WO2004070653A3 - Image analysis system and method - Google Patents

Image analysis system and method Download PDF

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Publication number
WO2004070653A3
WO2004070653A3 PCT/US2004/002633 US2004002633W WO2004070653A3 WO 2004070653 A3 WO2004070653 A3 WO 2004070653A3 US 2004002633 W US2004002633 W US 2004002633W WO 2004070653 A3 WO2004070653 A3 WO 2004070653A3
Authority
WO
WIPO (PCT)
Prior art keywords
image
sample
pixels
evaluated
samples
Prior art date
Application number
PCT/US2004/002633
Other languages
French (fr)
Other versions
WO2004070653A2 (en
Inventor
Rhett L Affleck
Robert K Levin
John E Lillig
Robert K Neeper
William R Ewing
Duane Desieno
Eric Hansen
Mike Bodnar
Original Assignee
Discovery Partners Internat
Rhett L Affleck
Robert K Levin
John E Lillig
Robert K Neeper
William R Ewing
Duane Desieno
Eric Hansen
Mike Bodnar
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Discovery Partners Internat, Rhett L Affleck, Robert K Levin, John E Lillig, Robert K Neeper, William R Ewing, Duane Desieno, Eric Hansen, Mike Bodnar filed Critical Discovery Partners Internat
Publication of WO2004070653A2 publication Critical patent/WO2004070653A2/en
Publication of WO2004070653A3 publication Critical patent/WO2004070653A3/en

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B29/00Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
    • C30B29/54Organic compounds
    • C30B29/58Macromolecular compounds
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B7/00Single-crystal growth from solutions using solvents which are liquid at normal temperature, e.g. aqueous solutions
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/251Colorimeters; Construction thereof
    • G01N21/253Colorimeters; Construction thereof for batch operation, i.e. multisample apparatus
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/028Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations having reaction cells in the form of microtitration plates
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications
    • G02B21/0016Technical microscopes, e.g. for inspection or measuring in industrial production processes
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B01PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01LCHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE
    • B01L9/00Supporting devices; Holding devices
    • B01L9/52Supports specially adapted for flat sample carriers, e.g. for plates, slides, chips
    • B01L9/523Supports specially adapted for flat sample carriers, e.g. for plates, slides, chips for multisample carriers, e.g. used for microtitration plates
    • G01N15/1433
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00Sampling; Preparing specimens for investigation
    • G01N1/28Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G01N1/40Concentrating samples
    • G01N1/4022Concentrating samples by thermal techniques; Phase changes
    • G01N2001/4027Concentrating samples by thermal techniques; Phase changes evaporation leaving a concentrated sample
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
    • G01N15/10Investigating individual particles
    • G01N15/14Electro-optical investigation, e.g. flow cytometers
    • G01N2015/1493Particle size
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N2035/00346Heating or cooling arrangements
    • G01N2035/00356Holding samples at elevated temperature (incubation)
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N2035/00346Heating or cooling arrangements
    • G01N2035/00455Controlling humidity in analyser
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584Control arrangements for automatic analysers
    • G01N35/00722Communications; Identification
    • G01N35/00871Communications between instruments or with remote terminals
    • G01N2035/00881Communications between instruments or with remote terminals network configurations
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/04Details of the conveyor system
    • G01N2035/0401Sample carriers, cuvettes or reaction vessels
    • G01N2035/0418Plate elements with several rows of samples
    • G01N2035/042Plate elements with several rows of samples moved independently, e.g. by fork manipulator
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/04Details of the conveyor system
    • G01N2035/0401Sample carriers, cuvettes or reaction vessels
    • G01N2035/0418Plate elements with several rows of samples
    • G01N2035/0425Stacks, magazines or elevators for plates
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/04Details of the conveyor system
    • G01N2035/046General conveyor features
    • G01N2035/0462Buffers [FIFO] or stacks [LIFO] for holding carriers between operations
    • G01N2035/0463Buffers [FIFO] or stacks [LIFO] for holding carriers between operations in incubators
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/0099Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor comprising robots or similar manipulators

Abstract

An image analysis system (200) and related methods for automation of the monitoring of samples to determine crystal growth. Samples are imaged from time to time using a set of imaging parameters. The resulting images are evaluated to determine the contents of the samples. If the evaluation of the image indicates the presence of crystals, the sample may be re-imaged using a different set of imaging parameters, and the resulting image analyzed to determine its contents. The sample may also be evaluated by generating multiple images of a sample using various sets of imaging parameters, identifying pixels that depict regions of interest in a plurality of images, merging the pixels from each region of interest into a composite image and analyzing the composite image. An image of a sample can also be evaluated by classifying the pixels of the image based on the contents of the sample that they depict, color-coding the pixels using the classifications, and displaying the colored image for analysis.
PCT/US2004/002633 2003-01-31 2004-01-30 Image analysis system and method WO2004070653A2 (en)

Applications Claiming Priority (8)

Application Number Priority Date Filing Date Title
US44458503P 2003-01-31 2003-01-31
US44458603P 2003-01-31 2003-01-31
US44451903P 2003-01-31 2003-01-31
US60/444,586 2003-01-31
US60/444,585 2003-01-31
US60/444,519 2003-01-31
US47498903P 2003-05-30 2003-05-30
US60/474,989 2003-05-30

Publications (2)

Publication Number Publication Date
WO2004070653A2 WO2004070653A2 (en) 2004-08-19
WO2004070653A3 true WO2004070653A3 (en) 2005-01-06

Family

ID=32854497

Family Applications (4)

Application Number Title Priority Date Filing Date
PCT/US2004/003239 WO2004069984A2 (en) 2003-01-31 2004-01-30 Automated imaging system and method
PCT/US2004/002617 WO2004071067A2 (en) 2003-01-31 2004-01-30 Data communication in a laboratory environment
PCT/US2004/002633 WO2004070653A2 (en) 2003-01-31 2004-01-30 Image analysis system and method
PCT/US2004/002717 WO2004069409A2 (en) 2003-01-31 2004-01-30 Automated sample analysis system and method

Family Applications Before (2)

Application Number Title Priority Date Filing Date
PCT/US2004/003239 WO2004069984A2 (en) 2003-01-31 2004-01-30 Automated imaging system and method
PCT/US2004/002617 WO2004071067A2 (en) 2003-01-31 2004-01-30 Data communication in a laboratory environment

Family Applications After (1)

Application Number Title Priority Date Filing Date
PCT/US2004/002717 WO2004069409A2 (en) 2003-01-31 2004-01-30 Automated sample analysis system and method

Country Status (2)

Country Link
US (4) US7596251B2 (en)
WO (4) WO2004069984A2 (en)

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