WO2004017388A3 - Lithographic template and method of formation - Google Patents
Lithographic template and method of formation Download PDFInfo
- Publication number
- WO2004017388A3 WO2004017388A3 PCT/US2003/022559 US0322559W WO2004017388A3 WO 2004017388 A3 WO2004017388 A3 WO 2004017388A3 US 0322559 W US0322559 W US 0322559W WO 2004017388 A3 WO2004017388 A3 WO 2004017388A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- template
- sensitive material
- devices
- radiation sensitive
- pattern
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/08—Oxides
- C23C14/086—Oxides of zinc, germanium, cadmium, indium, tin, thallium or bismuth
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y40/00—Manufacture or treatment of nanostructures
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/0002—Lithographic processes using patterning methods other than those involving the exposure to radiation, e.g. by stamping
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/0017—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor for the production of embossing, cutting or similar devices; for the production of casting means
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/09—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers
- G03F7/093—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers characterised by antistatic means, e.g. for charge depletion
Abstract
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
AU2003256620A AU2003256620A1 (en) | 2002-08-15 | 2003-07-18 | Lithographic template and method of formation |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/222,734 US7083880B2 (en) | 2002-08-15 | 2002-08-15 | Lithographic template and method of formation and use |
US10/222,734 | 2002-08-15 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2004017388A2 WO2004017388A2 (en) | 2004-02-26 |
WO2004017388A3 true WO2004017388A3 (en) | 2004-08-12 |
Family
ID=31715050
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2003/022559 WO2004017388A2 (en) | 2002-08-15 | 2003-07-18 | Lithographic template and method of formation |
Country Status (3)
Country | Link |
---|---|
US (2) | US7083880B2 (en) |
AU (1) | AU2003256620A1 (en) |
WO (1) | WO2004017388A2 (en) |
Families Citing this family (35)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6852454B2 (en) * | 2002-06-18 | 2005-02-08 | Freescale Semiconductor, Inc. | Multi-tiered lithographic template and method of formation and use |
US20060193532A1 (en) * | 2005-02-25 | 2006-08-31 | William Roberts | Optimizing focal plane fitting functions for an image field on a substrate |
US7771917B2 (en) * | 2005-06-17 | 2010-08-10 | Micron Technology, Inc. | Methods of making templates for use in imprint lithography |
JP4262267B2 (en) * | 2005-09-06 | 2009-05-13 | キヤノン株式会社 | MOLD, IMPRINT APPARATUS AND DEVICE MANUFACTURING METHOD |
JP2009523312A (en) * | 2005-09-07 | 2009-06-18 | トッパン、フォウタマスクス、インク | Photomask for manufacturing dual damascene structure and method of forming the same |
US7968253B2 (en) | 2006-06-20 | 2011-06-28 | Samsung Electronics Co., Ltd. | Nano imprint master and method of manufacturing the same |
KR100785035B1 (en) | 2006-12-11 | 2007-12-12 | 삼성전자주식회사 | Nano imprint master and manufacturing method thereof |
US7883835B2 (en) * | 2006-09-22 | 2011-02-08 | Tokyo Electron Limited | Method for double patterning a thin film |
US7811747B2 (en) * | 2006-09-22 | 2010-10-12 | Tokyo Electron Limited | Method of patterning an anti-reflective coating by partial developing |
US7858293B2 (en) * | 2006-09-22 | 2010-12-28 | Tokyo Electron Limited | Method for double imaging a developable anti-reflective coating |
US7862985B2 (en) * | 2006-09-22 | 2011-01-04 | Tokyo Electron Limited | Method for double patterning a developable anti-reflective coating |
JP2008091782A (en) * | 2006-10-04 | 2008-04-17 | Toshiba Corp | Pattern forming template, pattern forming method and nano-imprinter |
US7767386B2 (en) * | 2007-01-15 | 2010-08-03 | Tokyo Electron Limited | Method of patterning an organic planarization layer |
US7932017B2 (en) * | 2007-01-15 | 2011-04-26 | Tokyo Electron Limited | Method of double patterning a thin film using a developable anti-reflective coating and a developable organic planarization layer |
JP4982213B2 (en) * | 2007-03-12 | 2012-07-25 | 株式会社日立ハイテクノロジーズ | Defect inspection apparatus and defect inspection method |
US20090004319A1 (en) * | 2007-05-30 | 2009-01-01 | Molecular Imprints, Inc. | Template Having a Silicon Nitride, Silicon Carbide or Silicon Oxynitride Film |
US7836420B2 (en) * | 2007-10-22 | 2010-11-16 | Chartered Semiconductor Manufacturing Ltd. | Integrated circuit system with assist feature |
US8114331B2 (en) * | 2008-01-02 | 2012-02-14 | International Business Machines Corporation | Amorphous oxide release layers for imprint lithography, and method of use |
US8029716B2 (en) * | 2008-02-01 | 2011-10-04 | International Business Machines Corporation | Amorphous nitride release layers for imprint lithography, and method of use |
US20090200266A1 (en) * | 2008-02-08 | 2009-08-13 | Molecular Imprints, Inc. | Template Pillar Formation |
DE102008019665A1 (en) * | 2008-04-18 | 2009-10-22 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Transparent barrier layer system |
JP2010027743A (en) * | 2008-07-16 | 2010-02-04 | Ebara Corp | Glass substrate for imprint, resist pattern forming method, and method and apparatus for inspecting glass substrate for imprint |
JP4609562B2 (en) * | 2008-09-10 | 2011-01-12 | 日立電線株式会社 | Stamper for fine structure transfer and manufacturing method thereof |
KR101343570B1 (en) * | 2008-12-18 | 2013-12-20 | 한국전자통신연구원 | Thin Film Transistor Using Boron-Doped Oxide Semiconductor Thin Film and Method for Preparing the Same |
CN101900936A (en) * | 2009-05-26 | 2010-12-01 | 鸿富锦精密工业(深圳)有限公司 | Impression mould and production method thereof |
DE102010027070A1 (en) * | 2010-07-13 | 2012-01-19 | Eberhard-Karls-Universität Tübingen | Gas sensor and method for its production |
KR20140076357A (en) * | 2012-12-12 | 2014-06-20 | 삼성전자주식회사 | Nanoimprint stamp having high contrast alignment mark and method of fabricating the same |
US9928727B2 (en) | 2015-07-28 | 2018-03-27 | Carrier Corporation | Flame detectors |
US9865766B2 (en) | 2015-07-28 | 2018-01-09 | Carrier Corporation | Ultraviolet photodetectors and methods of making ultraviolet photodetectors |
US9806125B2 (en) | 2015-07-28 | 2017-10-31 | Carrier Corporation | Compositionally graded photodetectors |
US10126165B2 (en) | 2015-07-28 | 2018-11-13 | Carrier Corporation | Radiation sensors |
CN106935668A (en) * | 2015-12-30 | 2017-07-07 | 中国建材国际工程集团有限公司 | Transparency conducting layer stacking and its manufacture method comprising pattern metal functional layer |
CN109683445A (en) * | 2019-01-10 | 2019-04-26 | 京东方科技集团股份有限公司 | A kind of joining method of nano-pattern, nano impression plate, grating and production method |
WO2021174426A1 (en) * | 2020-03-03 | 2021-09-10 | 安徽精卓光显技术有限责任公司 | Antenna and manufacturing method therefor, and electronic device |
CN112301317B (en) * | 2020-10-30 | 2021-05-18 | 连云港恒顺工业科技有限公司 | Surface treatment process for claw type vacuum pump rotor |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5817242A (en) * | 1995-08-04 | 1998-10-06 | International Business Machines Corporation | Stamp for a lithographic process |
US6004699A (en) * | 1997-02-28 | 1999-12-21 | Nec Corporation | Photomask used for projection exposure with phase shifted auxiliary pattern |
US6387787B1 (en) * | 2001-03-02 | 2002-05-14 | Motorola, Inc. | Lithographic template and method of formation and use |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0553289A (en) * | 1991-08-22 | 1993-03-05 | Nec Corp | Production of phase shift reticle |
US6635393B2 (en) * | 2001-03-23 | 2003-10-21 | Numerical Technologies, Inc. | Blank for alternating PSM photomask with charge dissipation layer |
US6653030B2 (en) * | 2002-01-23 | 2003-11-25 | Hewlett-Packard Development Company, L.P. | Optical-mechanical feature fabrication during manufacture of semiconductors and other micro-devices and nano-devices that include micron and sub-micron features |
-
2002
- 2002-08-15 US US10/222,734 patent/US7083880B2/en not_active Expired - Fee Related
-
2003
- 2003-07-18 WO PCT/US2003/022559 patent/WO2004017388A2/en not_active Application Discontinuation
- 2003-07-18 AU AU2003256620A patent/AU2003256620A1/en not_active Abandoned
-
2006
- 2006-06-12 US US11/423,621 patent/US7432024B2/en not_active Expired - Fee Related
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5817242A (en) * | 1995-08-04 | 1998-10-06 | International Business Machines Corporation | Stamp for a lithographic process |
US6004699A (en) * | 1997-02-28 | 1999-12-21 | Nec Corporation | Photomask used for projection exposure with phase shifted auxiliary pattern |
US6387787B1 (en) * | 2001-03-02 | 2002-05-14 | Motorola, Inc. | Lithographic template and method of formation and use |
Non-Patent Citations (6)
Title |
---|
BEN-SHALOM A ET AL: "SNO2 TRANSPARENT CONDUCTOR FILMS PRODUCED BY FILTERED VACUUM ARC DEPOSITION", THIN SOLID FILMS, ELSEVIER-SEQUOIA S.A. LAUSANNE, CH, vol. 236, no. 1/2, 15 December 1993 (1993-12-15), pages 20 - 26, XP000415509, ISSN: 0040-6090 * |
GORDON R G: "CRITERIA FOR CHOOSING TRANSPARENT CONDUCTORS", MRS BULLETIN, PITTSBURGH, US, vol. 25, no. 8, August 2000 (2000-08-01), pages 52 - 57, XP001087787 * |
MASATO KIUCHI ET AL: "TITANIUM NITRIDE FOR TRANSPARENT CONDUCTORS", APPLIED PHYSICS LETTERS, AMERICAN INSTITUTE OF PHYSICS. NEW YORK, US, vol. 64, no. 8, 21 February 1994 (1994-02-21), pages 1048 - 1049, XP000425897, ISSN: 0003-6951 * |
MINAMI T ET AL: "HIGHLY TRANSPARENT AND CONDUCTIVE ZN2IN2O5 THIN FILMS PREPARED BY RF MAGNETRON SPUTTERING", JAPANESE JOURNAL OF APPLIED PHYSICS, PUBLICATION OFFICE JAPANESE JOURNAL OF APPLIED PHYSICS. TOKYO, JP, vol. 34, no. 8A, 1995, pages L971 - L974, XP000563076, ISSN: 0021-4922 * |
PARK G -S ET AL: "Characterization of SnO/sub 2/ films on glass by transmission electron microscopy", THIN SOLID FILMS, 3 APRIL 2000, ELSEVIER, SWITZERLAND, vol. 365, no. 1, pages 7 - 11, XP004195119, ISSN: 0040-6090 * |
RESNICK D J ET AL: "New methods for fabricating step and flash imprint lithography templates", NANOSTRUCTURE SCIENCE, METROLOGY, AND TECHNOLOGY, GAITHERSBURG, MD, USA, 5-7 SEPT. 2001, vol. 4608, Proceedings of the SPIE - The International Society for Optical Engineering, 2002, SPIE-Int. Soc. Opt. Eng, USA, pages 176 - 181, XP002276868, ISSN: 0277-786X * |
Also Published As
Publication number | Publication date |
---|---|
US20040033424A1 (en) | 2004-02-19 |
AU2003256620A1 (en) | 2004-03-03 |
AU2003256620A8 (en) | 2004-03-03 |
WO2004017388A2 (en) | 2004-02-26 |
US7432024B2 (en) | 2008-10-07 |
US7083880B2 (en) | 2006-08-01 |
US20060222968A1 (en) | 2006-10-05 |
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