WO2004096491A3 - Apparatus and method of securing a workpiece during high-pressure processing - Google Patents

Apparatus and method of securing a workpiece during high-pressure processing Download PDF

Info

Publication number
WO2004096491A3
WO2004096491A3 PCT/US2004/013132 US2004013132W WO2004096491A3 WO 2004096491 A3 WO2004096491 A3 WO 2004096491A3 US 2004013132 W US2004013132 W US 2004013132W WO 2004096491 A3 WO2004096491 A3 WO 2004096491A3
Authority
WO
WIPO (PCT)
Prior art keywords
securing
pressure processing
during high
workpiece during
elements
Prior art date
Application number
PCT/US2004/013132
Other languages
French (fr)
Other versions
WO2004096491A2 (en
Inventor
Kenji Yokomizo
Original Assignee
Supercritical Systems Inc
Kenji Yokomizo
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Supercritical Systems Inc, Kenji Yokomizo filed Critical Supercritical Systems Inc
Publication of WO2004096491A2 publication Critical patent/WO2004096491A2/en
Publication of WO2004096491A3 publication Critical patent/WO2004096491A3/en

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/687Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
    • H01L21/68714Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
    • H01L21/68728Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a plurality of separate clamping members, e.g. clamping fingers
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B08CLEANING
    • B08BCLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B7/00Cleaning by methods not provided for in a single other subclass or a single group in this subclass
    • B08B7/0021Cleaning by methods not provided for in a single other subclass or a single group in this subclass by liquid gases or supercritical fluids
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S134/00Cleaning and liquid contact with solids
    • Y10S134/902Semiconductor wafer

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Cleaning Or Drying Semiconductors (AREA)

Abstract

An apparatus for performing high-pressure processing of a workpiece (130) having a top face and a bottom face. The apparatus comprises a processing chamber (101) defined by an upper segment having an upper plate (101A) with top elements (125A-C) and a lower segment with lower plate (101B) and lower elements (120A-C), the upper elements and lower elements defining a workpiece holder (129) for securing the workpiece within the processing chamber (101) so that a substantial portion of the top face and the bottom face is exposed to a processing material introduced into the processing chamber (101).
PCT/US2004/013132 2003-04-28 2004-04-27 Apparatus and method of securing a workpiece during high-pressure processing WO2004096491A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/425,701 2003-04-28
US10/425,701 US7270137B2 (en) 2003-04-28 2003-04-28 Apparatus and method of securing a workpiece during high-pressure processing

Publications (2)

Publication Number Publication Date
WO2004096491A2 WO2004096491A2 (en) 2004-11-11
WO2004096491A3 true WO2004096491A3 (en) 2006-07-06

Family

ID=33299526

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2004/013132 WO2004096491A2 (en) 2003-04-28 2004-04-27 Apparatus and method of securing a workpiece during high-pressure processing

Country Status (3)

Country Link
US (1) US7270137B2 (en)
TW (1) TWI243077B (en)
WO (1) WO2004096491A2 (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7513262B2 (en) * 2002-09-30 2009-04-07 Lam Research Corporation Substrate meniscus interface and methods for operation
KR100829923B1 (en) * 2006-08-30 2008-05-16 세메스 주식회사 Spin head and method using the same for treating substrate
US9484229B2 (en) 2011-11-14 2016-11-01 Lam Research Ag Device and method for processing wafer-shaped articles
KR102358561B1 (en) * 2017-06-08 2022-02-04 삼성전자주식회사 Substrate processing apparatus and apparatus for manufacturing integrated circuit device

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6239038B1 (en) * 1995-10-13 2001-05-29 Ziying Wen Method for chemical processing semiconductor wafers
US6264752B1 (en) * 1998-03-13 2001-07-24 Gary L. Curtis Reactor for processing a microelectronic workpiece
US20020046707A1 (en) * 2000-07-26 2002-04-25 Biberger Maximilian A. High pressure processing chamber for semiconductor substrate

Family Cites Families (155)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2625886A (en) * 1947-08-21 1953-01-20 American Brake Shoe Co Pump
US2625686A (en) 1950-06-07 1953-01-20 Rawlings Mfg Co Baseball mitt
US2617719A (en) * 1950-12-29 1952-11-11 Stanolind Oil & Gas Co Cleaning porous media
US2873597A (en) * 1955-08-08 1959-02-17 Victor T Fahringer Apparatus for sealing a pressure vessel
US3521765A (en) * 1967-10-31 1970-07-28 Western Electric Co Closed-end machine for processing articles in a controlled atmosphere
US3681171A (en) * 1968-08-23 1972-08-01 Hitachi Ltd Apparatus for producing a multilayer printed circuit plate assembly
US3623627A (en) * 1969-08-22 1971-11-30 Hunt Co Rodney Door construction for a pressure vessel
US3689025A (en) * 1970-07-30 1972-09-05 Elmer P Kiser Air loaded valve
US3744660A (en) * 1970-12-30 1973-07-10 Combustion Eng Shield for nuclear reactor vessel
US3968885A (en) * 1973-06-29 1976-07-13 International Business Machines Corporation Method and apparatus for handling workpieces
US4341592A (en) * 1975-08-04 1982-07-27 Texas Instruments Incorporated Method for removing photoresist layer from substrate by ozone treatment
US4029517A (en) * 1976-03-01 1977-06-14 Autosonics Inc. Vapor degreasing system having a divider wall between upper and lower vapor zone portions
US4091643A (en) * 1976-05-14 1978-05-30 Ama Universal S.P.A. Circuit for the recovery of solvent vapor evolved in the course of a cleaning cycle in dry-cleaning machines or plants, and for the de-pressurizing of such machines
GB1594935A (en) * 1976-11-01 1981-08-05 Gen Descaling Co Ltd Closure for pipe or pressure vessel and seal therefor
US4145161A (en) * 1977-08-10 1979-03-20 Standard Oil Company (Indiana) Speed control
JPS5448172A (en) * 1977-09-24 1979-04-16 Tokyo Ouka Kougiyou Kk Plasma reaction processor
US4367140A (en) * 1979-11-05 1983-01-04 Sykes Ocean Water Ltd. Reverse osmosis liquid purification apparatus
DE3110341C2 (en) * 1980-03-19 1983-11-17 Hitachi, Ltd., Tokyo Method and apparatus for aligning a thin substrate in the image plane of a copier
US4355937A (en) * 1980-12-24 1982-10-26 International Business Machines Corporation Low shock transmissive antechamber seal mechanisms for vacuum chamber type semi-conductor wafer electron beam writing apparatus
US4316750A (en) * 1981-01-16 1982-02-23 Western Electric Company, Inc. Apparatus and method for cleaning a flux station of a soldering system
DE3112434A1 (en) * 1981-03-28 1982-10-07 Depa GmbH, 4000 Düsseldorf PNEUMATIC DIAPHRAGM PUMP
US4682937A (en) 1981-11-12 1987-07-28 The Coca-Cola Company Double-acting diaphragm pump and reversing mechanism therefor
DE3145815C2 (en) * 1981-11-19 1984-08-09 AGA Gas GmbH, 2102 Hamburg Process for removing peelable layers of material from coated objects,
US4522788A (en) 1982-03-05 1985-06-11 Leco Corporation Proximate analyzer
US4426358A (en) * 1982-04-28 1984-01-17 Johansson Arne I Fail-safe device for a lid of a pressure vessel
DE3238768A1 (en) 1982-10-20 1984-04-26 Kurt Wolf & Co Kg, 7547 Wildbad COOKING VESSEL FROM COOKER AND LID, ESPECIALLY STEAM PRESSURE COOKER
FR2536433A1 (en) 1982-11-19 1984-05-25 Privat Michel METHOD AND APPARATUS FOR CLEANING AND DECONTAMINATING PARTICULARLY CLOTHING, ESPECIALLY CLOTHES CONTAMINATED WITH RADIOACTIVE PARTICLES
US4626509A (en) 1983-07-11 1986-12-02 Data Packaging Corp. Culture media transfer assembly
US4865061A (en) 1983-07-22 1989-09-12 Quadrex Hps, Inc. Decontamination apparatus for chemically and/or radioactively contaminated tools and equipment
US4549467A (en) 1983-08-03 1985-10-29 Wilden Pump & Engineering Co. Actuator valve
GB8332394D0 (en) 1983-12-05 1984-01-11 Pilkington Brothers Plc Coating apparatus
US4960140A (en) 1984-11-30 1990-10-02 Ishijima Industrial Co., Ltd. Washing arrangement for and method of washing lead frames
US4693777A (en) 1984-11-30 1987-09-15 Kabushiki Kaisha Toshiba Apparatus for producing semiconductor devices
US4788043A (en) 1985-04-17 1988-11-29 Tokuyama Soda Kabushiki Kaisha Process for washing semiconductor substrate with organic solvent
US4778356A (en) 1985-06-11 1988-10-18 Hicks Cecil T Diaphragm pump
US4749440A (en) 1985-08-28 1988-06-07 Fsi Corporation Gaseous process and apparatus for removing films from substrates
US5044871A (en) 1985-10-24 1991-09-03 Texas Instruments Incorporated Integrated circuit processing system
US4827867A (en) 1985-11-28 1989-05-09 Daikin Industries, Ltd. Resist developing apparatus
US4670126A (en) 1986-04-28 1987-06-02 Varian Associates, Inc. Sputter module for modular wafer processing system
US4917556A (en) 1986-04-28 1990-04-17 Varian Associates, Inc. Modular wafer transport and processing system
JPS63157870A (en) 1986-12-19 1988-06-30 Anelva Corp Substrate treatment device
US5882165A (en) * 1986-12-19 1999-03-16 Applied Materials, Inc. Multiple chamber integrated process system
US4951601A (en) 1986-12-19 1990-08-28 Applied Materials, Inc. Multi-chamber integrated process system
US4924892A (en) 1987-07-28 1990-05-15 Mazda Motor Corporation Painting truck washing system
DE3725565A1 (en) 1987-08-01 1989-02-16 Peter Weil METHOD AND SYSTEM FOR DE-PAINTING OBJECTS WITH A SUBMERSIBLE CONTAINER WITH SOLVENT
US5105556A (en) 1987-08-12 1992-04-21 Hitachi, Ltd. Vapor washing process and apparatus
US4838476A (en) 1987-11-12 1989-06-13 Fluocon Technologies Inc. Vapour phase treatment process and apparatus
US4789077A (en) 1988-02-24 1988-12-06 Public Service Electric & Gas Company Closure apparatus for a high pressure vessel
US4823976A (en) 1988-05-04 1989-04-25 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Quick actuating closure
US5185296A (en) 1988-07-26 1993-02-09 Matsushita Electric Industrial Co., Ltd. Method for forming a dielectric thin film or its pattern of high accuracy on a substrate
US4879431A (en) 1989-03-09 1989-11-07 Biomedical Research And Development Laboratories, Inc. Tubeless cell harvester
US5169296A (en) 1989-03-10 1992-12-08 Wilden James K Air driven double diaphragm pump
DE3914065A1 (en) 1989-04-28 1990-10-31 Leybold Ag DEVICE FOR CARRYING OUT PLASMA ETCHING PROCESSES
US5186718A (en) 1989-05-19 1993-02-16 Applied Materials, Inc. Staged-vacuum wafer processing system and method
US5062770A (en) 1989-08-11 1991-11-05 Systems Chemistry, Inc. Fluid pumping apparatus and system with leak detection and containment
DE3926577A1 (en) * 1989-08-11 1991-02-14 Leybold Ag VACUUM PUMP WITH A ROTOR AND ROTOR BEARINGS OPERATED WITH VACUUM
US4983223A (en) 1989-10-24 1991-01-08 Chenpatents Apparatus and method for reducing solvent vapor losses
US5169408A (en) 1990-01-26 1992-12-08 Fsi International, Inc. Apparatus for wafer processing with in situ rinse
US5186594A (en) 1990-04-19 1993-02-16 Applied Materials, Inc. Dual cassette load lock
US5217043A (en) 1990-04-19 1993-06-08 Milic Novakovic Control valve
DE69133413D1 (en) 1990-05-07 2004-10-21 Canon Kk Vacuum type substrate support
DE4018464A1 (en) 1990-06-08 1991-12-12 Ott Kg Lewa DIAPHRAGM FOR A HYDRAULICALLY DRIVED DIAPHRAGM PUMP
US5071485A (en) 1990-09-11 1991-12-10 Fusion Systems Corporation Method for photoresist stripping using reverse flow
US5167716A (en) 1990-09-28 1992-12-01 Gasonics, Inc. Method and apparatus for batch processing a semiconductor wafer
US5306350A (en) 1990-12-21 1994-04-26 Union Carbide Chemicals & Plastics Technology Corporation Methods for cleaning apparatus using compressed fluids
US5143103A (en) 1991-01-04 1992-09-01 International Business Machines Corporation Apparatus for cleaning and drying workpieces
AT395951B (en) * 1991-02-19 1993-04-26 Union Ind Compr Gase Gmbh CLEANING OF WORKPIECES WITH ORGANIC RESIDUES
CH684402A5 (en) 1991-03-04 1994-09-15 Xorella Ag Wettingen Device for sliding and pivoting of a container-closure.
US5259731A (en) 1991-04-23 1993-11-09 Dhindsa Jasbir S Multiple reciprocating pump system
US5242641A (en) * 1991-07-15 1993-09-07 Pacific Trinetics Corporation Method for forming filled holes in multi-layer integrated circuit packages
US5190373A (en) 1991-12-24 1993-03-02 Union Carbide Chemicals & Plastics Technology Corporation Method, apparatus, and article for forming a heated, pressurized mixture of fluids
US5252041A (en) 1992-04-30 1993-10-12 Dorr-Oliver Incorporated Automatic control system for diaphragm pumps
KR940009563B1 (en) * 1992-09-04 1994-10-15 대우전자주식회사 Tableware washing machine
JP3252865B2 (en) * 1992-09-11 2002-02-04 住友電気工業株式会社 Surface acoustic wave device and method of manufacturing surface acoustic wave device
US5474410A (en) 1993-03-14 1995-12-12 Tel-Varian Limited Multi-chamber system provided with carrier units
JP3220579B2 (en) 1993-10-05 2001-10-22 新キャタピラー三菱株式会社 Hydraulic system control method for construction machinery
US5434107A (en) 1994-01-28 1995-07-18 Texas Instruments Incorporated Method for planarization
DE69523208T2 (en) 1994-04-08 2002-06-27 Texas Instruments Inc Process for cleaning semiconductor wafers using liquefied gases
US5934856A (en) * 1994-05-23 1999-08-10 Tokyo Electron Limited Multi-chamber treatment system
EP0791093B1 (en) * 1994-11-09 2001-04-11 R.R. STREET & CO., INC. Method and system for rejuvenating pressurized fluid solvents used in cleaning substrates
US5556497A (en) * 1995-01-09 1996-09-17 Essef Corporation Fitting installation process
US5981399A (en) * 1995-02-15 1999-11-09 Hitachi, Ltd. Method and apparatus for fabricating semiconductor devices
WO1996028660A1 (en) 1995-03-14 1996-09-19 The Boeing Company Aircraft hydraulic pump control system
JPH08306632A (en) * 1995-04-27 1996-11-22 Shin Etsu Handotai Co Ltd Vapor epitaxial growth equipment
US6097015A (en) * 1995-05-22 2000-08-01 Healthbridge, Inc. Microwave pressure vessel and method of sterilization
JP3983831B2 (en) * 1995-05-30 2007-09-26 シグマメルテック株式会社 Substrate baking apparatus and substrate baking method
US6454945B1 (en) * 1995-06-16 2002-09-24 University Of Washington Microfabricated devices and methods
AU6541596A (en) * 1995-06-16 1997-01-15 University Of Washington Microfabricated differential extraction device and method
US6037277A (en) * 1995-11-16 2000-03-14 Texas Instruments Incorporated Limited-volume apparatus and method for forming thin film aerogels on semiconductor substrates
US6159295A (en) * 1995-11-16 2000-12-12 Texas Instruments Incorporated Limited-volume apparatus for forming thin film aerogels on semiconductor substrates
US5679169A (en) 1995-12-19 1997-10-21 Micron Technology, Inc. Method for post chemical-mechanical planarization cleaning of semiconductor wafers
JPH09213772A (en) * 1996-01-30 1997-08-15 Dainippon Screen Mfg Co Ltd Board holder
JP3346698B2 (en) * 1996-03-18 2002-11-18 株式会社荏原製作所 High temperature motor pump and its operation method
JP3955340B2 (en) * 1996-04-26 2007-08-08 株式会社神戸製鋼所 High-temperature and high-pressure gas processing equipment
DK9600149U3 (en) * 1996-05-01 1997-09-12 Moerch & Soenner A S cover assembly
US5971714A (en) 1996-05-29 1999-10-26 Graco Inc Electronic CAM compensation of pressure change of servo controlled pumps
US6203582B1 (en) * 1996-07-15 2001-03-20 Semitool, Inc. Modular semiconductor workpiece processing tool
US5928389A (en) * 1996-10-21 1999-07-27 Applied Materials, Inc. Method and apparatus for priority based scheduling of wafer processing within a multiple chamber semiconductor wafer processing tool
JPH10131889A (en) * 1996-10-25 1998-05-19 Mitsubishi Heavy Ind Ltd Compressor for perforator
US5888050A (en) * 1996-10-30 1999-03-30 Supercritical Fluid Technologies, Inc. Precision high pressure control assembly
JPH10144757A (en) * 1996-11-08 1998-05-29 Dainippon Screen Mfg Co Ltd Substrate processing device
JPH10144650A (en) * 1996-11-11 1998-05-29 Mitsubishi Electric Corp Semiconductor material cleaner
US5906866A (en) 1997-02-10 1999-05-25 Tokyo Electron Limited Process for chemical vapor deposition of tungsten onto a titanium nitride substrate surface
JP3437734B2 (en) * 1997-02-26 2003-08-18 富士通株式会社 manufacturing device
US5879459A (en) 1997-08-29 1999-03-09 Genus, Inc. Vertically-stacked process reactor and cluster tool system for atomic layer deposition
JPH10261687A (en) * 1997-03-18 1998-09-29 Furontetsuku:Kk Production system for semiconductor and the like
JP4246804B2 (en) * 1997-03-26 2009-04-02 株式会社神戸製鋼所 Heating / pressurizing equipment
JPH10288158A (en) * 1997-04-10 1998-10-27 Kobe Steel Ltd Piston gas compressor and gas compression equipment
US6164297A (en) * 1997-06-13 2000-12-26 Tokyo Electron Limited Cleaning and drying apparatus for objects to be processed
TW524873B (en) * 1997-07-11 2003-03-21 Applied Materials Inc Improved substrate supporting apparatus and processing chamber
US5975492A (en) 1997-07-14 1999-11-02 Brenes; Arthur Bellows driver slot valve
EP1012372A4 (en) 1997-09-09 2004-06-23 Snap Tite Tech Inc Dry cleaning system using carbon dioxide
JP3194036B2 (en) * 1997-09-17 2001-07-30 東京エレクトロン株式会社 Drying treatment apparatus and drying treatment method
US6056008A (en) * 1997-09-22 2000-05-02 Fisher Controls International, Inc. Intelligent pressure regulator
US6235634B1 (en) * 1997-10-08 2001-05-22 Applied Komatsu Technology, Inc. Modular substrate processing system
US6103638A (en) * 1997-11-07 2000-08-15 Micron Technology, Inc. Formation of planar dielectric layers using liquid interfaces
US6005226A (en) * 1997-11-24 1999-12-21 Steag-Rtp Systems Rapid thermal processing (RTP) system with gas driven rotating substrate
US5904737A (en) * 1997-11-26 1999-05-18 Mve, Inc. Carbon dioxide dry cleaning system
US5946945A (en) 1997-12-24 1999-09-07 Kegler; Andrew High pressure liquid/gas storage frame for a pressurized liquid cleaning apparatus
US5850747A (en) 1997-12-24 1998-12-22 Raytheon Commercial Laundry Llc Liquified gas dry-cleaning system with pressure vessel temperature compensating compressor
US5858107A (en) 1998-01-07 1999-01-12 Raytheon Company Liquid carbon dioxide cleaning using jet edge sonic whistles at low temperature
KR100524204B1 (en) * 1998-01-07 2006-01-27 동경 엘렉트론 주식회사 Gas processor
US5934991A (en) * 1998-02-01 1999-08-10 Fortrend Engineering Corporation Pod loader interface improved clean air system
US6067728A (en) * 1998-02-13 2000-05-30 G.T. Equipment Technologies, Inc. Supercritical phase wafer drying/cleaning system
US6244121B1 (en) * 1998-03-06 2001-06-12 Applied Materials, Inc. Sensor device for non-intrusive diagnosis of a semiconductor processing system
US6423642B1 (en) * 1998-03-13 2002-07-23 Semitool, Inc. Reactor for processing a semiconductor wafer
SG81975A1 (en) * 1998-04-14 2001-07-24 Kaijo Kk Method and apparatus for drying washed objects
US5943721A (en) 1998-05-12 1999-08-31 American Dryer Corporation Liquified gas dry cleaning system
US6017820A (en) * 1998-07-17 2000-01-25 Cutek Research, Inc. Integrated vacuum and plating cluster system
US6085935A (en) * 1998-08-10 2000-07-11 Alliance Laundry Systems Llc Pressure vessel door operating apparatus
US6642140B1 (en) * 1998-09-03 2003-11-04 Micron Technology, Inc. System for filling openings in semiconductor products
US6277753B1 (en) * 1998-09-28 2001-08-21 Supercritical Systems Inc. Removal of CMP residue from semiconductors using supercritical carbon dioxide process
JP2000265945A (en) * 1998-11-10 2000-09-26 Uct Kk Chemical supplying pump, chemical supplying device, chemical supplying system, substrate cleaning device, chemical supplying method, and substrate cleaning method
US6806194B2 (en) * 1999-01-22 2004-10-19 Semitool. Inc. Apparatus and methods for processing a workpiece
US6548411B2 (en) * 1999-01-22 2003-04-15 Semitool, Inc. Apparatus and methods for processing a workpiece
US6344174B1 (en) * 1999-01-25 2002-02-05 Mine Safety Appliances Company Gas sensor
US6305677B1 (en) * 1999-03-30 2001-10-23 Lam Research Corporation Perimeter wafer lifting
US6241825B1 (en) * 1999-04-16 2001-06-05 Cutek Research Inc. Compliant wafer chuck
US6128830A (en) * 1999-05-15 2000-10-10 Dean Bettcher Apparatus and method for drying solid articles
US6436824B1 (en) * 1999-07-02 2002-08-20 Chartered Semiconductor Manufacturing Ltd. Low dielectric constant materials for copper damascene
US6508259B1 (en) * 1999-08-05 2003-01-21 S.C. Fluids, Inc. Inverted pressure vessel with horizontal through loading
US6602349B2 (en) * 1999-08-05 2003-08-05 S.C. Fluids, Inc. Supercritical fluid cleaning process for precision surfaces
US6334266B1 (en) * 1999-09-20 2002-01-01 S.C. Fluids, Inc. Supercritical fluid drying system and method of use
US6433342B1 (en) * 1999-08-18 2002-08-13 Ibis Technology Corporation Coated wafer holding pin
US6155436A (en) * 1999-08-18 2000-12-05 Ibis Technology Corporation Arc inhibiting wafer holder assembly
US6251250B1 (en) * 1999-09-03 2001-06-26 Arthur Keigler Method of and apparatus for controlling fluid flow and electric fields involved in the electroplating of substantially flat workpieces and the like and more generally controlling fluid flow in the processing of other work piece surfaces as well
US6228563B1 (en) * 1999-09-17 2001-05-08 Gasonics International Corporation Method and apparatus for removing post-etch residues and other adherent matrices
US6264003B1 (en) * 1999-09-30 2001-07-24 Reliance Electric Technologies, Llc Bearing system including lubricant circulation and cooling apparatus
US6286231B1 (en) * 2000-01-12 2001-09-11 Semitool, Inc. Method and apparatus for high-pressure wafer processing and drying
US6388317B1 (en) * 2000-09-25 2002-05-14 Lockheed Martin Corporation Solid-state chip cooling by use of microchannel coolant flow
US6418956B1 (en) * 2000-11-15 2002-07-16 Plast-O-Matic Valves, Inc. Pressure controller
KR100445259B1 (en) * 2001-11-27 2004-08-21 삼성전자주식회사 Cleaning method and cleaning apparatus for performing the same
JP3978023B2 (en) * 2001-12-03 2007-09-19 株式会社神戸製鋼所 High pressure processing method
JP2004006672A (en) * 2002-04-19 2004-01-08 Dainippon Screen Mfg Co Ltd Substrate processing method and apparatus
US6875285B2 (en) * 2003-04-24 2005-04-05 Taiwan Semiconductor Manufacturing Company, Ltd. System and method for dampening high pressure impact on porous materials

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6239038B1 (en) * 1995-10-13 2001-05-29 Ziying Wen Method for chemical processing semiconductor wafers
US6264752B1 (en) * 1998-03-13 2001-07-24 Gary L. Curtis Reactor for processing a microelectronic workpiece
US20020046707A1 (en) * 2000-07-26 2002-04-25 Biberger Maximilian A. High pressure processing chamber for semiconductor substrate

Also Published As

Publication number Publication date
US20040211447A1 (en) 2004-10-28
US7270137B2 (en) 2007-09-18
WO2004096491A2 (en) 2004-11-11
TWI243077B (en) 2005-11-11
TW200503851A (en) 2005-02-01

Similar Documents

Publication Publication Date Title
AU2003296050A1 (en) Method and apparatus for treating a substrate
TW200603329A (en) Methods and apparatus for reducing arcing during plasma processing
EP1791161A3 (en) Liquid processing method and liquid processing apparatus
EP1640110A4 (en) Laser cladding apparatus and method
DE59904373D1 (en) DEVICE AND METHOD FOR PRESSING AND / OR INJECTIONING AND FOR BORING A DECORATIVE MATERIAL WITH A SUPPORT MATERIAL
ATE326412T1 (en) METHOD AND APPARATUS FOR FEEDING A PANEL FROM A STACK
DE69938721D1 (en) METHOD AND DEVICE FOR TREATING CELLULOSIC MATERIALS
EP1366508A4 (en) Apparatus and method for atmospheric pressure reactive atom plasma processing for surface modification
WO2006038990A3 (en) Method for treating a substrate
EP1110669A3 (en) Apparatus and method for cutting workpieces by flushing working liquid to the tool-and-workpiece interface
WO2000020873A8 (en) Plug flow cytometry for high throughput screening and drug discovery
WO2003089684A3 (en) Method and device for depositing thin layers on a substrate in a height-adjustable process chamber
CA2437959A1 (en) Method and device for slaughtering fish, in particular white fish
AU2003257393A1 (en) Grinding machine and method for grinding a workpiece
WO2003011513A3 (en) Frictional stirring surface treatment method and apparatus
WO2004096491A3 (en) Apparatus and method of securing a workpiece during high-pressure processing
WO2007065896A3 (en) Removable liners for charged particle beam systems
FR2861609B1 (en) METHOD FOR DISTRIBUTING DROPS OF A LIQUID OF INTEREST ON A SURFACE
ATE306431T1 (en) METHOD FOR PRODUCING A COMBINATION PACKAGING CONTAINER AND DEVICE FOR IMPLEMENTING THE METHOD
WO2006012172A3 (en) Method and apparatus for pretreatment of polymeric materials
TW349060B (en) Workpiece placement jig, process for producing the same, and screen printer
ATE411171T1 (en) APPARATUS AND METHOD FOR STORING AT LEAST TWO PRESSURE CYLINDER ELEVATORS
ZA200600448B (en) A method and a device for defining a small volume of a liquid sample
IT1319496B1 (en) PROCESS FOR THE CONTINUOUS PRODUCTION OF PLASTIC MATERIAL EXPANDED FOR THE CONSTRUCTION OF PANELS AND SIMILAR, AS WELL AS THE PLANT FOR ITS
SE9801636D0 (en) Apparatus and method for hydroforming workpieces

Legal Events

Date Code Title Description
AK Designated states

Kind code of ref document: A2

Designated state(s): AE AG AL AM AT AU AZ BA BB BG BR BW BY BZ CA CH CN CO CR CU CZ DE DK DM DZ EC EE EG ES FI GB GD GE GH GM HR HU ID IL IN IS JP KE KG KP KR KZ LC LK LR LS LT LU LV MA MD MG MK MN MW MX MZ NA NI NO NZ OM PG PH PL PT RO RU SC SD SE SG SK SL SY TJ TM TN TR TT TZ UA UG US UZ VC VN YU ZA ZM ZW

AL Designated countries for regional patents

Kind code of ref document: A2

Designated state(s): BW GH GM KE LS MW MZ NA SD SL SZ TZ UG ZM ZW AM AZ BY KG KZ MD RU TJ TM AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IT LU MC NL PL PT RO SE SI SK TR BF BJ CF CG CI CM GA GN GQ GW ML MR NE SN TD TG

121 Ep: the epo has been informed by wipo that ep was designated in this application
32PN Ep: public notification in the ep bulletin as address of the adressee cannot be established

Free format text: NOTING OF LOSS OF RIGHTS PURSUANT TO RULE 69(1) EPC (EPO FORM 1205A SENZ 25.01.2006)

122 Ep: pct application non-entry in european phase