WO2004030008A3 - Electric sector time-of-flight mass spectrometer with adjustable ion optical elements - Google Patents

Electric sector time-of-flight mass spectrometer with adjustable ion optical elements Download PDF

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Publication number
WO2004030008A3
WO2004030008A3 PCT/US2003/027974 US0327974W WO2004030008A3 WO 2004030008 A3 WO2004030008 A3 WO 2004030008A3 US 0327974 W US0327974 W US 0327974W WO 2004030008 A3 WO2004030008 A3 WO 2004030008A3
Authority
WO
WIPO (PCT)
Prior art keywords
optical elements
mass spectrometer
ion optical
flight mass
electric sector
Prior art date
Application number
PCT/US2003/027974
Other languages
French (fr)
Other versions
WO2004030008A2 (en
Inventor
Sidney E Buttrill Jr
Original Assignee
Ciphergen Biosystems Inc
Sidney E Buttrill Jr
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ciphergen Biosystems Inc, Sidney E Buttrill Jr filed Critical Ciphergen Biosystems Inc
Priority to CA002498842A priority Critical patent/CA2498842A1/en
Priority to EP03749485A priority patent/EP1543538A2/en
Priority to JP2004540053A priority patent/JP2006500751A/en
Priority to AU2003268517A priority patent/AU2003268517A1/en
Publication of WO2004030008A2 publication Critical patent/WO2004030008A2/en
Publication of WO2004030008A3 publication Critical patent/WO2004030008A3/en

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/26Mass spectrometers or separator tubes
    • H01J49/34Dynamic spectrometers
    • H01J49/40Time-of-flight spectrometers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/26Mass spectrometers or separator tubes
    • H01J49/28Static spectrometers
    • H01J49/282Static spectrometers using electrostatic analysers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/22Electrostatic deflection
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/26Mass spectrometers or separator tubes
    • H01J49/34Dynamic spectrometers
    • H01J49/40Time-of-flight spectrometers
    • H01J49/408Time-of-flight spectrometers with multiple changes of direction, e.g. by using electric or magnetic sectors, closed-loop time-of-flight

Abstract

The invention provides apparatus and methods for performing time-of-flight (TOF) mass spectrometry (200). A TOF mass spectrometer of the present invention comprises one or more ion focusing electric sectors (250, 350, 450, and 550). . At least one of the electric sectors is associated with an ion optical element (266, 267). The ion optical elements (266, 267) comprise at least one adjustable electrode (260, 261), such that the adjustable electrode (260, 261)is able to modify the potential experienced by an ion entering (70) or exiting (72) the electric sector (250, 350, 450, or 550) with which it is associated.
PCT/US2003/027974 2002-09-24 2003-09-04 Electric sector time-of-flight mass spectrometer with adjustable ion optical elements WO2004030008A2 (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
CA002498842A CA2498842A1 (en) 2002-09-24 2003-09-04 Electric sector time-of-flight mass spectrometer with adjustable ion optical elements
EP03749485A EP1543538A2 (en) 2002-09-24 2003-09-04 Electric sector time-of-flight mass spectrometer with adjustable ion optical elements
JP2004540053A JP2006500751A (en) 2002-09-24 2003-09-04 Electric sector time-of-flight mass spectrometer with adjustable ion optics
AU2003268517A AU2003268517A1 (en) 2002-09-24 2003-09-04 Electric sector time-of-flight mass spectrometer with adjustable ion optical elements

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US41340602P 2002-09-24 2002-09-24
US60/413,406 2002-09-24
US10/424,351 US6867414B2 (en) 2002-09-24 2003-04-24 Electric sector time-of-flight mass spectrometer with adjustable ion optical elements
US10/424,351 2003-04-24

Publications (2)

Publication Number Publication Date
WO2004030008A2 WO2004030008A2 (en) 2004-04-08
WO2004030008A3 true WO2004030008A3 (en) 2004-12-16

Family

ID=31998179

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2003/027974 WO2004030008A2 (en) 2002-09-24 2003-09-04 Electric sector time-of-flight mass spectrometer with adjustable ion optical elements

Country Status (9)

Country Link
US (4) US6867414B2 (en)
EP (1) EP1543538A2 (en)
JP (1) JP2006500751A (en)
KR (1) KR20050071502A (en)
CN (1) CN1685467A (en)
AU (1) AU2003268517A1 (en)
CA (1) CA2498842A1 (en)
TW (1) TW200420339A (en)
WO (1) WO2004030008A2 (en)

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WO2010041296A1 (en) * 2008-10-09 2010-04-15 株式会社島津製作所 Mass spectrometer
TWI452595B (en) * 2010-10-22 2014-09-11 Advanced Ion Beam Tech Inc Electrode assembly for accelerating or decelerating ion beam,ion implantation system, and method of decelerating spot beams or ribbon-shaped ion beam
JP5644863B2 (en) * 2010-12-17 2014-12-24 株式会社島津製作所 Ion guide and mass spectrometer
WO2012124041A1 (en) * 2011-03-14 2012-09-20 株式会社島津製作所 Ion guide and mass spectrometer
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US8796620B2 (en) 2011-06-08 2014-08-05 Mks Instruments, Inc. Mass spectrometry for gas analysis with a one-stage charged particle deflector lens between a charged particle source and a charged particle analyzer both offset from a central axis of the deflector lens
US9159543B2 (en) * 2012-03-20 2015-10-13 Bruker Chemical Analysis Bv Ion deflector for a mass spectrometer
US9093253B2 (en) * 2012-12-31 2015-07-28 908 Devices Inc. High pressure mass spectrometry systems and methods
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WO2015108969A1 (en) 2014-01-14 2015-07-23 908 Devices Inc. Sample collection in compact mass spectrometry systems
US9761431B2 (en) * 2015-09-21 2017-09-12 NOAA Technology Partnerships Office System and methodology for expressing ion path in a time-of-flight mass spectrometer
WO2018044253A1 (en) * 2016-08-27 2018-03-08 NOAA Technology Partnerships Office System and methodology for expressing ion path in a time-of-flight mass spectrometer
US10566180B2 (en) 2018-07-11 2020-02-18 Thermo Finnigan Llc Adjustable multipole assembly for a mass spectrometer
CN112799120B (en) * 2019-11-13 2024-03-22 中国科学院国家空间科学中心 Dual-channel electrostatic analyzer for synchronous measurement of ions and electrons
CN116822248B (en) * 2023-08-23 2023-11-17 杭州谱育科技发展有限公司 Parameter design method of flight time mass spectrum device

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Also Published As

Publication number Publication date
US6998606B2 (en) 2006-02-14
EP1543538A2 (en) 2005-06-22
US20040149901A1 (en) 2004-08-05
TW200420339A (en) 2004-10-16
CA2498842A1 (en) 2004-04-08
CN1685467A (en) 2005-10-19
US7247846B2 (en) 2007-07-24
US20050224708A1 (en) 2005-10-13
KR20050071502A (en) 2005-07-07
AU2003268517A1 (en) 2004-04-19
US20080128613A1 (en) 2008-06-05
JP2006500751A (en) 2006-01-05
US20040056190A1 (en) 2004-03-25
US6867414B2 (en) 2005-03-15
WO2004030008A2 (en) 2004-04-08

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