WO2004059266A3 - Out-of-plane birefringence measurement - Google Patents

Out-of-plane birefringence measurement Download PDF

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Publication number
WO2004059266A3
WO2004059266A3 PCT/US2003/040366 US0340366W WO2004059266A3 WO 2004059266 A3 WO2004059266 A3 WO 2004059266A3 US 0340366 W US0340366 W US 0340366W WO 2004059266 A3 WO2004059266 A3 WO 2004059266A3
Authority
WO
WIPO (PCT)
Prior art keywords
plane birefringence
sample
beams
birefringence measurement
detected
Prior art date
Application number
PCT/US2003/040366
Other languages
French (fr)
Other versions
WO2004059266A2 (en
Inventor
Baoliang Wang
Original Assignee
Hinds Instruments Inc
Baoliang Wang
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US10/364,006 external-priority patent/US7016039B2/en
Application filed by Hinds Instruments Inc, Baoliang Wang filed Critical Hinds Instruments Inc
Priority to JP2005510008A priority Critical patent/JP4657105B2/en
Priority to AU2003299695A priority patent/AU2003299695A1/en
Priority to CN2003801088823A priority patent/CN1739007B/en
Priority to EP03799977A priority patent/EP1573287A4/en
Publication of WO2004059266A2 publication Critical patent/WO2004059266A2/en
Publication of WO2004059266A3 publication Critical patent/WO2004059266A3/en
Priority to US11/155,825 priority patent/US7312869B2/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J4/00—Measuring polarisation of light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties
    • G01N21/23—Bi-refringence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light

Abstract

The disclosure is directed to precise measurement of out-of-plane birefringence properties of samples of transparent optical material. Two angled-apart light beams (B1, B2) are passed through a selected location of a sample (26) optical element. One of the beams (B1, B2) is incident to the sample (26) surface. The characteristics of the beams (B1, B2) are detected after passing through the sample (26), and the information detected is processed to determine the out-of-plane birefringence.
PCT/US2003/040366 2002-12-20 2003-12-19 Out-of-plane birefringence measurement WO2004059266A2 (en)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2005510008A JP4657105B2 (en) 2002-12-20 2003-12-19 Measurement of out-of-plane birefringence
AU2003299695A AU2003299695A1 (en) 2002-12-20 2003-12-19 Out-of-plane birefringence measurement
CN2003801088823A CN1739007B (en) 2002-12-20 2003-12-19 Method and apparatus for measuring out-of-plane birefringence of transparent samples
EP03799977A EP1573287A4 (en) 2002-12-20 2003-12-19 Out-of-plane birefringence measurement
US11/155,825 US7312869B2 (en) 2002-12-20 2005-06-16 Out-of-plane birefringence measurement

Applications Claiming Priority (6)

Application Number Priority Date Filing Date Title
US43558802P 2002-12-20 2002-12-20
US60/435,588 2002-12-20
US10/364,006 US7016039B2 (en) 2003-02-10 2003-02-10 Purging light beam paths in optical equipment
US10/364,006 2003-02-10
US49283803P 2003-08-06 2003-08-06
US60/492,838 2003-08-06

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US11/155,825 Continuation US7312869B2 (en) 2002-12-20 2005-06-16 Out-of-plane birefringence measurement

Publications (2)

Publication Number Publication Date
WO2004059266A2 WO2004059266A2 (en) 2004-07-15
WO2004059266A3 true WO2004059266A3 (en) 2004-10-21

Family

ID=32685986

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2003/040366 WO2004059266A2 (en) 2002-12-20 2003-12-19 Out-of-plane birefringence measurement

Country Status (6)

Country Link
EP (1) EP1573287A4 (en)
JP (1) JP4657105B2 (en)
KR (1) KR20050093790A (en)
CN (1) CN1739007B (en)
AU (1) AU2003299695A1 (en)
WO (1) WO2004059266A2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9375158B2 (en) 2007-07-31 2016-06-28 The General Hospital Corporation Systems and methods for providing beam scan patterns for high speed doppler optical frequency domain imaging

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20080043835A (en) * 2005-09-14 2008-05-19 칼 짜이스 에스엠테 아게 Optical system of a microlithographic exposure system
JP4317558B2 (en) * 2006-08-23 2009-08-19 株式会社堀場製作所 Sample analysis method, sample analysis apparatus, and program
TWI331213B (en) 2005-11-29 2010-10-01 Horiba Ltd Sample analyzing method, sample analyzing apparatus,and recording medium
US7746465B2 (en) 2007-01-18 2010-06-29 Hinds Instruments, Inc. Sample holder for an optical element
KR100911626B1 (en) * 2007-07-13 2009-08-12 서강대학교산학협력단 Apparatus for measuring bio-sensor
JP5140451B2 (en) * 2008-02-05 2013-02-06 富士フイルム株式会社 Birefringence measuring method, apparatus and program
JP2009229229A (en) * 2008-03-21 2009-10-08 Fujifilm Corp Double refraction measuring instrument and double refraction measuring method
US8582101B2 (en) * 2008-07-08 2013-11-12 Hinds Instruments, Inc. High throughput birefringence measurement
JP2012150107A (en) * 2010-12-27 2012-08-09 Nippon Zeon Co Ltd Evaluation method of optical anisotropic film, measuring apparatus for optical characteristics of optical anisotropic film and manufacturing method of optical anisotropic film
GB201308434D0 (en) * 2013-05-10 2013-06-19 Innovia Films Sarl Authentication apparatus and method
WO2014189967A2 (en) 2013-05-23 2014-11-27 Hinds Instruments, Inc. Polarization properties imaging systems

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5956146A (en) * 1997-01-29 1999-09-21 Victor Company Of Japan, Ltd. Birefringence measuring apparatus for optical disc substrate

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3106818A1 (en) * 1981-02-24 1982-09-09 Basf Ag, 6700 Ludwigshafen Method of continuously determining multiaxial orientation states of stretched films or panels
JPH0623689B2 (en) * 1988-12-12 1994-03-30 株式会社オーク製作所 Birefringence measurement method
JPH0545278A (en) * 1991-08-09 1993-02-23 Matsushita Electric Ind Co Ltd Complex refraction measuring device
JPH08201277A (en) * 1995-01-31 1996-08-09 New Oji Paper Co Ltd Method and apparatus for measuring double refraction
JPH10267831A (en) * 1997-03-25 1998-10-09 Unie Opt:Kk Birefringence measuring optical system and high space resolution polarization analyzer
JP4629869B2 (en) * 1998-02-20 2011-02-09 ハインズ インスツルメンツ インコーポレイテッド Birefringence characteristic measuring method and apparatus
US5864403A (en) * 1998-02-23 1999-01-26 National Research Council Of Canada Method and apparatus for measurement of absolute biaxial birefringence in monolayer and multilayer films, sheets and shapes
US6268914B1 (en) * 2000-01-14 2001-07-31 Hinds Instruments, Inc. Calibration Process For Birefringence Measurement System

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5956146A (en) * 1997-01-29 1999-09-21 Victor Company Of Japan, Ltd. Birefringence measuring apparatus for optical disc substrate

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of EP1573287A4 *

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9375158B2 (en) 2007-07-31 2016-06-28 The General Hospital Corporation Systems and methods for providing beam scan patterns for high speed doppler optical frequency domain imaging

Also Published As

Publication number Publication date
AU2003299695A8 (en) 2004-07-22
JP2006511823A (en) 2006-04-06
EP1573287A2 (en) 2005-09-14
JP4657105B2 (en) 2011-03-23
EP1573287A4 (en) 2009-11-11
KR20050093790A (en) 2005-09-23
WO2004059266A2 (en) 2004-07-15
CN1739007A (en) 2006-02-22
AU2003299695A1 (en) 2004-07-22
CN1739007B (en) 2013-06-19

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