WO2004090466A3 - Apparatus and method for measurement of fields of backscattered and forward scattered/reflected beams by an object in interferometry - Google Patents
Apparatus and method for measurement of fields of backscattered and forward scattered/reflected beams by an object in interferometry Download PDFInfo
- Publication number
- WO2004090466A3 WO2004090466A3 PCT/US2004/009984 US2004009984W WO2004090466A3 WO 2004090466 A3 WO2004090466 A3 WO 2004090466A3 US 2004009984 W US2004009984 W US 2004009984W WO 2004090466 A3 WO2004090466 A3 WO 2004090466A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- aperture
- imaging system
- region
- light passing
- interferometry
- Prior art date
Links
- 238000005305 interferometry Methods 0.000 title abstract 2
- 238000005259 measurement Methods 0.000 title abstract 2
- 238000000034 method Methods 0.000 title 1
- 238000003384 imaging method Methods 0.000 abstract 5
- 230000010363 phase shift Effects 0.000 abstract 2
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0052—Optical details of the image generation
- G02B21/0056—Optical details of the image generation based on optical coherence, e.g. phase-contrast arrangements, interference arrangements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
- G01B9/02007—Two or more frequencies or sources used for interferometric measurement
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02015—Interferometers characterised by the beam path configuration
- G01B9/02017—Interferometers characterised by the beam path configuration with multiple interactions between the target object and light beams, e.g. beam reflections occurring from different locations
- G01B9/02019—Interferometers characterised by the beam path configuration with multiple interactions between the target object and light beams, e.g. beam reflections occurring from different locations contacting different points on same face of object
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02015—Interferometers characterised by the beam path configuration
- G01B9/02029—Combination with non-interferometric systems, i.e. for measuring the object
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02015—Interferometers characterised by the beam path configuration
- G01B9/02029—Combination with non-interferometric systems, i.e. for measuring the object
- G01B9/0203—With imaging systems
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02041—Interferometers characterised by particular imaging or detection techniques
- G01B9/02042—Confocal imaging
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02055—Reduction or prevention of errors; Testing; Calibration
- G01B9/02062—Active error reduction, i.e. varying with time
- G01B9/02067—Active error reduction, i.e. varying with time by electronic control systems, i.e. using feedback acting on optics or light
- G01B9/02069—Synchronization of light source or manipulator and detector
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02055—Reduction or prevention of errors; Testing; Calibration
- G01B9/02075—Reduction or prevention of errors; Testing; Calibration of particular errors
- G01B9/02078—Caused by ambiguity
- G01B9/02079—Quadrature detection, i.e. detecting relatively phase-shifted signals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/58—Photometry, e.g. photographic exposure meter using luminescence generated by light
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/21—Polarisation-affecting properties
- G01N21/211—Ellipsometry
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B17/00—Systems with reflecting surfaces, with or without refracting elements
- G02B17/08—Catadioptric systems
- G02B17/0804—Catadioptric systems using two curved mirrors
- G02B17/0808—Catadioptric systems using two curved mirrors on-axis systems with at least one of the mirrors having a central aperture
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70483—Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
- G03F7/70605—Workpiece metrology
- G03F7/70616—Monitoring the printed patterns
- G03F7/70625—Dimensions, e.g. line width, critical dimension [CD], profile, sidewall angle or edge roughness
Abstract
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP04758700A EP1608933A4 (en) | 2003-04-03 | 2004-04-01 | Apparatus and method for measurement of fields of backscattered and forward scattered/reflected beams by an object in interferometry |
JP2006509564A JP2006522338A (en) | 2003-04-03 | 2004-04-01 | Apparatus and method for field measurement of backscattered and forward scattered / reflected beams by interferometric objects |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US46012903P | 2003-04-03 | 2003-04-03 | |
US60/460,129 | 2003-04-03 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2004090466A2 WO2004090466A2 (en) | 2004-10-21 |
WO2004090466A3 true WO2004090466A3 (en) | 2004-12-29 |
Family
ID=33159733
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2004/009984 WO2004090466A2 (en) | 2003-04-03 | 2004-04-01 | Apparatus and method for measurement of fields of backscattered and forward scattered/reflected beams by an object in interferometry |
Country Status (5)
Country | Link |
---|---|
US (1) | US7064838B2 (en) |
EP (1) | EP1608933A4 (en) |
JP (1) | JP2006522338A (en) |
KR (1) | KR20050119680A (en) |
WO (1) | WO2004090466A2 (en) |
Families Citing this family (25)
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---|---|---|---|---|
US6403124B1 (en) * | 1997-04-16 | 2002-06-11 | Sigma-Tau Industrie Farmaceutiche Riunite S.P.A. | Storage and maintenance of blood products including red blood cells and platelets |
JP2006516762A (en) * | 2003-01-27 | 2006-07-06 | ゼテテック インスティテュート | Leaky sandwiched waveguide mode used in interference confocal microscopy to measure trench properties |
EP1588119A4 (en) | 2003-01-27 | 2007-03-07 | Zetetic Inst | Apparatus and method for joint measurements of conjugated quadratures of fields of reflected/scattered and transmitted beams by an object in interferometry |
US7084983B2 (en) * | 2003-01-27 | 2006-08-01 | Zetetic Institute | Interferometric confocal microscopy incorporating a pinhole array beam-splitter |
KR20050114615A (en) | 2003-02-04 | 2005-12-06 | 제테틱 인스티튜트 | Compensation for effects of mismatch in indices of refraction at a substrate-medium interface in non-confocal, confocal, and interferometric confocal microscopy |
WO2004072688A2 (en) * | 2003-02-07 | 2004-08-26 | Zetetic Institute | Multiple-source arrays fed by guided-wave structures and resonant guided-wave structure cavities |
WO2004072695A2 (en) * | 2003-02-13 | 2004-08-26 | Zetetic Institute | Transverse differential interferometric confocal microscopy |
JP2006518488A (en) * | 2003-02-19 | 2006-08-10 | ゼテテック インスティテュート | Method and apparatus for using dark field interference confocal microscope |
JP2006518487A (en) * | 2003-02-19 | 2006-08-10 | ゼテテック インスティテュート | Vertical differential interference confocal microscope |
WO2004090465A2 (en) * | 2003-04-01 | 2004-10-21 | Zetetic Institute | Apparatus and method for joint measurement of fields of scattered/reflected or transmitted orthogonally polarized beams by an object in interferometry |
US7054077B2 (en) | 2003-04-01 | 2006-05-30 | Zetetic Institute | Method for constructing a catadioptric lens system |
JP2006522338A (en) | 2003-04-03 | 2006-09-28 | ゼテテック インスティテュート | Apparatus and method for field measurement of backscattered and forward scattered / reflected beams by interferometric objects |
WO2005008334A2 (en) | 2003-07-07 | 2005-01-27 | Zetetic Institute | Apparatus and method for high speed scan for detection and measurement of properties of sub-wavelength defects and artifacts in semiconductor and mask metrology |
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US7312877B2 (en) * | 2003-10-01 | 2007-12-25 | Zetetic Institute | Method and apparatus for enhanced resolution of high spatial frequency components of images using standing wave beams in non-interferometric and interferometric microscopy |
US7345771B2 (en) | 2004-05-06 | 2008-03-18 | Zetetic Institute | Apparatus and method for measurement of critical dimensions of features and detection of defects in UV, VUV, and EUV lithography masks |
TW200538704A (en) * | 2004-05-21 | 2005-12-01 | Zetetic Inst | Apparatus and methods for overlay, alignment mark, and critical dimension metrologies based on optical interferometry |
US7161680B2 (en) * | 2004-08-16 | 2007-01-09 | Zetetic Institute | Apparatus and method for joint and time delayed measurements of components of conjugated quadratures of fields of reflected/scattered and transmitted/scattered beams by an object in interferometry |
WO2006023612A2 (en) * | 2004-08-19 | 2006-03-02 | Zetetic Institute | Sub-nanometer overlay, critical dimension, and lithography tool projection optic metrology systems based on measurement of exposure induced changes in photoresist on wafers |
WO2006034065A2 (en) * | 2004-09-20 | 2006-03-30 | Zetetic Institute | Catoptric imaging systems comprising pellicle and/or aperture-array beam-splitters and non-adaptive and /or adaptive catoptric surfaces |
WO2012102887A2 (en) * | 2011-01-24 | 2012-08-02 | The Board Of Trustees Of The University Of Illinois | Computational adaptive optics for interferometric synthetic aperture microscopy and other interferometric imaging |
US10514296B2 (en) * | 2015-07-29 | 2019-12-24 | Samsung Electronics Co., Ltd. | Spectrometer including metasurface |
US11867556B2 (en) | 2015-07-29 | 2024-01-09 | Samsung Electronics Co., Ltd. | Spectrometer including metasurface |
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EP1588119A4 (en) | 2003-01-27 | 2007-03-07 | Zetetic Inst | Apparatus and method for joint measurements of conjugated quadratures of fields of reflected/scattered and transmitted beams by an object in interferometry |
KR20050114615A (en) | 2003-02-04 | 2005-12-06 | 제테틱 인스티튜트 | Compensation for effects of mismatch in indices of refraction at a substrate-medium interface in non-confocal, confocal, and interferometric confocal microscopy |
WO2004072688A2 (en) | 2003-02-07 | 2004-08-26 | Zetetic Institute | Multiple-source arrays fed by guided-wave structures and resonant guided-wave structure cavities |
WO2004072695A2 (en) | 2003-02-13 | 2004-08-26 | Zetetic Institute | Transverse differential interferometric confocal microscopy |
JP2006518487A (en) | 2003-02-19 | 2006-08-10 | ゼテテック インスティテュート | Vertical differential interference confocal microscope |
JP2006518488A (en) | 2003-02-19 | 2006-08-10 | ゼテテック インスティテュート | Method and apparatus for using dark field interference confocal microscope |
WO2004090465A2 (en) | 2003-04-01 | 2004-10-21 | Zetetic Institute | Apparatus and method for joint measurement of fields of scattered/reflected or transmitted orthogonally polarized beams by an object in interferometry |
US7054077B2 (en) | 2003-04-01 | 2006-05-30 | Zetetic Institute | Method for constructing a catadioptric lens system |
JP2006522338A (en) | 2003-04-03 | 2006-09-28 | ゼテテック インスティテュート | Apparatus and method for field measurement of backscattered and forward scattered / reflected beams by interferometric objects |
-
2004
- 2004-04-01 JP JP2006509564A patent/JP2006522338A/en not_active Withdrawn
- 2004-04-01 WO PCT/US2004/009984 patent/WO2004090466A2/en not_active Application Discontinuation
- 2004-04-01 KR KR1020057018801A patent/KR20050119680A/en not_active Application Discontinuation
- 2004-04-01 EP EP04758700A patent/EP1608933A4/en not_active Withdrawn
- 2004-04-01 US US10/816,172 patent/US7064838B2/en not_active Expired - Fee Related
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5760901A (en) * | 1997-01-28 | 1998-06-02 | Zetetic Institute | Method and apparatus for confocal interference microscopy with background amplitude reduction and compensation |
US6445453B1 (en) * | 1999-08-02 | 2002-09-03 | Zetetic Institute | Scanning interferometric near-field confocal microscopy |
US6717736B1 (en) * | 2003-02-13 | 2004-04-06 | Zetetic Institute | Catoptric and catadioptric imaging systems |
Non-Patent Citations (1)
Title |
---|
See also references of EP1608933A4 * |
Also Published As
Publication number | Publication date |
---|---|
US7064838B2 (en) | 2006-06-20 |
WO2004090466A2 (en) | 2004-10-21 |
JP2006522338A (en) | 2006-09-28 |
EP1608933A4 (en) | 2007-03-21 |
KR20050119680A (en) | 2005-12-21 |
US20040227950A1 (en) | 2004-11-18 |
EP1608933A2 (en) | 2005-12-28 |
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