WO2004001706A3 - Control device of an optoelectronic device having improved testing properties - Google Patents

Control device of an optoelectronic device having improved testing properties Download PDF

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Publication number
WO2004001706A3
WO2004001706A3 PCT/EP2003/006481 EP0306481W WO2004001706A3 WO 2004001706 A3 WO2004001706 A3 WO 2004001706A3 EP 0306481 W EP0306481 W EP 0306481W WO 2004001706 A3 WO2004001706 A3 WO 2004001706A3
Authority
WO
WIPO (PCT)
Prior art keywords
contact areas
control device
improved testing
generating
testing properties
Prior art date
Application number
PCT/EP2003/006481
Other languages
German (de)
French (fr)
Other versions
WO2004001706A2 (en
Inventor
Matthias Brunner
Original Assignee
Akt Electron Beam Technology G
Matthias Brunner
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Akt Electron Beam Technology G, Matthias Brunner filed Critical Akt Electron Beam Technology G
Priority to KR1020047020388A priority Critical patent/KR100980120B1/en
Priority to JP2004514792A priority patent/JP4444102B2/en
Priority to US10/518,780 priority patent/US20050212782A1/en
Priority to DE50307773T priority patent/DE50307773D1/en
Priority to EP03760655A priority patent/EP1521973B1/en
Publication of WO2004001706A2 publication Critical patent/WO2004001706A2/en
Publication of WO2004001706A3 publication Critical patent/WO2004001706A3/en
Priority to US12/355,698 priority patent/US8208114B2/en

Links

Classifications

    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing

Abstract

The invention relates to control electronics for controlling a display comprising a matrix (101) of pixels. The driver circuit (102x or 102y) for generating signals for controlling the pixels via control lines (103) is provided with signals at inputs (110) via contact areas (104). Contact areas (105), which are used within the framework of a testing method, are situated next to contact areas (104), which are used for generating any image. The contact areas (105) for the testing method are connected to the inputs (110) of the driver circuit as well and are used for generating a test pattern.
PCT/EP2003/006481 2002-06-19 2003-06-18 Control device of an optoelectronic device having improved testing properties WO2004001706A2 (en)

Priority Applications (6)

Application Number Priority Date Filing Date Title
KR1020047020388A KR100980120B1 (en) 2002-06-19 2003-06-18 Drive Apparatus with Improved Testing Properties
JP2004514792A JP4444102B2 (en) 2002-06-19 2003-06-18 Control device for optoelectronic devices having improved test characteristics
US10/518,780 US20050212782A1 (en) 2002-06-19 2003-06-18 Control device having improved testing properties
DE50307773T DE50307773D1 (en) 2002-06-19 2003-06-18 CONTROL DEVICE OF AN OPTOELECTRONIC DEVICE WITH IMPROVED TEST PROPERTIES
EP03760655A EP1521973B1 (en) 2002-06-19 2003-06-18 Control device of an optoelectronic device having improved testing properties
US12/355,698 US8208114B2 (en) 2002-06-19 2009-01-16 Drive apparatus with improved testing properties

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE10227332.4 2002-06-19
DE10227332A DE10227332A1 (en) 2002-06-19 2002-06-19 Control device with improved test properties

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US12/355,698 Continuation US8208114B2 (en) 2002-06-19 2009-01-16 Drive apparatus with improved testing properties

Publications (2)

Publication Number Publication Date
WO2004001706A2 WO2004001706A2 (en) 2003-12-31
WO2004001706A3 true WO2004001706A3 (en) 2004-02-26

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/EP2003/006481 WO2004001706A2 (en) 2002-06-19 2003-06-18 Control device of an optoelectronic device having improved testing properties

Country Status (8)

Country Link
US (2) US20050212782A1 (en)
EP (1) EP1521973B1 (en)
JP (1) JP4444102B2 (en)
KR (1) KR100980120B1 (en)
AT (1) ATE368232T1 (en)
DE (2) DE10227332A1 (en)
TW (1) TWI345751B (en)
WO (1) WO2004001706A2 (en)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10227332A1 (en) * 2002-06-19 2004-01-15 Akt Electron Beam Technology Gmbh Control device with improved test properties
TWI333094B (en) * 2005-02-25 2010-11-11 Au Optronics Corp System and method for display testing
JP4665677B2 (en) * 2005-09-09 2011-04-06 セイコーエプソン株式会社 Integrated circuit device and electronic apparatus
KR20080008704A (en) * 2006-07-21 2008-01-24 삼성전자주식회사 Display substrate, method of manufacturing the same and display device having the same
US8115506B2 (en) * 2007-05-14 2012-02-14 Applied Materials, Inc. Localization of driver failures within liquid crystal displays
JP4692566B2 (en) * 2008-03-28 2011-06-01 ブラザー工業株式会社 Communication device
US9109759B2 (en) 2010-12-24 2015-08-18 Zeon Corporation Light-emitting element
CN105954899B (en) * 2016-07-08 2019-07-23 武汉华星光电技术有限公司 Liquid crystal display panel and liquid crystal display
KR102456696B1 (en) * 2018-08-07 2022-10-19 삼성디스플레이 주식회사 Display panel and manufacturing method thereof
CN110444117B (en) * 2019-07-24 2021-09-28 苏州清越光电科技股份有限公司 Preparation method of packaging substrate and display panel
CN111261055B (en) * 2020-01-21 2022-02-22 京东方科技集团股份有限公司 OLED display screen and OLED display device

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5657139A (en) * 1994-09-30 1997-08-12 Kabushiki Kaisha Toshiba Array substrate for a flat-display device including surge protection circuits and short circuit line or lines
EP0806700A1 (en) * 1988-05-17 1997-11-12 Seiko Epson Corporation Liquid crystal device
US5774100A (en) * 1995-09-26 1998-06-30 Kabushiki Kaisha Tobshiba Array substrate of liquid crystal display device
WO1998031050A1 (en) * 1997-01-13 1998-07-16 Image Quest Technologies, Inc. Improved active matrix esd protection and testing scheme
US5930607A (en) * 1995-10-03 1999-07-27 Seiko Epson Corporation Method to prevent static destruction of an active element comprised in a liquid crystal display device
US6265889B1 (en) * 1997-09-30 2001-07-24 Kabushiki Kaisha Toshiba Semiconductor test circuit and a method for testing a semiconductor liquid crystal display circuit
US6320568B1 (en) * 1990-12-31 2001-11-20 Kopin Corporation Control system for display panels
US6337722B1 (en) * 1997-08-07 2002-01-08 Lg.Philips Lcd Co., Ltd Liquid crystal display panel having electrostatic discharge prevention circuitry
US6340963B1 (en) * 1998-11-26 2002-01-22 Hitachi, Ltd. Liquid crystal display device
US6380729B1 (en) * 1999-02-16 2002-04-30 Alien Technology Corporation Testing integrated circuit dice

Family Cites Families (115)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3983401A (en) * 1975-03-13 1976-09-28 Electron Beam Microfabrication Corporation Method and apparatus for target support in electron projection systems
US4090056A (en) * 1976-05-17 1978-05-16 Electron Beam Welding, Inc. Optical viewing system for an electron beam welder
DE2902852C2 (en) * 1979-01-25 1983-04-07 Siemens AG, 1000 Berlin und 8000 München Flat electron beam display tube
DE2937004C2 (en) * 1979-09-13 1984-11-08 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V., 8000 München Chromatically corrected deflection device for corpuscular beam devices
US4495966A (en) * 1982-05-24 1985-01-29 Electron Beam Corporation Separable high vacuum valve
JPS58210631A (en) * 1982-05-31 1983-12-07 Toshiba Corp Ic tester utilizing electron beam
US4456910A (en) * 1982-08-12 1984-06-26 General Electric Company Non-complementary metal oxide semiconductor (MOS) driver for liquid crystal displays
US4528452A (en) * 1982-12-09 1985-07-09 Electron Beam Corporation Alignment and detection system for electron image projectors
EP0175933A1 (en) * 1984-09-21 1986-04-02 Siemens Aktiengesellschaft Scanning lens system without deflection chromatic defects for corpuscular beam treatment of material
US4985681A (en) * 1985-01-18 1991-01-15 Siemens Aktiengesellschaft Particle beam measuring method for non-contact testing of interconnect networks
JPS622552A (en) * 1985-06-27 1987-01-08 Matsushita Electric Ind Co Ltd Inspecting unit for semiconductor and inspecting method for semiconductor
JPS6298544A (en) 1985-10-25 1987-05-08 Hitachi Ltd Charged particle ray device
US4764818A (en) * 1986-02-03 1988-08-16 Electron Beam Memories Electron beam memory system with improved high rate digital beam pulsing system
US4740705A (en) * 1986-08-11 1988-04-26 Electron Beam Memories Axially compact field emission cathode assembly
US4760567A (en) * 1986-08-11 1988-07-26 Electron Beam Memories Electron beam memory system with ultra-compact, high current density electron gun
US4725736A (en) * 1986-08-11 1988-02-16 Electron Beam Memories Electrostatic electron gun with integrated electron beam deflection and/or stigmating system
US4965515A (en) * 1986-10-15 1990-10-23 Tokyo Electron Limited Apparatus and method of testing a semiconductor wafer
US4819038A (en) * 1986-12-22 1989-04-04 Ibm Corporation TFT array for liquid crystal displays allowing in-process testing
US4795912A (en) * 1987-02-17 1989-01-03 Trw Inc. Method and apparatus for correcting chromatic aberration in charged particle beams
NL8700933A (en) * 1987-04-21 1988-11-16 Philips Nv TEST METHOD FOR LCD ELEMENTS.
KR960006869B1 (en) * 1987-09-02 1996-05-23 도오교오 에레구토론 가부시끼가이샤 Method of testing electrical characteristics of lcd with probe device
US6288561B1 (en) * 1988-05-16 2001-09-11 Elm Technology Corporation Method and apparatus for probing, testing, burn-in, repairing and programming of integrated circuits in a closed environment using a single apparatus
US4870357A (en) * 1988-06-03 1989-09-26 Apple Computer, Inc. LCD error detection system
US4862075A (en) * 1988-09-01 1989-08-29 Photon Dynamics, Inc. High frequency test head using electro-optics
US4983833A (en) 1988-11-21 1991-01-08 Siemens Aktiengesellschaft Device for the detecting of charged secondary particles
US4985676A (en) * 1989-02-17 1991-01-15 Tokyo Electron Limited Method and apparatus of performing probing test for electrically and sequentially testing semiconductor device patterns
EP0402499A1 (en) 1989-06-13 1990-12-19 Siemens Aktiengesellschaft Process for testing a circuit board with a particle beam
US5124635A (en) * 1990-02-15 1992-06-23 Photon Dynamics, Inc. Voltage imaging system using electro-optics
US5177437A (en) * 1990-08-08 1993-01-05 Photon Dynamics, Inc. High-density optically-addressable circuit board probe panel and method for use
US5285150A (en) * 1990-11-26 1994-02-08 Photon Dynamics, Inc. Method and apparatus for testing LCD panel array
US5081687A (en) * 1990-11-30 1992-01-14 Photon Dynamics, Inc. Method and apparatus for testing LCD panel array prior to shorting bar removal
JPH05136218A (en) * 1991-02-19 1993-06-01 Tokyo Electron Yamanashi Kk Inspection device
US5170127A (en) * 1991-02-19 1992-12-08 Photon Dynamics, Inc. Capacitance imaging system using electro-optics
JPH04326725A (en) * 1991-04-26 1992-11-16 Tokyo Electron Ltd Plasma apparatus
US5175495A (en) * 1991-04-30 1992-12-29 Lsi Logic Corporation Detection of semiconductor failures by photoemission and electron beam testing
DE69223088T2 (en) * 1991-06-10 1998-03-05 Fujitsu Ltd Pattern checking apparatus and electron beam device
US5432461A (en) * 1991-06-28 1995-07-11 Photon Dynamics, Inc. Method of testing active matrix liquid crystal display substrates
US5268638A (en) * 1991-07-15 1993-12-07 Siemens Aktiengesellschaft Method for particle beam testing of substrates for liquid crystal displays "LCD"
DE4123959C1 (en) 1991-07-19 1993-02-04 Man Roland Druckmaschinen Ag, 6050 Offenbach, De
US5504438A (en) * 1991-09-10 1996-04-02 Photon Dynamics, Inc. Testing method for imaging defects in a liquid crystal display substrate
US5258706A (en) * 1991-10-16 1993-11-02 Siemens Aktiengesellschaft Method for the recognition of testing errors in the test of microwirings
US5369359A (en) * 1991-11-05 1994-11-29 Siemens Aktiengesellschaft Particle beam testing method with countervoltage or retarding voltage follow-up or feedback
US5313156A (en) * 1991-12-04 1994-05-17 Advantest Corporation Apparatus for automatic handling
US5546013A (en) * 1993-03-05 1996-08-13 International Business Machines Corporation Array tester for determining contact quality and line integrity in a TFT/LCD
JP3334719B2 (en) * 1993-09-16 2002-10-15 倭 窪田 Wound dressing material and wound dressing composition
DE69326003T2 (en) * 1993-09-20 1999-11-25 Hewlett Packard Gmbh Test apparatus for testing and handling a variety of devices
US5644245A (en) * 1993-11-24 1997-07-01 Tokyo Electron Limited Probe apparatus for inspecting electrical characteristics of a microelectronic element
US5528158A (en) * 1994-04-11 1996-06-18 Xandex, Inc. Probe card changer system and method
EP0686958B1 (en) * 1994-06-06 2003-10-29 Canon Kabushiki Kaisha DC compensation for interlaced display
JP3247799B2 (en) * 1994-06-09 2002-01-21 シャープ株式会社 Liquid crystal display panel and inspection method thereof
KR100283851B1 (en) * 1994-07-11 2001-04-02 기리야마 겐지 Monitor device and monitor method
US5691764A (en) * 1994-08-05 1997-11-25 Tokyo Electron Limited Apparatus for examining target objects such as LCD panels
JPH08201841A (en) * 1994-11-24 1996-08-09 Toshiba Electron Eng Corp Display device and its inspection method
US5558717A (en) * 1994-11-30 1996-09-24 Applied Materials CVD Processing chamber
US5742173A (en) * 1995-03-18 1998-04-21 Tokyo Electron Limited Method and apparatus for probe testing substrate
US5621333A (en) * 1995-05-19 1997-04-15 Microconnect, Inc. Contact device for making connection to an electronic circuit device
DE19525081B4 (en) * 1995-07-10 2006-06-29 Display Products Group, Inc., Hayward Method and device for testing the function of microstructure elements
KR100291316B1 (en) * 1995-07-14 2001-06-01 히가시 데쓰로 LCD inspection device
JPH0980460A (en) * 1995-09-07 1997-03-28 Seiko Instr Inc Liquid crystal display device and inspection method therefor
US5892224A (en) * 1996-05-13 1999-04-06 Nikon Corporation Apparatus and methods for inspecting wafers and masks using multiple charged-particle beams
US6046599A (en) * 1996-05-20 2000-04-04 Microconnect, Inc. Method and device for making connection
TW329002B (en) * 1996-06-05 1998-04-01 Zenshin Test Co Apparatus and method for inspecting a LCD substrate
US6243208B1 (en) * 1996-08-22 2001-06-05 Canon Kabushiki Kaisha Optical element, optical system using optical element, and optical device with optical element
US5923180A (en) * 1997-02-04 1999-07-13 Hewlett-Packard Company Compliant wafer prober docking adapter
JP3423979B2 (en) * 1997-07-11 2003-07-07 東京エレクトロン株式会社 Probe method and probe device
JP4036923B2 (en) 1997-07-17 2008-01-23 株式会社半導体エネルギー研究所 Display device and drive circuit thereof
US5936687A (en) * 1997-09-25 1999-08-10 Samsung Electronics Co., Ltd. Liquid crystal display having an electrostatic discharge protection circuit and a method for testing display quality using the circuit
US6188453B1 (en) * 1997-09-30 2001-02-13 Sanyo Electric Co., Ltd. Display apparatus having test elements under or bounded by the sealant
US5973323A (en) * 1997-11-05 1999-10-26 Kla-Tencor Corporation Apparatus and method for secondary electron emission microscope
US6075245A (en) * 1998-01-12 2000-06-13 Toro-Lira; Guillermo L. High speed electron beam based system for testing large area flat panel displays
DE19802848B4 (en) 1998-01-26 2012-02-02 Display Products Group,Inc. Method and apparatus for testing a substrate
US5982190A (en) * 1998-02-04 1999-11-09 Toro-Lira; Guillermo L. Method to determine pixel condition on flat panel displays using an electron beam
US6086362A (en) * 1998-05-20 2000-07-11 Applied Komatsu Technology, Inc. Multi-function chamber for a substrate processing system
US6198299B1 (en) * 1998-08-27 2001-03-06 The Micromanipulator Company, Inc. High Resolution analytical probe station
US6343369B1 (en) * 1998-09-15 2002-01-29 Microconnect, Inc. Methods for making contact device for making connection to an electronic circuit device and methods of using the same
EP0999573B1 (en) 1998-11-06 2006-06-28 ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH Beam column for charged particle device
US6137303A (en) * 1998-12-14 2000-10-24 Sony Corporation Integrated testing method and apparatus for semiconductor test operations processing
JP2000180392A (en) 1998-12-15 2000-06-30 Shimadzu Corp Electron beam microanalyser
US6344750B1 (en) * 1999-01-08 2002-02-05 Schlumberger Technologies, Inc. Voltage contrast method for semiconductor inspection using low voltage particle beam
JP2000223057A (en) 1999-01-28 2000-08-11 Shimadzu Corp Electron probe microanalyzer
US6437596B1 (en) * 1999-01-28 2002-08-20 International Business Machines Corporation Integrated circuits for testing a display array
JP2000268764A (en) 1999-03-18 2000-09-29 Shimadzu Corp Automatic electron beam analyzer
US6614026B1 (en) 1999-04-15 2003-09-02 Applied Materials, Inc. Charged particle beam column
US6452175B1 (en) 1999-04-15 2002-09-17 Applied Materials, Inc. Column for charged particle beam device
JP2000311930A (en) * 1999-04-28 2000-11-07 Agilent Technologies Japan Ltd Semiconductor inspection apparatus and method for specifying attribute of each die on wafer in the apparatus
US6281701B1 (en) * 1999-06-04 2001-08-28 Chi Mei Optoelectronics Corporation Apparatus for testing flat panel display
WO2001001438A1 (en) * 1999-06-23 2001-01-04 Applied Materials, Inc. Ion beam generation apparatus
JP4045696B2 (en) 1999-07-22 2008-02-13 株式会社島津製作所 X-ray spectrometer
JP2001053282A (en) 1999-08-11 2001-02-23 Matsushita Electric Ind Co Ltd Thin-film transistor array substrate and method of testing the same
TW533319B (en) * 1999-11-19 2003-05-21 De & T Co Ltd LCD testing system
JP2001215463A (en) * 2000-02-02 2001-08-10 Seiko Epson Corp Circuit and method for setting common output of lcd driver and semiconductor device for lcd driver
JP2001318116A (en) 2000-05-11 2001-11-16 Micronics Japan Co Ltd Inspection apparatus for display panel board
JP2001330639A (en) * 2000-05-24 2001-11-30 Toshiba Corp Array substrate inspecting method
JP3937692B2 (en) 2000-06-15 2007-06-27 セイコーエプソン株式会社 Array substrate inspection method, array substrate manufacturing method, array substrate, and electro-optical device
US6828587B2 (en) * 2000-06-19 2004-12-07 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
JP4517323B2 (en) 2000-07-19 2010-08-04 株式会社島津製作所 Electron microanalyzer measurement data correction method
KR100385082B1 (en) * 2000-07-27 2003-05-22 삼성전자주식회사 a liquid crystal display and a manufacturing method thereof
JP2002048740A (en) 2000-07-31 2002-02-15 Shimadzu Corp Electron beam analyzer
JP2002040464A (en) * 2000-07-31 2002-02-06 Sony Corp Liquid crystal display panel
KR100960773B1 (en) * 2000-09-15 2010-06-01 어플라이드 머티어리얼스, 인코포레이티드 Double dual slot load lock for process equipment
US20020135395A1 (en) 2001-02-08 2002-09-26 Pete Smith System and method for testing a display device
JP2002257997A (en) 2001-03-01 2002-09-11 Shimadzu Corp Charged particle beam stabilizing device
JP2002343294A (en) 2001-03-12 2002-11-29 Jeol Ltd Complex electron microscope
JP2002310959A (en) 2001-04-16 2002-10-23 Shimadzu Corp Electron beam analyzer
US6777675B2 (en) * 2001-04-18 2004-08-17 Multibeam Detector optics for electron beam inspection system
US20030085855A1 (en) * 2001-07-17 2003-05-08 Kabushiki Kaisha Toshiba Array substrate, method of inspecting array substrate, and liquid crystal display
JP2003050380A (en) * 2001-08-07 2003-02-21 Toshiba Corp Method for inspecting array substrate
US7129694B2 (en) * 2002-05-23 2006-10-31 Applied Materials, Inc. Large substrate test system
JP4126484B2 (en) 2002-06-10 2008-07-30 株式会社島津製作所 X-ray equipment
DE10227332A1 (en) * 2002-06-19 2004-01-15 Akt Electron Beam Technology Gmbh Control device with improved test properties
US6765203B1 (en) * 2003-01-31 2004-07-20 Shimadzu Corporation Pallet assembly for substrate inspection device and substrate inspection device
US6833717B1 (en) 2004-02-12 2004-12-21 Applied Materials, Inc. Electron beam test system with integrated substrate transfer module
US7355418B2 (en) * 2004-02-12 2008-04-08 Applied Materials, Inc. Configurable prober for TFT LCD array test
US7518602B2 (en) * 2004-12-06 2009-04-14 Semiconductor Energy Laboratory Co., Ltd. Test circuit and display device having the same
US7532265B2 (en) * 2005-06-08 2009-05-12 Wintek Corporation Integrated circuit with the cell test function for the electrostatic discharge protection

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0806700A1 (en) * 1988-05-17 1997-11-12 Seiko Epson Corporation Liquid crystal device
US6320568B1 (en) * 1990-12-31 2001-11-20 Kopin Corporation Control system for display panels
US5657139A (en) * 1994-09-30 1997-08-12 Kabushiki Kaisha Toshiba Array substrate for a flat-display device including surge protection circuits and short circuit line or lines
US5774100A (en) * 1995-09-26 1998-06-30 Kabushiki Kaisha Tobshiba Array substrate of liquid crystal display device
US5930607A (en) * 1995-10-03 1999-07-27 Seiko Epson Corporation Method to prevent static destruction of an active element comprised in a liquid crystal display device
WO1998031050A1 (en) * 1997-01-13 1998-07-16 Image Quest Technologies, Inc. Improved active matrix esd protection and testing scheme
US6337722B1 (en) * 1997-08-07 2002-01-08 Lg.Philips Lcd Co., Ltd Liquid crystal display panel having electrostatic discharge prevention circuitry
US6265889B1 (en) * 1997-09-30 2001-07-24 Kabushiki Kaisha Toshiba Semiconductor test circuit and a method for testing a semiconductor liquid crystal display circuit
US6340963B1 (en) * 1998-11-26 2002-01-22 Hitachi, Ltd. Liquid crystal display device
US6380729B1 (en) * 1999-02-16 2002-04-30 Alien Technology Corporation Testing integrated circuit dice

Also Published As

Publication number Publication date
JP2005530211A (en) 2005-10-06
EP1521973B1 (en) 2007-07-25
KR20050021007A (en) 2005-03-04
KR100980120B1 (en) 2010-09-03
US20090122056A1 (en) 2009-05-14
JP4444102B2 (en) 2010-03-31
EP1521973A2 (en) 2005-04-13
DE10227332A1 (en) 2004-01-15
TWI345751B (en) 2011-07-21
US20050212782A1 (en) 2005-09-29
WO2004001706A2 (en) 2003-12-31
US8208114B2 (en) 2012-06-26
ATE368232T1 (en) 2007-08-15
DE50307773D1 (en) 2007-09-06
TW200407824A (en) 2004-05-16

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