WO2004068186A3 - Interferometric confocal microscopy incorporating a pihnole array beam-splitter - Google Patents
Interferometric confocal microscopy incorporating a pihnole array beam-splitter Download PDFInfo
- Publication number
- WO2004068186A3 WO2004068186A3 PCT/US2004/002165 US2004002165W WO2004068186A3 WO 2004068186 A3 WO2004068186 A3 WO 2004068186A3 US 2004002165 W US2004002165 W US 2004002165W WO 2004068186 A3 WO2004068186 A3 WO 2004068186A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- pihnole
- splitter
- confocal microscopy
- array beam
- interferometric confocal
- Prior art date
Links
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
- G01B9/02007—Two or more frequencies or sources used for interferometric measurement
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
-
- A—HUMAN NECESSITIES
- A45—HAND OR TRAVELLING ARTICLES
- A45D—HAIRDRESSING OR SHAVING EQUIPMENT; EQUIPMENT FOR COSMETICS OR COSMETIC TREATMENTS, e.g. FOR MANICURING OR PEDICURING
- A45D8/00—Hair-holding devices; Accessories therefor
- A45D8/004—Hair-holding devices; Accessories therefor with decorative arrangements or form
- A45D8/006—Interchangeable ornaments attached to hair holding devices
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
- G01B9/02002—Interferometers characterised by controlling or generating intrinsic radiation properties using two or more frequencies
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
- G01B9/0201—Interferometers characterised by controlling or generating intrinsic radiation properties using temporal phase variation
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
- G01B9/02012—Interferometers characterised by controlling or generating intrinsic radiation properties using temporal intensity variation
- G01B9/02014—Interferometers characterised by controlling or generating intrinsic radiation properties using temporal intensity variation by using pulsed light
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02015—Interferometers characterised by the beam path configuration
- G01B9/02022—Interferometers characterised by the beam path configuration contacting one object by grazing incidence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02041—Interferometers characterised by particular imaging or detection techniques
- G01B9/02042—Confocal imaging
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02055—Reduction or prevention of errors; Testing; Calibration
- G01B9/02075—Reduction or prevention of errors; Testing; Calibration of particular errors
- G01B9/02078—Caused by ambiguity
- G01B9/02079—Quadrature detection, i.e. detecting relatively phase-shifted signals
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/04—Measuring microscopes
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0052—Optical details of the image generation
- G02B21/0056—Optical details of the image generation based on optical coherence, e.g. phase-contrast arrangements, interference arrangements
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/06—Means for illuminating specimens
- G02B21/08—Condensers
- G02B21/14—Condensers affording illumination for phase-contrast observation
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/01—Head-up displays
- G02B27/017—Head mounted
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/10—Beam splitting or combining systems
- G02B27/108—Beam splitting or combining systems for sampling a portion of a beam or combining a small beam in a larger one, e.g. wherein the area ratio or power ratio of the divided beams significantly differs from unity, without spectral selectivity
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/10—Beam splitting or combining systems
- G02B27/12—Beam splitting or combining systems operating by refraction only
- G02B27/126—The splitting element being a prism or prismatic array, including systems based on total internal reflection
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/10—Beam splitting or combining systems
- G02B27/14—Beam splitting or combining systems operating by reflection only
- G02B27/143—Beam splitting or combining systems operating by reflection only using macroscopically faceted or segmented reflective surfaces
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/10—Beam splitting or combining systems
- G02B27/14—Beam splitting or combining systems operating by reflection only
- G02B27/144—Beam splitting or combining systems operating by reflection only using partially transparent surfaces without spectral selectivity
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/10—Beam splitting or combining systems
- G02B27/14—Beam splitting or combining systems operating by reflection only
- G02B27/145—Beam splitting or combining systems operating by reflection only having sequential partially reflecting surfaces
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
- G01B2290/70—Using polarization in the interferometer
Abstract
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP04705643A EP1588120A4 (en) | 2003-01-27 | 2004-01-27 | Interferometric confocal microscopy incorporating a pihnole array beam-splitter |
JP2006503045A JP2006518854A (en) | 2003-01-27 | 2004-01-27 | Interferometric confocal microscope observation method incorporating a pinhole array beam splitter. |
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US44285803P | 2003-01-27 | 2003-01-27 | |
US60/442,858 | 2003-01-27 | ||
US44289203P | 2003-01-28 | 2003-01-28 | |
US60/442,892 | 2003-01-28 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2004068186A2 WO2004068186A2 (en) | 2004-08-12 |
WO2004068186A3 true WO2004068186A3 (en) | 2005-02-17 |
Family
ID=32829806
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2004/002166 WO2004068187A2 (en) | 2003-01-27 | 2004-01-27 | Apparatus and method for joint measurements of conjugated quadratures of fields of reflected/scattered and transmitted beams by an object in interferometry |
PCT/US2004/002165 WO2004068186A2 (en) | 2003-01-27 | 2004-01-27 | Interferometric confocal microscopy incorporating a pihnole array beam-splitter |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2004/002166 WO2004068187A2 (en) | 2003-01-27 | 2004-01-27 | Apparatus and method for joint measurements of conjugated quadratures of fields of reflected/scattered and transmitted beams by an object in interferometry |
Country Status (5)
Country | Link |
---|---|
US (2) | US20040257577A1 (en) |
EP (2) | EP1588119A4 (en) |
JP (2) | JP2006518854A (en) |
KR (2) | KR20060011938A (en) |
WO (2) | WO2004068187A2 (en) |
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EP1588119A4 (en) * | 2003-01-27 | 2007-03-07 | Zetetic Inst | Apparatus and method for joint measurements of conjugated quadratures of fields of reflected/scattered and transmitted beams by an object in interferometry |
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KR20050114615A (en) | 2003-02-04 | 2005-12-06 | 제테틱 인스티튜트 | Compensation for effects of mismatch in indices of refraction at a substrate-medium interface in non-confocal, confocal, and interferometric confocal microscopy |
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JP2006518488A (en) * | 2003-02-19 | 2006-08-10 | ゼテテック インスティテュート | Method and apparatus for using dark field interference confocal microscope |
WO2004090465A2 (en) * | 2003-04-01 | 2004-10-21 | Zetetic Institute | Apparatus and method for joint measurement of fields of scattered/reflected or transmitted orthogonally polarized beams by an object in interferometry |
US7054077B2 (en) | 2003-04-01 | 2006-05-30 | Zetetic Institute | Method for constructing a catadioptric lens system |
JP2006522338A (en) | 2003-04-03 | 2006-09-28 | ゼテテック インスティテュート | Apparatus and method for field measurement of backscattered and forward scattered / reflected beams by interferometric objects |
-
2004
- 2004-01-27 EP EP04705642A patent/EP1588119A4/en not_active Withdrawn
- 2004-01-27 WO PCT/US2004/002166 patent/WO2004068187A2/en active Application Filing
- 2004-01-27 KR KR1020057013865A patent/KR20060011938A/en not_active Application Discontinuation
- 2004-01-27 JP JP2006503045A patent/JP2006518854A/en not_active Withdrawn
- 2004-01-27 EP EP04705643A patent/EP1588120A4/en not_active Withdrawn
- 2004-01-27 JP JP2006503046A patent/JP2006516763A/en active Pending
- 2004-01-27 WO PCT/US2004/002165 patent/WO2004068186A2/en not_active Application Discontinuation
- 2004-01-27 KR KR1020057013857A patent/KR20050114611A/en not_active Application Discontinuation
- 2004-01-27 US US10/765,368 patent/US20040257577A1/en not_active Abandoned
-
2008
- 2008-01-31 US US12/023,803 patent/US7495769B2/en not_active Expired - Fee Related
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5220403A (en) * | 1991-03-11 | 1993-06-15 | International Business Machines Corporation | Apparatus and a method for high numerical aperture microscopic examination of materials |
US6775009B2 (en) * | 2000-07-27 | 2004-08-10 | Zetetic Institute | Differential interferometric scanning near-field confocal microscopy |
Non-Patent Citations (1)
Title |
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See also references of EP1588120A4 * |
Also Published As
Publication number | Publication date |
---|---|
EP1588119A4 (en) | 2007-03-07 |
WO2004068187A3 (en) | 2005-03-24 |
EP1588119A2 (en) | 2005-10-26 |
EP1588120A4 (en) | 2006-12-20 |
KR20060011938A (en) | 2006-02-06 |
US7495769B2 (en) | 2009-02-24 |
JP2006518854A (en) | 2006-08-17 |
US20040257577A1 (en) | 2004-12-23 |
US20080180682A1 (en) | 2008-07-31 |
WO2004068187A2 (en) | 2004-08-12 |
KR20050114611A (en) | 2005-12-06 |
JP2006516763A (en) | 2006-07-06 |
EP1588120A2 (en) | 2005-10-26 |
WO2004068186A2 (en) | 2004-08-12 |
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