WO2005026810A3 - Catoptric and catadioptric imaging systems with adaptive catoptric surfaces - Google Patents

Catoptric and catadioptric imaging systems with adaptive catoptric surfaces Download PDF

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Publication number
WO2005026810A3
WO2005026810A3 PCT/US2004/029788 US2004029788W WO2005026810A3 WO 2005026810 A3 WO2005026810 A3 WO 2005026810A3 US 2004029788 W US2004029788 W US 2004029788W WO 2005026810 A3 WO2005026810 A3 WO 2005026810A3
Authority
WO
WIPO (PCT)
Prior art keywords
catoptric
rays
imaging systems
adaptive
beam splitter
Prior art date
Application number
PCT/US2004/029788
Other languages
French (fr)
Other versions
WO2005026810A2 (en
Inventor
Henry Allen Hill
Original Assignee
Zetetic Inst
Henry Allen Hill
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Zetetic Inst, Henry Allen Hill filed Critical Zetetic Inst
Publication of WO2005026810A2 publication Critical patent/WO2005026810A2/en
Publication of WO2005026810A3 publication Critical patent/WO2005026810A3/en

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B17/00—Systems with reflecting surfaces, with or without refracting elements
    • G02B17/08—Catadioptric systems
    • G02B17/0856—Catadioptric systems comprising a refractive element with a reflective surface, the reflection taking place inside the element, e.g. Mangin mirrors
    • G02B17/086—Catadioptric systems comprising a refractive element with a reflective surface, the reflection taking place inside the element, e.g. Mangin mirrors wherein the system is made of a single block of optical material, e.g. solid catadioptric systems
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/58—Photometry, e.g. photographic exposure meter using luminescence generated by light
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B17/00—Systems with reflecting surfaces, with or without refracting elements
    • G02B17/008—Systems specially adapted to form image relays or chained systems
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/06—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the phase of light
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/10—Beam splitting or combining systems
    • G02B27/14—Beam splitting or combining systems operating by reflection only
    • G02B27/144—Beam splitting or combining systems operating by reflection only using partially transparent surfaces without spectral selectivity
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/10—Beam splitting or combining systems
    • G02B27/14—Beam splitting or combining systems operating by reflection only
    • G02B27/145—Beam splitting or combining systems operating by reflection only having sequential partially reflecting surfaces

Abstract

An imaging system (110)for imaging an object point to an image point, the system including : a beam splitter (48) positioned to receive light rays from the object point and separate each of a plurality of rays into a transmitted portion and a reflected portion, the transmitted portions defining a first set of rays and the reflected portions defining a second set of rays; and an array of independently positionable reflecting elements (42A-1,42A-2,42A-3,42C-1,42C-2,42C-3,46A-1,46A-2,46C-1,46C-2)forming a reflecting surface positioned to receive one of the sets of rays from the beam splitter (48)and focus that set of rays towards the image point via the beam splitter (48).
PCT/US2004/029788 2003-09-10 2004-09-10 Catoptric and catadioptric imaging systems with adaptive catoptric surfaces WO2005026810A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US50166603P 2003-09-10 2003-09-10
US60/501,666 2003-09-10

Publications (2)

Publication Number Publication Date
WO2005026810A2 WO2005026810A2 (en) 2005-03-24
WO2005026810A3 true WO2005026810A3 (en) 2005-07-21

Family

ID=34312289

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2004/029788 WO2005026810A2 (en) 2003-09-10 2004-09-10 Catoptric and catadioptric imaging systems with adaptive catoptric surfaces

Country Status (3)

Country Link
US (1) US7355722B2 (en)
TW (1) TW200523578A (en)
WO (1) WO2005026810A2 (en)

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WO2005026810A2 (en) * 2003-09-10 2005-03-24 Zetetic Institute Catoptric and catadioptric imaging systems with adaptive catoptric surfaces
US20050111007A1 (en) * 2003-09-26 2005-05-26 Zetetic Institute Catoptric and catadioptric imaging system with pellicle and aperture-array beam-splitters and non-adaptive and adaptive catoptric surfaces
EP1869399A2 (en) * 2005-04-11 2007-12-26 Zetetic Institute Apparatus and method for in situ and ex situ measurement of spatial impulse response of an optical system using phase-shifting point-diffraction interferometry
EP1883783A2 (en) * 2005-05-18 2008-02-06 Zetetic Institute Apparatus and method for in situ and ex situ measurements of optical system flare
WO2007019548A2 (en) * 2005-08-08 2007-02-15 Zetetic Institute Apparatus and methods for reduction and compensation of effects of vibrations and of environmental effects in wavefront interferometry
WO2007025147A2 (en) * 2005-08-26 2007-03-01 Zetetic Institute Apparatus and method for measurement and compensation of atmospheric turbulence effects in wavefront interferometry
US20070121115A1 (en) * 2005-11-15 2007-05-31 Zetetic Institute Apparatus and method for reducing effects of coherent artifacts and compensation of effects of vibrations and environmental changes in interferometry
US8665536B2 (en) 2007-06-19 2014-03-04 Kla-Tencor Corporation External beam delivery system for laser dark-field illumination in a catadioptric optical system
US8649089B2 (en) * 2008-10-09 2014-02-11 Ge Healthcare Bio-Sciences Corp. System and method for adjusting a beam expander in an imaging system
US8731272B2 (en) * 2011-01-24 2014-05-20 The Board Of Trustees Of The University Of Illinois Computational adaptive optics for interferometric synthetic aperture microscopy and other interferometric imaging
US9584817B2 (en) 2014-03-31 2017-02-28 Sony Corporation Video transmission system with color prediction and method of operation thereof
CN111133361B (en) 2017-09-22 2022-06-03 伊雷克托科学工业股份有限公司 Acousto-optic system with phase-shifting reflector

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Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3628027A (en) * 1969-12-17 1971-12-14 Sulzer Ag Beam deflecting and focusing means for photoelectric monitoring, counting or control apparatus
US5241423A (en) * 1990-07-11 1993-08-31 International Business Machines Corporation High resolution reduction catadioptric relay lens
US6011654A (en) * 1996-09-04 2000-01-04 Carl-Zeiss-Stiftung Optical arrangement for several individual beams with a segmented mirror field
US5757493A (en) * 1996-10-16 1998-05-26 Tropel Corporation Interferometer with catadioptric imaging system having expanded range of numerical aperture
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Also Published As

Publication number Publication date
US7355722B2 (en) 2008-04-08
WO2005026810A2 (en) 2005-03-24
US20050195500A1 (en) 2005-09-08
TW200523578A (en) 2005-07-16

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