WO2005065432A3 - Pin-type probes for contacting electronic circuits and methods for making such probes - Google Patents

Pin-type probes for contacting electronic circuits and methods for making such probes Download PDF

Info

Publication number
WO2005065432A3
WO2005065432A3 PCT/US2005/000060 US2005000060W WO2005065432A3 WO 2005065432 A3 WO2005065432 A3 WO 2005065432A3 US 2005000060 W US2005000060 W US 2005000060W WO 2005065432 A3 WO2005065432 A3 WO 2005065432A3
Authority
WO
WIPO (PCT)
Prior art keywords
probes
pin
methods
making
electronic circuits
Prior art date
Application number
PCT/US2005/000060
Other languages
French (fr)
Other versions
WO2005065432A2 (en
Inventor
Richard T Chen
Ezekiel J J Kruglick
Vacit Arat
Daniel I Feinberg
Original Assignee
Microfabrica Inc
Richard T Chen
Ezekiel J J Kruglick
Vacit Arat
Daniel I Feinberg
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US10/772,943 external-priority patent/US20050104609A1/en
Priority claimed from US10/949,738 external-priority patent/US20060006888A1/en
Application filed by Microfabrica Inc, Richard T Chen, Ezekiel J J Kruglick, Vacit Arat, Daniel I Feinberg filed Critical Microfabrica Inc
Publication of WO2005065432A2 publication Critical patent/WO2005065432A2/en
Publication of WO2005065432A3 publication Critical patent/WO2005065432A3/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R3/00—Apparatus or processes specially adapted for the manufacture or maintenance of measuring instruments, e.g. of probe tips

Abstract

Pin probes (102) and pin probe arrays (102) are provided the allow electric contact to be made with selected electronic circuit components. Some embodiments include one or more compliant pin elements (202) located within a sheath (204). Some embodiments include pin probes (402) that include locking or latching elements (414) that may be used to fix pin portions of probes (402) into sheaths (406). Some embodiments provide for fabrication of probes using multi-layer electrochemical fabrication methods.
PCT/US2005/000060 2003-12-31 2005-01-03 Pin-type probes for contacting electronic circuits and methods for making such probes WO2005065432A2 (en)

Applications Claiming Priority (12)

Application Number Priority Date Filing Date Title
US53393303P 2003-12-31 2003-12-31
US60/533,933 2003-12-31
US53686504P 2004-01-15 2004-01-15
US60/536,865 2004-01-15
US54051104P 2004-01-29 2004-01-29
US60/540,511 2004-01-29
US10/772,943 US20050104609A1 (en) 2003-02-04 2004-02-04 Microprobe tips and methods for making
US10/772,943 2004-02-04
US58272604P 2004-06-23 2004-06-23
US60/582,726 2004-06-23
US10/949,738 2004-09-24
US10/949,738 US20060006888A1 (en) 2003-02-04 2004-09-24 Electrochemically fabricated microprobes

Publications (2)

Publication Number Publication Date
WO2005065432A2 WO2005065432A2 (en) 2005-07-21
WO2005065432A3 true WO2005065432A3 (en) 2005-10-13

Family

ID=34754039

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2005/000060 WO2005065432A2 (en) 2003-12-31 2005-01-03 Pin-type probes for contacting electronic circuits and methods for making such probes

Country Status (2)

Country Link
TW (1) TW200535425A (en)
WO (1) WO2005065432A2 (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102006017549A1 (en) * 2006-04-13 2007-10-18 Imi Intelligent Medical Implants Ag Process for producing implant structures for contacting or electrostimulation of living tissue cells or nerves
JP5618677B2 (en) * 2010-07-30 2014-11-05 矢崎総業株式会社 Connecting terminal
JP5708430B2 (en) * 2011-10-14 2015-04-30 オムロン株式会社 Contact
US9435826B2 (en) * 2012-05-08 2016-09-06 Kla-Tencor Corporation Variable spacing four-point probe pin device and method
CN111579833B (en) * 2020-05-18 2022-12-23 武汉精毅通电子技术有限公司 Probe and connector suitable for high-current high-speed signal test

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4773877A (en) * 1986-08-19 1988-09-27 Feinmetall Gmbh Contactor for an electronic tester
US5017738A (en) * 1989-02-28 1991-05-21 Fujitsu Limited Connecting apparatus
US5297967A (en) * 1992-10-13 1994-03-29 International Business Machines Corporation Electrical interconnector with helical contacting portion and assembly using same
US5366380A (en) * 1989-06-13 1994-11-22 General Datacomm, Inc. Spring biased tapered contact elements for electrical connectors and integrated circuit packages
US6471524B1 (en) * 1999-05-25 2002-10-29 Molex Incorporated IC socket
US6783405B1 (en) * 2003-11-28 2004-08-31 Chuan Yi Precision Industry Co., Ltd. Terminal for electric connector for communication apparatus

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4773877A (en) * 1986-08-19 1988-09-27 Feinmetall Gmbh Contactor for an electronic tester
US5017738A (en) * 1989-02-28 1991-05-21 Fujitsu Limited Connecting apparatus
US5366380A (en) * 1989-06-13 1994-11-22 General Datacomm, Inc. Spring biased tapered contact elements for electrical connectors and integrated circuit packages
US5297967A (en) * 1992-10-13 1994-03-29 International Business Machines Corporation Electrical interconnector with helical contacting portion and assembly using same
US6471524B1 (en) * 1999-05-25 2002-10-29 Molex Incorporated IC socket
US6783405B1 (en) * 2003-11-28 2004-08-31 Chuan Yi Precision Industry Co., Ltd. Terminal for electric connector for communication apparatus

Also Published As

Publication number Publication date
WO2005065432A2 (en) 2005-07-21
TW200535425A (en) 2005-11-01

Similar Documents

Publication Publication Date Title
TWI266882B (en) High performance probe system
CN100374870C (en) Apparatus with interchangeable modules for measuring characteristics of cables and networks
US5942906A (en) Interface system utilizing engagement mechanism
JP2009520329A (en) Board mount header for cable connector assembly
US20210167555A1 (en) Board-to-board connector and mounting structure therefor
JP2007178164A (en) Inspection unit
KR20040044377A (en) Inspection jig for radio frequency device, and contact probe incorporated in the jig
WO2000073905A3 (en) Test interface for electronic circuits
US6857898B2 (en) Apparatus and method for low-profile mounting of a multi-conductor coaxial cable launch to an electronic circuit board
ATE272253T1 (en) HIGH DENSITY CONNECTORS
FR2920052B1 (en) DIGITAL MULTIMETER HAVING SEALED INPUT DETECTION ARRANGEMENT
TWI257005B (en) Methods and apparatus for testing continuity of electrical paths through connectors of circuit assemblies
US6390825B1 (en) Assembly including an electrical connector and a pair of printed circuit boards
TW200520330A (en) Electrical connector
US5808475A (en) Semiconductor probe card for low current measurements
EP1503217A3 (en) Electronic component test apparatus
WO2005065432A3 (en) Pin-type probes for contacting electronic circuits and methods for making such probes
MXPA01001466A (en) Electronic connection testing device and method for terminal.
DE60104347D1 (en) Connectors
WO2003079643A3 (en) Telecommunications terminal module
WO2002080328A8 (en) An electrical circuit device with compact terminal configuration
WO2001009980A3 (en) Controlled compliance fine pitch interconnect
JP2008166121A (en) Coaxial probe, probe housing board, cable holding board, contact unit, and manufacturing method of cable holding board
KR20100095142A (en) Test socket
EP1014096A3 (en) Substrate and method for inspection

Legal Events

Date Code Title Description
AK Designated states

Kind code of ref document: A2

Designated state(s): AE AG AL AM AT AU AZ BA BB BG BR BW BY BZ CA CH CN CO CR CU CZ DE DK DM DZ EC EE EG ES FI GB GD GE GH GM HR HU ID IL IN IS JP KE KG KP KR KZ LC LK LR LS LT LU LV MA MD MG MK MN MW MX MZ NA NI NO NZ OM PG PH PL PT RO RU SC SD SE SG SK SL SY TJ TM TN TR TT TZ UA UG US UZ VC VN YU ZA ZM ZW

AL Designated countries for regional patents

Kind code of ref document: A2

Designated state(s): BW GH GM KE LS MW MZ NA SD SL SZ TZ UG ZM ZW AM AZ BY KG KZ MD RU TJ TM AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IS IT LT LU MC NL PL PT RO SE SI SK TR BF BJ CF CG CI CM GA GN GQ GW ML MR NE SN TD TG

121 Ep: the epo has been informed by wipo that ep was designated in this application
NENP Non-entry into the national phase

Ref country code: DE

WWW Wipo information: withdrawn in national office

Country of ref document: DE

122 Ep: pct application non-entry in european phase