WO2003016590A3 - Device for supplying gas mixtures to a cvd reactor - Google Patents
Device for supplying gas mixtures to a cvd reactor Download PDFInfo
- Publication number
- WO2003016590A3 WO2003016590A3 PCT/DE2002/002592 DE0202592W WO03016590A3 WO 2003016590 A3 WO2003016590 A3 WO 2003016590A3 DE 0202592 W DE0202592 W DE 0202592W WO 03016590 A3 WO03016590 A3 WO 03016590A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- supply line
- cvd reactor
- supplying gas
- gas mixtures
- carrier gas
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/4401—Means for minimising impurities, e.g. dust, moisture or residual gas, in the reaction chamber
- C23C16/4408—Means for minimising impurities, e.g. dust, moisture or residual gas, in the reaction chamber by purging residual gases from the reaction chamber or gas lines
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/448—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials
- C23C16/4481—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials by evaporation using carrier gas in contact with the source material
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45561—Gas plumbing upstream of the reaction chamber
Abstract
The invention relates to a device comprising a supply line branch (Z1) for a gas mixture consisting of an atomized medium (M1) and a carrier gas (T) to a CVD reactor (R). The supply line branch (Z1) comprises a supply line for the liquid medium (M1), a supply line for the carrier gas (T) and a processing unit which is fed by the supply lines and is used to convert the liquid medium (M1) into a gaseous state using an injector valve (EV1) and to mix the medium (M1) with the carrier gas (T). The supply lines are respectively provided with a through flow control unit (DS11, DS12)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE10137673.1 | 2001-08-01 | ||
DE2001137673 DE10137673A1 (en) | 2001-08-01 | 2001-08-01 | Device for supplying gas mixtures to a CVD reactor |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2003016590A2 WO2003016590A2 (en) | 2003-02-27 |
WO2003016590A3 true WO2003016590A3 (en) | 2003-05-30 |
Family
ID=7693981
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/DE2002/002592 WO2003016590A2 (en) | 2001-08-01 | 2002-07-15 | Device for supplying gas mixtures to a cvd reactor |
Country Status (2)
Country | Link |
---|---|
DE (1) | DE10137673A1 (en) |
WO (1) | WO2003016590A2 (en) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE10337568A1 (en) * | 2003-08-14 | 2005-03-17 | Infineon Technologies Ag | Gas supply arrangement, in particular for a CVD process reactor for growing an epitaxial layer |
DE10345824A1 (en) * | 2003-09-30 | 2005-05-04 | Infineon Technologies Ag | Arrangement for depositing atomic layers onto substrates used in the production of semiconductors comprises a source for trimethylaluminum vapor and a source for water connected together |
US20090214777A1 (en) * | 2008-02-22 | 2009-08-27 | Demetrius Sarigiannis | Multiple ampoule delivery systems |
CN110016657B (en) * | 2018-01-08 | 2020-06-19 | 北京北方华创微电子装备有限公司 | Flow control method and device and reaction chamber |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5968588A (en) * | 1997-03-17 | 1999-10-19 | Applied Materials, Inc. | In-situ liquid flow rate estimation and verification by sonic flow method |
US6110531A (en) * | 1991-02-25 | 2000-08-29 | Symetrix Corporation | Method and apparatus for preparing integrated circuit thin films by chemical vapor deposition |
US6176930B1 (en) * | 1999-03-04 | 2001-01-23 | Applied Materials, Inc. | Apparatus and method for controlling a flow of process material to a deposition chamber |
US6179925B1 (en) * | 1999-05-14 | 2001-01-30 | Applied Materials, Inc. | Method and apparatus for improved control of process and purge material in substrate processing system |
US6244575B1 (en) * | 1996-10-02 | 2001-06-12 | Micron Technology, Inc. | Method and apparatus for vaporizing liquid precursors and system for using same |
EP1113089A1 (en) * | 1999-12-30 | 2001-07-04 | Applied Materials, Inc. | MOCVD of lead zirconate titanate films |
EP1122335A1 (en) * | 2000-02-01 | 2001-08-08 | Applied Materials, Inc. | Methods and apparatus for vaporization of liquids |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH06291040A (en) * | 1992-03-03 | 1994-10-18 | Rintetsuku:Kk | Method and apparatus for vaporizing and supplying liquid |
JP3122311B2 (en) * | 1994-06-29 | 2001-01-09 | 東京エレクトロン株式会社 | Apparatus for supplying liquid material to film forming chamber and method of using the same |
AU9507298A (en) * | 1997-09-26 | 1999-04-23 | Advanced Technology Materials, Inc. | Liquid reagent delivery system |
KR100273474B1 (en) * | 1998-09-14 | 2000-12-15 | 이경수 | Gas supply apparatus of chemical vapor deposition apparatus |
JP4230596B2 (en) * | 1999-03-12 | 2009-02-25 | 東京エレクトロン株式会社 | Thin film formation method |
-
2001
- 2001-08-01 DE DE2001137673 patent/DE10137673A1/en not_active Withdrawn
-
2002
- 2002-07-15 WO PCT/DE2002/002592 patent/WO2003016590A2/en active Application Filing
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6110531A (en) * | 1991-02-25 | 2000-08-29 | Symetrix Corporation | Method and apparatus for preparing integrated circuit thin films by chemical vapor deposition |
US6244575B1 (en) * | 1996-10-02 | 2001-06-12 | Micron Technology, Inc. | Method and apparatus for vaporizing liquid precursors and system for using same |
US5968588A (en) * | 1997-03-17 | 1999-10-19 | Applied Materials, Inc. | In-situ liquid flow rate estimation and verification by sonic flow method |
US6176930B1 (en) * | 1999-03-04 | 2001-01-23 | Applied Materials, Inc. | Apparatus and method for controlling a flow of process material to a deposition chamber |
US6179925B1 (en) * | 1999-05-14 | 2001-01-30 | Applied Materials, Inc. | Method and apparatus for improved control of process and purge material in substrate processing system |
EP1113089A1 (en) * | 1999-12-30 | 2001-07-04 | Applied Materials, Inc. | MOCVD of lead zirconate titanate films |
EP1122335A1 (en) * | 2000-02-01 | 2001-08-08 | Applied Materials, Inc. | Methods and apparatus for vaporization of liquids |
Also Published As
Publication number | Publication date |
---|---|
WO2003016590A2 (en) | 2003-02-27 |
DE10137673A1 (en) | 2003-02-27 |
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121 | Ep: the epo has been informed by wipo that ep was designated in this application | ||
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122 | Ep: pct application non-entry in european phase |