WO2005081994A3 - Method and system for multisite rf transceiver testing - Google Patents

Method and system for multisite rf transceiver testing Download PDF

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Publication number
WO2005081994A3
WO2005081994A3 PCT/US2005/005832 US2005005832W WO2005081994A3 WO 2005081994 A3 WO2005081994 A3 WO 2005081994A3 US 2005005832 W US2005005832 W US 2005005832W WO 2005081994 A3 WO2005081994 A3 WO 2005081994A3
Authority
WO
WIPO (PCT)
Prior art keywords
operable
signals
signal
output
source
Prior art date
Application number
PCT/US2005/005832
Other languages
French (fr)
Other versions
WO2005081994A2 (en
Inventor
Dale A Heaton
Lianrui Zhang
Craig Lambert
Original Assignee
Texas Instruments Inc
Dale A Heaton
Lianrui Zhang
Craig Lambert
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Texas Instruments Inc, Dale A Heaton, Lianrui Zhang, Craig Lambert filed Critical Texas Instruments Inc
Publication of WO2005081994A2 publication Critical patent/WO2005081994A2/en
Publication of WO2005081994A3 publication Critical patent/WO2005081994A3/en

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04W—WIRELESS COMMUNICATION NETWORKS
    • H04W24/00—Supervisory, monitoring or testing arrangements

Abstract

According to one embodiment of the invention, a system for testing electronic devices includes a first RF source operable to output a first signal, a second RF source operable to output a second signal, a combiner coupled to the first and second RF sources and operable to combine the first and second signals to create a third signal, one or more down converters operable to receive respective output signals from respective electronic devices and create respective down converted signals, and a set of switches operable to switch the second RF source to a local oscillator function that couples to the one or more down converters for inputting respective reference signals into the one or more down converters.
PCT/US2005/005832 2004-02-24 2005-02-24 Method and system for multisite rf transceiver testing WO2005081994A2 (en)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US54740204P 2004-02-24 2004-02-24
US60/547,402 2004-02-24
US10/961,887 2004-10-08
US10/961,887 US7340219B2 (en) 2004-02-24 2004-10-08 Method and system for multisite RF transceiver testing

Publications (2)

Publication Number Publication Date
WO2005081994A2 WO2005081994A2 (en) 2005-09-09
WO2005081994A3 true WO2005081994A3 (en) 2009-04-23

Family

ID=34864591

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2005/005832 WO2005081994A2 (en) 2004-02-24 2005-02-24 Method and system for multisite rf transceiver testing

Country Status (2)

Country Link
US (1) US7340219B2 (en)
WO (1) WO2005081994A2 (en)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7310504B2 (en) * 2004-03-26 2007-12-18 Agilent Technologies, Inc. IF frequency response characterization employing overlapping frequency bands
US7383032B2 (en) * 2004-12-02 2008-06-03 Avago Technologies Wireless Ip Pte Ltd Cellular phone and method for receiving and transmitting signals of different frequency bands
US7564893B2 (en) * 2005-03-22 2009-07-21 Agilent Technologies, Inc. Test system and method for parallel modulation error measurement of transceivers
US8132214B2 (en) * 2008-04-03 2012-03-06 Echostar Technologies L.L.C. Low noise block converter feedhorn
US7477875B2 (en) * 2005-07-26 2009-01-13 Texas Instruments Incorporated Built in loop back self test in design or on test board for transceivers
US20070275667A1 (en) * 2006-05-25 2007-11-29 Hung Fung Leung Parallel test of portable wireless multimedia devices
DE102007013756A1 (en) * 2007-03-22 2008-09-25 Rhode & Schwarz Gmbh & Co. Kg switching
US7680493B2 (en) * 2007-05-10 2010-03-16 Broadcom Corporation Low phase noise testing system utilizing a crystal filter
JP5042955B2 (en) * 2008-09-22 2012-10-03 株式会社日立製作所 Radio base station and receiver fault diagnosis method
US8374552B2 (en) * 2008-09-22 2013-02-12 National Instruments Corporation Concurrent testing of multiple communication devices
US9146277B2 (en) 2008-11-07 2015-09-29 Infineon Technologies Ag Test board and test system
US8688052B2 (en) * 2012-01-03 2014-04-01 Silicon Laboratories Inc. Apparatus and method for phase noise self-test
US10084554B2 (en) * 2014-03-10 2018-09-25 Litepoint Corporation System and method for testing a radio frequency transceiver by controlling test flow via an induced interrupt
US10009122B2 (en) * 2016-07-28 2018-06-26 ETS-Lindgren Inc. Distributed system for radio frequency environment simulation
CN106341194A (en) * 2016-09-21 2017-01-18 捷开通讯科技(上海)有限公司 Mobile communication terminal testing system and method

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5581190A (en) * 1995-04-29 1996-12-03 Lucent Technologies Inc. Method and apparatus for testing RF devices
US6346907B1 (en) * 1998-08-07 2002-02-12 Agere Systems Guardian Corp. Analog-to-digital converter having voltage to-time converter and time digitizer, and method for using same
US7038605B2 (en) * 2000-10-17 2006-05-02 Advantest Corporation Apparatus and method for measuring noise, and recording medium

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6980611B1 (en) * 1999-02-08 2005-12-27 Scientific Applications & Research Associates, Inc. System and method for measuring RF radiated emissions in the presence of strong ambient signals
JP4145006B2 (en) * 2000-08-31 2008-09-03 株式会社アドバンテスト DC test apparatus and semiconductor test apparatus
US6700388B1 (en) * 2002-02-19 2004-03-02 Itt Manufacturing Enterprises, Inc. Methods and apparatus for detecting electromagnetic interference
KR100475739B1 (en) * 2002-12-16 2005-03-10 삼성전자주식회사 system for testing character of filter
US7237167B2 (en) * 2004-02-06 2007-06-26 Advantest Corporation Testing apparatus
US7061276B2 (en) * 2004-04-02 2006-06-13 Teradyne, Inc. Digital phase detector

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5581190A (en) * 1995-04-29 1996-12-03 Lucent Technologies Inc. Method and apparatus for testing RF devices
US6346907B1 (en) * 1998-08-07 2002-02-12 Agere Systems Guardian Corp. Analog-to-digital converter having voltage to-time converter and time digitizer, and method for using same
US7038605B2 (en) * 2000-10-17 2006-05-02 Advantest Corporation Apparatus and method for measuring noise, and recording medium

Also Published As

Publication number Publication date
WO2005081994A2 (en) 2005-09-09
US7340219B2 (en) 2008-03-04
US20050186914A1 (en) 2005-08-25

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