WO2003010624A3 - On-site analysis system with central processor and method of analysing - Google Patents

On-site analysis system with central processor and method of analysing Download PDF

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Publication number
WO2003010624A3
WO2003010624A3 PCT/US2002/022966 US0222966W WO03010624A3 WO 2003010624 A3 WO2003010624 A3 WO 2003010624A3 US 0222966 W US0222966 W US 0222966W WO 03010624 A3 WO03010624 A3 WO 03010624A3
Authority
WO
WIPO (PCT)
Prior art keywords
central processor
analysis system
analysis
analysing
calibration models
Prior art date
Application number
PCT/US2002/022966
Other languages
French (fr)
Other versions
WO2003010624A2 (en
Inventor
Alan P Lundstedt
Allen L Hall
Ching-Hui Tseng
Original Assignee
Cognis Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Cognis Corp filed Critical Cognis Corp
Priority to AU2002318275A priority Critical patent/AU2002318275B2/en
Priority to BRPI0211369-4A priority patent/BR0211369A/en
Priority to EP02748208.2A priority patent/EP1525534B1/en
Publication of WO2003010624A2 publication Critical patent/WO2003010624A2/en
Publication of WO2003010624A3 publication Critical patent/WO2003010624A3/en

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/359—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using near infrared light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00594—Quality control, including calibration or testing of components of the analyser
    • G01N35/00712—Automatic status testing, e.g. at start-up or periodic
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00722—Communications; Identification
    • G01N35/00871—Communications between instruments or with remote terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00722—Communications; Identification
    • G01N35/00871—Communications between instruments or with remote terminals
    • G01N2035/00881—Communications between instruments or with remote terminals network configurations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing
    • G01N2201/127—Calibration; base line adjustment; drift compensation
    • G01N2201/12746—Calibration values determination
    • G01N2201/12753—Calibration values determination and storage
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing
    • G01N2201/127—Calibration; base line adjustment; drift compensation
    • G01N2201/12792—Compensating own radiation in apparatus

Abstract

A method of analysis, analysis system, program product, apparatus, and method of supplying analysis of value incorporating the use of at least one data acquisition device (2, 4, 6) a central processor (10), and a communication link (8) that is connectable between the data acquisition device (2, 4, 6) and the central processor (10). The central processor (10) is loaded with multivariate calibration models developped for predicting values for various properties of interest, wherein the calibration models are capable of compensating for variations in an effectively comprehensive set of measurement conditions and secondary material characteristics. As so configured, the calibration models can compensate for instrument-specific calibration transfer. Measurements results (14) generated by the central processor (10) can be transmitted to an output device of a user interface (32).
PCT/US2002/022966 2001-07-23 2002-07-19 On-site analysis system with central processor and method of analysing WO2003010624A2 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
AU2002318275A AU2002318275B2 (en) 2001-07-23 2002-07-19 On-site analysis system with central processor and method of analysing
BRPI0211369-4A BR0211369A (en) 2001-07-23 2002-07-19 method for predicting a value of a property of interest of a material, system for analyzing a material, methods for generating and updating a calibration model, for defining at least one acceptable data region, for defining a refined filter using a set of validation and training set, to review a calibration model and calibration model development from a training set, to evaluate an instrument and an instrument component for acceptability as a data acquisition device, and to provide analytical services, program product, product program, and, appliance
EP02748208.2A EP1525534B1 (en) 2001-07-23 2002-07-19 Method of predicting a value of a property of interest using NIR spectroscopy

Applications Claiming Priority (8)

Application Number Priority Date Filing Date Title
US30734701P 2001-07-23 2001-07-23
US30734801P 2001-07-23 2001-07-23
US60/307,347 2001-07-23
US60/307,348 2001-07-23
US10/188,853 US20030135547A1 (en) 2001-07-23 2002-07-05 Extensible modular communication executive with active message queue and intelligent message pre-validation
US10/188,853 2002-07-05
US10/188,972 US7194369B2 (en) 2001-07-23 2002-07-05 On-site analysis system with central processor and method of analyzing
US10/188,972 2002-07-05

Publications (2)

Publication Number Publication Date
WO2003010624A2 WO2003010624A2 (en) 2003-02-06
WO2003010624A3 true WO2003010624A3 (en) 2005-02-24

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2002/022966 WO2003010624A2 (en) 2001-07-23 2002-07-19 On-site analysis system with central processor and method of analysing

Country Status (7)

Country Link
US (4) US7194369B2 (en)
EP (1) EP1525534B1 (en)
AR (1) AR036238A1 (en)
AU (1) AU2002318275B2 (en)
BR (1) BR0211369A (en)
MY (1) MY140632A (en)
WO (1) WO2003010624A2 (en)

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