WO2004030008A3 - Electric sector time-of-flight mass spectrometer with adjustable ion optical elements - Google Patents
Electric sector time-of-flight mass spectrometer with adjustable ion optical elements Download PDFInfo
- Publication number
- WO2004030008A3 WO2004030008A3 PCT/US2003/027974 US0327974W WO2004030008A3 WO 2004030008 A3 WO2004030008 A3 WO 2004030008A3 US 0327974 W US0327974 W US 0327974W WO 2004030008 A3 WO2004030008 A3 WO 2004030008A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- optical elements
- mass spectrometer
- ion optical
- flight mass
- electric sector
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/40—Time-of-flight spectrometers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/28—Static spectrometers
- H01J49/282—Static spectrometers using electrostatic analysers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/22—Electrostatic deflection
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/40—Time-of-flight spectrometers
- H01J49/408—Time-of-flight spectrometers with multiple changes of direction, e.g. by using electric or magnetic sectors, closed-loop time-of-flight
Abstract
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CA002498842A CA2498842A1 (en) | 2002-09-24 | 2003-09-04 | Electric sector time-of-flight mass spectrometer with adjustable ion optical elements |
EP03749485A EP1543538A2 (en) | 2002-09-24 | 2003-09-04 | Electric sector time-of-flight mass spectrometer with adjustable ion optical elements |
JP2004540053A JP2006500751A (en) | 2002-09-24 | 2003-09-04 | Electric sector time-of-flight mass spectrometer with adjustable ion optics |
AU2003268517A AU2003268517A1 (en) | 2002-09-24 | 2003-09-04 | Electric sector time-of-flight mass spectrometer with adjustable ion optical elements |
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US41340602P | 2002-09-24 | 2002-09-24 | |
US60/413,406 | 2002-09-24 | ||
US10/424,351 US6867414B2 (en) | 2002-09-24 | 2003-04-24 | Electric sector time-of-flight mass spectrometer with adjustable ion optical elements |
US10/424,351 | 2003-04-24 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2004030008A2 WO2004030008A2 (en) | 2004-04-08 |
WO2004030008A3 true WO2004030008A3 (en) | 2004-12-16 |
Family
ID=31998179
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2003/027974 WO2004030008A2 (en) | 2002-09-24 | 2003-09-04 | Electric sector time-of-flight mass spectrometer with adjustable ion optical elements |
Country Status (9)
Country | Link |
---|---|
US (4) | US6867414B2 (en) |
EP (1) | EP1543538A2 (en) |
JP (1) | JP2006500751A (en) |
KR (1) | KR20050071502A (en) |
CN (1) | CN1685467A (en) |
AU (1) | AU2003268517A1 (en) |
CA (1) | CA2498842A1 (en) |
TW (1) | TW200420339A (en) |
WO (1) | WO2004030008A2 (en) |
Families Citing this family (31)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6867414B2 (en) * | 2002-09-24 | 2005-03-15 | Ciphergen Biosystems, Inc. | Electric sector time-of-flight mass spectrometer with adjustable ion optical elements |
JP4182844B2 (en) * | 2003-09-03 | 2008-11-19 | 株式会社島津製作所 | Mass spectrometer |
JP4001100B2 (en) * | 2003-11-14 | 2007-10-31 | 株式会社島津製作所 | Mass spectrometer |
US7439520B2 (en) * | 2005-01-24 | 2008-10-21 | Applied Biosystems Inc. | Ion optics systems |
US7351958B2 (en) * | 2005-01-24 | 2008-04-01 | Applera Corporation | Ion optics systems |
GB0605089D0 (en) * | 2006-03-14 | 2006-04-26 | Micromass Ltd | Mass spectrometer |
GB0607542D0 (en) * | 2006-04-13 | 2006-05-24 | Thermo Finnigan Llc | Mass spectrometer |
KR100790532B1 (en) * | 2006-10-31 | 2008-01-02 | 한국기초과학지원연구원 | A method for improving fourier transform ion cyclotron resonance mass spectrometer signal |
JP4940977B2 (en) * | 2007-02-07 | 2012-05-30 | 株式会社島津製作所 | Ion deflection apparatus and mass spectrometer |
JP4766170B2 (en) * | 2007-05-22 | 2011-09-07 | 株式会社島津製作所 | Mass spectrometer |
US8334506B2 (en) | 2007-12-10 | 2012-12-18 | 1St Detect Corporation | End cap voltage control of ion traps |
CN101883983B (en) * | 2007-12-13 | 2013-07-10 | 株式会社岛津制作所 | Mass analysis method and mass analysis system |
US7847248B2 (en) * | 2007-12-28 | 2010-12-07 | Mds Analytical Technologies, A Business Unit Of Mds Inc. | Method and apparatus for reducing space charge in an ion trap |
US7932487B2 (en) * | 2008-01-11 | 2011-04-26 | Thermo Finnigan Llc | Mass spectrometer with looped ion path |
US7973277B2 (en) * | 2008-05-27 | 2011-07-05 | 1St Detect Corporation | Driving a mass spectrometer ion trap or mass filter |
WO2010041296A1 (en) * | 2008-10-09 | 2010-04-15 | 株式会社島津製作所 | Mass spectrometer |
TWI452595B (en) * | 2010-10-22 | 2014-09-11 | Advanced Ion Beam Tech Inc | Electrode assembly for accelerating or decelerating ion beam,ion implantation system, and method of decelerating spot beams or ribbon-shaped ion beam |
JP5644863B2 (en) * | 2010-12-17 | 2014-12-24 | 株式会社島津製作所 | Ion guide and mass spectrometer |
WO2012124041A1 (en) * | 2011-03-14 | 2012-09-20 | 株式会社島津製作所 | Ion guide and mass spectrometer |
US8450681B2 (en) * | 2011-06-08 | 2013-05-28 | Mks Instruments, Inc. | Mass spectrometry for gas analysis in which both a charged particle source and a charged particle analyzer are offset from an axis of a deflector lens, resulting in reduced baseline signal offsets |
US8796638B2 (en) | 2011-06-08 | 2014-08-05 | Mks Instruments, Inc. | Mass spectrometry for a gas analysis with a two-stage charged particle deflector lens between a charged particle source and a charged particle analyzer both offset from a central axis of the deflector lens |
US8796620B2 (en) | 2011-06-08 | 2014-08-05 | Mks Instruments, Inc. | Mass spectrometry for gas analysis with a one-stage charged particle deflector lens between a charged particle source and a charged particle analyzer both offset from a central axis of the deflector lens |
US9159543B2 (en) * | 2012-03-20 | 2015-10-13 | Bruker Chemical Analysis Bv | Ion deflector for a mass spectrometer |
US9093253B2 (en) * | 2012-12-31 | 2015-07-28 | 908 Devices Inc. | High pressure mass spectrometry systems and methods |
US9099286B2 (en) * | 2012-12-31 | 2015-08-04 | 908 Devices Inc. | Compact mass spectrometer |
WO2015108969A1 (en) | 2014-01-14 | 2015-07-23 | 908 Devices Inc. | Sample collection in compact mass spectrometry systems |
US9761431B2 (en) * | 2015-09-21 | 2017-09-12 | NOAA Technology Partnerships Office | System and methodology for expressing ion path in a time-of-flight mass spectrometer |
WO2018044253A1 (en) * | 2016-08-27 | 2018-03-08 | NOAA Technology Partnerships Office | System and methodology for expressing ion path in a time-of-flight mass spectrometer |
US10566180B2 (en) | 2018-07-11 | 2020-02-18 | Thermo Finnigan Llc | Adjustable multipole assembly for a mass spectrometer |
CN112799120B (en) * | 2019-11-13 | 2024-03-22 | 中国科学院国家空间科学中心 | Dual-channel electrostatic analyzer for synchronous measurement of ions and electrons |
CN116822248B (en) * | 2023-08-23 | 2023-11-17 | 杭州谱育科技发展有限公司 | Parameter design method of flight time mass spectrum device |
Citations (2)
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US4472631A (en) * | 1982-06-04 | 1984-09-18 | Research Corporation | Combination of time resolution and mass dispersive techniques in mass spectrometry |
US6674069B1 (en) * | 1998-12-17 | 2004-01-06 | Jeol Usa, Inc. | In-line reflecting time-of-flight mass spectrometer for molecular structural analysis using collision induced dissociation |
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US3576992A (en) * | 1968-09-13 | 1971-05-04 | Bendix Corp | Time-of-flight mass spectrometer having both linear and curved drift regions whose energy dispersions with time are mutually compensatory |
GB1318200A (en) * | 1969-11-07 | 1973-05-23 | Ass Elect Ind | Mass spectrometers |
US3863068A (en) * | 1972-07-27 | 1975-01-28 | Max Planck Gesellschaft | Time-of-flight mass spectrometer |
JPS5015594A (en) * | 1973-06-08 | 1975-02-19 | ||
US4234791A (en) * | 1978-11-13 | 1980-11-18 | Research Corporation | Tandem quadrupole mass spectrometer for selected ion fragmentation studies and low energy collision induced dissociator therefor |
US4864130A (en) * | 1986-06-04 | 1989-09-05 | Arch Development Corporation | Photo ion spectrometer |
US4889987A (en) * | 1986-06-04 | 1989-12-26 | Arch Development Corporation | Photo ion spectrometer |
US5097125A (en) * | 1986-06-04 | 1992-03-17 | Arch Development Corporation | Photo ion spectrometer |
US4855596A (en) * | 1986-06-04 | 1989-08-08 | Arch Development Corp. | Photo ion spectrometer |
US4754135A (en) * | 1987-03-27 | 1988-06-28 | Eastman Kodak Company | Quadruple focusing time of flight mass spectrometer |
US4774408A (en) * | 1987-03-27 | 1988-09-27 | Eastman Kodak Company | Time of flight mass spectrometer |
JPH0619973B2 (en) | 1987-04-23 | 1994-03-16 | 日本電子株式会社 | Electrostatically corrected time-of-flight secondary ion microscope |
US4800273A (en) * | 1988-01-07 | 1989-01-24 | Phillips Bradway F | Secondary ion mass spectrometer |
JP2523781B2 (en) * | 1988-04-28 | 1996-08-14 | 日本電子株式会社 | Time-of-flight / deflection double focusing type switching mass spectrometer |
JPH0299846A (en) * | 1988-10-07 | 1990-04-11 | Toshiba Corp | Energy analyzer |
US5032723A (en) * | 1989-03-24 | 1991-07-16 | Tosoh Corporation | Charged particle energy analyzer |
GB8912580D0 (en) * | 1989-06-01 | 1989-07-19 | Vg Instr Group | Charged particle energy analyzer and mass spectrometer incorporating it |
US5128543A (en) * | 1989-10-23 | 1992-07-07 | Charles Evans & Associates | Particle analyzer apparatus and method |
US5087815A (en) * | 1989-11-08 | 1992-02-11 | Schultz J Albert | High resolution mass spectrometry of recoiled ions for isotopic and trace elemental analysis |
EP0545064B1 (en) * | 1991-12-02 | 2001-08-08 | Unaxis Balzers Aktiengesellschaft | Device for filtering charged particles, energy filter and analyser using such an energy filter |
DE4239866A1 (en) * | 1992-02-03 | 1993-08-05 | Forschungszentrum Juelich Gmbh | |
JP3375734B2 (en) | 1994-06-24 | 2003-02-10 | 日本電子株式会社 | Multi-stage time-of-flight mass spectrometer |
GB9510699D0 (en) * | 1995-05-26 | 1995-07-19 | Fisons Plc | Apparatus and method for surface analysis |
US5696375A (en) * | 1995-11-17 | 1997-12-09 | Bruker Analytical Instruments, Inc. | Multideflector |
JP4151926B2 (en) | 1997-10-28 | 2008-09-17 | 日本電子株式会社 | Ion optics of a time-of-flight mass spectrometer. |
JP3539848B2 (en) | 1997-10-30 | 2004-07-07 | 日本電子株式会社 | Ion optical system in time-of-flight mass spectrometer |
JPH11135060A (en) * | 1997-10-31 | 1999-05-21 | Jeol Ltd | Flight time type mass spectrometer |
AU2463299A (en) * | 1998-01-23 | 1999-08-09 | Analytica Of Branford, Inc. | Mass spectrometry from surfaces |
JP3392345B2 (en) | 1998-04-09 | 2003-03-31 | 住友重機械工業株式会社 | Time-of-flight mass spectrometer |
JP3571566B2 (en) | 1999-02-19 | 2004-09-29 | 日本電子株式会社 | Ion optical system of time-of-flight mass spectrometer |
JP3571567B2 (en) | 1999-02-19 | 2004-09-29 | 日本電子株式会社 | Ion optical system of time-of-flight mass spectrometer |
JP3773430B2 (en) | 2001-09-12 | 2006-05-10 | 日本電子株式会社 | Ion optics of a time-of-flight mass spectrometer. |
US6867414B2 (en) * | 2002-09-24 | 2005-03-15 | Ciphergen Biosystems, Inc. | Electric sector time-of-flight mass spectrometer with adjustable ion optical elements |
-
2003
- 2003-04-24 US US10/424,351 patent/US6867414B2/en not_active Expired - Fee Related
- 2003-09-04 CA CA002498842A patent/CA2498842A1/en not_active Abandoned
- 2003-09-04 CN CNA038227517A patent/CN1685467A/en active Pending
- 2003-09-04 AU AU2003268517A patent/AU2003268517A1/en not_active Abandoned
- 2003-09-04 JP JP2004540053A patent/JP2006500751A/en active Pending
- 2003-09-04 EP EP03749485A patent/EP1543538A2/en not_active Withdrawn
- 2003-09-04 KR KR1020057004972A patent/KR20050071502A/en not_active Application Discontinuation
- 2003-09-04 WO PCT/US2003/027974 patent/WO2004030008A2/en active Application Filing
- 2003-09-15 TW TW092125336A patent/TW200420339A/en unknown
-
2004
- 2004-01-14 US US10/758,326 patent/US6998606B2/en not_active Expired - Fee Related
-
2005
- 2005-06-08 US US11/148,865 patent/US7247846B2/en not_active Expired - Fee Related
-
2007
- 2007-06-15 US US11/818,913 patent/US20080128613A1/en not_active Abandoned
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4472631A (en) * | 1982-06-04 | 1984-09-18 | Research Corporation | Combination of time resolution and mass dispersive techniques in mass spectrometry |
US6674069B1 (en) * | 1998-12-17 | 2004-01-06 | Jeol Usa, Inc. | In-line reflecting time-of-flight mass spectrometer for molecular structural analysis using collision induced dissociation |
Also Published As
Publication number | Publication date |
---|---|
US6998606B2 (en) | 2006-02-14 |
EP1543538A2 (en) | 2005-06-22 |
US20040149901A1 (en) | 2004-08-05 |
TW200420339A (en) | 2004-10-16 |
CA2498842A1 (en) | 2004-04-08 |
CN1685467A (en) | 2005-10-19 |
US7247846B2 (en) | 2007-07-24 |
US20050224708A1 (en) | 2005-10-13 |
KR20050071502A (en) | 2005-07-07 |
AU2003268517A1 (en) | 2004-04-19 |
US20080128613A1 (en) | 2008-06-05 |
JP2006500751A (en) | 2006-01-05 |
US20040056190A1 (en) | 2004-03-25 |
US6867414B2 (en) | 2005-03-15 |
WO2004030008A2 (en) | 2004-04-08 |
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