B1 (en) | 2011-02-23 |
US20070229086A1 (en) | 2007-10-04 |
JP4794828B2 (en) | 2011-10-19 |
EP1756598A1 (en) | 2007-02-28 |
ATE499616T1 (en) | 2011-03-15 |
CN1965238A (en) | 2007-05-16 |
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