WO2004090582A3 - Method for constructing a catadioptric lens system - Google Patents
Method for constructing a catadioptric lens system Download PDFInfo
- Publication number
- WO2004090582A3 WO2004090582A3 PCT/US2004/009968 US2004009968W WO2004090582A3 WO 2004090582 A3 WO2004090582 A3 WO 2004090582A3 US 2004009968 W US2004009968 W US 2004009968W WO 2004090582 A3 WO2004090582 A3 WO 2004090582A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- catadioptric lens
- pie
- lens system
- constructing
- shaped segments
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B17/00—Systems with reflecting surfaces, with or without refracting elements
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0052—Optical details of the image generation
- G02B21/0056—Optical details of the image generation based on optical coherence, e.g. phase-contrast arrangements, interference arrangements
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B3/00—Simple or compound lenses
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B3/00—Simple or compound lenses
- G02B3/02—Simple or compound lenses with non-spherical faces
- G02B3/08—Simple or compound lenses with non-spherical faces with discontinuous faces, e.g. Fresnel lens
Abstract
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006509556A JP2006522371A (en) | 2003-04-01 | 2004-04-01 | Method for constructing a catadioptric optical lens system |
EP04758689A EP1609019A2 (en) | 2003-04-01 | 2004-04-01 | Method for constructing a catadioptric lens system |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US45949303P | 2003-04-01 | 2003-04-01 | |
US60/459,493 | 2003-04-01 |
Publications (3)
Publication Number | Publication Date |
---|---|
WO2004090582A2 WO2004090582A2 (en) | 2004-10-21 |
WO2004090582A9 WO2004090582A9 (en) | 2005-03-31 |
WO2004090582A3 true WO2004090582A3 (en) | 2005-06-16 |
Family
ID=33159659
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2004/009968 WO2004090582A2 (en) | 2003-04-01 | 2004-04-01 | Method for constructing a catadioptric lens system |
Country Status (5)
Country | Link |
---|---|
US (1) | US7054077B2 (en) |
EP (1) | EP1609019A2 (en) |
JP (1) | JP2006522371A (en) |
KR (1) | KR20050108422A (en) |
WO (1) | WO2004090582A2 (en) |
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US6403124B1 (en) * | 1997-04-16 | 2002-06-11 | Sigma-Tau Industrie Farmaceutiche Riunite S.P.A. | Storage and maintenance of blood products including red blood cells and platelets |
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EP1588120A4 (en) | 2003-01-27 | 2006-12-20 | Zetetic Inst | Interferometric confocal microscopy incorporating a pihnole array beam-splitter |
US7084983B2 (en) * | 2003-01-27 | 2006-08-01 | Zetetic Institute | Interferometric confocal microscopy incorporating a pinhole array beam-splitter |
US7164480B2 (en) | 2003-02-04 | 2007-01-16 | Zetetic Institute | Compensation for effects of mismatch in indices of refraction at a substrate-medium interface in non-confocal, confocal, and interferometric confocal microscopy |
US7263259B2 (en) * | 2003-02-07 | 2007-08-28 | Zetetic Institute | Multiple-source arrays fed by guided-wave structures and resonant guided-wave structure cavities |
WO2004072695A2 (en) * | 2003-02-13 | 2004-08-26 | Zetetic Institute | Transverse differential interferometric confocal microscopy |
US7133139B2 (en) * | 2003-02-19 | 2006-11-07 | Zetetic Institute | Longitudinal differential interferometric confocal microscopy |
WO2004074881A2 (en) * | 2003-02-19 | 2004-09-02 | Zetetic Institute | Method and apparatus for dark field interferometric confocal microscopy |
EP1609019A2 (en) | 2003-04-01 | 2005-12-28 | Zetetic Institute | Method for constructing a catadioptric lens system |
KR20050119672A (en) * | 2003-04-01 | 2005-12-21 | 제테틱 인스티튜트 | Apparatus and method for joint measurement of fields of scattered/reflected or transmitted orthogonally polarized beams by an object in interferometry |
EP1608933A4 (en) * | 2003-04-03 | 2007-03-21 | Zetetic Inst | Apparatus and method for measurement of fields of backscattered and forward scattered/reflected beams by an object in interferometry |
US7324209B2 (en) * | 2003-07-07 | 2008-01-29 | Zetetic Institute | Apparatus and method for ellipsometric measurements with high spatial resolution |
WO2005008334A2 (en) | 2003-07-07 | 2005-01-27 | Zetetic Institute | Apparatus and method for high speed scan for detection and measurement of properties of sub-wavelength defects and artifacts in semiconductor and mask metrology |
US7355722B2 (en) * | 2003-09-10 | 2008-04-08 | Zetetic Institute | Catoptric and catadioptric imaging systems with adaptive catoptric surfaces |
US20050111007A1 (en) * | 2003-09-26 | 2005-05-26 | Zetetic Institute | Catoptric and catadioptric imaging system with pellicle and aperture-array beam-splitters and non-adaptive and adaptive catoptric surfaces |
US7312877B2 (en) * | 2003-10-01 | 2007-12-25 | Zetetic Institute | Method and apparatus for enhanced resolution of high spatial frequency components of images using standing wave beams in non-interferometric and interferometric microscopy |
US7430316B2 (en) * | 2004-01-29 | 2008-09-30 | Datacolor Holding Ag | Method for visually accurately predicting color matches on different materials |
TW200538703A (en) | 2004-05-06 | 2005-12-01 | Zetetic Inst | Apparatus and methods for measurement of critical dimensions of features and detection of defects in UV, VUV, and EUV lithography masks |
US7298496B2 (en) * | 2004-05-21 | 2007-11-20 | Zetetic Institute | Apparatus and methods for overlay, alignment mark, and critical dimension metrologies based on optical interferometry |
US7161680B2 (en) * | 2004-08-16 | 2007-01-09 | Zetetic Institute | Apparatus and method for joint and time delayed measurements of components of conjugated quadratures of fields of reflected/scattered and transmitted/scattered beams by an object in interferometry |
WO2006023612A2 (en) * | 2004-08-19 | 2006-03-02 | Zetetic Institute | Sub-nanometer overlay, critical dimension, and lithography tool projection optic metrology systems based on measurement of exposure induced changes in photoresist on wafers |
US7145663B2 (en) * | 2004-09-20 | 2006-12-05 | Zetetic Institute | Catoptric imaging systems comprising pellicle and/or aperture-array beam-splitters and non-adaptive and/or adaptive catoptric surfaces |
US20110143287A1 (en) * | 2009-09-14 | 2011-06-16 | Nikon Corporation | Catadioptric system, aberration measuring apparatus, method of adjusting optical system, exposure apparatus, and device manufacturing method |
US9507129B2 (en) * | 2013-10-31 | 2016-11-29 | Duke University | Apparatus comprising a compact catadioptric telescope |
EP2869056B1 (en) * | 2013-11-05 | 2020-05-20 | Malvern Panalytical Limited | Improvements relating to particle characterisation |
EP2869055A1 (en) * | 2013-11-05 | 2015-05-06 | Malvern Instruments Limited | Improvements relating to particle characterisation |
EP2869054A1 (en) * | 2013-11-05 | 2015-05-06 | Malvern Instruments Limited | Improvements relating to particle characterisation |
CN105445824B (en) * | 2014-08-20 | 2017-02-22 | 清华大学 | LED optical communication receiving lens and LED optical communication system |
DE102017101829A1 (en) * | 2017-01-31 | 2018-08-02 | Carl Zeiss Microscopy Gmbh | Arrangement for increasing the resolution of a laser scanning microscope |
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US5485317A (en) * | 1993-07-23 | 1996-01-16 | Solari Udine S.P.A. | Optical system for light emitting diodes |
US5699201A (en) * | 1995-03-27 | 1997-12-16 | Hewlett-Packard Co. | Low-profile, high-gain, wide-field-of-view, non-imaging optics |
US5894195A (en) * | 1996-05-03 | 1999-04-13 | Mcdermott; Kevin | Elliptical axial lighting device |
US6714349B2 (en) * | 2001-03-27 | 2004-03-30 | Samsung Sdi Co., Ltd. | Screen and projection display system with improved viewing angle characteristic |
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US3748015A (en) | 1971-06-21 | 1973-07-24 | Perkin Elmer Corp | Unit power imaging catoptric anastigmat |
US4011011A (en) | 1973-03-09 | 1977-03-08 | The Perkin-Elmer Corporation | Optical projection apparatus |
US4272684A (en) | 1978-10-06 | 1981-06-09 | Xerox Corporation | Optical beam-splitting arrangements on object side of a lens |
US4226501A (en) | 1978-10-12 | 1980-10-07 | The Perkin-Elmer Corporation | Four mirror unobscurred anastigmatic telescope with all spherical surfaces |
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EP1588120A4 (en) | 2003-01-27 | 2006-12-20 | Zetetic Inst | Interferometric confocal microscopy incorporating a pihnole array beam-splitter |
US7084983B2 (en) | 2003-01-27 | 2006-08-01 | Zetetic Institute | Interferometric confocal microscopy incorporating a pinhole array beam-splitter |
US7164480B2 (en) | 2003-02-04 | 2007-01-16 | Zetetic Institute | Compensation for effects of mismatch in indices of refraction at a substrate-medium interface in non-confocal, confocal, and interferometric confocal microscopy |
US7263259B2 (en) | 2003-02-07 | 2007-08-28 | Zetetic Institute | Multiple-source arrays fed by guided-wave structures and resonant guided-wave structure cavities |
WO2004072695A2 (en) | 2003-02-13 | 2004-08-26 | Zetetic Institute | Transverse differential interferometric confocal microscopy |
US6717736B1 (en) | 2003-02-13 | 2004-04-06 | Zetetic Institute | Catoptric and catadioptric imaging systems |
US7133139B2 (en) | 2003-02-19 | 2006-11-07 | Zetetic Institute | Longitudinal differential interferometric confocal microscopy |
WO2004074881A2 (en) | 2003-02-19 | 2004-09-02 | Zetetic Institute | Method and apparatus for dark field interferometric confocal microscopy |
EP1609019A2 (en) | 2003-04-01 | 2005-12-28 | Zetetic Institute | Method for constructing a catadioptric lens system |
KR20050119672A (en) | 2003-04-01 | 2005-12-21 | 제테틱 인스티튜트 | Apparatus and method for joint measurement of fields of scattered/reflected or transmitted orthogonally polarized beams by an object in interferometry |
EP1608933A4 (en) | 2003-04-03 | 2007-03-21 | Zetetic Inst | Apparatus and method for measurement of fields of backscattered and forward scattered/reflected beams by an object in interferometry |
-
2004
- 2004-04-01 EP EP04758689A patent/EP1609019A2/en not_active Withdrawn
- 2004-04-01 US US10/816,201 patent/US7054077B2/en not_active Expired - Fee Related
- 2004-04-01 WO PCT/US2004/009968 patent/WO2004090582A2/en active Application Filing
- 2004-04-01 JP JP2006509556A patent/JP2006522371A/en not_active Withdrawn
- 2004-04-01 KR KR1020057018803A patent/KR20050108422A/en not_active Application Discontinuation
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5485317A (en) * | 1993-07-23 | 1996-01-16 | Solari Udine S.P.A. | Optical system for light emitting diodes |
US5699201A (en) * | 1995-03-27 | 1997-12-16 | Hewlett-Packard Co. | Low-profile, high-gain, wide-field-of-view, non-imaging optics |
US5894195A (en) * | 1996-05-03 | 1999-04-13 | Mcdermott; Kevin | Elliptical axial lighting device |
US6714349B2 (en) * | 2001-03-27 | 2004-03-30 | Samsung Sdi Co., Ltd. | Screen and projection display system with improved viewing angle characteristic |
Also Published As
Publication number | Publication date |
---|---|
WO2004090582A2 (en) | 2004-10-21 |
EP1609019A2 (en) | 2005-12-28 |
JP2006522371A (en) | 2006-09-28 |
WO2004090582A9 (en) | 2005-03-31 |
US20040228008A1 (en) | 2004-11-18 |
KR20050108422A (en) | 2005-11-16 |
US7054077B2 (en) | 2006-05-30 |
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