WO2004070693A3 - Method and apparatus for optical inspection of a display - Google Patents

Method and apparatus for optical inspection of a display Download PDF

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Publication number
WO2004070693A3
WO2004070693A3 PCT/US2004/003217 US2004003217W WO2004070693A3 WO 2004070693 A3 WO2004070693 A3 WO 2004070693A3 US 2004003217 W US2004003217 W US 2004003217W WO 2004070693 A3 WO2004070693 A3 WO 2004070693A3
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WO
WIPO (PCT)
Prior art keywords
display
pixel
sensors
determining
scaling ratios
Prior art date
Application number
PCT/US2004/003217
Other languages
French (fr)
Other versions
WO2004070693A2 (en
Inventor
Reza Safaee-Rad
Aleksander Crnatovic
Jeffrey Hawthorne
Branko Bukal
Ray Leerentveld
Original Assignee
Photon Dynamics Inc
Reza Safaee-Rad
Aleksander Crnatovic
Jeffrey Hawthorne
Branko Bukal
Ray Leerentveld
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Photon Dynamics Inc, Reza Safaee-Rad, Aleksander Crnatovic, Jeffrey Hawthorne, Branko Bukal, Ray Leerentveld filed Critical Photon Dynamics Inc
Priority to JP2006503322A priority Critical patent/JP2006520482A/en
Publication of WO2004070693A2 publication Critical patent/WO2004070693A2/en
Publication of WO2004070693A3 publication Critical patent/WO2004070693A3/en

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Classifications

    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • G06T7/0004Industrial image inspection
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F18/00Pattern recognition
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/30Subject of image; Context of image processing
    • G06T2207/30108Industrial image inspection
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N17/00Diagnosis, testing or measuring for television systems or their details
    • H04N17/02Diagnosis, testing or measuring for television systems or their details for colour television signals
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N17/00Diagnosis, testing or measuring for television systems or their details
    • H04N17/04Diagnosis, testing or measuring for television systems or their details for receivers

Abstract

A method and apparatus for optically inspecting a display employs sub-pixel accuracy for each primary color to take into account angle of rotation (520). The method includes capturing images of a display with R x S sensors, determining sets of sensor coordinates mapping to a pixel (540), determining multiple misalignment angles between the pixel on the display and the R x S sensors, determining multiple x scaling ratios, determining multiple weighting factor associates with RxS sensors in response the corresponding multiple misalignment angle and the corresponding multiple x and y scaling ratios, and inspection the scaled image to identify potential defects of the pixel on the display (580).
PCT/US2004/003217 2003-02-03 2004-02-03 Method and apparatus for optical inspection of a display WO2004070693A2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2006503322A JP2006520482A (en) 2003-02-03 2004-02-03 Method and system for optical inspection of displays

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US44488903P 2003-02-03 2003-02-03
US60/444,889 2003-02-03

Publications (2)

Publication Number Publication Date
WO2004070693A2 WO2004070693A2 (en) 2004-08-19
WO2004070693A3 true WO2004070693A3 (en) 2004-11-11

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2004/003217 WO2004070693A2 (en) 2003-02-03 2004-02-03 Method and apparatus for optical inspection of a display

Country Status (6)

Country Link
US (1) US7308157B2 (en)
JP (1) JP2006520482A (en)
KR (1) KR100983943B1 (en)
CN (1) CN100367293C (en)
TW (1) TWI236840B (en)
WO (1) WO2004070693A2 (en)

Families Citing this family (145)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6950115B2 (en) * 2001-05-09 2005-09-27 Clairvoyante, Inc. Color flat panel display sub-pixel arrangements and layouts
US7417648B2 (en) 2002-01-07 2008-08-26 Samsung Electronics Co. Ltd., Color flat panel display sub-pixel arrangements and layouts for sub-pixel rendering with split blue sub-pixels
US20040051724A1 (en) * 2002-09-13 2004-03-18 Elliott Candice Hellen Brown Four color arrangements of emitters for subpixel rendering
US7167186B2 (en) 2003-03-04 2007-01-23 Clairvoyante, Inc Systems and methods for motion adaptive filtering
US7352374B2 (en) 2003-04-07 2008-04-01 Clairvoyante, Inc Image data set with embedded pre-subpixel rendered image
US20040246280A1 (en) 2003-06-06 2004-12-09 Credelle Thomas Lloyd Image degradation correction in novel liquid crystal displays
US8035599B2 (en) 2003-06-06 2011-10-11 Samsung Electronics Co., Ltd. Display panel having crossover connections effecting dot inversion
US7397455B2 (en) 2003-06-06 2008-07-08 Samsung Electronics Co., Ltd. Liquid crystal display backplane layouts and addressing for non-standard subpixel arrangements
US7084923B2 (en) 2003-10-28 2006-08-01 Clairvoyante, Inc Display system having improved multiple modes for displaying image data from multiple input source formats
US7525526B2 (en) * 2003-10-28 2009-04-28 Samsung Electronics Co., Ltd. System and method for performing image reconstruction and subpixel rendering to effect scaling for multi-mode display
JP4845382B2 (en) 2004-02-06 2011-12-28 キヤノン株式会社 Image processing apparatus, control method therefor, computer program, and computer-readable storage medium
US8184923B2 (en) * 2004-04-19 2012-05-22 Semiconductor Energy Laboratory Co., Ltd. Image analysis method, image analysis program, pixel evaluation system having the image analysis method, and pixel evaluation system having the image analysis program
JP4480002B2 (en) * 2004-05-28 2010-06-16 Hoya株式会社 Nonuniformity defect inspection method and apparatus, and photomask manufacturing method
US20060061248A1 (en) * 2004-09-22 2006-03-23 Eastman Kodak Company Uniformity and brightness measurement in OLED displays
KR100769428B1 (en) * 2005-04-28 2007-10-22 삼성에스디아이 주식회사 Light emitting display, and apparatus and method for digitizing brightness thereof
US7404645B2 (en) * 2005-06-20 2008-07-29 Digital Display Innovations, Llc Image and light source modulation for a digital display system
US7364306B2 (en) 2005-06-20 2008-04-29 Digital Display Innovations, Llc Field sequential light source modulation for a digital display system
EP1739443A1 (en) * 2005-06-29 2007-01-03 SwissQual License AG A device and method for assessing the quality of a mobile phone or mobile phone network
US8022977B2 (en) * 2005-10-17 2011-09-20 I2Ic Corporation Camera placed behind a display with a transparent backlight
US7859274B2 (en) * 2006-02-15 2010-12-28 Dongjin Semichem Co., Ltd. System for testing a flat panel display device and method thereof
US7854518B2 (en) * 2006-06-16 2010-12-21 Hewlett-Packard Development Company, L.P. Mesh for rendering an image frame
US7907792B2 (en) * 2006-06-16 2011-03-15 Hewlett-Packard Development Company, L.P. Blend maps for rendering an image frame
KR100834730B1 (en) * 2006-09-04 2008-06-05 케이 이엔지(주) Inspection system of inferior liquid crystal display panel using vision sensor
JP4799329B2 (en) * 2006-09-07 2011-10-26 株式会社東芝 Unevenness inspection method, display panel manufacturing method, and unevenness inspection apparatus
KR101702887B1 (en) * 2007-04-18 2017-02-06 마이크로닉 마이데이타 에이비 Method and apparatus for mura detection and metrology
US8049695B2 (en) * 2007-10-15 2011-11-01 Sharp Laboratories Of America, Inc. Correction of visible mura distortions in displays by use of flexible system for memory resources and mura characteristics
WO2009063295A1 (en) * 2007-11-12 2009-05-22 Micronic Laser Systems Ab Methods and apparatuses for detecting pattern errors
KR101101132B1 (en) * 2007-11-23 2012-01-12 삼성엘이디 주식회사 LED inspection apparatus and inspection method using the same
IL188825A0 (en) * 2008-01-16 2008-11-03 Orbotech Ltd Inspection of a substrate using multiple cameras
US8902321B2 (en) 2008-05-20 2014-12-02 Pelican Imaging Corporation Capturing and processing of images using monolithic camera array with heterogeneous imagers
US8866920B2 (en) 2008-05-20 2014-10-21 Pelican Imaging Corporation Capturing and processing of images using monolithic camera array with heterogeneous imagers
US11792538B2 (en) 2008-05-20 2023-10-17 Adeia Imaging Llc Capturing and processing of images including occlusions focused on an image sensor by a lens stack array
JP5286938B2 (en) * 2008-05-27 2013-09-11 東京エレクトロン株式会社 Needle mark inspection device, probe device, needle mark inspection method, and storage medium
KR100910175B1 (en) * 2009-04-06 2009-07-30 (주)에이직뱅크 Image sensor for generating a three dimensional image
US8508507B2 (en) * 2009-04-08 2013-08-13 Integrated Digital Technologies, Inc. Input detection systems and methods for display panels with embedded photo sensors
US8328365B2 (en) 2009-04-30 2012-12-11 Hewlett-Packard Development Company, L.P. Mesh for mapping domains based on regularized fiducial marks
EP2502115A4 (en) 2009-11-20 2013-11-06 Pelican Imaging Corp Capturing and processing of images using monolithic camera array with heterogeneous imagers
US9035673B2 (en) 2010-01-25 2015-05-19 Palo Alto Research Center Incorporated Method of in-process intralayer yield detection, interlayer shunt detection and correction
GB2478164A (en) * 2010-02-26 2011-08-31 Sony Corp Calculating misalignment between a stereoscopic image pair based on feature positions
KR101824672B1 (en) 2010-05-12 2018-02-05 포토네이션 케이맨 리미티드 Architectures for imager arrays and array cameras
JP5624133B2 (en) * 2010-06-04 2014-11-12 パナソニック株式会社 Luminance display panel brightness measurement method
US8380845B2 (en) 2010-10-08 2013-02-19 Microsoft Corporation Providing a monitoring service in a cloud-based computing environment
US8959219B2 (en) 2010-10-18 2015-02-17 Microsoft Technology Licensing, Llc Dynamic rerouting of service requests between service endpoints for web services in a composite service
US8874787B2 (en) 2010-10-20 2014-10-28 Microsoft Corporation Optimized consumption of third-party web services in a composite service
US8878950B2 (en) 2010-12-14 2014-11-04 Pelican Imaging Corporation Systems and methods for synthesizing high resolution images using super-resolution processes
US9970180B2 (en) * 2011-03-14 2018-05-15 Caterpillar Trimble Control Technologies Llc System for machine control
JP2014519741A (en) 2011-05-11 2014-08-14 ペリカン イメージング コーポレイション System and method for transmitting and receiving array camera image data
US8866899B2 (en) * 2011-06-07 2014-10-21 Photon Dynamics Inc. Systems and methods for defect detection using a whole raw image
US20130265459A1 (en) 2011-06-28 2013-10-10 Pelican Imaging Corporation Optical arrangements for use with an array camera
EP2726930A4 (en) 2011-06-28 2015-03-04 Pelican Imaging Corp Optical arrangements for use with an array camera
US8704895B2 (en) * 2011-08-29 2014-04-22 Qualcomm Incorporated Fast calibration of displays using spectral-based colorimetrically calibrated multicolor camera
WO2013043761A1 (en) 2011-09-19 2013-03-28 Pelican Imaging Corporation Determining depth from multiple views of a scene that include aliasing using hypothesized fusion
EP2761534B1 (en) 2011-09-28 2020-11-18 FotoNation Limited Systems for encoding light field image files
KR101189209B1 (en) * 2011-10-06 2012-10-09 늘솜주식회사 Position recognizing apparatus and methed therefor
JP2013160629A (en) * 2012-02-06 2013-08-19 Hitachi High-Technologies Corp Defect inspection method, defect inspection apparatus, program, and output unit
US9412206B2 (en) 2012-02-21 2016-08-09 Pelican Imaging Corporation Systems and methods for the manipulation of captured light field image data
US8976250B2 (en) 2012-05-01 2015-03-10 Apple Inc. Lens inspection system
US9210392B2 (en) 2012-05-01 2015-12-08 Pelican Imaging Coporation Camera modules patterned with pi filter groups
WO2014005123A1 (en) 2012-06-28 2014-01-03 Pelican Imaging Corporation Systems and methods for detecting defective camera arrays, optic arrays, and sensors
US20140002674A1 (en) 2012-06-30 2014-01-02 Pelican Imaging Corporation Systems and Methods for Manufacturing Camera Modules Using Active Alignment of Lens Stack Arrays and Sensors
KR101996917B1 (en) 2012-07-20 2019-10-02 삼성디스플레이 주식회사 Method and apparatus for inspecting flat panel display
CN107346061B (en) 2012-08-21 2020-04-24 快图有限公司 System and method for parallax detection and correction in images captured using an array camera
WO2014032020A2 (en) 2012-08-23 2014-02-27 Pelican Imaging Corporation Feature based high resolution motion estimation from low resolution images captured using an array source
US9214013B2 (en) 2012-09-14 2015-12-15 Pelican Imaging Corporation Systems and methods for correcting user identified artifacts in light field images
CN104685860A (en) 2012-09-28 2015-06-03 派力肯影像公司 Generating images from light fields utilizing virtual viewpoints
US9143711B2 (en) 2012-11-13 2015-09-22 Pelican Imaging Corporation Systems and methods for array camera focal plane control
TWI512277B (en) * 2013-01-04 2015-12-11 Taiwan Power Testing Technology Co Ltd Monitor inspection equipment
JP6490013B2 (en) * 2013-02-18 2019-03-27 カティーバ, インコーポレイテッド Systems, devices and methods for quality assessment of OLED stack films
US9462164B2 (en) 2013-02-21 2016-10-04 Pelican Imaging Corporation Systems and methods for generating compressed light field representation data using captured light fields, array geometry, and parallax information
US9253380B2 (en) 2013-02-24 2016-02-02 Pelican Imaging Corporation Thin form factor computational array cameras and modular array cameras
US9638883B1 (en) 2013-03-04 2017-05-02 Fotonation Cayman Limited Passive alignment of array camera modules constructed from lens stack arrays and sensors based upon alignment information obtained during manufacture of array camera modules using an active alignment process
US9774789B2 (en) 2013-03-08 2017-09-26 Fotonation Cayman Limited Systems and methods for high dynamic range imaging using array cameras
US8866912B2 (en) * 2013-03-10 2014-10-21 Pelican Imaging Corporation System and methods for calibration of an array camera using a single captured image
US9521416B1 (en) 2013-03-11 2016-12-13 Kip Peli P1 Lp Systems and methods for image data compression
JP6453780B2 (en) 2013-03-12 2019-01-16 マイクロニック アーベーMycronic Ab Method and apparatus for mechanically formed alignment reference body
WO2014140047A2 (en) 2013-03-12 2014-09-18 Micronic Mydata AB Method and device for writing photomasks with reduced mura errors
US9888194B2 (en) 2013-03-13 2018-02-06 Fotonation Cayman Limited Array camera architecture implementing quantum film image sensors
US9106784B2 (en) 2013-03-13 2015-08-11 Pelican Imaging Corporation Systems and methods for controlling aliasing in images captured by an array camera for use in super-resolution processing
WO2014164550A2 (en) 2013-03-13 2014-10-09 Pelican Imaging Corporation System and methods for calibration of an array camera
WO2014165244A1 (en) 2013-03-13 2014-10-09 Pelican Imaging Corporation Systems and methods for synthesizing images from image data captured by an array camera using restricted depth of field depth maps in which depth estimation precision varies
US8836797B1 (en) 2013-03-14 2014-09-16 Radiant-Zemax Holdings, LLC Methods and systems for measuring and correcting electronic visual displays
US9578259B2 (en) 2013-03-14 2017-02-21 Fotonation Cayman Limited Systems and methods for reducing motion blur in images or video in ultra low light with array cameras
WO2014153098A1 (en) 2013-03-14 2014-09-25 Pelican Imaging Corporation Photmetric normalization in array cameras
US9497429B2 (en) 2013-03-15 2016-11-15 Pelican Imaging Corporation Extended color processing on pelican array cameras
US9445003B1 (en) 2013-03-15 2016-09-13 Pelican Imaging Corporation Systems and methods for synthesizing high resolution images using image deconvolution based on motion and depth information
US9497370B2 (en) 2013-03-15 2016-11-15 Pelican Imaging Corporation Array camera architecture implementing quantum dot color filters
US10122993B2 (en) 2013-03-15 2018-11-06 Fotonation Limited Autofocus system for a conventional camera that uses depth information from an array camera
WO2014145856A1 (en) 2013-03-15 2014-09-18 Pelican Imaging Corporation Systems and methods for stereo imaging with camera arrays
US9633442B2 (en) 2013-03-15 2017-04-25 Fotonation Cayman Limited Array cameras including an array camera module augmented with a separate camera
CN103440654B (en) * 2013-08-27 2016-08-10 南京大学 A kind of LCD foreign body defect detection method
WO2015048694A2 (en) 2013-09-27 2015-04-02 Pelican Imaging Corporation Systems and methods for depth-assisted perspective distortion correction
WO2015070105A1 (en) 2013-11-07 2015-05-14 Pelican Imaging Corporation Methods of manufacturing array camera modules incorporating independently aligned lens stacks
US10119808B2 (en) 2013-11-18 2018-11-06 Fotonation Limited Systems and methods for estimating depth from projected texture using camera arrays
EP3075140B1 (en) 2013-11-26 2018-06-13 FotoNation Cayman Limited Array camera configurations incorporating multiple constituent array cameras
KR102175702B1 (en) * 2013-12-30 2020-11-09 삼성디스플레이 주식회사 Method of compensating mura of display apparatus and vision inspection apparatus performing the method
US10089740B2 (en) 2014-03-07 2018-10-02 Fotonation Limited System and methods for depth regularization and semiautomatic interactive matting using RGB-D images
US9247117B2 (en) 2014-04-07 2016-01-26 Pelican Imaging Corporation Systems and methods for correcting for warpage of a sensor array in an array camera module by introducing warpage into a focal plane of a lens stack array
US9521319B2 (en) 2014-06-18 2016-12-13 Pelican Imaging Corporation Array cameras and array camera modules including spectral filters disposed outside of a constituent image sensor
CN113256730B (en) 2014-09-29 2023-09-05 快图有限公司 System and method for dynamic calibration of an array camera
KR102248789B1 (en) * 2014-10-07 2021-05-06 삼성전자 주식회사 Application processor for sharing resource based on image resolution and devices having same
CN104317079B (en) * 2014-10-29 2017-12-01 京东方科技集团股份有限公司 A kind of display panel identifying system, detecting system, recognition methods and detection method
CN105704482A (en) * 2014-11-27 2016-06-22 英业达科技有限公司 Screen detection method
US20160292376A1 (en) * 2015-04-02 2016-10-06 Advan Int'l Corp. Method for calibrating medical display device using smartphone
US9942474B2 (en) 2015-04-17 2018-04-10 Fotonation Cayman Limited Systems and methods for performing high speed video capture and depth estimation using array cameras
CN104914133B (en) * 2015-06-19 2017-12-22 合肥京东方光电科技有限公司 Rub defect detecting device
WO2016207703A1 (en) 2015-06-23 2016-12-29 Bosch Car Multimedia Portugal, S.A. Apparatus and method for detection of pixel or sub-pixel functional defects of an image display
KR102409966B1 (en) * 2015-09-17 2022-06-16 삼성전자주식회사 Method of manufacturing light source module
CN105204195B (en) * 2015-09-21 2018-05-25 京东方科技集团股份有限公司 A kind of liquid crystal panel detects integrated system into box
CN108770384B (en) 2015-10-02 2021-09-07 安波福技术有限公司 Method and system for reducing Moire interference in a display system including multiple displays using a refractive beam mapper
MX2018004030A (en) 2015-10-02 2018-08-16 Pure Depth Ltd Method and system for performing sub-pixel compression in order to reduce moir㉠interference in a display system including multiple displays.
US10234691B2 (en) 2015-10-02 2019-03-19 Pure Depth Limited Method and system for performing color filter offsets in order to reduce moiré interference in a display system including multiple displays
JP7210280B2 (en) * 2015-11-04 2023-01-23 マジック リープ, インコーポレイテッド Light field display measurement
CN105426926B (en) * 2016-01-04 2019-09-24 京东方科技集团股份有限公司 A kind of couple of AMOLED carries out the method and device of detection classification
CN107155058B (en) * 2016-03-02 2020-04-21 由田新技股份有限公司 Object automatic correction method and automatic correction detection device thereof
TWI603060B (en) * 2016-03-02 2017-10-21 由田新技股份有限公司 Automatic object alignment method and automatic alignment inspection device thereof
US10181391B2 (en) * 2016-05-26 2019-01-15 Nanojehm Inc. Image processing system and method of processing images
US10366674B1 (en) * 2016-12-27 2019-07-30 Facebook Technologies, Llc Display calibration in electronic displays
US10311276B2 (en) * 2017-02-22 2019-06-04 Synaptics Incorporated Under display optical fingerprint sensor arrangement for mitigating moiré effects
US10482618B2 (en) 2017-08-21 2019-11-19 Fotonation Limited Systems and methods for hybrid depth regularization
WO2019040310A1 (en) * 2017-08-24 2019-02-28 Radiant Vision Systems, LLC Methods and systems for measuring electronic visual displays using fractional pixels
CN108022266B (en) * 2017-12-14 2024-02-02 杭州电子科技大学 Artificial intelligent image recognition method for photovoltaic cell on-line position detection
CN108303424A (en) * 2018-01-02 2018-07-20 京东方科技集团股份有限公司 Display panel testing and its detection method
US10755133B2 (en) * 2018-02-22 2020-08-25 Samsung Display Co., Ltd. System and method for line Mura detection with preprocessing
TWI672493B (en) * 2018-03-07 2019-09-21 由田新技股份有限公司 An automatic optical inspection system and method to obtain mura defect from the panel
CN109141822B (en) * 2018-08-02 2020-07-03 凌云光技术集团有限责任公司 Screen defect detection device and method based on four-piece type color filter
CN109164551A (en) * 2018-10-25 2019-01-08 苏州源泽光电科技集团有限公司 A kind of optical lens detected for showing screen
KR20200074299A (en) * 2018-12-14 2020-06-25 삼성디스플레이 주식회사 Vision inspection apparatus and method of driving the same
CN109727233B (en) * 2018-12-18 2021-06-08 武汉精立电子技术有限公司 LCD defect detection method
KR20200081541A (en) * 2018-12-27 2020-07-08 삼성디스플레이 주식회사 Imaging apparatus and driving method of the same
TWI693386B (en) * 2019-05-09 2020-05-11 聯策科技股份有限公司 System and method for optimally adjusting imaging parameters
US10825163B1 (en) 2019-06-13 2020-11-03 Viavi Solutions Inc. Automatically executing a test to inspect an end face of an optical fiber when an image is in focus
MX2022003020A (en) 2019-09-17 2022-06-14 Boston Polarimetrics Inc Systems and methods for surface modeling using polarization cues.
EP4042366A4 (en) 2019-10-07 2023-11-15 Boston Polarimetrics, Inc. Systems and methods for augmentation of sensor systems and imaging systems with polarization
KR20230116068A (en) 2019-11-30 2023-08-03 보스턴 폴라리메트릭스, 인크. System and method for segmenting transparent objects using polarization signals
CN115552486A (en) 2020-01-29 2022-12-30 因思创新有限责任公司 System and method for characterizing an object pose detection and measurement system
KR20220133973A (en) 2020-01-30 2022-10-05 인트린식 이노베이션 엘엘씨 Systems and methods for synthesizing data to train statistical models for different imaging modalities, including polarized images
KR102355462B1 (en) * 2020-03-27 2022-01-26 하이버스 주식회사 System for Inspecting Display Panel
KR102355463B1 (en) * 2020-03-27 2022-01-26 하이버스 주식회사 System and Method for Inspecting Display Panel
WO2021243088A1 (en) 2020-05-27 2021-12-02 Boston Polarimetrics, Inc. Multi-aperture polarization optical systems using beam splitters
US11954886B2 (en) 2021-04-15 2024-04-09 Intrinsic Innovation Llc Systems and methods for six-degree of freedom pose estimation of deformable objects
US11290658B1 (en) 2021-04-15 2022-03-29 Boston Polarimetrics, Inc. Systems and methods for camera exposure control
DE102021205703A1 (en) 2021-06-07 2022-12-08 TechnoTeam Holding GmbH Method and device for photometric measurement of an electronic display and method for controlling an electronic display
US11689813B2 (en) 2021-07-01 2023-06-27 Intrinsic Innovation Llc Systems and methods for high dynamic range imaging using crossed polarizers
KR102560720B1 (en) * 2022-06-08 2023-07-28 시냅스이미징(주) Inspection apparatus for substrate having multiple inspection units
KR20240022084A (en) * 2022-08-11 2024-02-20 주식회사 엘엑스세미콘 Apparatus and Method for Compensating Mura

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5418371A (en) * 1993-02-01 1995-05-23 Aslund; Nils R. D. Apparatus for quantitative imaging of multiple fluorophores using dual detectors
US6177955B1 (en) * 1997-10-09 2001-01-23 Westar Corporation Visual display inspection system
US6323922B1 (en) * 1994-04-19 2001-11-27 Nec Corporation Liquid crystal display cell
US20020075439A1 (en) * 2000-10-31 2002-06-20 Hideki Uehara Electro-optical device, inspection method therefor, and electronic equipment
US6531707B1 (en) * 2000-12-29 2003-03-11 Cognex Corporation Machine vision method for the inspection of a material for defects

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2766942B2 (en) * 1991-02-04 1998-06-18 ミナトエレクトロニクス 株式会社 Display screen reading method of display element
JPH06250139A (en) * 1993-02-23 1994-09-09 Casio Comput Co Ltd Method for inspecting liquid crystal display pannel
JP3087098B2 (en) * 1993-02-23 2000-09-11 カシオ計算機株式会社 Method for detecting position and rotation angle of display pixel of liquid crystal display panel
JP3343445B2 (en) * 1994-07-14 2002-11-11 株式会社アドバンテスト LCD panel image quality inspection system
JP3343444B2 (en) 1994-07-14 2002-11-11 株式会社アドバンテスト LCD panel image quality inspection apparatus and LCD image presampling method
JP3512535B2 (en) * 1995-05-19 2004-03-29 株式会社アドバンテスト Panel image quality inspection apparatus and image quality correction method thereof
US5703362A (en) * 1996-01-02 1997-12-30 General Electric Company Method for nondestructive/noncontact detection and quantification of alpha case on a surface of a workpiece made of titanium or a titanium-based alloy
US6166366A (en) * 1997-07-23 2000-12-26 Cc1, Inc. System and method for monitoring and controlling the deposition of pattern and overall material coatings
US6504943B1 (en) * 1998-07-20 2003-01-07 Sandia Corporation Information-efficient spectral imaging sensor
US6266437B1 (en) * 1998-09-04 2001-07-24 Sandia Corporation Sequential detection of web defects
US6874420B2 (en) * 1999-10-22 2005-04-05 Cc1, Inc. System and method for register mark recognition

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5418371A (en) * 1993-02-01 1995-05-23 Aslund; Nils R. D. Apparatus for quantitative imaging of multiple fluorophores using dual detectors
US6323922B1 (en) * 1994-04-19 2001-11-27 Nec Corporation Liquid crystal display cell
US6177955B1 (en) * 1997-10-09 2001-01-23 Westar Corporation Visual display inspection system
US20020075439A1 (en) * 2000-10-31 2002-06-20 Hideki Uehara Electro-optical device, inspection method therefor, and electronic equipment
US6531707B1 (en) * 2000-12-29 2003-03-11 Cognex Corporation Machine vision method for the inspection of a material for defects

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CN1745385A (en) 2006-03-08
KR20050105194A (en) 2005-11-03
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KR100983943B1 (en) 2010-09-27
US7308157B2 (en) 2007-12-11

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