WO2004102598A3 - Switched suspended conductor and connection - Google Patents

Switched suspended conductor and connection Download PDF

Info

Publication number
WO2004102598A3
WO2004102598A3 PCT/US2004/012338 US2004012338W WO2004102598A3 WO 2004102598 A3 WO2004102598 A3 WO 2004102598A3 US 2004012338 W US2004012338 W US 2004012338W WO 2004102598 A3 WO2004102598 A3 WO 2004102598A3
Authority
WO
WIPO (PCT)
Prior art keywords
connection
switched
suspended conductor
suspended
probe assembly
Prior art date
Application number
PCT/US2004/012338
Other languages
French (fr)
Other versions
WO2004102598A2 (en
Inventor
John Dunklee
Original Assignee
Cascade Microtech Inc
John Dunklee
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Cascade Microtech Inc, John Dunklee filed Critical Cascade Microtech Inc
Publication of WO2004102598A2 publication Critical patent/WO2004102598A2/en
Publication of WO2004102598A3 publication Critical patent/WO2004102598A3/en

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851Testing of integrated circuits [IC]
    • G01R31/2886Features relating to contacting the IC under test, e.g. probe heads; chucks

Abstract

A probe assembly having a switch that selectively electrically connects, for example, either a Kelvin connection or a suspended guard element with the probe assembly.
PCT/US2004/012338 2003-05-06 2004-04-21 Switched suspended conductor and connection WO2004102598A2 (en)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US46885103P 2003-05-06 2003-05-06
US60/468,851 2003-05-06
US10/794,511 US7221172B2 (en) 2003-05-06 2004-03-05 Switched suspended conductor and connection
US10/794,511 2004-03-05

Publications (2)

Publication Number Publication Date
WO2004102598A2 WO2004102598A2 (en) 2004-11-25
WO2004102598A3 true WO2004102598A3 (en) 2005-11-03

Family

ID=33423783

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2004/012338 WO2004102598A2 (en) 2003-05-06 2004-04-21 Switched suspended conductor and connection

Country Status (3)

Country Link
US (2) US7221172B2 (en)
TW (1) TWI316138B (en)
WO (1) WO2004102598A2 (en)

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US7250779B2 (en) * 2002-11-25 2007-07-31 Cascade Microtech, Inc. Probe station with low inductance path
US7492172B2 (en) 2003-05-23 2009-02-17 Cascade Microtech, Inc. Chuck for holding a device under test
US7250626B2 (en) 2003-10-22 2007-07-31 Cascade Microtech, Inc. Probe testing structure
US7187188B2 (en) 2003-12-24 2007-03-06 Cascade Microtech, Inc. Chuck with integrated wafer support
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TWI629490B (en) * 2017-07-07 2018-07-11 鴻勁精密股份有限公司 Electronic component testing equipment with lower-type cold source conveying device

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US20040222807A1 (en) 2004-11-11
US7468609B2 (en) 2008-12-23
US20070205784A1 (en) 2007-09-06
WO2004102598A2 (en) 2004-11-25
TWI316138B (en) 2009-10-21
TW200424542A (en) 2004-11-16
US7221172B2 (en) 2007-05-22

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